JPH032077B2 - - Google Patents

Info

Publication number
JPH032077B2
JPH032077B2 JP8033084A JP8033084A JPH032077B2 JP H032077 B2 JPH032077 B2 JP H032077B2 JP 8033084 A JP8033084 A JP 8033084A JP 8033084 A JP8033084 A JP 8033084A JP H032077 B2 JPH032077 B2 JP H032077B2
Authority
JP
Japan
Prior art keywords
line
drawing pen
vernier
scale
main scale
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP8033084A
Other languages
Japanese (ja)
Other versions
JPS60224597A (en
Inventor
Atsushi Senju
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Dainippon Screen Manufacturing Co Ltd
Original Assignee
Dainippon Screen Manufacturing Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Dainippon Screen Manufacturing Co Ltd filed Critical Dainippon Screen Manufacturing Co Ltd
Priority to JP8033084A priority Critical patent/JPS60224597A/en
Priority to GB08509294A priority patent/GB2158256B/en
Priority to DE19853514537 priority patent/DE3514537A1/en
Publication of JPS60224597A publication Critical patent/JPS60224597A/en
Publication of JPH032077B2 publication Critical patent/JPH032077B2/ja
Granted legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B5/00Measuring arrangements characterised by the use of mechanical techniques
    • G01B5/14Measuring arrangements characterised by the use of mechanical techniques for measuring distance or clearance between spaced objects or spaced apertures
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01DMEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE; ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVERED IN A SINGLE OTHER SUBCLASS; TARIFF METERING APPARATUS; MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR
    • G01D9/00Recording measured values
    • G01D9/40Producing one or more recordings, each recording being produced by controlling either the recording element, e.g. stylus or the recording medium, e.g. paper roll, in accordance with two or more variables

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)

Description

【発明の詳細な説明】 (産業上の利用分野) 本発明は、複数の描画ペンを使用する自動製図
機における描画ペンの取付位置誤差量測定方法に
関する。
DETAILED DESCRIPTION OF THE INVENTION (Field of Industrial Application) The present invention relates to a method for measuring the amount of error in the mounting position of a drawing pen in an automatic drawing machine that uses a plurality of drawing pens.

(従来技術) 従来、プロツタあるいは自動製図機と呼ばれて
いる作図装置は、描画ペンをヘツドに取付けX−
Y方向に動かすことによつて、紙上に、設計図、
工業デザイン、測量図あるいは三次元の地形図等
を描くことができるようになつている。
(Prior Art) Conventionally, a drawing device called a plotter or an automatic drawing machine has a drawing pen attached to the head.
By moving in the Y direction, the blueprint,
It is now possible to draw industrial designs, survey maps, or three-dimensional topographic maps.

この場合、多色の作図あるいは線の太さを選択
して数種に分けて描く場合には、第6図に示すよ
うに、予め用意された複数本の描画ペンa,a′の
うち、所要の描画ペンaを、最初にアームbをも
つて選択し、ヘツドcをX−Yに動かして作図し
た後、次に描画ペンa′を選択して同様に作図する
こととなる。
In this case, when drawing in multiple colors or when drawing in several different line thicknesses, as shown in FIG. First, the desired drawing pen a is selected with arm b, and the head c is moved in the X-Y direction to draw a drawing, and then drawing pen a' is selected and drawn in the same manner.

しかしながら、このように描画ペンa,a′を交
換して使用する際、個々の描画ペンの先端の位
置、あるいはアームb対する取付位置が僅かに異
なるため、ヘツドcを例えばX軸について同一座
標に設定しても、描画された画線の中心位置は、
一方の位置をヘツド中心oからの距離tとすれ
ば、他方の位置はt−sとなり、双方の描画ペン
のズレ量、すなわち、誤差量sだけ狂うこととな
る。
However, when drawing pens a and a' are used interchangeably in this way, the positions of the tips of the individual drawing pens or the mounting positions with respect to arm b are slightly different, so it is necessary to set head c at the same coordinates on the X axis, for example. Even if set, the center position of the drawn line will be
If one position is a distance t from the head center o, the other position is t-s, which means that both drawing pens are deviated by the amount of deviation, that is, the error amount s.

