JPH03220405A - Inspecting apparatus of film point of black matrix - Google Patents

Inspecting apparatus of film point of black matrix

Info

Publication number
JPH03220405A
JPH03220405A JP1520090A JP1520090A JPH03220405A JP H03220405 A JPH03220405 A JP H03220405A JP 1520090 A JP1520090 A JP 1520090A JP 1520090 A JP1520090 A JP 1520090A JP H03220405 A JPH03220405 A JP H03220405A
Authority
JP
Japan
Prior art keywords
black matrix
output
film
light
scanning
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP1520090A
Other languages
Japanese (ja)
Inventor
Masayuki Yojima
與島 政幸
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NEC Corp
Original Assignee
NEC Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by NEC Corp filed Critical NEC Corp
Priority to JP1520090A priority Critical patent/JPH03220405A/en
Publication of JPH03220405A publication Critical patent/JPH03220405A/en
Pending legal-status Critical Current

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  • Formation Of Various Coating Films On Cathode Ray Tubes And Lamps (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Manufacture Of Electron Tubes, Discharge Lamp Vessels, Lead-In Wires, And The Like (AREA)

Abstract

PURPOSE:To enable application of an apparatus to a hole-shaped black matrix by providing a convergent lens, a main scanning mechanism, a subordinate scanning mechanism, a condenser lens, a light-sensing element, a positional slippage detection processing device, an AO deflector, a film point detection processing device, etc. CONSTITUTION:A convergent lens 3 converges a laser light 16 on the inner surface of a black matrix film 14 so that a beam diameter be a little larger than the diameter of a film point 15. A main scanning mechanism 4 scans the laser light 16 in the main scanning direction 17 being the direction of arrangement of the film points 15, while a subordinate scanning mechanism 5 changes the scanning position to the subordinate scanning direction 18 which is perpendicular to the direction 17. An AO deflector 2 vibrates the laser light 16 minutely in the direction 18 and conducts minute positional correction in the direction 18. A Fresnel lens 13 condenses a light passing the film point 15 and a light-sensing element 7 detects an optical output of the passing light. A positional slippage detection processing device 8 samples and holds an output of the element 7 synchronously with the frequency of minute vibrations, average the output thereof by a filter and detects a positional slippage in the direction 18. A film point detection processing device 9 turns the output of the element 7 into ternary codes by two reference voltages and has a counter circuit which counts the number of output pulses thereof.

Description

【発明の詳細な説明】 〔産業上の利用分野〕 本発明はブラックマトリックス膜点検査装置、特にカラ
ーブラウン管に用いられるブラックマトリックスの蛍光
体を塗布する前の膜点の穴径を検査するためのブラック
マトリックス膜点検査装置に関する。
[Detailed Description of the Invention] [Field of Industrial Application] The present invention is a black matrix film spot inspection device, particularly for inspecting the hole diameter of a black matrix film spot used in a color cathode ray tube before coating with phosphor. The present invention relates to a black matrix film spot inspection device.

〔従来の技術〕[Conventional technology]

