JPH0351360U - - Google Patents
Info
- Publication number
- JPH0351360U JPH0351360U JP11315889U JP11315889U JPH0351360U JP H0351360 U JPH0351360 U JP H0351360U JP 11315889 U JP11315889 U JP 11315889U JP 11315889 U JP11315889 U JP 11315889U JP H0351360 U JPH0351360 U JP H0351360U
- Authority
- JP
- Japan
- Prior art keywords
- gantry
- light
- light beam
- scanning
- subject
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 230000003287 optical effect Effects 0.000 claims 1
- 238000003325 tomography Methods 0.000 claims 1
- 238000010586 diagram Methods 0.000 description 4
- 238000001514 detection method Methods 0.000 description 1
- 238000000034 method Methods 0.000 description 1
Landscapes
- Investigating Or Analysing Materials By Optical Means (AREA)
- Mechanical Optical Scanning Systems (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP11315889U JPH0351360U (ru) | 1989-09-27 | 1989-09-27 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP11315889U JPH0351360U (ru) | 1989-09-27 | 1989-09-27 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPH0351360U true JPH0351360U (ru) | 1991-05-20 |
Family
ID=31661581
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP11315889U Pending JPH0351360U (ru) | 1989-09-27 | 1989-09-27 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH0351360U (ru) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2006084233A (ja) * | 2004-09-14 | 2006-03-30 | Hamamatsu Photonics Kk | 試料計測装置及び計測方法 |
-
1989
- 1989-09-27 JP JP11315889U patent/JPH0351360U/ja active Pending
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2006084233A (ja) * | 2004-09-14 | 2006-03-30 | Hamamatsu Photonics Kk | 試料計測装置及び計測方法 |
| JP4698992B2 (ja) * | 2004-09-14 | 2011-06-08 | 浜松ホトニクス株式会社 | 試料計測装置及び計測方法 |