JPH03257842A - Holding device for electronic component - Google Patents

Holding device for electronic component

Info

Publication number
JPH03257842A
JPH03257842A JP2056835A JP5683590A JPH03257842A JP H03257842 A JPH03257842 A JP H03257842A JP 2056835 A JP2056835 A JP 2056835A JP 5683590 A JP5683590 A JP 5683590A JP H03257842 A JPH03257842 A JP H03257842A
Authority
JP
Japan
Prior art keywords
electronic component
electrode
pressurizing
contact
shaft
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2056835A
Other languages
Japanese (ja)
Inventor
Yoshinobu Suda
須田 義信
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Mitsubishi Electric Corp
Original Assignee
Mitsubishi Electric Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Mitsubishi Electric Corp filed Critical Mitsubishi Electric Corp
Priority to JP2056835A priority Critical patent/JPH03257842A/en
Publication of JPH03257842A publication Critical patent/JPH03257842A/en
Pending legal-status Critical Current

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  • Testing Of Individual Semiconductor Devices (AREA)
  • Manipulator (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)

Abstract

PURPOSE:To prevent the deformation of the electrode of an electronic component by bringing the electrode of the electronic component into contact with the electrode of a supporting base so as to press it and providing a holding means which can move relatively to a pressurizing part in the direction orthogonal to the surface of the supporting base. CONSTITUTION:The main body of an electronic component 19 which is attracted by a vacuum to an attraction edge 54 is brought into contact with an attraction bar 16, the main body is directed to the surface of a supporting base 14 while being sandwiched by a holding axis 51 and the attraction bar 16 and an electronic component electrode 20 is brought into contact with an electrode 15. Then, an electronic component holding part 69 comes closer to the surface of the supporting base 14 and the electronic component electrode 20 receives the reaction force from the electrode 15. The holding axis 51 is pressed into a pressurizing axis 6 by the reaction force, the electronic component electrode 20 is brought into contact with a pressurizing plate 55 and they are pressed into a supporting cylinder 2 being integrated with the pressurizing axis 6. A pressurizing spring 11 is compressed by such action and the contact power between the electrodes is given through a pressurizing plate 55.

Description

【発明の詳細な説明】 [産業上の利用分野] この発明は半導体電子部品の電気特性を測定する装置に
おける電子部品用把持装置に関するものである。
DETAILED DESCRIPTION OF THE INVENTION [Field of Industrial Application] The present invention relates to a gripping device for electronic components in an apparatus for measuring the electrical characteristics of semiconductor electronic components.

[従来の技術] 第7図は従来の電子部品用把持装置を示す破砕断面図で
ある0図において(1)は可動腕、(2)は可動腕(1
)に嵌合され締結されている支持筒、(3)は可動腕(
1)に締結された片持ち台、(4)は加圧調整ねしで、
内筒面が摺動面になっている。(5)は固定用ナツト、
(6)は加圧軸で、真空吸引するための軸孔(7)が設
けられている。(8)は吸着端で、電子部品を吸着保持
する部位である。(9)はジヨイントで、真空吸引用の
チューブ(図示せず)が取り付けられる。(10)は横
ずれ防止板で、吸着端(8)を挟んで加圧軸(6)の外
側面に取り外し自在に締結されている。(11)は加圧
ばねで、加圧軸(6)に挿入され加圧軸(6)の段付き
部と加圧調整ねじ(4)との間に配設されている。(1
2)は位置調整ナツトで、(13)は止めナツトである
。なお加圧ばね(11)のばね剛さは電子部品の電気試
験を行う際の充分な接触圧が得られる程度の剛さてあり
、接触圧の設定には加圧調整ねじ(4)が使用される0
以上(2)〜(13)の構成による組立体を電子部品把
持部(30)と名付ける。
[Prior Art] FIG. 7 is a fragmented cross-sectional view showing a conventional gripping device for electronic components. In FIG. 0, (1) is a movable arm, and (2) is a movable arm
) is fitted and fastened to the support tube, (3) is the movable arm (
1) is a cantilever base fastened to, (4) is a pressure adjustment screw,
The inner cylinder surface is a sliding surface. (5) is a fixing nut,
(6) is a pressurizing shaft, which is provided with a shaft hole (7) for vacuum suction. (8) is a suction end, which is a part that suctions and holds electronic components. (9) is a joint to which a vacuum suction tube (not shown) is attached. (10) is a lateral slip prevention plate which is removably fastened to the outer surface of the pressurizing shaft (6) with the suction end (8) in between. A pressure spring (11) is inserted into the pressure shaft (6) and disposed between the stepped portion of the pressure shaft (6) and the pressure adjustment screw (4). (1
2) is a position adjustment nut, and (13) is a locking nut. The spring stiffness of the pressure spring (11) is such that sufficient contact pressure can be obtained when performing electrical tests on electronic components, and the pressure adjustment screw (4) is used to set the contact pressure. Ru0
The assembly having the configurations (2) to (13) above is named an electronic component gripping section (30).

