JPH0351359U - - Google Patents
Info
- Publication number
- JPH0351359U JPH0351359U JP11092289U JP11092289U JPH0351359U JP H0351359 U JPH0351359 U JP H0351359U JP 11092289 U JP11092289 U JP 11092289U JP 11092289 U JP11092289 U JP 11092289U JP H0351359 U JPH0351359 U JP H0351359U
- Authority
- JP
- Japan
- Prior art keywords
- light
- particle detection
- lamp
- sheet
- optical system
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 239000002245 particle Substances 0.000 claims description 6
- 238000001514 detection method Methods 0.000 claims description 5
- 230000003287 optical effect Effects 0.000 claims 2
- 238000010586 diagram Methods 0.000 description 2
Landscapes
- Investigating Or Analysing Materials By Optical Means (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP11092289U JPH0351359U (fr) | 1989-09-25 | 1989-09-25 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP11092289U JPH0351359U (fr) | 1989-09-25 | 1989-09-25 |
Publications (1)
Publication Number | Publication Date |
---|---|
JPH0351359U true JPH0351359U (fr) | 1991-05-20 |
Family
ID=31659427
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP11092289U Pending JPH0351359U (fr) | 1989-09-25 | 1989-09-25 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPH0351359U (fr) |
Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS6383633A (ja) * | 1986-09-29 | 1988-04-14 | Hitachi Ltd | 微粒子測定装置 |
-
1989
- 1989-09-25 JP JP11092289U patent/JPH0351359U/ja active Pending
Patent Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS6383633A (ja) * | 1986-09-29 | 1988-04-14 | Hitachi Ltd | 微粒子測定装置 |