JPH03280560A - Semiconductor device - Google Patents

Semiconductor device

Info

Publication number
JPH03280560A
JPH03280560A JP8216890A JP8216890A JPH03280560A JP H03280560 A JPH03280560 A JP H03280560A JP 8216890 A JP8216890 A JP 8216890A JP 8216890 A JP8216890 A JP 8216890A JP H03280560 A JPH03280560 A JP H03280560A
Authority
JP
Japan
Prior art keywords
chip
lead
resin
heat dissipating
heat
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP8216890A
Other languages
Japanese (ja)
Inventor
Ichiro Tsuchikane
土金 一郎
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NEC IC Microcomputer Systems Co Ltd
Original Assignee
NEC IC Microcomputer Systems Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by NEC IC Microcomputer Systems Co Ltd filed Critical NEC IC Microcomputer Systems Co Ltd
Priority to JP8216890A priority Critical patent/JPH03280560A/en
Publication of JPH03280560A publication Critical patent/JPH03280560A/en
Pending legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/42Wire connectors; Manufacturing methods related thereto
    • H01L2224/47Structure, shape, material or disposition of the wire connectors after the connecting process
    • H01L2224/48Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
    • H01L2224/4805Shape
    • H01L2224/4809Loop shape
    • H01L2224/48091Arched
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/42Wire connectors; Manufacturing methods related thereto
    • H01L2224/47Structure, shape, material or disposition of the wire connectors after the connecting process
    • H01L2224/48Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
    • H01L2224/481Disposition
    • H01L2224/48151Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive
    • H01L2224/48221Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked
    • H01L2224/48245Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being metallic
    • H01L2224/48247Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being metallic connecting the wire to a bond pad of the item
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/42Wire connectors; Manufacturing methods related thereto
    • H01L2224/47Structure, shape, material or disposition of the wire connectors after the connecting process
    • H01L2224/49Structure, shape, material or disposition of the wire connectors after the connecting process of a plurality of wire connectors
    • H01L2224/491Disposition
    • H01L2224/4912Layout
    • H01L2224/49171Fan-out arrangements
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/15Details of package parts other than the semiconductor or other solid state devices to be connected
    • H01L2924/181Encapsulation
    • H01L2924/1815Shape

Landscapes

  • Cooling Or The Like Of Semiconductors Or Solid State Devices (AREA)

Abstract

PURPOSE:To increase the durability of resin, and reduce the external dimension of a heat dissipating plate, as compared with the structure wherein the plate is separately installed, by integrally proving a heat dissipating part wherein leads stretch toward an IC chip in a resin part, and dissipate the heat of the IC chip in the noncontact state. CONSTITUTION:Each lead 2 connected with each bonding pad 6 of an IC chip 1 stretches as far as the lower surface of an IC chip mounting part 5 on which the IC chip 1 is mounted, and forms a heat dissipating part 2a in a unified body which part 2a is arranged so as to be adjacent to and in parallel with the lower surface of the mounting part 5. On the base part side of the heat dissipating part 2a, each of the leads 2 is electrically connected with a bonding pad 6 of the IC pad 1 via a bonding wire 4, and the heat dissipating part 2a is built in a resin part 3 so as to keep the noncontact state with the IC chip 1. The other end of each lead 2 is led out from the resin part 3 outwardly. Hence the heat radiated by the IC chip 1 is received by the heat dissipating part 2a of the lead 2, and dissipated outside the resin part 3 through the lead 2 of high thermal conductivity.

Description

【発明の詳細な説明】 〔産業上の利用分野〕 本発明は半導体装置に関し、特に発熱する半導体装置に
関する。
DETAILED DESCRIPTION OF THE INVENTION [Field of Industrial Application] The present invention relates to a semiconductor device, and particularly to a semiconductor device that generates heat.

〔従来の技術〕[Conventional technology]

般に半導体装置はプリント基板などに取付けられ、電気
回路を構成するように使われる。
Semiconductor devices are generally attached to printed circuit boards and used to form electrical circuits.

従来の半導体装置は第2図(a) 、 (b)に示すよ
うに、ICチップ搭載部5に搭載されたICチップ1の
ポンディングパッド6とリード2とがボンディングワイ
ヤ4を介して電気的に接続され、ICチップ1及びIC
チッグlとリード2との電気的接続箇所か樹脂部3にて
気密封止されている。
In the conventional semiconductor device, as shown in FIGS. 2(a) and 2(b), the bonding pads 6 of the IC chip 1 mounted on the IC chip mounting part 5 and the leads 2 are electrically connected via the bonding wires 4. connected to IC chip 1 and IC
The electrical connection point between the tip 1 and the lead 2 is hermetically sealed with a resin part 3.