(14)は支持台で、その上面には電極(15)が、若
干の弾性変位が許されるように設けられている。  (
16)は吸着バーで、図示されていない駆動機構により
移動可能である。
(14) is a support base, and an electrode (15) is provided on the upper surface of the support base so as to allow slight elastic displacement. (
16) is a suction bar, which is movable by a drive mechanism (not shown).

(17)は真空吸引孔であり、(18)は吸着端で、共
に吸着バーに設けられている。(19)は電子部品、(
20)は電子部品電極である。
(17) is a vacuum suction hole, and (18) is a suction end, both of which are provided on the suction bar. (19) is an electronic component, (
20) is an electronic component electrode.

第8図は従来例の部分側面図であり、第7図のI−Iか
ら見た図である。
FIG. 8 is a partial side view of the conventional example, taken along line II in FIG. 7.

つぎに動作について説明する。Next, the operation will be explained.

図示されていない電子部品の位置決め部で電子部品が配
列されている。その位置に電子部品把持部(30)が可
動腕(1)により移動され、真空吸引により吸着端(8
)に電子部品が吸着される。その後可動腕(1)により
電子部品把持部(30)が移動され、電子部品(19)
は支持台(14)に対向させられる6第9図は電子部品
(19)が支持台(14)に対向させられた状態を説明
した正面図である。この位置から電子部品把持部(30
)は可動腕(1)により支持台(14)の表面に向がっ
て移動され、途中吸着バー(16)とで電子部品(19
)を挟持しつつ電子部品電極(20)を電極(15)に
接触させる。このとき加圧ばね(11)が圧縮されて電
極相互の接触力が生じ、この状態で電子部品(19)の
電気特性試験が実施される。第1θ図は電子部8電!(
20〉が電極(15)に接触した状態を説明した正面図
である。なお第10図のT寸法とは電子部品(19)の
上面が吸着端(8)に真空吸引された状態で、横ずれ防
止板(lO)先端から電子部品電極(20)の底面まで
の寸法である。なお、横ずれ防止板(lO)は電子部品
(19)が吸着端(8)に真空吸引された後、移動の際
に電子部品(19〉が吸着端(8)で移動し、軸孔(7
)からはずれるのを防止するための部材である。電気特
性試験終了後電子部品把持部(30)は支持台(14)
の表面から離れ、電子部品(19)を吸着バー(16)
に残して電子部品の位置決め部に戻る。吸着バー(16
)に残された電子部品(19)は他のもう一つの電子部
品把持部(30)に把持されて、図示されていない次の
工程の装置に搬送される。
Electronic components are arranged in an electronic component positioning section (not shown). The electronic component gripping part (30) is moved to that position by the movable arm (1), and the suction end (8) is moved by vacuum suction.
) electronic components are attracted. After that, the electronic component gripping section (30) is moved by the movable arm (1), and the electronic component (19) is moved.
FIG. 9 is a front view illustrating a state in which the electronic component (19) is opposed to the support base (14). From this position, the electronic component gripping section (30
) is moved toward the surface of the support base (14) by the movable arm (1), and the electronic component (19) is moved by the suction bar (16) on the way.
) while holding the electronic component electrode (20) in contact with the electrode (15). At this time, the pressure spring (11) is compressed to generate a contact force between the electrodes, and in this state, an electrical property test of the electronic component (19) is performed. Figure 1 theta is electronic part 8 electricity! (
20> is a front view illustrating a state in which the electrode (15) is in contact with the electrode (15). The T dimension in Figure 10 is the dimension from the tip of the lateral slip prevention plate (lO) to the bottom of the electronic component electrode (20) when the top surface of the electronic component (19) is vacuum-suctioned by the suction end (8). be. In addition, after the electronic component (19) is vacuum-suctioned to the suction end (8), the lateral slip prevention plate (lO) moves when the electronic component (19) is moved by the suction end (8), and the shaft hole (7)
) This is a member to prevent it from coming off. After the electrical property test is completed, the electronic component gripping section (30) is attached to the support stand (14).
Keep the electronic components (19) away from the surface of the suction bar (16).
, and return to the electronic component positioning section. Suction bar (16
The electronic component (19) left in the electronic component (19) is held by another electronic component gripping section (30) and transported to a device for the next process (not shown).

