JPH0342557A - Method for inspecting brazing appearance - Google Patents

Method for inspecting brazing appearance

Info

Publication number
JPH0342557A
JPH0342557A JP17877689A JP17877689A JPH0342557A JP H0342557 A JPH0342557 A JP H0342557A JP 17877689 A JP17877689 A JP 17877689A JP 17877689 A JP17877689 A JP 17877689A JP H0342557 A JPH0342557 A JP H0342557A
Authority
JP
Japan
Prior art keywords
brazing
brightness
inspection
darkness
parts
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP17877689A
Other languages
Japanese (ja)
Inventor
Kazuhiro Ikeda
和弘 池田
Naoko Sato
尚子 佐藤
Takahisa Baba
馬場 隆久
Kazuo Nagai
和雄 永井
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Oki Electric Industry Co Ltd
Original Assignee
Oki Electric Industry Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Oki Electric Industry Co Ltd filed Critical Oki Electric Industry Co Ltd
Priority to JP17877689A priority Critical patent/JPH0342557A/en
Publication of JPH0342557A publication Critical patent/JPH0342557A/en
Pending legal-status Critical Current

Links

Abstract

PURPOSE:To make decision with high sensitivity and to improve the reliability of the decision by comparing the respective brightness and darkness distributions obtd. by numerical processing of the bright parts or dark parts in an inspection area and deciding the normal/defective condition of brazing. CONSTITUTION:An inspecting apparatus 1 is constituted of an upper illumination 1 and lower illumination 3 which illuminate the inspection area 10 from directions of different angles, a television camera 4 which picks up the image of a material 20 to be inspected, an image processing section 5 which processes the signal of the input image thereof and computes the brightness and darkness distributions, and a decision control section 6 which switches the illumination of the illuminations 2, 3 and decides the normal/defective condition of brazing. The illuminations 2, 3 consist of light sources 7, photoirradiating parts 8, and light transmission parts 8 which connect the light sources 7 and the irradiating parts 8. The appearance inspection is executed by making the numerical processing of the bright parts or dark parts in the inspection area 10 set in the respective images to determine the brightness and darkness distributions, comparing the brightness and darkness distributions and deciding the normal/defective condition of brazing and, therefore, the accuracy of the decision is improved.

Description

【発明の詳細な説明】 〈産業上の利用分野〉 本発明は、半田や銀ろう等でろう付けした電子部品のろ
う付け部分を光学的手段によって検査するろう付け外観
検査方法に関する。
DETAILED DESCRIPTION OF THE INVENTION <Industrial Application Field> The present invention relates to a brazing appearance inspection method for inspecting a brazed part of an electronic component brazed with solder, silver solder, etc. by optical means.

〈従来の技術〉 従来のろう付け外観検査方法としては、特開昭61−2
93567号公報に開示された半田付け外観検査方法が
ある。
<Prior art> As a conventional brazing appearance inspection method, Japanese Patent Application Laid-Open No. 61-2
There is a soldering appearance inspection method disclosed in Japanese Patent No. 93567.

該半田付け外観検査方法は、第6図に示す検査装置30
で行う。
The soldering appearance inspection method uses an inspection apparatus 30 shown in FIG.
Do it with

該検査装置30には、被検査物2oの上方てかっドーム
状に配設した複数個のリンク状の照明手段:Il、32
.:13が設けられている。又被検査Th20の上方に
はテレビカメラ34か設けられている。該テレビカメラ
34には画像処理装置35が接続されている。
The inspection device 30 includes a plurality of link-shaped illumination means: Il, 32 arranged in a dome shape above the object to be inspected 2o.
.. :13 is provided. Further, a television camera 34 is provided above the inspection target Th20. An image processing device 35 is connected to the television camera 34.

又当該画像処理装置35には判定制御部36か接続され
ている。
A determination control section 36 is also connected to the image processing device 35.