この種の半導体装置では、ICチップ1の熱を樹脂部3
の外部に放熱するために、ICチップ搭載部5の下面に
熱伝導率の高い樹脂を付着してこの樹脂を通して放熱を
行うか、又は第3図に示すようにICチップ搭載部5に
放熱板7を設けた構造のものが一般的である。
In this type of semiconductor device, the heat of the IC chip 1 is transferred to the resin part 3.
In order to radiate heat to the outside, a resin with high thermal conductivity is attached to the bottom surface of the IC chip mounting part 5 and the heat is radiated through this resin, or a heat sink is attached to the IC chip mounting part 5 as shown in FIG. 7 is common.

〔発明が解決しようとする課題〕[Problem to be solved by the invention]

しかしながら、熱伝導率の高い樹脂を介して放熱を行う
場合には、樹脂の強度が熱により低下してしまい、寿命
が短縮されてしまうという欠点があった。
However, when heat is dissipated through a resin with high thermal conductivity, the strength of the resin decreases due to heat, resulting in a shortened lifespan.

また、第3図に示す構造のものでは、放熱板7が必要と
なるため、外形寸法が大型化されてしまい、小型化する
上での支障を来たすという欠点があった。
Furthermore, the structure shown in FIG. 3 requires a heat sink 7, which increases the external dimensions, which poses a problem in downsizing.

本発明の目的は、前記課題を解決した半導体装置を提供
することにある。
An object of the present invention is to provide a semiconductor device that solves the above problems.

〔課題を解決するための手段〕[Means to solve the problem]

前記目的を達成するため、本発明に係る半導体装置にお
いては、ICチップと、リードと、樹脂部とを有する半
導体装置であって、 前記ICチップは、ICチップ搭載部に搭載されるもの
であり、 前記リードは、前記ICチップのボンディングパッドに
ボンディングワイヤを介して電気的に接続されるもので
あり、 前記樹脂部は、ICチップ及びICチップとリードとの
電気的な接続箇所を気密封止するものであり、 さらに、前記リードは、樹脂部内のICチップに向けて
延在し、非接触状態でICチップの放熱を行う放熱部を
一体に有するものである。
In order to achieve the above object, a semiconductor device according to the present invention includes an IC chip, a lead, and a resin part, wherein the IC chip is mounted on an IC chip mounting part. , the lead is electrically connected to a bonding pad of the IC chip via a bonding wire, and the resin part hermetically seals the IC chip and the electrical connection point between the IC chip and the lead. Furthermore, the lead integrally has a heat dissipation part that extends toward the IC chip within the resin part and dissipates heat from the IC chip in a non-contact state.

〔実施例〕〔Example〕

以下、本発明の一実施例を図により説明する。 Hereinafter, one embodiment of the present invention will be described with reference to the drawings.

第1図(a)は本発明の一実施例を示す平面図、第1図
[b)は第1図(a)のA−A’線断面図である。
FIG. 1(a) is a plan view showing an embodiment of the present invention, and FIG. 1(b) is a sectional view taken along the line AA' in FIG. 1(a).

図において、本発明は、樹脂部3内のICチップ1が放
出する熱を、熱伝導率の高いリード2を利用して外部に
放熱することを意図したものである。
In the figure, the present invention is intended to radiate heat emitted by an IC chip 1 within a resin portion 3 to the outside by using a lead 2 having high thermal conductivity.

すなわち、ICチップ1の各ポンディングパッド6にそ
れぞれ接続される各リード2は、ICチップlが搭載さ
れたICチップ搭載部5の下面まで延在し、かつその下
面に隣接して平行に配設された放熱部2aを一体に形成
したものである。各リード2は、放熱部2aの基部側で
ICチップ1のポンディングパッド6とボンディングワ
イヤ4を介して電気的に接続され、その放熱部2aは樹
脂部3内にICチップ1と非接触状態に内装される。ま
た、各リード2の他端は樹脂部3より外部に引圧されて
いる。
That is, each lead 2 connected to each bonding pad 6 of the IC chip 1 extends to the lower surface of the IC chip mounting portion 5 on which the IC chip 1 is mounted, and is arranged adjacent to and parallel to the lower surface. The provided heat dissipation section 2a is integrally formed. Each lead 2 is electrically connected to the bonding pad 6 of the IC chip 1 via the bonding wire 4 on the base side of the heat dissipation part 2a, and the heat dissipation part 2a is in a non-contact state with the IC chip 1 within the resin part 3. will be decorated. Further, the other end of each lead 2 is pulled outward from the resin portion 3.