従来の技術としては、例えば収束したレーザ光走査によ
るブラウン管のブラックマトリックス寸法検査装置があ
る。従来のブラウン管のブラックマトリックス寸法検査
装置は、レーザ光と、レーザ光をブラウン管のブラック
マトリックスに黒色物質を塗布した膜面上でブラックガ
ートバンドの幅とほぼ同じビーム径に収束する収束レン
ズと、収束したレーザ光をブラウン管のブラックマトリ
ックスの配列方向に走査する主走査機構と、この主走査
機構と直角方向にレーザ光の走査位置を変える副走査機
構と、ブラウン管のブラックマトリックスを透過した透
過光の出力を均一化する拡散板と、この拡散板の透過光
出力を受光する受光器と、この受光器の出力を基準電圧
で2値化し、ブラックマトリックスオープニング(以下
ストライプと称す)に相当するパルス幅の時間からスト
ライプ寸法を求める信号処理部と、この信号処理部の出
力からブラウン管のブラックマトリックスの合否判定を
行う合否判定処理部とにより構成される。
As a conventional technique, for example, there is an apparatus for inspecting the black matrix size of a cathode ray tube using focused laser beam scanning. Conventional cathode ray tube black matrix dimension inspection equipment consists of a laser beam, a converging lens that converges the laser beam onto the surface of the cathode ray tube's black matrix coated with a black material, and a converging lens that converges the laser beam to a beam diameter that is approximately the same as the width of the black guard band. A main scanning mechanism that scans the laser beam in the direction of arrangement of the black matrix of the cathode ray tube, a sub-scanning mechanism that changes the scanning position of the laser beam in a direction perpendicular to this main scanning mechanism, and an output of the transmitted light that has passed through the black matrix of the cathode ray tube. A diffuser plate that equalizes the light intensity, a light receiver that receives the transmitted light output of the diffuser plate, and a light receiver that binarizes the output of this light receiver using a reference voltage and generates a pulse width corresponding to the black matrix opening (hereinafter referred to as a stripe). It is composed of a signal processing section that calculates the stripe size from time, and a pass/fail judgment processing section that judges whether the black matrix of the cathode ray tube is pass/fail based on the output of the signal processing section.

次に従来のブラウン管のブラックマトリックス寸法検査
装置について図面を参照して詳細に説明する。第6図は
従来のブラウン管のブラックマトリックス寸法検査装置
の構成原理図で、レーザ26と、収束レンズ27と、レ
ーザ光をブラックマトリックス35を走査させる走査機
構28と、ブラックマトリックス35からの透過光を均
一化する拡散板30と、透過光出力を受光する受光器3
1と、受光器31からの出力によりブラックマトリック
ス35の寸法形状を求める信号処理部32と、信号処理
部32からの出力により合否判定を行う合否判定部33
と、主走査機構28を制御する制御部34とにより構成
される。
Next, a conventional cathode ray tube black matrix dimension inspection apparatus will be described in detail with reference to the drawings. FIG. 6 is a diagram showing the basic structure of a conventional cathode ray tube black matrix dimension inspection device, which includes a laser 26, a converging lens 27, a scanning mechanism 28 that scans the black matrix 35 with laser light, and a scanning mechanism 28 that scans the transmitted light from the black matrix 35. A diffuser plate 30 for uniformization and a light receiver 3 for receiving transmitted light output
1, a signal processing unit 32 that determines the dimensions and shape of the black matrix 35 based on the output from the light receiver 31, and a pass/fail judgment unit 33 that makes a pass/fail judgment based on the output from the signal processing unit 32.
and a control section 34 that controls the main scanning mechanism 28.

第7図は縞状のブラックマトリックスの平面図、第8図
は第6図のブラックマトリックス検査装置の検査方法を
説明するための原理図である。ブラックガートバンド3
9とほぼ同じ径のレーザビームを第7図に示すブラック
マトリックス35の主走査方向36に走査し、受光器3
1の出力を基準電圧40で2値化して、ストライプ38
に対応するパルス波形の時間からストライプの寸法検査
を行う。
FIG. 7 is a plan view of a striped black matrix, and FIG. 8 is a principle diagram for explaining the inspection method of the black matrix inspection apparatus of FIG. 6. black guard band 3
9 is scanned in the main scanning direction 36 of the black matrix 35 shown in FIG.
The output of 1 is binarized with a reference voltage of 40, and a stripe of 38
The stripe dimension is inspected from the time of the pulse waveform corresponding to .

