JPH0321003Y2 - - Google Patents
Info
- Publication number
- JPH0321003Y2 JPH0321003Y2 JP8467984U JP8467984U JPH0321003Y2 JP H0321003 Y2 JPH0321003 Y2 JP H0321003Y2 JP 8467984 U JP8467984 U JP 8467984U JP 8467984 U JP8467984 U JP 8467984U JP H0321003 Y2 JPH0321003 Y2 JP H0321003Y2
- Authority
- JP
- Japan
- Prior art keywords
- container
- insulator
- entrance
- charged particle
- charged particles
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
- 239000002245 particle Substances 0.000 claims description 22
- 239000012212 insulator Substances 0.000 claims description 12
- 238000001514 detection method Methods 0.000 description 1
- 239000000463 material Substances 0.000 description 1
Landscapes
- Electron Tubes For Measurement (AREA)
Description
【考案の詳細な説明】
〔産業上の利用分野〕
本考案は、簡単な構成で正確に荷電粒子を検出
することができる荷電粒子検出器に関する。[Detailed Description of the Invention] [Industrial Application Field] The present invention relates to a charged particle detector that can accurately detect charged particles with a simple configuration.
第2図は、従来のフアラデイ・カツプ型の荷電
粒子検出器を示しており、1は、荷電粒子入射口
2を有した導電性容器、3は該容器1に入射する
被検出荷電粒子Bを制限する接地電位の絞り板で
ある。該絞り板3によつて制限された荷電粒子
は、入射口2を通つて該容器1内部に入射し、該
導電性容器1に流れ込んで検出される。該検出信
号は、該容器1に接続された増幅器4によつて増
幅され、図示しない記録計あるいは表示装置に供
給され、荷電粒子のビーム電流値が測定される。
ところで、荷電粒子が該容器の低部に入射すると
その入射部分から二次電子が発生するが、この二
次電子が該容器1の外部に逃げてしまうと、正確
にビーム電流値を測定することができなくなる。
通常、この対策として該容器1の上部に電源5か
ら負の電圧が印加される電極6を配置し、容器1
の外側に逃げる二次電子を容器1内部に戻すよう
に構成している。しかしながら、このような構成
では、電源5と電極6が必要となり、検出器全体
が高価となる。
FIG. 2 shows a conventional Faraday cup-type charged particle detector, in which 1 is a conductive container having a charged particle entrance 2, and 3 is a conductive container that detects charged particles B entering the container 1. This is an aperture plate that limits the ground potential. The charged particles restricted by the aperture plate 3 enter the container 1 through the entrance port 2, flow into the conductive container 1, and are detected. The detection signal is amplified by an amplifier 4 connected to the container 1, and supplied to a recorder or display device (not shown) to measure the beam current value of the charged particles.
By the way, when charged particles enter the lower part of the container, secondary electrons are generated from the incident part, but if these secondary electrons escape to the outside of the container 1, it is difficult to accurately measure the beam current value. become unable to do so.
Usually, as a countermeasure against this, an electrode 6 to which a negative voltage is applied from a power source 5 is placed on the top of the container 1.
The structure is such that secondary electrons escaping to the outside of the container 1 are returned to the inside of the container 1. However, such a configuration requires a power source 5 and an electrode 6, making the entire detector expensive.
本考案は、上述した点に艦みてなされたもの
で、簡単な構成で正確に荷電粒子を検出すること
ができる荷電粒子検出器を提供することを目的と
している。
The present invention has been made in consideration of the above points, and an object of the present invention is to provide a charged particle detector that can accurately detect charged particles with a simple configuration.
本考案に基づく荷電粒子検出器は、荷電粒子入
射口を有する導電性容器を備え、該入射口を通
り、該容器に流れ込む荷電粒子の電流値を測定す
るようにした荷電粒子検出器において、該容器の
入射口近傍の容器内部に絶縁体を配置したことを
特徴としている。
A charged particle detector based on the present invention includes a conductive container having a charged particle entrance, and measures the current value of charged particles flowing into the container through the entrance. It is characterized by an insulator placed inside the container near the entrance of the container.
以下、本考案の実施例を添附図面に基づいて詳
述する。
Embodiments of the present invention will be described in detail below with reference to the accompanying drawings.
