JPH0344680U - - Google Patents

Info

Publication number
JPH0344680U
JPH0344680U JP10487889U JP10487889U JPH0344680U JP H0344680 U JPH0344680 U JP H0344680U JP 10487889 U JP10487889 U JP 10487889U JP 10487889 U JP10487889 U JP 10487889U JP H0344680 U JPH0344680 U JP H0344680U
Authority
JP
Japan
Prior art keywords
chute
air supply
supply path
heats
transporting
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP10487889U
Other languages
English (en)
Japanese (ja)
Other versions
JPH0755504Y2 (ja
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP1989104878U priority Critical patent/JPH0755504Y2/ja
Publication of JPH0344680U publication Critical patent/JPH0344680U/ja
Application granted granted Critical
Publication of JPH0755504Y2 publication Critical patent/JPH0755504Y2/ja
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Landscapes

  • Testing Electric Properties And Detecting Electric Faults (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
JP1989104878U 1989-09-08 1989-09-08 Ｉｃデバイスのプリヒート装置 Expired - Lifetime JPH0755504Y2 (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP1989104878U JPH0755504Y2 (ja) 1989-09-08 1989-09-08 Ｉｃデバイスのプリヒート装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP1989104878U JPH0755504Y2 (ja) 1989-09-08 1989-09-08 Ｉｃデバイスのプリヒート装置

Publications (2)

Publication Number Publication Date
JPH0344680U true JPH0344680U (fr) 1991-04-25
JPH0755504Y2 JPH0755504Y2 (ja) 1995-12-20

Family

ID=31653657

Family Applications (1)

Application Number Title Priority Date Filing Date
JP1989104878U Expired - Lifetime JPH0755504Y2 (ja) 1989-09-08 1989-09-08 Ｉｃデバイスのプリヒート装置

Country Status (1)

Country Link
JP (1) JPH0755504Y2 (fr)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR101537325B1 (ko) * 2014-12-05 2015-07-16 엘아이지넥스원 주식회사 렌치 소켓

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6052031A (ja) * 1983-08-31 1985-03-23 Sharp Corp 半導体装置の高温テスト装置
JPS6244282U (fr) * 1985-09-04 1987-03-17

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6052031A (ja) * 1983-08-31 1985-03-23 Sharp Corp 半導体装置の高温テスト装置
JPS6244282U (fr) * 1985-09-04 1987-03-17

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR101537325B1 (ko) * 2014-12-05 2015-07-16 엘아이지넥스원 주식회사 렌치 소켓

Also Published As

Publication number Publication date
JPH0755504Y2 (ja) 1995-12-20

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