JPH03224179A - Calibrating system for medium defect detector - Google Patents

Calibrating system for medium defect detector

Info

Publication number
JPH03224179A
JPH03224179A JP1976290A JP1976290A JPH03224179A JP H03224179 A JPH03224179 A JP H03224179A JP 1976290 A JP1976290 A JP 1976290A JP 1976290 A JP1976290 A JP 1976290A JP H03224179 A JPH03224179 A JP H03224179A
Authority
JP
Japan
Prior art keywords
medium
signal
defect
waveform
defect detection
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP1976290A
Other languages
Japanese (ja)
Inventor
Masayoshi Murakami
政義 村上
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NEC Corp
Original Assignee
NEC Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by NEC Corp filed Critical NEC Corp
Priority to JP1976290A priority Critical patent/JPH03224179A/en
Publication of JPH03224179A publication Critical patent/JPH03224179A/en
Pending legal-status Critical Current

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Abstract

PURPOSE:To perform calibration with a high precision by using a reference defect waveform signal generated by a waveform generator. CONSTITUTION:A waveform generator 2 sends a reference defect waveform signal 11 to a medium defect detector 5, and a controller 1 sends an output control signal 10 to the waveform generator 2 to control the signal output of the waveform generator 2 and sets a defect detection slice level 12 to the medium defect detector 3. The medium defect detector 3 checks a recording medium based on the defect detection slice level 12, and a defect detection signal 13 is sent to a controller 1 if a defect part is detected. The controller 1 calculates the probability that the medium defect detector 3 detects the reference defect waveform signal 11 as a defect waveform signal. Thus, calibration of high precision is performed.

Description

【発明の詳細な説明】 〔産業上の利用分野〕 本発明は媒体欠陥検出装置の校正方式に関し、特に記録
媒体の欠陥部からの読み出し信号を再生できる波形発生
器を用いた媒体欠陥検出装置の校正方式に関する。
[Detailed Description of the Invention] [Industrial Application Field] The present invention relates to a method for calibrating a medium defect detection device, and in particular to a method for calibrating a medium defect detection device using a waveform generator capable of reproducing a read signal from a defective portion of a recording medium. Regarding calibration methods.

〔従来の技術〕[Conventional technology]

従来、この種の媒体欠陥検出装置の校正方式では、校正
の基準となる基準欠陥波形として、記憶装置に搭載され
た記録媒体の欠陥部の読み出し波形を使用していた。
Conventionally, in a calibration method for this type of medium defect detection device, a readout waveform of a defective portion of a recording medium mounted in a storage device has been used as a reference defect waveform serving as a reference for calibration.

〔発明が解決しようとする課題〕[Problem to be solved by the invention]

上述した従来の媒体欠陥検出装置の校正方式は、記録媒
体から基準欠陥波形を読み出す度に波形の形状は多少異
なり、また、再書き込みを行った場合、書き込みのタイ
ミングのずれにより、全く同じ形状の波形が読み出され
ることは稀であるため、校正のための基準波形の再現性
が低く精度の高い校正を行うには無理があるという欠点
がある。
In the calibration method of the conventional medium defect detection device described above, the shape of the waveform differs slightly each time the reference defect waveform is read from the recording medium, and when rewriting is performed, due to the timing shift of writing, the shape of the waveform may be slightly different. Since the waveform is rarely read out, the reproducibility of the reference waveform for calibration is low, making it difficult to perform highly accurate calibration.

〔課題を解決するための手段〕[Means to solve the problem]

本発明は、記録媒体に情報を記録すると共にその情報を
読み出して前記記録媒体の欠陥を検出する媒体欠陥検出
装置の校正方式において、前記制御装置は波形発生器に
対して信号出力の大きさを指示し、且つ、媒体欠陥検出
装置に対して欠陥検出スライスレベルを指示し、前記波
形発生器は前記記録媒体の媒体欠陥部の読み出し信号波
形と同等な波形を有する信号を生成して送出し、前記記
録媒体を搭載した前記媒体欠陥検出装置は前記信号を書
き込んだ後、読み出しを行い、前記記録媒体の媒体欠陥
部が検出されると前記制御装置に対して欠陥検出信号を
送出することを特徴とする。
The present invention provides a calibration method for a medium defect detection device that records information on a recording medium and reads the information to detect defects in the recording medium, in which the control device controls the magnitude of a signal output to a waveform generator. and instructs a defect detection slice level to a medium defect detection device, and the waveform generator generates and sends out a signal having a waveform equivalent to a read signal waveform of a medium defect portion of the recording medium; The medium defect detection device equipped with the recording medium writes and reads the signal, and when a medium defect portion of the recording medium is detected, sends a defect detection signal to the control device. shall be.

〔実施例〕〔Example〕

次に、本発明について図面を参照して説明する。 Next, the present invention will be explained with reference to the drawings.