[発明が解決しようとする課題] 従来の電子部品用把持装置は以上の様に構成されている
ので、次の様な問題点があった。
[Problems to be Solved by the Invention] Since the conventional electronic component gripping device is configured as described above, it has the following problems.

第11図は電子部品(19)の側面図である。FIG. 11 is a side view of the electronic component (19).

この図のし寸法とは電子部品(19)の本体底面から電
子部品電極(20)の底面までの寸法であり、近年電子
部品の使用者からし寸法の管理が厳しく要求されるよう
になってきている。
The dimension in this figure is the dimension from the bottom of the main body of the electronic component (19) to the bottom of the electronic component electrode (20), and in recent years electronic component users have been required to strictly control the dimensions. ing.

さて先に示した第10図のT寸法は理想的には電子部品
電極(20)の肉厚とおなしであればよいが、電子部品
電極(20)のフォーミングを金型を使用した塑性加工
で行うため充分な寸法精度が出ない、もしT寸法が電子
部品電極(20)の肉厚より小さいと電子部品(19)
上面と吸着端(14)との間に隙間ができ電子部品(1
9)を真空吸引できなくなる。このため電子部品電極(
20)の肉厚よりもT寸法を大きめにするのが通常であ
る。しかじT寸法が電子部品電極(20)の肉厚より大
き過ぎると電子部品電極(20)と電極(15)とが接
触した後、接触力により電子部品電極(20)が変形し
て、当初予定していたし寸法が得られなくなるという問
題点があった。
Now, the T dimension shown in Fig. 10 shown earlier should ideally be the same as the wall thickness of the electronic component electrode (20), but the forming of the electronic component electrode (20) can be done by plastic working using a mold. If the T dimension is smaller than the wall thickness of the electronic component electrode (20), the electronic component (19)
A gap is created between the top surface and the suction end (14), and the electronic component (1)
9) cannot be vacuum suctioned. For this reason, electronic component electrodes (
It is normal to make the T dimension larger than the wall thickness of 20). However, if the T dimension is too large than the wall thickness of the electronic component electrode (20), after the electronic component electrode (20) and the electrode (15) come into contact, the electronic component electrode (20) will be deformed due to the contact force, causing the initial There was a problem that the planned dimensions could no longer be obtained.

この発明は上記のような課題を解消するためになされた
ものであり、接触力による電子部品の電極の変形を防ぎ
、電子部品の品質向上を目的としている。
This invention was made to solve the above-mentioned problems, and aims to improve the quality of electronic components by preventing deformation of electrodes of electronic components due to contact force.

[課題を解決するための手段] この発明に係わる電子部品用把持装置は、支持台の電極
に電子部品の電極を移動する加圧手段と、この加圧手段
に装着され、電子部品の電極を支持台の電極に接触押圧
させる加圧部と、支持台の表面と対向した位1に吸着端
を有し、支持台の表面と直行する方向において加圧部と
相対的に移動可能な把持手段と、を備えたものである。
[Means for Solving the Problems] A gripping device for electronic components according to the present invention includes a pressurizing means for moving an electrode of an electronic component to an electrode of a support base, and a pressurizing means attached to the pressurizing means to move an electrode of an electronic component to an electrode of a support base. A gripping means that has a pressure part that contacts and presses the electrode of the support base, and a suction end at a position opposite to the surface of the support base, and is movable relative to the pressure part in a direction perpendicular to the surface of the support base. It is equipped with the following.