検査を行うには、各段のリンク状の照明手段31.32
.3:lを順次点燈して被検査物20に照明を与える。
To carry out the inspection, link-shaped illumination means 31, 32 of each stage are used.
.. 3: Illuminates the inspected object 20 by sequentially turning on the lights.

そして、その都度得られる被検査物20の像をテレビカ
メラ34で撮影し、検査エリアの画像を画像処理装置3
5で処理する。
Then, the image of the object to be inspected 20 obtained each time is photographed by the television camera 34, and the image of the inspection area is captured by the image processing device 3.
Process in step 5.

次に被検査物20における各半田付け状態とともに画像
処理部で処理された検査画像を第7図に示す。
Next, FIG. 7 shows an inspection image processed by the image processing section along with each soldering state on the object 20 to be inspected.

被検査物20は、基板ll上に形成したパッド12にリ
ード14を半田15で接着した部分である。各半田付け
状態は、(イ)半田不足(ロ)良品(ハ)半田過剰で示
される。
The object to be inspected 20 is a portion in which a lead 14 is bonded with a solder 15 to a pad 12 formed on a substrate 11. Each soldering condition is indicated by (a) insufficient solder, (b) good product, and (c) excessive solder.

前記処理された検査画像は、明部(斜線部)と暗部(白
ヌキ部)とによって構成されている。又各検査エリアl
口の明部と暗部の分布は半田付け状態や各段によって異
なる。
The processed inspection image is composed of bright areas (hatched areas) and dark areas (white areas). Also, each inspection area
The distribution of bright and dark parts of the mouth differs depending on the soldering condition and each stage.

そして第8図に示す如く、検査エリア10をW、。Then, as shown in FIG. 8, the inspection area 10 is W.

W2.W:l毎に明部又は暗部の面積値を求める0次に
判定制御部36において、上記の如く求めた面積植と良
・不良を判定する基準面積値とを比較して、半田付けの
良・不良を判定する。
W2. The zero-order determination control unit 36, which calculates the area value of the bright or dark area for each W:l, compares the area printing obtained as described above with the standard area value for determining good/defective, and determines whether the soldering is good or not.・Determine defectiveness.

〈発明が解決しようとする課題〉 しかしなから従来の方法では、各分割したエリア内の明
部又は暗部の面積のみで判定する為に、微妙な形状の違
いを判別することか困難であり、十分な判別精度を確保
することが困難であった。
<Problems to be Solved by the Invention> However, in the conventional method, judgment is made only based on the area of bright or dark parts within each divided area, making it difficult to distinguish subtle differences in shape. It was difficult to ensure sufficient discrimination accuracy.

く課題を解決するための手段〉 本発明は、上記した課題を解決する為に威されたもので
、高精度なろう付け外観検査方法を提供することを目的
とする。
Means for Solving the Problems> The present invention was made to solve the above problems, and an object of the present invention is to provide a highly accurate brazing appearance inspection method.

即ち、被検査物に異なった複数の角度から照明を与え、
その都度得られる画像からろう付けの良否を総合的に判
定する方法において、前記各画像に設定した検査エリア
内の明部又は暗部を数値処理して明暗分布を求め、該各
明暗分布を比較してろう付けの良否を判定することを特
徴とする方法である。
In other words, illumination is applied to the object to be inspected from a plurality of different angles,
In the method of comprehensively determining the quality of brazing from the images obtained each time, the bright and dark areas within the inspection area set in each image are numerically processed to determine the brightness distribution, and the brightness and darkness distributions are compared. This method is characterized by determining the quality of soldering.

前記明暗分布を求める数値処理には、明部又は暗部を微
小区間に区分して積分する方法が採られる。又、前記検
査エリアを分割して設けた検査部毎に明暗分布を求めて
も好ましい。
In the numerical processing for determining the brightness distribution, a method is adopted in which bright areas or dark areas are divided into minute sections and integrated. It is also preferable to obtain the brightness and darkness distribution for each inspection section provided by dividing the inspection area.