〔発明が解決しようとする課題〕[Problem to be solved by the invention]

上述した従来のブラウン管のブラックマトリックス寸法
検査装置は、対象ブラックマトリックスの形状が縞状で
あるため、ストライプと直交する方向である主走査方向
にレーザ光を走査し、ストライプ幅を求める際に主走査
方向と直交する方向である副走査方向については、走査
位置の安定性のみが問題であるが、鎖点形状のブラック
マトリックスの場合はレーザ光を鎖点上で走査させる必
要があり、副走査方向における位置決めが問題となり、
副走査方向における位置ずれ検出機構および位置補正機
構のない従来のブラウン管のブラックマトリックス寸法
検査装置は、鎖点形状のブラックマトリックスの穴径検
査には適用が困難であるという欠点がある。
In the conventional cathode ray tube black matrix dimension inspection device described above, since the target black matrix has a striped shape, the laser beam is scanned in the main scanning direction, which is a direction perpendicular to the stripes, and the main scanning direction is used to determine the stripe width. In the sub-scanning direction, which is perpendicular to the sub-scanning direction, only the stability of the scanning position is a problem, but in the case of a black matrix with a chain point shape, it is necessary to scan the laser beam on the chain points, and in the sub-scanning direction Positioning becomes a problem,
A conventional cathode ray tube black matrix dimension inspection device without a positional deviation detection mechanism and a position correction mechanism in the sub-scanning direction has a drawback in that it is difficult to apply to inspecting the hole diameter of a dot-shaped black matrix.

〔課題を解決するための手段〕[Means to solve the problem]

本発明のブラウン管鎖点検査装置は、レーザと、このレ
ーザからのレーザ光をブラックマトリックスの膜内面上
で鎖点径よりやや大きいビーム径に収束する収束レンズ
と、レーザ光をブラックマトリックスの鎖点の配列方向
に走査する主走査機構と、この主走査機構による走査方
向と直角方向の副走査方向にレーザ光の走査位置を変え
る副走査機構と、レーザ光を副走査方向に微小振動させ
るウオブリング機構と、ブラックマトリックスの鎖点を
通過した通過光を集光する集光レンズと、この集光レン
ズにより集光された通過光の光出力を検出する受光素子
と、この受光素子の出力を前記ウオブリング機構による
微小振動の周波数に同期してサンプルホールドし、この
サンプルホールドの出力をフィルタにより平均化して走
査レーザ光の副走査方向の位置ずれを検出する位置ずれ
検出処理部と、この位置ずれ検出処理部からの出力によ
り副走査方向の走査レーザ光の位置補正を行なう操作位
置微調機構と、前記受光素子の出力を二つの基準値で3
値化したパルスの数を計数するカウンタを有する鎖点検
出処理部とを含むことにより構成される。
The cathode ray tube chain point inspection device of the present invention includes a laser, a converging lens that converges the laser beam from the laser to a beam diameter slightly larger than the chain point diameter on the inner surface of the film of the black matrix, and a main scanning mechanism that scans in the array direction of the main scanning mechanism, a sub-scanning mechanism that changes the scanning position of the laser beam in the sub-scanning direction perpendicular to the scanning direction of the main scanning mechanism, and a wobbling mechanism that makes the laser beam minutely vibrate in the sub-scanning direction. a condensing lens that condenses the passing light that has passed through the chain points of the black matrix; a light receiving element that detects the optical output of the passing light that has been condensed by the condensing lens; A positional deviation detection processing unit that samples and holds the sample in synchronization with the frequency of minute vibrations caused by the mechanism, averages the output of this sample and hold using a filter, and detects positional deviation in the sub-scanning direction of the scanning laser beam, and this positional deviation detection processing. an operation position fine adjustment mechanism that corrects the position of the scanning laser beam in the sub-scanning direction based on the output from the section;
and a chain point detection processing section having a counter for counting the number of pulses converted into values.

〔実施例〕〔Example〕

次に、本発明の実施例について図面を参照して説明する
Next, embodiments of the present invention will be described with reference to the drawings.

