JPH0343735U - - Google Patents
Info
- Publication number
- JPH0343735U JPH0343735U JP10512889U JP10512889U JPH0343735U JP H0343735 U JPH0343735 U JP H0343735U JP 10512889 U JP10512889 U JP 10512889U JP 10512889 U JP10512889 U JP 10512889U JP H0343735 U JPH0343735 U JP H0343735U
- Authority
- JP
- Japan
- Prior art keywords
- lsi
- mode
- internal circuit
- test
- burn
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 230000002457 bidirectional effect Effects 0.000 claims description 2
- 230000010355 oscillation Effects 0.000 claims 1
- 238000010586 diagram Methods 0.000 description 2
Landscapes
- Tests Of Electronic Circuits (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP10512889U JPH0343735U (pt-PT) | 1989-09-06 | 1989-09-06 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP10512889U JPH0343735U (pt-PT) | 1989-09-06 | 1989-09-06 |
Publications (1)
Publication Number | Publication Date |
---|---|
JPH0343735U true JPH0343735U (pt-PT) | 1991-04-24 |
Family
ID=31653901
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP10512889U Pending JPH0343735U (pt-PT) | 1989-09-06 | 1989-09-06 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPH0343735U (pt-PT) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2008004778A (ja) * | 2006-06-22 | 2008-01-10 | Sharp Corp | 半導体装置、半導体装置の検査方法、プローブカード |
-
1989
- 1989-09-06 JP JP10512889U patent/JPH0343735U/ja active Pending
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2008004778A (ja) * | 2006-06-22 | 2008-01-10 | Sharp Corp | 半導体装置、半導体装置の検査方法、プローブカード |
JP4708269B2 (ja) * | 2006-06-22 | 2011-06-22 | シャープ株式会社 | 半導体装置、及び半導体装置の検査方法 |
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