〈作用〉 上記方法のろう付け外観検査は、各画像に設定した検査
エリア内の明部又は暗部を数値処理して明暗分布を求め
、該各明暗分布を比較してろう付けの良否を判定するの
で、判定精度か高まる。
<Operation> In the brazing appearance inspection of the above method, bright and dark areas within the inspection area set in each image are numerically processed to obtain a brightness distribution, and each brightness and darkness distribution is compared to determine the quality of the brazing. Therefore, the judgment accuracy increases.

〈実施例〉 本発明の実施例を図に基づいて説明する。<Example> Embodiments of the present invention will be described based on the drawings.

第1図は本発明を具体化したろう付け外観検査装置の構
成を示す。
FIG. 1 shows the configuration of a brazing appearance inspection apparatus embodying the present invention.

検査装置lは、検査エリアlOを角度の異なる方向から
照明する上部照明2及び下部照明3と、被検査物20を
撮像するテレビカメラ4と、該テレビカメラ4の人力画
像の信号を処理して明暗分布を演算する画像処理部5と
、各上部・下部照明2゜3の照明を切り換えるとともに
明暗分布を比較してろう付け(半田付け)の良否を判定
する判定制御部6とから構成されている。
The inspection device 1 includes an upper illumination 2 and a lower illumination 3 that illuminate the inspection area 1O from different angles, a television camera 4 that images the object to be inspected 20, and a signal of a human image from the television camera 4 that processes the signal. It is composed of an image processing unit 5 that calculates the brightness distribution, and a judgment control unit 6 that switches the illumination of each upper and lower illumination 2 and 3 and compares the brightness distribution to determine the quality of brazing (soldering). There is.

又前記上部照明2.下部照明3は、光源7と光照射部8
と、該光源7と該光照射部8とを接続した光伝送部9と
から或っている。
Also, the upper lighting 2. The lower illumination 3 includes a light source 7 and a light irradiation section 8
and a light transmission section 9 that connects the light source 7 and the light irradiation section 8.

前記被検査物20は、例えば基板11上に形成されたバ
ット12にICチップ13のリート14を半田15で接
着した部分及びその周辺である。
The object to be inspected 20 is, for example, a portion where a lead 14 of an IC chip 13 is bonded to a bat 12 formed on a substrate 11 with solder 15, and its surroundings.

上記した検査装置lを用いた第1実施例を第2図により
説明する。
A first embodiment using the above-mentioned inspection device 1 will be explained with reference to FIG.

第2図は、上段に様々な半田付け、(a)半田無し、(
b〉半田過少、(C)良品、(d)平温れの各状態の被
検査物20を示し、中段に上部照明2(第1図参照)で
被検査物20を照明した場合の入力画像v2と検査エリ
アlOの明暗分布D2とを示すとともに下段に下部照明
3(第1図参WA)て被検査物20を照明した場合の入
力画像V3と検査エリア10の明暗分布D3とを示す。
Figure 2 shows various types of soldering in the upper row, (a) no soldering, (
b> Input image showing the inspected object 20 in each state of insufficient solder, (C) non-defective product, and (d) normal temperature, with the inspected object 20 illuminated with the upper illumination 2 (see Fig. 1) in the middle row. v2 and the brightness/darkness distribution D2 of the inspection area IO, and the input image V3 and the brightness/darkness distribution D3 of the inspection area 10 when the inspected object 20 is illuminated with the lower illumination 3 (WA in FIG. 1) are shown in the lower row.

各入力画像V 2.V 3は、斜線部か明部を示し、白
ヌキ部が暗部を示す。
Each input image V2. V3 indicates a shaded area or a bright area, and a white blank area indicates a dark area.

入力画像v2は、半田15か成る傾斜角になる部分と、
リート14の端部の一部分と、バッド12の端部の−・
部分とか明部になる。
The input image v2 includes a portion having an inclined angle made of solder 15,
A part of the end of the lead 14 and the end of the bad 12.
Some parts become bright.

