JPH03227115A - Semiconductor integrated circuit - Google Patents

Semiconductor integrated circuit

Info

Publication number
JPH03227115A
JPH03227115A JP2023513A JP2351390A JPH03227115A JP H03227115 A JPH03227115 A JP H03227115A JP 2023513 A JP2023513 A JP 2023513A JP 2351390 A JP2351390 A JP 2351390A JP H03227115 A JPH03227115 A JP H03227115A
Authority
JP
Japan
Prior art keywords
input
voltage
constant current
transistor
circuit
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2023513A
Other languages
Japanese (ja)
Inventor
Makoto Kudo
誠 工藤
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NEC IC Microcomputer Systems Co Ltd
Original Assignee
NEC IC Microcomputer Systems Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by NEC IC Microcomputer Systems Co Ltd filed Critical NEC IC Microcomputer Systems Co Ltd
Priority to JP2023513A priority Critical patent/JPH03227115A/en
Publication of JPH03227115A publication Critical patent/JPH03227115A/en
Pending legal-status Critical Current

Links

Abstract

PURPOSE:To prevent an inverted input voltage from being fluctuated even when a power voltage is fluctuated by providing a depletion transistor(TR) as a constant current element in series with a MOS TR whose gate receives an input signal. CONSTITUTION:A depletion MOS TR TD1 in series connection with an N-channel MOS TR TN1 acts as a constant current element. Then the inversion of an input signal A is decided by the inversion of a 1st stage NOR gate and the constant current characteristic is realized by using the TR TD1 connected to an output of the NOR gate as a load and the input inverted voltage is almost independent of a power voltage. That is, a constant current resistor, especially a depletion TR is provided on the input 1st stage circuit of the signal input circuit to avoid a power voltage dependency and the degradation in the characteristic of the input inverting voltage due to the noise of power supply or ground at a low or a high power supply voltage is prevented.

Description

【発明の詳細な説明】 〔産業上の利用分野〕 本発明は半導体集積回路に関し、特にCMOS型トラン
ジスタで構成される信号入力回路に関する。
DETAILED DESCRIPTION OF THE INVENTION [Field of Industrial Application] The present invention relates to a semiconductor integrated circuit, and particularly to a signal input circuit composed of CMOS type transistors.

〔従来の技術〕[Conventional technology]

従来のCMO8型半導体集積回路の信号入力回路は、第
10図に示すように、PchトランジスタとN c h
 トランジスタとが完全相補型に構成されていた。
As shown in FIG. 10, the signal input circuit of a conventional CMO8 type semiconductor integrated circuit includes a Pch transistor and an Nch transistor.
The transistors were constructed in a completely complementary manner.

第10図において、本信号入力回路は、入力信号A′を
ゲート入力とするPチャネル、NチャネルMO8トラン
ジスタTP2 1 TNI’ と、トランジスタT’N
+’に並列接続したNチャネルMO8トランジスタ’r
N2’ と、トランジスタTP2’ と、直列接続され
たT、1′ と、出力段のP、Nチャネルトランジスタ
TP3’ 、 T、+、3’ とを有する。節点P′は
、トランジスタT、!’ 、 TN、’のゲートと、ト
ランジスタTP2’ 、 TNI’の共通接続点とに、
接続される。
In FIG. 10, this signal input circuit includes a P-channel, N-channel MO8 transistor TP2 1 TNI' whose gate input is an input signal A', and a transistor T'N
N-channel MO8 transistor 'r connected in parallel to +'
N2', transistor TP2', T,1' connected in series, and output stage P and N channel transistors TP3', T,+,3'. Node P' is connected to transistor T,! At the gates of ', TN,' and the common connection point of transistors TP2' and TNI',
Connected.

