JPH0325845A - Conditioning device of charged particle beam accelerating tube - Google Patents

Conditioning device of charged particle beam accelerating tube

Info

Publication number
JPH0325845A
JPH0325845A JP1159090A JP15909089A JPH0325845A JP H0325845 A JPH0325845 A JP H0325845A JP 1159090 A JP1159090 A JP 1159090A JP 15909089 A JP15909089 A JP 15909089A JP H0325845 A JPH0325845 A JP H0325845A
Authority
JP
Japan
Prior art keywords
conditioning
electrodes
electrode
charged particle
particle beam
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP1159090A
Other languages
Japanese (ja)
Inventor
Haruo Kasahara
春生 笠原
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Jeol Ltd
Original Assignee
Jeol Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Jeol Ltd filed Critical Jeol Ltd
Priority to JP1159090A priority Critical patent/JPH0325845A/en
Publication of JPH0325845A publication Critical patent/JPH0325845A/en
Pending legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/02Details
    • H01J37/04Arrangements of electrodes and associated parts for generating or controlling the discharge, e.g. electron-optical arrangement or ion-optical arrangement
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/30Electron-beam or ion-beam tubes for localised treatment of objects
    • H01J37/3002Details
    • H01J37/3007Electron or ion-optical systems
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J2237/00Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging
    • H01J2237/02Details
    • H01J2237/0203Protection arrangements
    • H01J2237/0206Extinguishing, preventing or controlling unwanted discharges
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J2237/00Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging
    • H01J2237/04Means for controlling the discharge
    • H01J2237/047Changing particle velocity
    • H01J2237/0473Changing particle velocity accelerating
    • H01J2237/04735Changing particle velocity accelerating with electrostatic means
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J2237/00Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging
    • H01J2237/30Electron or ion beam tubes for processing objects
    • H01J2237/317Processing objects on a microscale
    • H01J2237/31749Focused ion beam

Landscapes

  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)

Abstract

PURPOSE:To prevent roughening of an electrode surface on the lower electric potential side due to the discharge between adjoining electrodes by preferentially applying voltage for conditioning only between specified electrodes, in the same direction as in used. CONSTITUTION:At the time of conditioning, each electrode 1a-1f is connected to a power source 7 for conditioning through a connection switching circuit 6. In the drawing, the conditioning between electrodes 1a and 1b is depicted, in which electrodes 1b-1f are commonly connected together by the connection switching circuit 6. An electric field of the same direction as in use is thus applied between the electrodes 1a and 1b, whereby conditioning is performed. As the voltage is applied between the specified electrodes in the same direction as in the normal use, through the discharge during conditioning, roughening of the electrode surface on the lower electric potential side can be prevented.

Description

【発明の詳細な説明】 (産業上の利用分野) 本発明は、高加速電圧の電子ビーム装置やイオンビーム
装置に使用される加速管のコンディショニングを行う荷
電粒子ビーム加速管のコンディショニング装置に関する
DETAILED DESCRIPTION OF THE INVENTION (Industrial Application Field) The present invention relates to a charged particle beam accelerator tube conditioning device for conditioning an accelerator tube used in a high accelerating voltage electron beam device or ion beam device.

(従来の技術) 第3図は、高加速電圧の集束イオンビーム装置に用いら
れる加速管を示している。加速管は、多数の加速電極1
a〜1fと、各電極の間に配置された絶縁碍子2a〜2
eより構成されている。各電極18〜1fの間は、夫々
分割抵抗3a〜3eによって接続されており、最初の電
極1aと最後の電11fの間には、加速電源4から、高
電圧が印加される。各電極には、分割抵抗38〜3eに
よって分割された電圧が印加され、加速管内に導入され
たイオンビーム!Bは、各電極によって加速される。
(Prior Art) FIG. 3 shows an acceleration tube used in a focused ion beam device with a high acceleration voltage. The accelerating tube has a large number of accelerating electrodes 1
a to 1f and insulators 2a to 2 arranged between each electrode
It is composed of e. The electrodes 18 to 1f are connected by dividing resistors 3a to 3e, respectively, and a high voltage is applied from the acceleration power source 4 between the first electrode 1a and the last electrode 11f. Voltages divided by dividing resistors 38 to 3e are applied to each electrode, and the ion beam is introduced into the acceleration tube! B is accelerated by each electrode.

さて、このような加速管において、コンディショニング
を行う場合には、第4図に示すように、電極18〜1f
を1枚おきに接続し、交流電源5からの交流電圧を互い
に隣り合った電極間に印加する。
Now, when conditioning is performed in such an acceleration tube, as shown in FIG.
are connected to every other electrode, and an AC voltage from an AC power source 5 is applied between adjacent electrodes.