第1図は本発明の一実施例を示すブロック図、第2図は
第1図の構造の具体例を示す斜視図である。第1図の構
成を第2図を参照して説明を進めると、第1図はレーザ
1と、レーザ光16をブラックマトリックス14の膜内
面上で鎖点径よりやや大きめのビーム径に収束する収束
レンズ3と、収束するレーザ光16をブラックマトリッ
クス14の鎖点15の配列方向である主走査方向17に
走査するミラー駆動器12からなる主走査機構4と、主
走査方向17に直角向である副走査方向18にレーザ光
16の走査位置を変えるモータ11を含む副走査機構5
と、レーザ光16を副走査方向18に微小振動させ(以
下ウオブリングという)、且つ副走査方向18の微小位
置補正を行なうAO偏向器2と、ブラックマトリックス
14の鎖点15を通過した通過光を集光するフレネルレ
ンズ13と、集光された通過光の光出力を検出する受光
素子7と、受光素子7の出力をAO偏向器2のウオブリ
ング周波数に同期してサンプルホールドするサンプルホ
ールド回路、およびサンプルホールド回路の出力を平均
化するフィルタを有するレーザ光16の副走査方向18
に対する位置ずれ検出処理部8と、受光素子7の出力を
二つの基準電圧で3値化し、その出力パルス数を計数す
るカウンタ回路を有する成魚検出処理部9とにより構成
される。
FIG. 1 is a block diagram showing one embodiment of the present invention, and FIG. 2 is a perspective view showing a specific example of the structure of FIG. 1. The configuration of FIG. 1 will be explained with reference to FIG. 2. In FIG. 1, the laser 1 and the laser beam 16 are converged to a beam diameter slightly larger than the chain point diameter on the inner surface of the film of the black matrix 14. A main scanning mechanism 4 includes a converging lens 3, a mirror driver 12 that scans the converging laser beam 16 in a main scanning direction 17, which is the direction in which the chain points 15 of the black matrix 14 are arranged, and a main scanning mechanism 4 that is perpendicular to the main scanning direction 17. A sub-scanning mechanism 5 including a motor 11 that changes the scanning position of the laser beam 16 in a certain sub-scanning direction 18
and an AO deflector 2 that makes the laser beam 16 minutely vibrate in the sub-scanning direction 18 (hereinafter referred to as wobbling) and performs minute position correction in the sub-scanning direction 18, and the passing light that has passed through the chain points 15 of the black matrix 14. A Fresnel lens 13 that collects light, a light receiving element 7 that detects the optical output of the focused passing light, a sample hold circuit that samples and holds the output of the light receiving element 7 in synchronization with the wobbling frequency of the AO deflector 2, and A sub-scanning direction 18 of the laser beam 16 having a filter that averages the output of the sample and hold circuit.
and an adult fish detection processing section 9 having a counter circuit that converts the output of the light receiving element 7 into three values using two reference voltages and counts the number of output pulses.

次に、第1図および第2図の動作について説明を進める
と、第3図(a)、(b)および(c)は鎖点15に対
する収束されたレーザ光16の走査軌跡を示したもので
、第3図(a)は鎖点15の中心に対してレーザ光16
の中心走査位置19aが一致している場合、第3図(b
)は中心走査位置19bが鎖点15の中心に対して上側
にΔYだけずれた場合、第3図(C)は中心走査位置1
9cが鎖点15の中心に対して下側にΔYだけずれた場
合を示している。また第4図(a)。
Next, to proceed with the explanation of the operations shown in FIGS. 1 and 2, FIGS. 3(a), (b), and (c) show the scanning trajectory of the converged laser beam 16 with respect to the chain point 15. In FIG. 3(a), the laser beam 16 is directed to the center of the chain point 15.
If the center scanning positions 19a of
) is when the center scanning position 19b is shifted upward by ΔY with respect to the center of the chain point 15, and FIG. 3(C) is the center scanning position 1.
The case where 9c is shifted downward by ΔY with respect to the center of chain point 15 is shown. Also, FIG. 4(a).