〔発明が解決しようとする課題〕[Problem to be solved by the invention]

前述した従来の信号入力回路は、第11図に示すように
、入力反転電圧が電源電圧に依存するため、電源電圧の
高いところや低いところで、入力電圧規格に対する動作
余裕が小さくなり、バッファ等で発生した電源、グラン
ドの雑音(ノイズ)の影響を受けて、入力反転電圧が悪
化するという欠点がある。
As shown in Figure 11, in the conventional signal input circuit described above, the input inversion voltage depends on the power supply voltage, so the operating margin with respect to the input voltage standard becomes small at high or low power supply voltages, and buffers etc. The disadvantage is that the input inversion voltage deteriorates due to the influence of generated power supply and ground noise.

第12図は第10図に示す従来の入力初段の入出力電圧
特性図であるが、入力電圧の反転レベルが電源電圧に大
きく依存する。
FIG. 12 is an input/output voltage characteristic diagram of the conventional input first stage shown in FIG. 10, and the inversion level of the input voltage largely depends on the power supply voltage.

本発明の目的は、前記欠点が解決され、電源1圧が変動
しても、入力反転電圧が変動しないよそにした半導体集
積回路を提供することにある。
SUMMARY OF THE INVENTION An object of the present invention is to provide a semiconductor integrated circuit in which the above-mentioned drawbacks are solved and the input inversion voltage does not change even if the power supply voltage changes.

〔課題を解決するための手段〕[Means to solve the problem]

本発明の半導体集積回路の構成は、入力信号カケートに
印加されるMOSトランジスタと直列eS定電流素子が
設けられていることを特徴とする。
The structure of the semiconductor integrated circuit of the present invention is characterized in that an eS constant current element is provided in series with a MOS transistor applied to an input signal chain.

〔実施例〕〔Example〕

次に本発明について図面を参照して説明する。 Next, the present invention will be explained with reference to the drawings.

第1図は本発明の第1の実施例の半導体集積E路の回路
図である。第2図は第1図の回路の入力反転電圧の電源
電圧依存性を示す特性図である。
FIG. 1 is a circuit diagram of a semiconductor integrated circuit E according to a first embodiment of the present invention. FIG. 2 is a characteristic diagram showing the dependence of the input inversion voltage of the circuit of FIG. 1 on the power supply voltage.

第3図は第1図の回路の入力初段の入出力電圧生性を示
す特性図である。第1図において、本実が例の半導体集
積回路は、入力電圧Aがゲートに1加されるNチャネル
MOSトランジスタTN1と、これに並列接続されたN
チャネルMOSトランうスタTS、2と、トランジスタ
T h’+に直列接続され人PチャネルMO8)ランシ
スタTPI、テプレッション型MO8,トランジスタT
DIと、共通接続点から出力信号Bを出力するP、Nチ
ャネルMOSトランジスタTP31 TN3とを備えて
いる。トランジスタTPI、 TN2のゲートは接続さ
れ、トランジスタTotのゲートは接点Pに接続され、
トランジスタTP3+ TN3のり−トも接点Pに接続
されている。ここで、トランジスタT’D+は、定電流
素子として働く。入力信号Aは初段NORゲートの反転
によって、入力反転電圧が決定されるが、ゲートをNO
Rゲートの出力に接続したデプレッショントランジスタ
TD1を負荷として使用することで、定電流特性を示し
、第2図に示すように入力反転電圧は電源電圧にほとん
ど依存しない。
FIG. 3 is a characteristic diagram showing the input/output voltage characteristics of the first input stage of the circuit of FIG. 1. In FIG. 1, the semiconductor integrated circuit of this example includes an N-channel MOS transistor TN1 to which an input voltage A is added to the gate, and an N-channel MOS transistor TN1 connected in parallel to this.
Channel MOS transistor TS, 2 and transistor T h'+ are connected in series to P channel MO8) transistor TPI, depression type MO8, transistor T
DI, and P and N channel MOS transistors TP31 to TN3 that output an output signal B from a common connection point. The gates of transistors TPI and TN2 are connected, the gate of transistor Tot is connected to contact P,
The transistor TP3+TN3 gate is also connected to the contact P. Here, transistor T'D+ functions as a constant current element. The input inversion voltage of the input signal A is determined by the inversion of the first stage NOR gate.
By using the depletion transistor TD1 connected to the output of the R gate as a load, constant current characteristics are exhibited, and as shown in FIG. 2, the input inversion voltage hardly depends on the power supply voltage.