入力画像V3は、上部照明で照明されて明部になる半田
15の傾斜角より急な成る傾斜角を有する半田15の部
分と、リード14の端部の一部分と、バッド12の端部
の−・部分とが明部になる。
The input image V3 includes a portion of the solder 15 that has a slope angle steeper than the slope angle of the solder 15 that becomes a bright portion when illuminated by the upper illumination, a portion of the end of the lead 14, and the − of the end of the pad 12.・The part becomes the bright part.

又明暗分布D 2 、 D 3の夫々は、画像処理部5
で演算されて、各入力画像V 2 、 V 3の明部(
暗部)を微小区間ΔXでy軸方向に積分したピーク値P
のX軸方向分布で表わされる。
Further, each of the brightness and darkness distributions D 2 and D 3 is calculated by the image processing unit 5
The bright areas (
The peak value P obtained by integrating the dark area) in the y-axis direction over a minute interval ΔX
It is expressed by the distribution in the X-axis direction.

各明暗分布D 2.D 3は、半田15の傾斜が成る一
定の角度になる位置で高いピークを生じる。又リート1
4の端部及びバッド12の端部では低いピークを生しる
Each brightness distribution D2. D3 produces a high peak at a position where the slope of the solder 15 forms a certain angle. Mata REIT 1
4 and the ends of pad 12 produce low peaks.

そして判定制御部6で各明暗分’/li D 2 、D
 3から所定値以上の高さを有するピークを抽出して、
ピークの有無やピークの位置関係から半田付けの良否を
判定する。
Then, the determination control unit 6 calculates each brightness/darkness '/li D 2 , D
3, extract a peak having a height greater than a predetermined value,
The quality of soldering is determined based on the presence or absence of peaks and the positional relationship of the peaks.

判定は、基準位置Sから各ピークまでの夫々の判定距離
L 2 、 L sを求めて比較し、以下の様にして半
田付けの良否を分類する。
For the determination, the respective determination distances L 2 and L s from the reference position S to each peak are determined and compared, and the quality of the soldering is classified as follows.

a)ピーク無し→rl[]]無し」 b)L2 <L3→「不濡れ」 c)L2 >L3→「半田過少」及び「良品」又「良品
」と「半田過少」との区別は、明暗分!1D2のピーク
と明暗分布D:lのピークとの間隔により判定し、該間
隔か所定値以下の場合には「半田過少」になる。
a) No peak → No rl []] b) L2 < L3 → “Not wetted” c) L2 > L3 → “Insufficient solder” and “Good product” or “Good product” and “Insufficient solder” can be distinguished by light and darkness. Minute! The determination is made based on the interval between the peak of 1D2 and the peak of the brightness/darkness distribution D:l, and if the interval is less than a predetermined value, "insufficient solder" occurs.

第3図は、パット12とリート14とを接着する半田1
5か部分的に過少になっている「部分的半田過少」を示
す。
Figure 3 shows the solder 1 used to bond the pad 12 and the lead 14.
5 indicates "partial undersolder" where the solder is partially undersold.

この様な「部分的半田過少」の状態を確実に判定する第
2実施例を第4図及び第5図により説明する。
A second embodiment for reliably determining such a state of "partial undersolder" will be described with reference to FIGS. 4 and 5.

第2実施例は第1実施例と同様に、前記検査装置1(第
1図参照)を用いて検査を行う。
In the second embodiment, similarly to the first embodiment, inspection is performed using the inspection apparatus 1 (see FIG. 1).

又検査エリアlOは、第4図に示す如くy軸方向に等分
した複数個の検査部A + 、 A 2 、 A :+
に分割されている。
In addition, the inspection area IO is divided into a plurality of inspection areas A + , A 2 , A :+ equally divided in the y-axis direction as shown in FIG.
It is divided into.

第5図は、上段に様々な半田付け、(a)半田無し、(
b)部分的半田過少、(C)良品。
Figure 5 shows various types of soldering in the upper row, (a) no soldering, (
b) Partially undersoldered, (C) Good product.

