JPH0352300U - - Google Patents
Info
- Publication number
- JPH0352300U JPH0352300U JP11430889U JP11430889U JPH0352300U JP H0352300 U JPH0352300 U JP H0352300U JP 11430889 U JP11430889 U JP 11430889U JP 11430889 U JP11430889 U JP 11430889U JP H0352300 U JPH0352300 U JP H0352300U
- Authority
- JP
- Japan
- Prior art keywords
- thermal vacuum
- panel
- testing device
- heater
- orbit
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 238000010438 heat treatment Methods 0.000 claims 2
- 238000010586 diagram Methods 0.000 description 2
- 238000001816 cooling Methods 0.000 description 1
Landscapes
- Investigating Or Analyzing Materials Using Thermal Means (AREA)
Description
第１図はこの考案に係る熱真空試験装置の一実
施例を示す図、第２図は上記熱真空試験装置の断
面図、第３図は従来の熱真空試験装置を示す図、
第４図は上記従来の熱真空試験装置の断面図であ
り１……供試体、２……供試体やパネルを支持す
る支持フレーム、３……パネルに貼付けたヒータ
、４……上記供試体１に対向し供試体１に熱照射
を与えるパネル、５……極低温に冷却されたチエ
ンバシユラウド、６……上記パネル４に施された
冷却配管である。なお、各図中同一符号は同一ま
たは相当部分を示す。
FIG. 1 is a diagram showing an embodiment of the thermal vacuum testing device according to this invention, FIG. 2 is a sectional view of the thermal vacuum testing device, and FIG. 3 is a diagram showing a conventional thermal vacuum testing device.
FIG. 4 is a cross-sectional view of the conventional thermal vacuum testing apparatus, and shows 1... the specimen, 2... the support frame that supports the specimen and the panel, 3... the heater attached to the panel, 4... the above-mentioned specimen. A panel facing 1 and applying heat irradiation to the specimen 1; 5...a chamber loud cooled to an extremely low temperature; and 6... cooling piping provided on the panel 4. Note that the same reference numerals in each figure indicate the same or corresponding parts.
Claims (1)
軌道上で照射される太陽光エネルギ、地球赤外線
等の熱入力と等価なエネルギを照射する赤外線加
熱式の熱真空試験装置において、加熱源としての
ヒータを照射板としてのパネル上に取付け、しか
も上記パネル間にすき間を設けたことを特徴とす
る熱真空試験装置。 Under the low pressure and extremely low temperature environment similar to outer space,
In an infrared heating type thermal vacuum test device that irradiates energy equivalent to heat input such as solar energy and earth's infrared rays irradiated in orbit, a heater as a heating source is mounted on a panel as an irradiation plate, and the above-mentioned A thermal vacuum testing device characterized by providing a gap between panels.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP11430889U JPH0352300U (en) | 1989-09-29 | 1989-09-29 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP11430889U JPH0352300U (en) | 1989-09-29 | 1989-09-29 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPH0352300U true JPH0352300U (en) | 1991-05-21 |
Family
ID=31662686
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP11430889U Pending JPH0352300U (en) | 1989-09-29 | 1989-09-29 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH0352300U (en) |
-
1989
- 1989-09-29 JP JP11430889U patent/JPH0352300U/ja active Pending
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| DE69728426D1 (en) | HOT WELDING OF PLASTICS BY means of RADIATION | |
| NO172102C (en) | FILTER UNIT, A GROUP OF SUCH FILTER UNITS, AND A PROCEDURE FOR USING SUCH A FILTER UNIT OR FILTER GROUP | |
| JPH0352300U (en) | ||
| JPH03157300A (en) | Artificial satellite | |
| JPH0265700U (en) | ||
| JPH0325400U (en) | ||
| EP0378374A3 (en) | Thermal imaging device | |
| JPH0325000U (en) | ||
| FR2303250A1 (en) | Room heating system using solar heat - has heat absorbing panels behind glass with two independent heat circulating circuits | |
| JPS6281026U (en) | ||
| JPH01120634U (en) | ||
| JPS62119634U (en) | ||
| JPH0395451A (en) | Checking method of bonding structure without breaking the same | |
| JPS6434524U (en) | ||
| JPS63195236U (en) | ||
| JPS6446723U (en) | ||
| JPH02128544U (en) | ||
| JPS5595840A (en) | Infrared ray detector | |
| JPH0463094U (en) | ||
| JPH0214042U (en) | ||
| Mihai | Thermal techniques of examination without direct contact applied in the metallic stratified materials control | |
| KR19980026571U (en) | Panel Far Infrared Radiator | |
| JPH0460544U (en) | ||
| JPH01120500U (en) | ||
| JPH0312145U (en) |