[作用] この発明における電子部品用把持装置では、電子部品を
真空吸着する吸着端が、電子部品の電極を加圧する加圧
部に対し相対的に動くことができるので、電極を加圧す
る力が電子部品の電極を変形させない。
[Function] In the electronic component gripping device of the present invention, the suction end that vacuum-chucks the electronic component can move relative to the pressurizing part that pressurizes the electrode of the electronic component, so that the force that presses the electrode is reduced. Do not deform the electrodes of electronic components.

[発明の実施例] 以下、この発明を図について説明する。[Embodiments of the invention] The invention will be explained below with reference to the drawings.

第1図はこの発明の一実施例を示す破砕断面図であり、
(1)〜(5)、(9)、(11)〜(20)の構成は
従来例と同様であるので説明を省略する。
FIG. 1 is a fragmented sectional view showing an embodiment of the present invention.
The configurations (1) to (5), (9), and (11) to (20) are the same as those of the conventional example, so their explanations will be omitted.

図において加圧軸(6)は上軸(40)と下軸(41)
とからなり、上軸(40)が下軸(41)にねじ込むこ
とにより一体にされている。(50)は加圧軸(6)に
設けられた貫通孔である。(51)は把持軸で、貫通孔
(5o)内で摺動でき、両端が加圧軸(6)より突出し
ている。また把持軸(51)はフランジ部を有し、この
フランジ部は貫通孔(50)内で下軸(41)の段付き
部で直接支承されると共に、上軸(40)との間に配設
された戻しばね(52)によりゆるく拘束されている。
In the figure, the pressure shaft (6) is the upper shaft (40) and the lower shaft (41).
The upper shaft (40) is screwed into the lower shaft (41) to be integrated. (50) is a through hole provided in the pressurizing shaft (6). (51) is a gripping shaft which can slide within the through hole (5o) and has both ends protruding from the pressurizing shaft (6). Furthermore, the gripping shaft (51) has a flange portion, and this flange portion is directly supported within the through hole (50) by the stepped portion of the lower shaft (41), and is disposed between it and the upper shaft (40). It is loosely restrained by a return spring (52) provided.

(53)は軸孔で、真空吸引するためのものであり、把
持軸(51)を貫通している0把持軸(51)の一端に
電子部品を吸着保持する吸着端(54)が、他端には真
空吸引用のチューブ(図示せず)のためのジヨイント(
9)が結合されている0把持軸(51)の吸着端(54
)を挟んで加圧軸(6)の外側面には絶縁体からなる加
圧板(55)がねじにより取り外し自在に締結されてい
る。この加圧板(55)は従来例の横ずれ防止板(10
)のように吸着端(54)での電子部品(12)の移動
を防止するだけに留まらず、動作の説明の箇所で述べる
ように電極相互の接触圧がこの加圧板(55〉を介して
加えられる。を子部品電極(20)と接触する、この加
圧板(55)のコーナ一部(56)には、電子部品電極
(20)への擦傷防止用の丸みが付けられている。また
、電子部品電極金属が加圧板(55)の先端面へ移着し
電子部品電極相互間で電気的に導通することを防止する
ため、後に示す第2図で示されているように加圧板(5
5)の先端面の長手方向には電子部品電極(20)の−
本の幅より広いピッチ間隔で、電子部品電極(20)の
幅より狭い、切欠き渭(57)が設けられている。
(53) is a shaft hole for vacuum suction, and a suction end (54) for suctioning and holding an electronic component is attached to one end of the gripping shaft (51) passing through the gripping shaft (51), and the other The end has a joint (not shown) for a vacuum suction tube (not shown).
9) is connected to the suction end (54) of the zero gripping shaft (51).
) A pressure plate (55) made of an insulator is removably fastened to the outer surface of the pressure shaft (6) with screws. This pressure plate (55) is the conventional lateral slip prevention plate (10
), it not only prevents the electronic component (12) from moving at the suction end (54), but also prevents the contact pressure between the electrodes from moving through this pressure plate (55), as described in the explanation of the operation. A corner portion (56) of this pressure plate (55) that contacts the child component electrode (20) is rounded to prevent scratches on the electronic component electrode (20). In order to prevent the electronic component electrode metal from being transferred to the tip surface of the pressure plate (55) and electrically conducting between the electronic component electrodes, the pressure plate (55) is attached as shown in FIG. 2 shown later. 5
- of the electronic component electrode (20) in the longitudinal direction of the tip surface of 5).
Notch edges (57) are provided at pitch intervals wider than the width of the book and narrower than the width of the electronic component electrodes (20).

