JPH0340749U - - Google Patents
Info
- Publication number
- JPH0340749U JPH0340749U JP10248389U JP10248389U JPH0340749U JP H0340749 U JPH0340749 U JP H0340749U JP 10248389 U JP10248389 U JP 10248389U JP 10248389 U JP10248389 U JP 10248389U JP H0340749 U JPH0340749 U JP H0340749U
- Authority
- JP
- Japan
- Prior art keywords
- frequency
- skimmer
- mass spectrometer
- plasma
- frequency induction
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 230000006698 induction Effects 0.000 claims description 4
- 238000009616 inductively coupled plasma Methods 0.000 claims description 3
- VYZAMTAEIAYCRO-UHFFFAOYSA-N Chromium Chemical compound [Cr] VYZAMTAEIAYCRO-UHFFFAOYSA-N 0.000 claims description 2
- 238000007747 plating Methods 0.000 claims description 2
- 150000002500 ions Chemical class 0.000 claims 2
- XKRFYHLGVUSROY-UHFFFAOYSA-N Argon Chemical compound [Ar] XKRFYHLGVUSROY-UHFFFAOYSA-N 0.000 description 2
- 229910052786 argon Inorganic materials 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 239000007789 gas Substances 0.000 description 1
- 239000012212 insulator Substances 0.000 description 1
Landscapes
- Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
- Electron Tubes For Measurement (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP10248389U JPH0638372Y2 (ja) | 1989-08-31 | 1989-08-31 | 高周波誘導結合プラズマ質量分析装置 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP10248389U JPH0638372Y2 (ja) | 1989-08-31 | 1989-08-31 | 高周波誘導結合プラズマ質量分析装置 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPH0340749U true JPH0340749U (OSRAM) | 1991-04-18 |
| JPH0638372Y2 JPH0638372Y2 (ja) | 1994-10-05 |
Family
ID=31651378
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP10248389U Expired - Lifetime JPH0638372Y2 (ja) | 1989-08-31 | 1989-08-31 | 高周波誘導結合プラズマ質量分析装置 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH0638372Y2 (OSRAM) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| KR200469616Y1 (ko) * | 2012-05-09 | 2013-10-25 | 이혁 | 롤 테이프 커터기의 테이프 휠 및 이를 적용한 롤 테이프 커터기 |
-
1989
- 1989-08-31 JP JP10248389U patent/JPH0638372Y2/ja not_active Expired - Lifetime
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| KR200469616Y1 (ko) * | 2012-05-09 | 2013-10-25 | 이혁 | 롤 테이프 커터기의 테이프 휠 및 이를 적용한 롤 테이프 커터기 |
Also Published As
| Publication number | Publication date |
|---|---|
| JPH0638372Y2 (ja) | 1994-10-05 |
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