このような誤差を補正するためには、補正用の
制御データを、ヘツドを動かすCADシステム等
に附加する必要があるが、この誤差量sは通常微
小であつて、例えば、描画する線副の数分の1程
度となり、その正確な測定は困難であつた。
In order to correct such errors, it is necessary to add correction control data to the CAD system that moves the head, but this error amount s is usually minute, and for example, It was about a fraction of that, and it was difficult to measure it accurately.

従来、この誤差量の測定方法としては、ヘツド
を同一位置において、描画ペンを交換しながら描
画し、それぞれの描画ペンによる線のズレを目視
するか、あるいは顕微鏡を使用するかして、例え
ば第7図に示すように、目盛eがついたルーペf
によつて計測していた。
Conventionally, this error amount has been measured by placing the head in the same position, drawing while exchanging drawing pens, and visually observing the line deviation caused by each drawing pen, or by using a microscope. As shown in Figure 7, a magnifying glass f with a scale e
It was measured by.

この場合、誤差量を計るためには、例えば2本
の線g,hのそれぞれの線の中心から中心までの
距離を計る必要があるが、この距離は微小である
ため、正確な測定が困難であつた。
In this case, in order to measure the amount of error, it is necessary to measure the distance from the center of each of the two lines g and h, for example, but since this distance is minute, accurate measurement is difficult. It was hot.

また、測定には長年の経験が必要であり、調整
のための時間を要する欠点があつた。
In addition, the measurement requires many years of experience and has the drawback of requiring time for adjustment.

(本発明の目的及び構成) 本発明の目的は、計測法における主尺と副尺の
関係、バーニヤ目盛の原理を、自動製図機におけ
る描画ペンの取付位置誤差量測定方法に適用する
ことによつて、誤差量測定を容易にしかも正確に
行なうことを可能にしようとするものであり、そ
の特徴は、基準として選んだ描画ペンで、基準線
から所定の間隔をn目盛で等分した主尺線を引
き、次いで、その他の描画ペンで、上記基準線の
位置から上記主尺線に重ねて前記所定の間隔をn
±1目盛で等分した副尺線を引き、前記主尺線と
副尺線の一致する位置を前記基準線からの主尺線
あるいは副尺線の目盛で数えることによつて、基
準として選んだ描画ペンと、その他の描画ペンと
の相対誤差を検出する手順とからなつている。
(Object and structure of the present invention) An object of the present invention is to apply the relationship between the main scale and vernier scale in the measurement method and the principle of the vernier scale to a method for measuring the amount of error in the installation position of a drawing pen in an automatic drafting machine. The aim is to make it possible to easily and accurately measure the amount of error, and its feature is to use a drawing pen selected as a standard, and use a main scale that divides a predetermined interval from the standard line into n scales. Draw a line, and then, using another drawing pen, draw a line from the reference line position to the main scale line to make the predetermined interval n.
Draw a vernier line equally divided by ±1 scale, and select the position where the main scale line and the vernier line match as a reference by counting the scale of the main scale line or the vernier line from the reference line. It consists of a procedure for detecting the relative error between a drawing pen and other drawing pens.

(実施例) 以下、本発明を、第1図乃至第5図において、
詳細に説明するが、実施例に使用する自動製図機
は、公知の構成であるので、説明は簡単に行う。
(Example) The present invention will be described below with reference to FIGS. 1 to 5.
Although a detailed explanation will be given, since the automatic drawing machine used in the examples has a known configuration, the explanation will be brief.

第1図の1は、自動製図機の描画ペンを保持す
るためのヘツドで、フレーム(図示略)に支持さ
れたX方向の軸2及びY方向の軸3に対して、水
平に移動自在に支承され、かつ図示しない駆動装
置によつて、X−Y方向に、図示しないコンピユ
ータによる制御のもとで、自動的に移動させられ
るようになつている。
1 in Fig. 1 is a head for holding a drawing pen of an automatic drafting machine, and is movable horizontally with respect to an axis 2 in the X direction and an axis 3 in the Y direction, which are supported by a frame (not shown). It is supported and is adapted to be automatically moved in the X-Y direction by a drive device (not shown) under the control of a computer (not shown).

