JPH0342566U - - Google Patents
Info
- Publication number
- JPH0342566U JPH0342566U JP10307389U JP10307389U JPH0342566U JP H0342566 U JPH0342566 U JP H0342566U JP 10307389 U JP10307389 U JP 10307389U JP 10307389 U JP10307389 U JP 10307389U JP H0342566 U JPH0342566 U JP H0342566U
- Authority
- JP
- Japan
- Prior art keywords
- probe
- pellets
- measuring
- probe card
- support substrate
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 239000000523 sample Substances 0.000 claims description 10
- 239000000758 substrate Substances 0.000 claims description 2
- 239000008188 pellet Substances 0.000 claims 2
- 239000004065 semiconductor Substances 0.000 claims 2
- 238000005259 measurement Methods 0.000 description 2
- 239000012212 insulator Substances 0.000 description 1
Landscapes
- Testing Of Individual Semiconductor Devices (AREA)
- Measuring Leads Or Probes (AREA)
- Testing Electric Properties And Detecting Electric Faults (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP10307389U JPH0342566U (nl) | 1989-08-31 | 1989-08-31 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP10307389U JPH0342566U (nl) | 1989-08-31 | 1989-08-31 |
Publications (1)
Publication Number | Publication Date |
---|---|
JPH0342566U true JPH0342566U (nl) | 1991-04-22 |
Family
ID=31651936
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP10307389U Pending JPH0342566U (nl) | 1989-08-31 | 1989-08-31 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPH0342566U (nl) |
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1989
- 1989-08-31 JP JP10307389U patent/JPH0342566U/ja active Pending