第3図に示すように、入力初段の入力電圧Aの反転レベ
ルは、電源電圧の大、中、小によって、あまり変動する
ことがない。
As shown in FIG. 3, the inversion level of the input voltage A at the first input stage does not vary much depending on whether the power supply voltage is high, medium, or low.

第4図は本発明の第2の実施例の半導体集積回路を示す
回路図である。第4図において、本実施例の半導体集積
回路は、MOSトランジスタTI 、rom、 T 2
の直列体からなるインバータと、図示されていないが第
1図のトランジスタT、3゜TN3とを備えている。以
下の実施例において、すべてこの部分が省略されている
。ここで、トランジスタT Diは、デプレッション型
である。
FIG. 4 is a circuit diagram showing a semiconductor integrated circuit according to a second embodiment of the present invention. In FIG. 4, the semiconductor integrated circuit of this embodiment includes MOS transistors TI, ROM, and T2.
Although not shown, the transistor T and 3° TN3 shown in FIG. 1 are provided. In the following examples, this part is omitted. Here, the transistor TDi is a depression type.

第5図は本発明の第3の実施例の回路図でありデプレッ
ション型のMOSトランジスタT’b+とMOSトラン
ジスタTI、T2との直列体からなるインバータを備え
ている。
FIG. 5 is a circuit diagram of a third embodiment of the present invention, which includes an inverter consisting of a depletion type MOS transistor T'b+ and MOS transistors TI and T2 connected in series.

第6図は本発明の第4の実施例の回路図でありデプレッ
ション型のMOSトランジスタTDIと、MOSトラン
ジスタT1〜T4とからなる2NANDゲートを備えて
いる。
FIG. 6 is a circuit diagram of a fourth embodiment of the present invention, which includes a 2NAND gate consisting of a depression type MOS transistor TDI and MOS transistors T1 to T4.

第7図は本発明の第5の実施例の回路図でありデプレッ
ション型のMOSトランジスタT。1と、MOSトラン
ジスタT1〜T4とからなる2NANDゲートを備えて
いる。
FIG. 7 is a circuit diagram of a fifth embodiment of the present invention, which is a depression type MOS transistor T. 1 and 2NAND gates consisting of MOS transistors T1 to T4.

第8図は本発明の第6の実施例の回路図でありデプレッ
ション型のMOSトランジスタT。1とMOSトランジ
スタT1〜T4とからなる2NORゲートを備えている
FIG. 8 is a circuit diagram of a sixth embodiment of the present invention, which is a depression type MOS transistor T. 1 and 2NOR gates consisting of MOS transistors T1 to T4.

第9図は本発明の第7の実施例の回路図であり、テ′プ
レッション型のMOSトランジスタTD1.MO8)ラ
ンシスタT1〜T4からなる2NORゲートを備えてい
る。
FIG. 9 is a circuit diagram of a seventh embodiment of the present invention, which includes depression type MOS transistors TD1. MO8) Equipped with a 2NOR gate consisting of run transistors T1 to T4.

〔発明の効果〕〔Effect of the invention〕

以上に説明したように、本発明は信号入力回路の入力初
段回路に定電流抵抗、特にデプレッション・トランジス
タを持つことで、電源電圧依存性がなくなり、さらに電
源電圧の高いところ、低いところで電源グランドの雑音
(ノイズ)による入力反転電圧の特性悪化を防ぐという
効果がある。
As explained above, the present invention has a constant current resistor, especially a depletion transistor, in the input first stage circuit of the signal input circuit, thereby eliminating power supply voltage dependence, and furthermore, the power supply ground is connected to high and low power supply voltages. This has the effect of preventing deterioration of the characteristics of the input inversion voltage due to noise.