ヘツド1は、水平なアーム4を有し、このアー
ム4の先端の二又状の描画ペン受け4aは、描画
ペンM0の軸部を垂直に保持し、またこれを離し
て、別の描画ペンと交換しうるように作動する。
The head 1 has a horizontal arm 4, and a forked drawing pen holder 4a at the tip of this arm 4 holds the shaft of the drawing pen M0 vertically, and when it is released, another drawing can be performed. It works so that it can be replaced with a pen.

描画ペンM0の他に、同形で、かつ色あるいは
描画される線幅の異なる描画ペンM1,M2,M3
…が用意されており、これら描画ペンM0,M1
M2…を交換して使用することにより、用紙U上
に、各色のあるいは太さの異なる線を引くことが
できる。
In addition to the drawing pen M 0 , there are drawing pens M 1 , M 2 , M 3 that have the same shape but differ in color or drawn line width.
... are prepared, and these drawing pens M 0 , M 1 ,
By replacing and using M 2 . . . , it is possible to draw lines of different colors or different thicknesses on the paper U.

第2図及び第3図は、描画ペンの取付位置誤差
量測定方法を示すものであり、最初に、基準とな
る1の描画ペンM0をもつて、X座標の原点、
ORGX0に基準線R0を引き、この基準線R0から、
所定の間隔Lをn等分(この場合10等分)したピ
ツチで、主尺線R1,R2…を引く。
FIGS. 2 and 3 show a method for measuring the amount of error in the installation position of a drawing pen. First, with a drawing pen M0 serving as a reference, the origin of the X coordinate,
Draw a reference line R 0 at ORGX 0 , and from this reference line R 0 ,
Main scale lines R 1 , R 2 . . . are drawn at pitches obtained by dividing the predetermined interval L into n equal parts (in this case, 10 equal parts).

次いで、測定すべき他の描画ペンMXをもつて、
X座標原点、ORGX0の位置から、前記所定の間
隔Lをn±1等分(この場合11等分)したピツチ
で、副尺線Q0,Q1,Q2…を引き、前記主尺線
R1,R2…とY方向に互いに部分的に重なり合う
か、もしくは重なり合わないまでも、Y方向のギ
ヤツプが殆ど生じないようにする。この場合、主
尺線と副尺線のピツチ差をPとする。
Next, with another drawing pen M X to be measured,
From the X coordinate origin, ORGX 0 , draw vernier lines Q 0 , Q 1 , Q 2 . line
R 1 , R 2 . . . partially overlap each other in the Y direction, or even if they do not overlap, almost no gap in the Y direction occurs. In this case, let P be the pitch difference between the main scale line and the vernier scale line.

そして、前記主尺線R0,R1,R2…と副尺線
Q0,Q1,Q2…とが一致する位置を検出する。
Then, the main scale lines R 0 , R 1 , R 2 ... and the vernier scale lines
Detect the position where Q 0 , Q 1 , Q 2 , etc. match.

第3図においては、主尺線R4と副尺線Q4とが
基準線R0からm番目(この場合4目盛)におい
て一致するため、誤差量をΔxoとすれば、Δxo
P(ピツチ差)×mとなる。また、測定すべき描画
ペンMXの原点座標ORGXoとすれば、ORGXo
ORGX0+Δxoの関係となる。
In Fig. 3, the main scale line R 4 and the vernier scale line Q 4 coincide at the mth scale (4th scale in this case) from the reference line R 0 , so if the error amount is Δ xo , Δ xo =
P (pitch difference)×m. Also, if the origin coordinates of the drawing pen M X to be measured are ORGX o , then ORGX o =
The relationship is ORGX 0 + Δ xo .