(d)不濡れの各状態の被検査物20を示し、中段に上
部照明(第1図参照)で被検査¥IIJ20を照明した
場合の入力画像V2と各検査部A、、A、、A3の明暗
分布D21 +  2□、D23とを示す。又下段に下
り 部照明(第1図参照)で被検査物20を照明した場合の
入力画像V3と各検査部A i 、 A 2 、 A 
3の明暗分布D!!103□、D33とを示す。
(d) Input image V2 and each inspection part A, , A, , A3 when the inspected object 20 is shown in each state of non-wetting, and the inspected object ¥IIJ20 is illuminated with upper illumination (see Fig. 1) in the middle stage. The brightness and darkness distributions D21 + 2□ and D23 are shown. In addition, the input image V3 and each inspection section A i , A 2 , A when the inspection object 20 is illuminated with descending section illumination (see Fig. 1) are shown in the lower stage.
3 brightness distribution D! ! 103□ and D33 are shown.

各入力画像V2.v:Iは、斜線部か明部を示し、白ヌ
キ部が暗部を示す。
Each input image V2. v:I indicates a shaded area or a bright area, and a white area indicates a dark area.

入力画像v2では、半田15が成る傾斜角になる部分と
り−ト14の端部の一部分とバッド12の端部の一部分
とが明部になる。
In the input image v2, a portion of the edge of the partial slot 14 and a portion of the edge of the pad 12 that correspond to the inclination angle of the solder 15 are bright portions.

入力画像V3では、前記上部照明で照明されて明部にな
る傾斜角より急な傾斜角を有する半田15の部分と、リ
ード14の端部の一部分とバッド12の端部の一部分と
が明部になる。
In the input image V3, a portion of the solder 15 having a slope angle steeper than the slope angle that becomes a bright portion when illuminated by the upper illumination, a portion of the end of the lead 14, and a portion of the end of the pad 12 are bright portions. become.

各明暗分布D21. D221 D23及び各明暗分布
り、、、D、□IDff2の夫々は、画像処理部5で演
算されて、各検査部A r 、 A 2 、 A :l
の明部(暗部)を微小区間ΔXでy軸方向に積分したピ
ーク値PのX軸方向分布で表わされる。
Each brightness distribution D21. D221 D23 and each brightness/dark distribution, , D, □IDff2 are calculated by the image processing unit 5, and each inspection unit A r , A 2 , A :l
It is expressed by the distribution in the X-axis direction of the peak value P obtained by integrating the bright part (dark part) in the y-axis direction over a minute interval ΔX.

各明暗分布D21乃至D23及びDl乃至D33は、半
田15の傾斜が成る一定の角度になる位置で高いピーク
を生しる。又リード14の端部及びバッド12の端部で
は低いピークを生しる。そして、判定制御部6で所定値
以上の高さを有するピークを抽出して、ピークの有無や
ピークの位置関係から半田付けの良否を判定する。
Each of the brightness and darkness distributions D21 to D23 and D1 to D33 has a high peak at a position where the slope of the solder 15 is a certain angle. Further, low peaks occur at the ends of the leads 14 and the ends of the pads 12. Then, the determination control unit 6 extracts peaks having a height equal to or higher than a predetermined value, and determines whether the soldering is good or bad based on the presence or absence of the peaks and the positional relationship of the peaks.

判定は、各検査部A 1. A 2 、 A :lにお
いて、基準位置Sから各ピーク迄の各判定圧fll L
 2 + 、 L 2□。
Judgment is made by each inspection department A1. At A2, A:l, each judgment pressure fll L from the reference position S to each peak
2 +, L 2□.