したがって、ICチップ1が放出する熱は、リード2の
放熱部2aにて受熱され、熱伝導率の高いリード2を通
して樹脂部3の外部に放出される。
Therefore, the heat emitted by the IC chip 1 is received by the heat radiation part 2a of the lead 2, and is released to the outside of the resin part 3 through the lead 2 having high thermal conductivity.

〔発明の効果〕〔Effect of the invention〕

以上説明したように、本発明はICチップからの熱を熱
伝導率の高いリードを介して放出するため、樹脂の耐久
性を高めることができる。また、既存のリードを利用し
て放熱を行うため、放熱板を別途装備する構造に比して
その外形寸法を小型化できるという効果を有する。
As explained above, since the present invention releases heat from an IC chip through the leads having high thermal conductivity, it is possible to improve the durability of the resin. Furthermore, since heat is radiated using existing leads, the external dimensions can be reduced in size compared to a structure in which a heat sink is separately provided.

【図面の簡単な説明】[Brief explanation of drawings]

第1図(a)は本発明の一実施例を示す平面図、第1図
(b)は第1図(a)のA−A’線断面図、第2図(a
)は従来例を示す平面図、第2図(b)は第2図(a)
のB−B′線断面図、第3図は放熱板を装備した従来例
を示す断面図である。 1・・・ICチップ    2・・・リード2a・・・
放熱部     3・・・樹脂部4・・・ボンデインク
ワイヤ 5・・・ICチップ搭載部
FIG. 1(a) is a plan view showing one embodiment of the present invention, FIG. 1(b) is a sectional view taken along the line AA' in FIG. 1(a), and FIG.
) is a plan view showing the conventional example, and Fig. 2(b) is Fig. 2(a).
FIG. 3 is a sectional view showing a conventional example equipped with a heat sink. 1...IC chip 2...Lead 2a...
Heat radiation part 3...Resin part 4...Bonde ink wire 5...IC chip mounting part

Claims (1)

【特許請求の範囲】[Claims] (1)ICチップと、リードと、樹脂部とを有する半導
体装置であって、 前記ICチップは、ICチップ搭載部に搭載されるもの
であり、 前記リードは、前記ICチップのボンディングパッドに
ボンディングワイヤを介して電気的に接続されるもので
あり、 前記樹脂部は、ICチップ及びICチップとリードとの
電気的な接続箇所を気密封止するものであり、 さらに、前記リードは、樹脂部内のICチップに向けて
延在し、非接触状態でICチップの放熱を行う放熱部を
一体に有することを特徴とする半導体装置。
(1) A semiconductor device having an IC chip, a lead, and a resin part, wherein the IC chip is mounted on an IC chip mounting part, and the lead is bonded to a bonding pad of the IC chip. electrically connected via a wire; the resin part hermetically seals the IC chip and the electrical connection points between the IC chip and the leads; What is claimed is: 1. A semiconductor device characterized by integrally having a heat dissipation part that extends toward an IC chip and dissipates heat from the IC chip in a non-contact state.
JP8216890A 1990-03-29 1990-03-29 Semiconductor device Pending JPH03280560A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP8216890A JPH03280560A (en) 1990-03-29 1990-03-29 Semiconductor device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP8216890A JPH03280560A (en) 1990-03-29 1990-03-29 Semiconductor device

Publications (1)

Publication Number Publication Date
JPH03280560A true JPH03280560A (en) 1991-12-11

Family

ID=13766903

Family Applications (1)

Application Number Title Priority Date Filing Date
JP8216890A Pending JPH03280560A (en) 1990-03-29 1990-03-29 Semiconductor device

Country Status (1)

Country Link
JP (1) JPH03280560A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5753977A (en) * 1996-03-22 1998-05-19 Mitsubishi Denki Kabushiki Kaisha Semiconductor device and lead frame therefor

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5753977A (en) * 1996-03-22 1998-05-19 Mitsubishi Denki Kabushiki Kaisha Semiconductor device and lead frame therefor

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