例えば、L=11mm n=10とし、p=0.1mm、
m=4とすれば誤差量Δxo=0.1×4=0.4mmとな
り、基準の描画ペンと、他の描画ペンとの相対誤
差を求めることができる。
For example, L=11mm, n=10, p=0.1mm,
If m=4, the error amount Δ xo =0.1×4=0.4 mm, and the relative error between the reference drawing pen and other drawing pens can be determined.

なお、上記実施例においては、主尺の目盛を
n、副尺をn+1としたが、副尺の目盛をn−1
としてもよい。
In the above embodiment, the scale of the main scale was n and the vernier scale was n+1, but the scale of the vernier was n-1.
You can also use it as

第4図X1〜X6は、描画ペンM1〜M6の6本を
使用した自動製図機において、本発明を適用し、
各描画ペンのX軸における相対誤差、オフセツト
量Δdを測定した場合のパターンを図示したもの
である。
FIG. 4 X 1 to X 6 shows an automatic drawing machine using six drawing pens M 1 to M 6 to which the present invention is applied.
This figure shows a pattern when the relative error and offset amount Δd on the X axis of each drawing pen are measured.

この実施例においては、基準となる描画ペン
M4の主尺線Rを実線で示し、各描画ペンM1
M2,M3,M5,M6の副尺線Qを破線で示してあ
る。
In this example, the reference drawing pen
The main scale line R of M 4 is shown as a solid line, and each drawing pen M 1 ,
The vernier lines Q of M 2 , M 3 , M 5 , and M 6 are shown as broken lines.

従つて、前述したように、各主尺線Rと副尺線
Qの重なる位置、(▼)で示す位置を、基準とな
る原点(ORGX0=ORGX4)から(m)本と数え
ることによつて、主尺線Rと副尺線Qのピツチ差
をpとすれば、各描画ペンM1〜M6の原点
ORGX1〜ORGX6の各オフセツト量Δd=m×p
で求めることができる。
Therefore, as mentioned above, the overlapping positions of each main scale line R and vernier scale line Q, indicated by (▼), are counted as (m) lines from the reference origin (ORGX 0 = ORGX 4 ). Therefore, if the pitch difference between the main scale line R and the vernier scale line Q is p, then the origin of each drawing pen M 1 to M 6
Each offset amount Δd of ORGX 1 to ORGX 6 = m×p
It can be found by

第5図Y1〜Y6は、第4図における各描画ペン
のY軸における相対誤差、オフセツト量Δdを測
定した場合のパターンを図示したものである。
FIGS. 5, Y 1 to Y 6 illustrate patterns when the relative error and offset amount Δd on the Y axis of each drawing pen in FIG. 4 are measured.

第4図と同様に、基準となる描画ペンM4の原
点(ORGY0=ORGY4)とする主尺線Rを実線で
示し、各描画ペンM1,M2,M3,M5,M6の副尺
線Qを破線で示している。
Similarly to FIG. 4, the main scale line R which is the origin (ORGY 0 = ORGY 4 ) of the reference drawing pen M 4 is shown as a solid line, and each drawing pen M 1 , M 2 , M 3 , M 5 , M The vernier line Q of No. 6 is shown as a broken line.

Y軸における各原点ORGY1〜ORGY6の各オフ
セツト量Δdは、Δd=m×pで求めることができ
る。
The offset amount Δd of each origin ORGY 1 to ORGY 6 on the Y axis can be determined by Δd=m×p.

以上のようにして、基準となる描画ペンM4
対する各描画ペンM1,M2,M3,M5,M6のX軸
及びY軸におけるオフセツト量Δdを求めたら、
これらを、ヘツド1の制御プログラムに、補正値
として入力する。
After calculating the offset amount Δd on the X and Y axes of each drawing pen M 1 , M 2 , M 3 , M 5 , M 6 with respect to the reference drawing pen M 4 in the above manner,
These are input into the head 1 control program as correction values.