第1図において、第2図と同一構成要素につい
ては同一番号を付し、その詳細な説明は省略す
る。この第1図の実施例において、第2図の構成
と相異する点は、第2図の電源5と電極6とを取
り除き、その代わりに、荷電粒子入射口2の近傍
の容器1の内側にシート状の絶縁体7を貼り付け
た点である。このような構成において、荷電粒子
検出時の初期状態においては、容器1内部への荷
電粒子Bの入射に基づいて発生した二次電子のあ
る部分は、入射口2を通つて容器外側に逃げだす
ものの、二次電子の一部は該絶縁体7の表面に付
着し、比較的短時間に該絶縁体を帯電させる。そ
の結果、該絶縁体表面は負電圧に保たれ、その後
発生する二次電子は該帯電した絶縁体によつて容
器外部への進行が防止される。 In FIG. 1, the same components as those in FIG. 2 are given the same numbers, and detailed explanation thereof will be omitted. The embodiment shown in FIG. 1 differs from the configuration shown in FIG. 2 in that the power source 5 and electrode 6 shown in FIG. This is the point where a sheet-like insulator 7 is pasted on. In such a configuration, in the initial state when charged particles are detected, a portion of the secondary electrons generated due to the incidence of charged particles B into the container 1 escapes to the outside of the container through the entrance port 2; A part of the secondary electrons adheres to the surface of the insulator 7 and charges the insulator in a relatively short period of time. As a result, the surface of the insulator is maintained at a negative voltage, and the secondary electrons generated thereafter are prevented from proceeding to the outside of the container by the charged insulator.
尚、この実施例では、シート状絶縁体7を容器
1の内壁に貼り付けたが、該絶縁体はシート状に
限らず、板状であつても良い。又、絶縁体は、入
射口の近傍に配置すれば良く、必ずしも容器に密
着して設ける必要はない。 In this embodiment, the sheet-like insulator 7 is attached to the inner wall of the container 1, but the insulator is not limited to a sheet-like shape, but may be a plate-like material. Further, the insulator may be placed near the entrance and does not necessarily need to be placed in close contact with the container.
以上詳述した如く、本考案においては、電源や
電極を設けることなく、導電性容器の内部に絶縁
体を配置する簡単な構成により、正確な荷電粒子
の検出を行うことができるものである。
As described in detail above, in the present invention, charged particles can be accurately detected using a simple configuration in which an insulator is placed inside a conductive container without providing a power source or electrodes.
第1図は本考案の一実施例を示す図、第2図
は、従来のフアラデイ・カツプ型の荷電粒子検出
器を示す図である。
1……導電性容器、2……荷電粒子入射口、4
……増幅器、7……絶縁体。
FIG. 1 shows an embodiment of the present invention, and FIG. 2 shows a conventional Faraday cup type charged particle detector. 1... Conductive container, 2... Charged particle entrance port, 4
...Amplifier, 7...Insulator.
Claims (1)
入射口を通り、該容器に流れ込む荷電粒子の電流
値を測定するようにした荷電粒子検出器におい
て、該容器の入射口近傍の容器内部に絶縁体を配
置したことを特徴とする荷電粒子検出器。 In a charged particle detector that is equipped with a conductive container having a charged particle entrance and measures the current value of charged particles flowing into the container through the entrance, an insulator is installed inside the container near the entrance of the container. A charged particle detector characterized by the placement of a body.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP8467984U JPS61752U (en) | 1984-06-07 | 1984-06-07 | charged particle detector |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP8467984U JPS61752U (en) | 1984-06-07 | 1984-06-07 | charged particle detector |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS61752U JPS61752U (en) | 1986-01-07 |
JPH0321003Y2 true JPH0321003Y2 (en) | 1991-05-08 |
Family
ID=30634389
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP8467984U Granted JPS61752U (en) | 1984-06-07 | 1984-06-07 | charged particle detector |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS61752U (en) |
-
1984
- 1984-06-07 JP JP8467984U patent/JPS61752U/en active Granted
Also Published As
Publication number | Publication date |
---|---|
JPS61752U (en) | 1986-01-07 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
JPS6371537U (en) | ||
US4270090A (en) | D.C. Electrostatic voltage follower having ion-coupled probe | |
US5029248A (en) | Electrostatic capture type radon measuring apparatus | |
JPH0321003Y2 (en) | ||
US4012729A (en) | Multi-element ionization chamber | |
US4150373A (en) | Ionization particle detector | |
US2479271A (en) | Ionization chamber circuit | |
US4394676A (en) | Photovoltaic radiation detector element | |
JPH0334253A (en) | Ion detector | |
JPH0329759Y2 (en) | ||
US2462351A (en) | Area measuring device and method | |
US4755682A (en) | Ionization monitor with improved ultra-high megohm resistor | |
JPH0321002Y2 (en) | ||
JPS5693339A (en) | Function test device of integrated circuit | |
JP2935362B1 (en) | Radiation measurement device | |
JPH0755512Y2 (en) | Faraday cup monitor | |
JP2907469B2 (en) | Ionization chamber detector | |
DE69737182D1 (en) | Device for fault detection and measurement on electrical supply lines | |
JPS55152415A (en) | Detector for angle of rotation | |
JPH0526549Y2 (en) | ||
RU2085966C1 (en) | Charge-particle current density measuring device | |
JPS57133358A (en) | Measuring device for voltage by electron beam | |
JPS585671A (en) | Measuring device for voltage | |
JPS58173161U (en) | Low speed electron beam prevention slit | |
JPS6119774U (en) | Potential measurement device using a scanning electron microscope |