JPH0354830B2 - - Google Patents

Info

Publication number
JPH0354830B2
JPH0354830B2 JP58083391A JP8339183A JPH0354830B2 JP H0354830 B2 JPH0354830 B2 JP H0354830B2 JP 58083391 A JP58083391 A JP 58083391A JP 8339183 A JP8339183 A JP 8339183A JP H0354830 B2 JPH0354830 B2 JP H0354830B2
Authority
JP
Japan
Prior art keywords
ion
magnetic field
ion beam
mass
electric field
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP58083391A
Other languages
English (en)
Japanese (ja)
Other versions
JPS59209258A (ja
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP58083391A priority Critical patent/JPS59209258A/ja
Publication of JPS59209258A publication Critical patent/JPS59209258A/ja
Publication of JPH0354830B2 publication Critical patent/JPH0354830B2/ja
Granted legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/26—Mass spectrometers or separator tubes
    • H01J49/28—Static spectrometers
    • H01J49/32—Static spectrometers using double focusing

Landscapes

  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Electron Tubes For Measurement (AREA)
  • Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
JP58083391A 1983-05-12 1983-05-12 質量分析装置 Granted JPS59209258A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP58083391A JPS59209258A (ja) 1983-05-12 1983-05-12 質量分析装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP58083391A JPS59209258A (ja) 1983-05-12 1983-05-12 質量分析装置

Publications (2)

Publication Number Publication Date
JPS59209258A JPS59209258A (ja) 1984-11-27
JPH0354830B2 true JPH0354830B2 (cs) 1991-08-21

Family

ID=13801124

Family Applications (1)

Application Number Title Priority Date Filing Date
JP58083391A Granted JPS59209258A (ja) 1983-05-12 1983-05-12 質量分析装置

Country Status (1)

Country Link
JP (1) JPS59209258A (cs)

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS59160949A (ja) * 1983-03-01 1984-09-11 Denshi Kagaku Kk 質量分析装置

Also Published As

Publication number Publication date
JPS59209258A (ja) 1984-11-27

Similar Documents

Publication Publication Date Title
JPH0354831B2 (cs)
SU1600645A3 (ru) Масс-спектрометр
US4174479A (en) Mass spectrometer
Beynon et al. A novel, double-focusing spectrometer for translational-energy-loss spectroscopy
EP0202117B1 (en) Double focusing mass spectrometers
US4924090A (en) Double focusing mass spectrometer and MS/MS arrangement
US5013923A (en) Mass recombinator for accelerator mass spectrometry
JPS5829577B2 (ja) 二重収束質量分析装置
JP2012517083A (ja) ２重集束を有する磁気色消し質量分析計
US6797962B1 (en) Electrostatic corrector for eliminating the chromatic aberration of particle lenses
JP3571523B2 (ja) オメガ型エネルギーフィルタ
US6441378B1 (en) Magnetic energy filter
JPH0354830B2 (cs)
JPH0812773B2 (ja) 同時検出型質量分析装置
CN111276387A (zh) 双模式离子传输装置及方法
JP2956706B2 (ja) 質量分析装置
EP0295253B1 (en) Electron spectrometer
JP3153386B2 (ja) 質量分析装置
JPS61259449A (ja) 二重収束質量分析装置
Matsuda et al. A mass spectrograph for the analysis of collisionally activated molecular fragments
Yavor et al. Parasitic aberrations in static sector field mass analyzers and their correction. Part 1. First order approximation
GB2631411A (en) Mass spectrometers comprising a pre-filter
JPS6062055A (ja) 質量分析装置
SU680534A1 (ru) Электростатический энергоанализатор
Boerboom Ion optics of multipoles