(b)および(c)は第3図(a)、(b)および(C
)のそれぞれに対応した通過光出力をボしたものである
。ウオブリング周期を主走査方向17における鎖点15
の四つの走査時間に同期させ、ウオブリング周波数に同
期して第4図に示すように時刻TaおよびTbでサンプ
ルホールドすると、中心走査位置19aが上側にずれた
場合通過光出力はP2のように大きくなり、逆に下側に
ずれるとP3のように小さくなる。そこで通過出力を検
出し、フィルタを通して主走査方向17の一走査の平均
的な位置ずれを求め、この位置ずれ検出量によりAO偏
向器2の駆動電圧のオフセ、ソト量を調整することで、
副走査方向18の位置補正を行いながら主走査方向17
に安定してレーザ光16を走査できる。第5図(a)お
よび(b)はそれぞれ第4図(a)の通過光出力および
この出力を二つの基準値P4およびP5で3値化したパ
ルス出力波形の示す図で、鎖点15の寸法形状により各
鎖点15に対応する通過光出力が変化するので、許容寸
法公差に入っている鎖点15のみ計数することができる
(b) and (c) are shown in Figure 3 (a), (b) and (C).
) are the transmitted light outputs corresponding to each of them. The wobbling period is set at the chain point 15 in the main scanning direction 17.
When sample-holding is performed at times Ta and Tb in synchronization with the wobbling frequency as shown in FIG. On the other hand, if it shifts downward, it becomes smaller like P3. Therefore, the passing output is detected, the average positional deviation per scan in the main scanning direction 17 is determined through a filter, and the amount of offset and deviation of the drive voltage of the AO deflector 2 is adjusted based on the detected amount of positional deviation.
While performing position correction in the sub-scanning direction 18,
The laser beam 16 can be scanned stably. FIGS. 5(a) and 5(b) are diagrams showing the transmitted light output in FIG. 4(a) and the pulse output waveform obtained by converting this output into three values using two reference values P4 and P5, respectively. Since the transmitted light output corresponding to each chain point 15 changes depending on the size and shape, only the chain points 15 that fall within the allowable dimensional tolerance can be counted.

〔発明の効果〕〔Effect of the invention〕

本発明のブラックマトリックス成魚検査装置は、従来の
レーザ光走査による縞状のブラックマトリックス寸法検
査装置が主走査方向と直交する副走査方向の位置ずれ検
出手段およびその位置ずれ補正手段を有していないのに
対して、副走査方向に微小振動させ、副走査方向の位置
ずれ検出およびその補正を行なうことにより、穴状のブ
ラックマトリックスに対して適用できるという効果があ
る。
The black matrix adult fish inspection device of the present invention does not have the positional deviation detection means in the sub-scanning direction perpendicular to the main scanning direction and the positional deviation correction means, which the conventional striped black matrix size inspection device using laser beam scanning does not have. On the other hand, by performing minute vibrations in the sub-scanning direction to detect and correct positional deviations in the sub-scanning direction, there is an effect that it can be applied to hole-shaped black matrices.

【図面の簡単な説明】[Brief explanation of drawings]

第1図は本発明の一実施例のブロック図、第2図は第1
図の構造の具体例を示す斜視図、第3図、第4図および
第5図は第1図の動作を説明するための図、第6図は従
来のブラックマトリックス寸法検査装置の構成原理図、
第7図および第8図は第6図の動作を説明するための図
である。 1.26・・・レーザ、2・・・AO偏向器、3.27
・・・収束レンズ、4・・・主走査機構、5・・・副走
査機構、6・・・集光レンズ、7・・・受光器、8・・
・位置ずれ検出処理部、9・・・成魚検出処理部、10
.41・・・遮光板、11・・・モータ、12・・・ミ
ラー駆動器、13・・・フレネルレンズ、 1 4・・・ブラックマ ト リ ックス、 5・・・成魚、 6・・・レーザ光。
FIG. 1 is a block diagram of one embodiment of the present invention, and FIG. 2 is a block diagram of an embodiment of the present invention.
FIG. 3, FIG. 4, and FIG. 5 are diagrams for explaining the operation of FIG. 1. FIG. 6 is a diagram of the configuration principle of a conventional black matrix dimension inspection device. ,
7 and 8 are diagrams for explaining the operation of FIG. 6. 1.26... Laser, 2... AO deflector, 3.27
... Converging lens, 4... Main scanning mechanism, 5... Sub-scanning mechanism, 6... Condensing lens, 7... Light receiver, 8...
・Positional deviation detection processing section, 9...Adult fish detection processing section, 10
.. 41... Light shielding plate, 11... Motor, 12... Mirror driver, 13... Fresnel lens, 1 4... Black matrix, 5... Adult fish, 6... Laser light.