L23及び各判定距離L31+ L(+21 L3:l
を求めて比較し、以下の様にして半田付けの良否を分類
する。
L23 and each judgment distance L31+L(+21 L3:l
are determined and compared, and the quality of the soldering is classified as follows.

d)ピーク無し→「半田無し」 e )L21< L:11.L22< L:+2.L2
3< L:l:l−「不濡れ」 f ) L21>L:Il、 L22> L:12. 
L2:+>1.:+3→「半田過少」及び良品 又「良品」と半田過少」との区別は、明暗分布D21乃
至D23の夫々のピークと明暗分布D3.乃至D33の
夫々のピークとの間熱により判定し、該間隔が所定値以
下の場合には「半田過少」になる。
d) No peak → "No solder" e) L21<L:11. L22<L:+2. L2
3<L:l:l-"non-wetting" f) L21>L:Il, L22>L:12.
L2:+>1. : +3 → "Insufficient solder" and "defective product" or "defective product" and "insufficient solder" are distinguished by the peaks of each of the brightness distributions D21 to D23 and the brightness distribution D3. It is determined based on the heat between the peaks of D33 and D33, and if the interval is less than a predetermined value, "insufficient solder" occurs.

よって、各検査部A I、 A 2 、 A :lのう
ちの何れか1ケ所又2ケ所の検査部で「半田過少」に判
定されたときには、「部分的半田過少」になる。又全検
査部A1乃至A3で「良品」に判定されたときには、検
査エリアlOの半田付け状態は「良品」(なる。
Therefore, when any one or two of the inspection sections A I, A 2 , A:l determines that there is "insufficient solder", it becomes "partial insufficient solder". Further, when all the inspection sections A1 to A3 determine that the product is "good", the soldering state in the inspection area IO is "good".

尚、上記検査方法ては上部照明2及び下部照明3の2台
を用いたが、3台以上に増設することにより、高精度な
検査を行うことかできる。
Although the above inspection method uses two units, the upper illumination 2 and the lower illumination 3, highly accurate inspection can be performed by increasing the number of units to three or more.

又実施例では半田付け外観検査を例に説明したか、銀ろ
う等のろう材を用いたろう付け外観検査にも同様にして
用いることができる。
Furthermore, in the embodiment, the soldering appearance inspection has been explained as an example, but the present invention can be similarly used for brazing appearance inspection using a brazing material such as silver solder.

〈発明の効果〉 以上説明した様に、本発明によれば、各画像のろう付け
部に設定した検査エリア内の明暗分布を比較してろう付
けの良否を判定するので、判定を高精度に行うことがで
き、判定の信頼性が向上てきる。
<Effects of the Invention> As explained above, according to the present invention, the quality of brazing is determined by comparing the brightness distribution within the inspection area set for the brazed portion of each image, so the determination can be made with high precision. The reliability of the judgment can be improved.

【図面の簡単な説明】[Brief explanation of drawings]

第1図は1本発明を具体化した検査装置の構成図、 第2図は、各半田付′け状態における入力画像及び明暗
分布の説明図、 第3図は、部分的半田過少の説明図、 第4図は、検査部の説明図、 第5図は、各半田付け状態における入力画像及び明暗分
布の説明図、 第6図は、従来の検査装置の構成図、 第7図は、半田付け状態と検査画像の説明図、 第8図は、検査エリアの説明図である。 l・・・検査装置、  2・・・上部照明。 3・・・下部照明、   4・・・テレビカメラ。 5・・・画像処理部、 6・・・判定制御部。 7・・・光源、    8・・・光照射部。 9・・・光伝送部、   10・・・検査エリア。 11・・・基板、      12・・・バット。 13・・・ICチップ、14・・・リート。 15・・・半田、20・・・被検査物。 A、乃至A3・・・検査部。 D 21D :lID 21乃至 D23. D3.乃至D33・・・明暗分布。 L2.L3・L21乃至 L2:1.L31乃至Li2・・・判定距離。 S・・・基準位置、  V2.V、・・・入力画像。
Fig. 1 is a configuration diagram of an inspection device embodying the present invention; Fig. 2 is an explanatory diagram of the input image and brightness distribution in each soldering state; Fig. 3 is an explanatory diagram of partial under-soldering. , Fig. 4 is an explanatory diagram of the inspection section, Fig. 5 is an explanatory diagram of the input image and brightness distribution in each soldering state, Fig. 6 is a configuration diagram of a conventional inspection device, and Fig. 7 is an explanatory diagram of the soldering FIG. 8 is an explanatory diagram of the attachment state and inspection image. FIG. 8 is an explanatory diagram of the inspection area. l...Inspection device, 2...Upper illumination. 3... Lower lighting, 4... TV camera. 5... Image processing unit, 6... Judgment control unit. 7... Light source, 8... Light irradiation section. 9... Optical transmission section, 10... Inspection area. 11... Board, 12... Bat. 13...IC chip, 14...LEET. 15...Solder, 20...Object to be inspected. A to A3... Inspection department. D 21D: lID 21 to D23. D3. to D33... Light/dark distribution. L2. L3/L21 to L2:1. L31 to Li2...judgment distance. S...Reference position, V2. V,...input image.