なお戻しばね(52)と加圧ばね(ll)とのばね剛さ
の関係は戻しばね(52)のほうが小さく、電子部品電
極(20)が電極(15)と接触した際の接触力により
把持軸(51)が加圧軸(6)に充分おしこまれる程度
に設定されている。
The spring stiffness relationship between the return spring (52) and the pressure spring (ll) is that the return spring (52) is smaller, and the electronic component electrode (20) is gripped by the contact force when it comes into contact with the electrode (15). The setting is such that the shaft (51) can be sufficiently pushed into the pressurizing shaft (6).

この(2)〜(6)、(9)、(11)〜(I3)、(
50)〜(56)の構成の組立体を電子部品把持部(6
0)と名付ける。
These (2) to (6), (9), (11) to (I3), (
50) to (56) are placed in the electronic component gripping section (6).
0).

また以上の構成において例えば、把持軸(51)と戻し
ばね(52)とジヨイント(9)とを把持手段(100
)とし、加圧軸(6)と加圧板(55)と加圧ばね(1
1)と位置調整ナツト(12)と止めナツト(13)と
を加圧部(101)とし、そして可動腕(1)と支持筒
(2)と片持台(3)と加圧調整ねじ(4)と固定用ナ
ツト(5)と把持手段(100)と加圧部(101)と
を加圧手段(102)としている。
Further, in the above configuration, for example, the gripping shaft (51), the return spring (52), and the joint (9) are connected to the gripping means (100).
), the pressure shaft (6), the pressure plate (55) and the pressure spring (1
1), the position adjustment nut (12), and the locking nut (13) are used as a pressure part (101), and the movable arm (1), the support tube (2), the cantilever base (3), and the pressure adjustment screw ( 4), the fixing nut (5), the gripping means (100), and the pressurizing part (101) are used as a pressurizing means (102).

次に動作について説明する。Next, the operation will be explained.

電子部品把持部(60)により図示されていない電子部
品の位置決め部で電子部品が吸着され、支持台(14)
表面に対向させられる。
The electronic component is sucked by the electronic component holding section (60) at the electronic component positioning section (not shown), and the electronic component is placed on the support base (14).
facing the surface.

第2図は電子部品(19)が電極(15)に対向させら
れた状態をしめしな側面図であり、第3図はその正面図
である。この位置から電子部品把持部(60)は支持台
(14)の表面に向かって、その表面と直交する方向に
移動される。ここまでは従来例と同様である。この後吸
着端(54)で真空吸着されている電子部品(19)の
本体はまず吸着バー(16)と接触し把持軸(51)と
吸着バー(16)とで挟持されつつ支持台(14)の表
面に向かい、電子部品電極(20)が電!(15)に接
触する。この後電子部品把持部(60)がさらに支持台
(14)の表面に近づき、電子部品電極(20)は電極
(15)から反力を受け、この反力により把持軸(51
)がまず加圧軸(6)に押し込まれ電子部品電極(20
)と加圧板(55)とが接触し、この後加圧軸(6)と
も一体となって支持筒(2)に押し込まれる。この動き
により加圧ばね(11)が圧縮されて、加圧板(55)
を介して電極相互の接触力が与えられる。第4図は電子
部品電極(20)が電極(15)に接触した状態を説明
した側面図であり、第5図はその正面図である。
FIG. 2 is a side view showing the electronic component (19) facing the electrode (15), and FIG. 3 is a front view thereof. From this position, the electronic component gripping section (60) is moved toward the surface of the support base (14) in a direction perpendicular to the surface. The process up to this point is the same as the conventional example. Thereafter, the main body of the electronic component (19) vacuum-suctioned by the suction end (54) first comes into contact with the suction bar (16) and is held between the gripping shaft (51) and the suction bar (16) while the main body of the electronic component (19) ) toward the surface of the electronic component electrode (20). Contact (15). After this, the electronic component gripping part (60) further approaches the surface of the support base (14), and the electronic component electrode (20) receives a reaction force from the electrode (15), and this reaction force causes the grip shaft (51
) is first pushed into the pressure shaft (6) and the electronic component electrode (20
) and the pressure plate (55) come into contact with each other, and are then pushed into the support cylinder (2) together with the pressure shaft (6). This movement compresses the pressure spring (11), and the pressure plate (55)
The contact force between the electrodes is applied through the contact force between the electrodes. FIG. 4 is a side view illustrating a state in which the electronic component electrode (20) is in contact with the electrode (15), and FIG. 5 is a front view thereof.