(発明が解決しようとする課題) 上記したコンディショニング方式で、第5図に示すよう
に、使用状態と同じ向きの電界が隣り合った電極1aと
1bとに印加される場合には、下方の電極表面の微小突
起Tの存在によって放電が起こり、これによって上方の
電極1aの下面が荒れることになる。これに対し、第6
図に示すように、使用状態と逆の向きの電界がl’fi
J加されたときには、コンディショニングによって、上
方の電極表面の微小突起Tの存在により放電が起こり、
下方の電極1bの上面が荒れることになる。このコンデ
ィショニングによって下方の電極1b,すなわち、通常
の使用状態における低電位側の電極表面が電子によって
荒らされてしまうと、これが原因で、正方向の静電位を
印加したときに絶縁破壊が生じる。
(Problem to be Solved by the Invention) In the above-described conditioning method, as shown in FIG. The presence of the microprotrusions T on the surface causes discharge, which roughens the lower surface of the upper electrode 1a. On the other hand, the sixth
As shown in the figure, the electric field in the opposite direction to that in use is l'fi.
When J is applied, a discharge occurs due to the presence of microprotrusions T on the upper electrode surface due to conditioning.
The upper surface of the lower electrode 1b will become rough. As a result of this conditioning, the surface of the lower electrode 1b, that is, the electrode on the low potential side in normal use, is roughened by electrons, which causes dielectric breakdown when a positive electrostatic potential is applied.

通常の使用状態と同じ状態でコンディショニングを行う
ことも考えられるが、その場合は、第3図に示す構成で
、加速電源4からの電圧をコンディシジニングが行える
ように高めることが必要となる。しかしながら、この接
続で、ある電極間で放電が発生すると、その隣り合った
電極が形成するギャップに過大な電圧が印加され、絶縁
碍子の劣化などにつながってしまう。
It may be possible to perform conditioning in the same state as in normal use, but in that case, it is necessary to increase the voltage from the acceleration power source 4 in the configuration shown in FIG. 3 so that conditioning can be performed. However, in this connection, if a discharge occurs between certain electrodes, an excessive voltage will be applied to the gap formed by the adjacent electrodes, leading to deterioration of the insulator.

本発明はこのような点に鑑みてなされたもので、その目
的は、通常の使用状態における低電位側の電極表面を放
電によって荒らすことがなく、又、特定の電極間に過大
な電圧が印加されないように、コンディショニングを行
うことができる荷電粒子ビーム加速管のコンディショニ
ング装置を実現することにある。
The present invention has been made in view of these points, and its purpose is to prevent the electrode surface on the low potential side from being damaged by discharge during normal use, and to prevent excessive voltage from being applied between specific electrodes. The object of the present invention is to realize a conditioning device for a charged particle beam accelerator tube that can perform conditioning so that the charged particle beam is not damaged.

(課題を解決するための手段) 本発明に基づく荷電粒子ビーム加速管のコンディショニ
ング装置は、多数の加速電極からなる荷電粒子ビーム加
速管において、コンディショニング用の電圧を、多数の
加速電極の内の隣り合った2枚の電極間に選択的に印加
し得るように構戊したことを特徴としている。
(Means for Solving the Problems) A conditioning device for a charged particle beam accelerator tube based on the present invention applies a conditioning voltage to one of the many accelerating electrodes adjacent to the charged particle beam accelerating tube. It is characterized in that it is structured so that it can be selectively applied between two matched electrodes.

(作用) 加速管のコンディショニングを行う際には、多数の加速
電極の一部を共通接続し、特定の2枚の電極間にのみ通
常の使用状態と同じ向きの電界を印加し、更に、電界が
印加される電極の組合わせを切換え、各電極間でのコン
ディショニングを行う。
(Function) When conditioning an accelerator tube, some of the many accelerating electrodes are connected in common, an electric field is applied in the same direction as in normal use only between two specific electrodes, and the electric field is The combination of electrodes to which is applied is switched, and conditioning is performed between each electrode.

(実施例) 以下、図面を参照して本発明の実施例を詳細に説明する
。第1図は本発明に基づくコンディショニング装置を示
しており、第3図と同一部分は同一番号を付してある。
(Example) Hereinafter, an example of the present invention will be described in detail with reference to the drawings. FIG. 1 shows a conditioning device according to the invention, in which the same parts as in FIG. 3 are given the same numbers.

この実施例において、コンディショニングの際には、各
電極1a〜1fは、接続切換回路6を介して、コンディ
ショニング用電[7に接続されている。第1図の状態は
、電極1aと1bとの間のコンディショニングを行う場
合を示しており、この場合、電極1b〜1fは、接続切
換回路6によって共通接続されている。従って、電極1
aとlbとの間に、使用状態と同じ向きの電界が印加さ
れ、コンディショニングが行われる。
In this embodiment, during conditioning, each of the electrodes 1a to 1f is connected to a conditioning power source [7] via a connection switching circuit 6. The state shown in FIG. 1 shows a case where conditioning is performed between electrodes 1a and 1b, and in this case, electrodes 1b to 1f are commonly connected by a connection switching circuit 6. Therefore, electrode 1
An electric field in the same direction as in use is applied between a and lb to perform conditioning.