Claims (1)

【特許請求の範囲】[Claims] レーザと、このレーザからのレーザ光をブラックマトリ
ックスの膜内面上で膜点径よりやや大きいビーム径に収
束する収束レンズと、レーザ光をブラックマトリックス
の膜点の配列方向に走査する主走査機構と、この主走査
機構による走査方向と直角方向の副走査方向にレーザ光
の走査位置を変える副走査機構と、レーザ光を副走査方
向に微小振動させるウォブリング機構と、ブラックマト
リックスの膜点を通過した通過光を集光する集光レンズ
と、この集光レンズにより集光された通過光の光出力を
検出する受光素子と、この受光素子の出力を前記ウォブ
リング機構による微小振動の周波数に同期してサンプル
ホールドし、このサンプルホールドの出力をフィルタに
より平均化して走査レーザ光の副走査方向の位置ずれを
検出する位置ずれ検出処理部と、この位置ずれ検出処理
部からの出力により副走査方向の走査レーザ光の位置補
正を行なう操作位置微調機構と、前記受光素子の出力を
二つの基準値で3値化したパルスの数を計数するカウン
タを有する膜点検出処理部とを含むことを特徴とするブ
ラックマトリックス膜点検査装置。
A laser, a converging lens that converges the laser light from the laser onto the inner surface of the black matrix film to a beam diameter slightly larger than the film dot diameter, and a main scanning mechanism that scans the laser light in the direction in which the film dots of the black matrix are arranged. , a sub-scanning mechanism that changes the scanning position of the laser beam in the sub-scanning direction perpendicular to the scanning direction by this main-scanning mechanism, a wobbling mechanism that makes the laser beam minutely vibrate in the sub-scanning direction, and a laser beam that passes through the film points of the black matrix. A condensing lens that condenses the passing light, a light receiving element that detects the optical output of the passing light condensed by the condensing lens, and a light receiving element that synchronizes the output of the light receiving element with the frequency of the minute vibration caused by the wobbling mechanism. A positional deviation detection processing section that samples and holds and averages the output of this sample and hold using a filter to detect the positional deviation of the scanning laser beam in the sub-scanning direction. It is characterized by including an operation position fine adjustment mechanism that performs position correction of the laser beam, and a film point detection processing unit that has a counter that counts the number of pulses obtained by converting the output of the light receiving element into three values using two reference values. Black matrix film spot inspection device.
JP1520090A 1990-01-24 1990-01-24 Inspecting apparatus of film point of black matrix Pending JPH03220405A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP1520090A JPH03220405A (en) 1990-01-24 1990-01-24 Inspecting apparatus of film point of black matrix

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP1520090A JPH03220405A (en) 1990-01-24 1990-01-24 Inspecting apparatus of film point of black matrix

Publications (1)

Publication Number Publication Date
JPH03220405A true JPH03220405A (en) 1991-09-27

Family

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Family Applications (1)

Application Number Title Priority Date Filing Date
JP1520090A Pending JPH03220405A (en) 1990-01-24 1990-01-24 Inspecting apparatus of film point of black matrix

Country Status (1)

Country Link
JP (1) JPH03220405A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US9069421B2 (en) 2010-12-16 2015-06-30 Hung-Ta LIU Touch sensor and touch display apparatus and driving method thereof

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US9069421B2 (en) 2010-12-16 2015-06-30 Hung-Ta LIU Touch sensor and touch display apparatus and driving method thereof

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