電気特性試験終了後電子部品把持部(60)は支持台(
14)から離れる方向に動き、途中把持軸(51)が戻
しばね(52)により加圧軸(6)から突き出る方向に
戻される。以下の動作は従来例と同様である。
After the electrical property test, the electronic component gripping section (60) is placed on the support stand (
14), and in the middle of the movement, the gripping shaft (51) is returned by the return spring (52) to the direction in which it projects from the pressing shaft (6). The following operation is similar to the conventional example.

第6図はこの発明の他の実施例を示す破砕断面図であり
、(1)〜(9)   (11)〜(20)の構成は従
来例と同様であるので説明を省略する。
FIG. 6 is a fragmented cross-sectional view showing another embodiment of the present invention, and the configurations (1) to (9) and (11) to (20) are the same as those of the conventional example, so explanations thereof will be omitted.

第6図において加圧軸(6)の外側面に締結されていた
横ずれ防止板(lO)の替りに加圧板(55)がねじに
より取り外し自在に締結されている。また加圧軸(6)
の、支持台(14)側軸端に接触力により加圧軸(6)
の軸方向に圧縮変形可能とされる把持手段、例えばプラ
スチック製の把持体(70)が結合されている0把持体
(70)には加圧軸(6)の軸孔(7)に連続して、軸
孔(71)が設けられている。加圧軸(6)の軸端と把
持体(70)とは結合面で真空漏洩のないように結合さ
れている0把持体(70)に必要な剛さは電極相互の接
触力により把持体(70)が変形して、把持体(70)
の吸着端(72)に真空吸引された電子部品(19)の
電子部品電極(20)が加圧板(55)に接触できる程
度の剛さてあればよい、このような構成を取ることによ
り、より簡単に先の実施例と同様の動作が実現できる。
In FIG. 6, a pressure plate (55) is removably fastened to the outer surface of the pressure shaft (6) in place of the lateral slip prevention plate (lO) fastened to the outer surface of the pressure shaft (6). Also, the pressure shaft (6)
Pressure shaft (6) is applied by contact force to the shaft end on the support stand (14) side.
The gripping means (70) is connected to a gripping means that can be compressed and deformed in the axial direction, for example, a plastic gripping body (70), which is connected to the shaft hole (7) of the pressurizing shaft (6). A shaft hole (71) is provided therein. The shaft end of the pressurizing shaft (6) and the gripping body (70) are connected at the joint surface to prevent vacuum leakage.The rigidity required for the gripping body (70) is determined by the contact force between the electrodes. (70) is deformed, and the grip body (70)
The electronic component electrode (20) of the electronic component (19) vacuum-suctioned to the suction end (72) of the electronic component (19) needs only to be stiff enough to contact the pressure plate (55). The same operation as in the previous embodiment can be easily realized.

また上記実施例では電子部品の試験装置について説明し
たが電子部品の電極形状の矯正装置などの他の装置でも
よく、上記実施例と同様の効果を奏する。
Further, in the above embodiment, a testing device for electronic components has been described, but other devices such as a device for correcting the electrode shape of electronic components may be used, and the same effects as in the above embodiments can be obtained.