【図面の簡単な説明】[Brief explanation of drawings]

第1図は本発明の第1の実施例の半導体集積回路を示す
回路図、第2図は第1図の回路の入力反転電圧、電源電
圧依存性を示す特性図、第3図は第1図の回路の入力反
転レベルを示す特性図、第4図乃至第9図は本発明のそ
れぞれ第2乃至第7の実施例の半導体集積回路を示す回
路図、第10図は従来回路を示す回路図、第11図、第
12図はいずれも第10図の特性図である。 A、A’・・・・・・入力信号、B、B’・・・・・・
出力信号、TNII TM01 TM31 TNI  
r Tl  r TN3  ・・・・・・Nチャネルエ
ンハンスメントMOSトランジスタ、TPI・TP2・
TPI  ・TP2  ・T’p3  °−−−−−P
チャネルエンハンスメン)MOSトランジスタ、TDI
・・・・・・NチャネルテフレッンヨンMO8トランジ
スタ、P、P’・・・・・・回路中の接点、Tl、・・
T4・・・・・・MOSトランジスタ。
FIG. 1 is a circuit diagram showing a semiconductor integrated circuit according to a first embodiment of the present invention, FIG. 2 is a characteristic diagram showing the input inversion voltage and power supply voltage dependence of the circuit in FIG. 1, and FIG. 4 to 9 are circuit diagrams showing semiconductor integrated circuits according to second to seventh embodiments of the present invention, respectively, and FIG. 10 is a circuit showing a conventional circuit. 11 and 12 are all characteristic diagrams of FIG. 10. A, A'... Input signal, B, B'...
Output signal, TNII TM01 TM31 TNI
r Tl r TN3 ・・・・・・N-channel enhancement MOS transistor, TPI・TP2・
TPI ・TP2 ・T'p3 °------P
channel enhancer) MOS transistor, TDI
...N-channel Teflon MO8 transistor, P, P'...Contact in circuit, Tl,...
T4...MOS transistor.

Claims (1)

【特許請求の範囲】[Claims] 入力信号がゲートに印加されるMOSトランジスタと直
列に定電流素子が設けられていることを特徴とする半導
体集積回路。
A semiconductor integrated circuit characterized in that a constant current element is provided in series with a MOS transistor to which an input signal is applied to the gate.
JP2023513A 1990-01-31 1990-01-31 Semiconductor integrated circuit Pending JPH03227115A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2023513A JPH03227115A (en) 1990-01-31 1990-01-31 Semiconductor integrated circuit

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2023513A JPH03227115A (en) 1990-01-31 1990-01-31 Semiconductor integrated circuit

Publications (1)

Publication Number Publication Date
JPH03227115A true JPH03227115A (en) 1991-10-08

Family

ID=12112532

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2023513A Pending JPH03227115A (en) 1990-01-31 1990-01-31 Semiconductor integrated circuit

Country Status (1)

Country Link
JP (1) JPH03227115A (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2008072197A (en) * 2006-09-12 2008-03-27 Renesas Technology Corp Semiconductor integrated circuit device
CN110032827A (en) * 2019-04-30 2019-07-19 清华大学 Current elements 3-d inversion method based on algebra elastic network(s) regularization method

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2008072197A (en) * 2006-09-12 2008-03-27 Renesas Technology Corp Semiconductor integrated circuit device
CN110032827A (en) * 2019-04-30 2019-07-19 清华大学 Current elements 3-d inversion method based on algebra elastic network(s) regularization method
CN110032827B (en) * 2019-04-30 2020-12-18 清华大学 Current element three-dimensional inversion method based on algebraic elastic network regularization method

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