Claims (1)

【特許請求の範囲】 (1)被検査物に異なった複数の角度から照明を与え、
その都度得られる画像からろう付けの良否を総合的に判
定する方法において、 前記各画像に設定した検査エリア内の明部又は暗部を数
値処理して明暗分布を求め、該各明暗分布を比較してろ
う付けの良否を判定することを特徴とするろう付け外観
検査方法。(2)前記各画像の明部又は暗部を微小区間
に区分して積分し、微小区間に区分した方向に明暗分布
を求めて比較することにより、ろう付けの良否を判定す
ることを特徴とする請求項1記載のろう付け外観検査方
法。 (3)前記各画像の検査エリアを分割して複数個の検査
部を設け、該分割した各検査部の明部又は暗部を微小区
間に区分して積分し、微小区間に区分した方向に明暗分
布を求めて各検査部毎に比較することにより、ろう付け
の良否を判定することを特徴とする請求項1記載のろう
付け外観検査方法。
[Claims] (1) Applying illumination to the object to be inspected from a plurality of different angles,
In the method of comprehensively determining the quality of brazing from the images obtained each time, the bright and dark areas in the inspection area set in each image are numerically processed to obtain the brightness distribution, and the brightness and darkness distributions are compared. A brazing appearance inspection method characterized by determining the quality of brazing. (2) The quality of the brazing is determined by dividing the bright part or the dark part of each image into minute sections, integrating them, finding the brightness distribution in the direction of the minute sections, and comparing them. The brazing appearance inspection method according to claim 1. (3) The inspection area of each image is divided into multiple inspection areas, and the bright or dark areas of each divided inspection area are divided into minute sections and integrated, and the brightness and darkness are adjusted in the direction of the minute sections. 2. The brazing appearance inspection method according to claim 1, wherein the quality of the brazing is determined by determining the distribution and comparing it for each inspected portion.
JP17877689A 1989-07-10 1989-07-10 Method for inspecting brazing appearance Pending JPH0342557A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP17877689A JPH0342557A (en) 1989-07-10 1989-07-10 Method for inspecting brazing appearance

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP17877689A JPH0342557A (en) 1989-07-10 1989-07-10 Method for inspecting brazing appearance

Publications (1)

Publication Number Publication Date
JPH0342557A true JPH0342557A (en) 1991-02-22

Family

ID=16054430

Family Applications (1)

Application Number Title Priority Date Filing Date
JP17877689A Pending JPH0342557A (en) 1989-07-10 1989-07-10 Method for inspecting brazing appearance

Country Status (1)

Country Link
JP (1) JPH0342557A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US8180490B2 (en) * 2007-01-05 2012-05-15 Objectvideo, Inc. Video-based sensing for daylighting controls

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US8180490B2 (en) * 2007-01-05 2012-05-15 Objectvideo, Inc. Video-based sensing for daylighting controls

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