第1図は本発明の媒体欠陥検出装置の校正方式を実現す
るための基本構成図である。第1図において、基本構成
は制御装置1.波形発生器2及び媒体欠陥検出装置3よ
りなり、制御装置1は信号線で波形発生器2.媒体欠陥
検出装置3とそれぞれ接続され、波形発生器2は信号線
で媒体欠陥検出装置3接続されている。まず波形発生器
2は被校正装置である媒体欠陥検出装置3に対して基準
欠陥波形信号11を送出する。この基準欠陥波形信号1
1は実際の媒体欠陥部の読み出し波形と同等な波形を有
する信号を生成するものであって、例えば、D/Aコン
バータを用いてディジタル的に生成される。また、この
とき制御装置1は波形発生器2に対して出力制御信号1
θを送出し、波形発生器2の信号出力を制御すると共に
媒体欠陥検出装置3に対して欠陥検出スライスレベル1
2の設定を行う。媒体欠陥検出装置3はこの欠陥検出ス
ライスレベル12に基いて記憶媒体の検査を行い、欠陥
部が検出されると制御装置1へ欠陥検出信号13を送出
する。また、制御装置1は波形発生器2が媒体欠陥検出
装置3に対して任意の基準欠陥波形信号11を出力する
ように出力制御信号10を送出すると共に媒体欠陥検出
装置3から送出される欠陥検出信号13を感知するこに
より、媒体欠陥検出装置3が基準欠陥波形信号11をど
のような確率で欠陥波形信号として検出したかを演算す
ることができる。よって、この演算結果を基にして媒体
欠陥検出装置3の欠陥検出レベルを校正することができ
る。
FIG. 1 is a basic configuration diagram for realizing a calibration method for a medium defect detection apparatus according to the present invention. In FIG. 1, the basic configuration is a control device 1. It consists of a waveform generator 2 and a medium defect detection device 3, and the control device 1 connects the waveform generator 2. The waveform generator 2 is connected to the medium defect detection device 3 through a signal line. First, the waveform generator 2 sends a reference defect waveform signal 11 to the medium defect detection device 3, which is a device to be calibrated. This reference defect waveform signal 1
1 generates a signal having a waveform equivalent to the read waveform of an actual medium defective portion, and is generated digitally using, for example, a D/A converter. Also, at this time, the control device 1 sends an output control signal 1 to the waveform generator 2.
θ is sent to control the signal output of the waveform generator 2, and the defect detection slice level 1 is sent to the medium defect detection device 3.
Perform the settings in step 2. The medium defect detection device 3 inspects the storage medium based on this defect detection slice level 12, and sends a defect detection signal 13 to the control device 1 when a defective portion is detected. Further, the control device 1 sends an output control signal 10 so that the waveform generator 2 outputs an arbitrary reference defect waveform signal 11 to the medium defect detection device 3, and also detects defects sent from the medium defect detection device 3. By sensing the signal 13, it is possible to calculate with what probability the medium defect detection device 3 detects the reference defect waveform signal 11 as a defective waveform signal. Therefore, the defect detection level of the medium defect detection device 3 can be calibrated based on this calculation result.

〔発明の効果〕〔Effect of the invention〕

以上説明したように、本発明の媒体欠陥検出装置の校正
方式によれば、波形発生器の発生する基準欠陥波形信号
を用いることによって、再現性の高い基準波形が得られ
、精度の高い校正を行うことができるという効果がある
As explained above, according to the calibration method of the medium defect detection device of the present invention, by using the reference defect waveform signal generated by the waveform generator, a highly reproducible reference waveform can be obtained and highly accurate calibration can be performed. The effect is that it can be done.

【図面の簡単な説明】[Brief explanation of drawings]

第1図は本発明の媒体欠陥検出装置の校正方式を実現す
るための基本構成図である。 1・・・制御装置、2・・・波形発生器、3・・・媒体
欠陥検出装置、lO・・・出力制御信号、11・・・基
準欠陥波形信号、12・・・欠陥検出スライスレベル、
13・・・欠陥検出信号。
FIG. 1 is a basic configuration diagram for realizing a calibration method for a medium defect detection apparatus according to the present invention. DESCRIPTION OF SYMBOLS 1... Control device, 2... Waveform generator, 3... Medium defect detection device, IO... Output control signal, 11... Reference defect waveform signal, 12... Defect detection slice level,
13...Defect detection signal.

Claims (1)

【特許請求の範囲】[Claims] 記録媒体に情報を記録すると共にその情報を読み出して
前記記録媒体の欠陥を検出する媒体欠陥検出装置の校正
方式において、前記制御装置は波形発生器に対して信号
出力の大きさを指示し、且つ、媒体欠陥検出装置に対し
て欠陥検出スライスレベルを指示し、前記波形発生器は
前記記録媒体の媒体欠陥部の読み出し信号波形と同等な
波形を有する信号を生成して送出し、前記記録媒体を搭
載した前記媒体欠陥検出装置は前記信号を書き込んだ後
、読み出しを行い、前記記録媒体の媒体欠陥部が検出さ
れると前記制御装置に対して欠陥検出信号を送出するこ
とを特徴とする媒体欠陥検出装置の校正方式。
In a calibration method for a medium defect detection device that records information on a recording medium and reads the information to detect defects in the recording medium, the control device instructs a waveform generator to output a signal, and , instructs a defect detection slice level to a medium defect detection device, and the waveform generator generates and sends a signal having a waveform equivalent to a read signal waveform of a medium defect portion of the recording medium, and The medium defect detection device mounted therein reads the signal after writing it, and sends a defect detection signal to the control device when a medium defect portion of the recording medium is detected. Calibration method for detection equipment.
JP1976290A 1990-01-29 1990-01-29 Calibrating system for medium defect detector Pending JPH03224179A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP1976290A JPH03224179A (en) 1990-01-29 1990-01-29 Calibrating system for medium defect detector

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP1976290A JPH03224179A (en) 1990-01-29 1990-01-29 Calibrating system for medium defect detector

Publications (1)

Publication Number Publication Date
JPH03224179A true JPH03224179A (en) 1991-10-03

Family

ID=12008351

Family Applications (1)

Application Number Title Priority Date Filing Date
JP1976290A Pending JPH03224179A (en) 1990-01-29 1990-01-29 Calibrating system for medium defect detector

Country Status (1)

Country Link
JP (1) JPH03224179A (en)

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