次に、電極1bと1cとの間のコンディショニングを行
う場合には、接続切換回路6によって、第2図に示すよ
うに、電極1aと1bが共通接続され、電極1c〜1f
が共通接続される。その結果、電極1bと1cとの間に
使用状態と同じ向きの電界が印加される。その後、同様
に、接続切換回路6によって各電極間が選択的にコンデ
ィショニングされるように電極間の接続状態が切換えら
れる。
Next, when conditioning the electrodes 1b and 1c, the connection switching circuit 6 connects the electrodes 1a and 1b in common, as shown in FIG.
are commonly connected. As a result, an electric field in the same direction as in the use state is applied between the electrodes 1b and 1c. Thereafter, similarly, the connection state between the electrodes is switched by the connection switching circuit 6 so that each electrode is selectively conditioned.

このように、特定の電極間のみに通常の使用状態と同じ
向きの電圧を印加するようにしたので、コンディショニ
ングの際の放電により、低電位側の電極表面が荒れるこ
とは防止される。
In this way, since voltage is applied in the same direction as in normal use only between specific electrodes, the electrode surface on the low potential side is prevented from becoming rough due to discharge during conditioning.

(発明の効果) 以上説明したように、本発明では、特定の電極間のみに
選択的にコンディショニング用の電圧を、使用状態と同
じ向きに印加するように構成したので、通常の使用状態
における低電位側の電極表面が放電によって荒れること
はなくなり、正方向の静電位を印加しても、絶縁破壊を
起こすことは防止される。又、個々の電極間のコンディ
ショニングを順に行うようにしたので、どの電極間に放
電が起こりやすいかを正確に把握することができる。
(Effects of the Invention) As explained above, in the present invention, since the conditioning voltage is selectively applied only between specific electrodes in the same direction as in the usage state, the The electrode surface on the potential side is not roughened by discharge, and dielectric breakdown is prevented even if a positive electrostatic potential is applied. Furthermore, since conditioning is performed between individual electrodes in order, it is possible to accurately determine which electrodes are likely to cause discharge.

更に、全部の加速電極のコンディショニングを同時に行
うことはしていないので、放電によって特定の電極間に
過大な電圧が印加されることは防止される。
Furthermore, since all accelerating electrodes are not conditioned at the same time, excessive voltage is prevented from being applied between specific electrodes due to discharge.

【図面の簡単な説明】[Brief explanation of drawings]

第1図および第2図は、本発明の一実施例である加速管
のコンディショニング装置を示す図、第3図は、加速管
を示す図、第4図は従来の加速管のコンディショニング
装置を示す図、第5図および第6図は、コンディショニ
ングによる放電の状態を示す図である。 1a〜1f・・・加速電極 2a〜2e・・・絶縁碍子 3a〜3e・・・分割抵抗
FIGS. 1 and 2 show an acceleration tube conditioning device according to an embodiment of the present invention, FIG. 3 shows an acceleration tube, and FIG. 4 shows a conventional acceleration tube conditioning device. 5 and 6 are diagrams showing the state of discharge due to conditioning. 1a to 1f...Accelerating electrodes 2a to 2e...Insulators 3a to 3e...Dividing resistors

Claims (1)

【特許請求の範囲】[Claims]  多数の加速電極からなる荷電粒子ビーム加速管におい
て、コンディショニング用の電圧を、多数の加速電極の
内の隣り合った2枚の電極間に選択的に印加し得るよう
に構成したことを特徴とする荷電粒子ビーム加速管のコ
ンディショニング装置。
A charged particle beam accelerator tube consisting of a large number of accelerating electrodes is characterized in that a conditioning voltage can be selectively applied between two adjacent electrodes among the large number of accelerating electrodes. Conditioning device for charged particle beam accelerator tube.
JP1159090A 1989-06-21 1989-06-21 Conditioning device of charged particle beam accelerating tube Pending JPH0325845A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP1159090A JPH0325845A (en) 1989-06-21 1989-06-21 Conditioning device of charged particle beam accelerating tube

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP1159090A JPH0325845A (en) 1989-06-21 1989-06-21 Conditioning device of charged particle beam accelerating tube

Publications (1)

Publication Number Publication Date
JPH0325845A true JPH0325845A (en) 1991-02-04

Family

ID=15686020

Family Applications (1)

Application Number Title Priority Date Filing Date
JP1159090A Pending JPH0325845A (en) 1989-06-21 1989-06-21 Conditioning device of charged particle beam accelerating tube

Country Status (1)

Country Link
JP (1) JPH0325845A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2013505545A (en) * 2009-09-18 2013-02-14 エフ・イ−・アイ・カンパニー Distributed ion source acceleration column

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2013505545A (en) * 2009-09-18 2013-02-14 エフ・イ−・アイ・カンパニー Distributed ion source acceleration column

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