JPH033760U - - Google Patents
Info
- Publication number
- JPH033760U JPH033760U JP6481389U JP6481389U JPH033760U JP H033760 U JPH033760 U JP H033760U JP 6481389 U JP6481389 U JP 6481389U JP 6481389 U JP6481389 U JP 6481389U JP H033760 U JPH033760 U JP H033760U
- Authority
- JP
- Japan
- Prior art keywords
- optical semiconductor
- semiconductor device
- phototransistor
- measuring
- measuring device
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 230000003287 optical effect Effects 0.000 claims 3
- 239000004065 semiconductor Substances 0.000 claims 3
- 230000008878 coupling Effects 0.000 claims 1
- 238000010168 coupling process Methods 0.000 claims 1
- 238000005859 coupling reaction Methods 0.000 claims 1
- 238000010586 diagram Methods 0.000 description 2
Landscapes
- Testing Of Optical Devices Or Fibers (AREA)
Description
第１図は本考案の実施例に係るフオトカプラの
測定装置を示す回路図、第２図は従来のフオトカ
プラの測定装置を示す回路図である。
１……定電流源、２……ＣＰＵ、３……フオト
カプラ、４……発光ダイオード、５……フオトト
ランジスタ、６……トランジスタ、７……電流検
出器、８……定電圧源、１１……抵抗、１２……
リレースイツチ。
FIG. 1 is a circuit diagram showing a photocoupler measuring device according to an embodiment of the present invention, and FIG. 2 is a circuit diagram showing a conventional photocoupler measuring device. DESCRIPTION OF SYMBOLS 1... Constant current source, 2... CPU, 3... Photocoupler, 4... Light emitting diode, 5... Photo transistor, 6... Transistor, 7... Current detector, 8... Constant voltage source, 11... ...Resistance, 12...
Relay switch.
Claims (1)
合してなる光半導体素子の電流伝達率を測定する
光半導体素子の測定装置において、前記フオトト
ランジスタのベースと接地との間に抵抗とスイツ
チの直列回路を接続したことを特徴とする光半導
体素子の測定装置。 In an optical semiconductor device measuring device for measuring the current transfer rate of an optical semiconductor device formed by optically coupling a light emitting diode and a phototransistor, a series circuit of a resistor and a switch is connected between the base of the phototransistor and ground. A measuring device for an optical semiconductor device, characterized in that:
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP6481389U JPH033760U (en) | 1989-06-02 | 1989-06-02 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP6481389U JPH033760U (en) | 1989-06-02 | 1989-06-02 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPH033760U true JPH033760U (en) | 1991-01-16 |
Family
ID=31596090
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP6481389U Pending JPH033760U (en) | 1989-06-02 | 1989-06-02 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH033760U (en) |
-
1989
- 1989-06-02 JP JP6481389U patent/JPH033760U/ja active Pending