[発明の効果] この発明は、電子部品の電極を支持台の電極に接触押圧
させる加圧部と、支持台の表面と直行する方向において
加圧部と相対的に移動可能な把持手段とを備えるように
構成されているので、電子部品の電極の変形を防ぎ、電
子部品の品質を向上する効果がある。
[Effects of the Invention] The present invention includes a pressurizing section that presses an electrode of an electronic component into contact with an electrode of a support base, and a gripping means that is movable relative to the pressurizing section in a direction perpendicular to the surface of the support base. Since it is configured to have such a structure, deformation of the electrodes of the electronic component is prevented and the quality of the electronic component is improved.

4、4,

【図面の簡単な説明】[Brief explanation of drawings]

第1図はこの発明の一実施例を示す破砕断面図、第2図
と第3図は上記一実施例による電子部品と支持台との対
向関係を説明するための側面図及び正面図、第4図と第
5図は上記一実施例による電子部品電極の接触状態を説
明するための側面図及び正面図、第6図はこの発明の他
の実施例を示す破砕断面図、第7図は従来例を示す破砕
断面図、第8図は第7図の部分側面図、第9図は従来例
による電子部品と支持台との対向関係を説明するための
正面図、第1θ図は従来例による電子部品電極の接触状
態を説明するための正面図、第11図は電子部品の側面
図である。 (14)は支持台、(100)は把持手段、(101)
は加圧部、(102)は加圧手段である。 なお図中、同一符号は同一、又は相当部分を示す。
FIG. 1 is a fragmented cross-sectional view showing one embodiment of the present invention, FIGS. 2 and 3 are side and front views for explaining the opposing relationship between the electronic component and the support base according to the above-mentioned embodiment, and FIG. 4 and 5 are a side view and a front view for explaining the contact state of electronic component electrodes according to the above embodiment, FIG. 6 is a fragmented sectional view showing another embodiment of the present invention, and FIG. 7 is a FIG. 8 is a partial side view of FIG. 7, FIG. 9 is a front view illustrating the opposing relationship between the electronic component and the support base according to the conventional example, and FIG. 1θ is a conventional example. FIG. 11 is a front view for explaining the contact state of the electronic component electrodes, and FIG. 11 is a side view of the electronic component. (14) is a support base, (100) is a gripping means, (101)
is a pressurizing section, and (102) is a pressurizing means. In the figures, the same reference numerals indicate the same or equivalent parts.

Claims (1)

【特許請求の範囲】  絶縁体からなる本体及びこの本体から突出延在された
電極とからなる電子部品の、上記電極が接触させられる
電極を表面に有した支持台と、 上記支持台の表面上に、これと直交する方 向に移動可能に設けられ、上記支持台の電極と対向した
位置に電子部品の電極を移動する加圧手段と、 上記加圧手段に装着され、電子部品の電極 を上記支持台の電極に接触押圧させる加圧部と、 上記加圧手段に装着され、上記支持台の表 面と対向した位置に真空吸引孔が形成された吸着端を有
し、かつ上記加圧部に対して上記支持台の表面と直行す
る方向に相対的に移動可能に設けられた把持手段とを備
えた電子部品用把持装置。
[Scope of Claims] A support base for an electronic component comprising a main body made of an insulator and an electrode protruding from the main body, the support base having an electrode on its surface with which the electrode comes into contact; a pressurizing means that is movable in a direction orthogonal thereto and that moves the electrodes of the electronic component to a position facing the electrodes of the support base; a pressurizing part that contacts and presses the electrode of the support base; a suction end that is attached to the pressurizing means and has a vacuum suction hole formed at a position facing the surface of the support base; A gripping device for an electronic component, comprising a gripping means that is movable relative to the surface of the support base in a direction perpendicular to the surface of the support base.
JP2056835A 1990-03-07 1990-03-07 Holding device for electronic component Pending JPH03257842A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2056835A JPH03257842A (en) 1990-03-07 1990-03-07 Holding device for electronic component

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2056835A JPH03257842A (en) 1990-03-07 1990-03-07 Holding device for electronic component

Publications (1)

Publication Number Publication Date
JPH03257842A true JPH03257842A (en) 1991-11-18

Family

ID=13038450

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2056835A Pending JPH03257842A (en) 1990-03-07 1990-03-07 Holding device for electronic component

Country Status (1)

Country Link
JP (1) JPH03257842A (en)

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