補正後においては、製図作業の開始とともに、
アーム4がどの描画ペンM1〜M6を選択しても、
基準となる原点ORGX0,ORGY0と各描画ペンの
原点ORGX1〜ORGX6,ORGY1〜ORGY6を合わ
せてあるため、描画の線は、ズレることなく一致
する。
After the correction, with the start of drafting work,
No matter which drawing pen M 1 to M 6 is selected by arm 4,
Since the reference origins ORGX 0 and ORGY 0 and the origins of each drawing pen ORGX 1 to ORGX 6 and ORGY 1 to ORGY 6 are aligned, the drawing lines match without deviation.

(発明の効果) 本発明によれば、バーニヤ目盛の原理を応用
し、基準として選んだ描画ペンと、その他の描画
ペンによる線引きを、主尺線と副尺線の関係とな
るように重ねて描くことにより、ヘツドに対する
各描画ペンの相対的な誤差量を簡単に測定できる
利点がある。
(Effects of the Invention) According to the present invention, by applying the principle of the vernier scale, lines drawn by a drawing pen selected as a reference and other drawing pens are overlapped so as to have the relationship of a main scale line and a vernier scale line. Drawing has the advantage that the relative amount of error of each drawing pen with respect to the head can be easily measured.

従つて、この測定量を基に、各描画ペンの原点
座標を基準原点座標に合わせることができ、自動
製図機において、簡単かつ正確に、描画ペンのオ
フセツト量を調整でき、描画ペンを自動的に交換
しても、線ズレ、色ズレ等を生じることはない。
Therefore, based on this measured amount, the origin coordinates of each drawing pen can be aligned with the reference origin coordinates, and the offset amount of the drawing pen can be easily and accurately adjusted in an automatic drafting machine, and the drawing pen can be automatically adjusted. Even if you replace it with a new one, there will be no line or color misalignment.

【図面の簡単な説明】[Brief explanation of drawings]

第1図は、本発明の実施に際して使用される描
画ペン用ヘツドの概略正面図、第2図及び第3図
は、本発明の測定原理を説明するための線図、第
4図及び第5図は、本発明の一実施例を説明する
ための各種パターンを示す線図、第6図は、従来
の自動製図機を示す概略正面図、第7図は、従来
の誤差量測定方法を示す概略平面図である。 1……ヘツド、2,3……軸、4……アーム、
4a……描画ペン受け、M0〜M6……描画ペン、
U……用紙、R,R0〜R10……主尺線、Q,Q0
Q10……副尺線、ORGX0……X座標原点、
ORGY0……Y座標原点、ORGX1〜ORGX6……
描画ペンX座標、ORGY1〜ORGY6……描画ペン
Y座標、Δd……誤差量(オフセツト量)、p……
ピツチ差。
FIG. 1 is a schematic front view of a drawing pen head used in carrying out the present invention, FIGS. 2 and 3 are line diagrams for explaining the measurement principle of the present invention, and FIGS. The figure is a diagram showing various patterns for explaining an embodiment of the present invention, FIG. 6 is a schematic front view showing a conventional automatic drawing machine, and FIG. 7 is a diagram showing a conventional error measurement method. FIG. 1...Head, 2, 3...Axis, 4...Arm,
4a...Drawing pen holder, M0 to M6 ...Drawing pen,
U... Paper, R, R 0 ~ R 10 ... Main scale line, Q, Q 0 ~
Q 10 ... Vernier line, ORGX 0 ... X coordinate origin,
ORGY 0 ...Y coordinate origin, ORGX 1 ~ ORGX 6 ...
Drawing pen X coordinate, ORGY 1 to ORGY 6 ...Drawing pen Y coordinate, Δd...Error amount (offset amount), p...
Pitch difference.

Claims (1)

【特許請求の範囲】[Claims] 1 用紙に対して相対移動しうるヘツドに、複数
の描画ペンを交換自在に取付ける自動製図機にお
いて、基準として選んだ描画ペンで基準線から所
定の間隔をn目盛で等分した主尺線を引き、次い
で、その他の描画ペンで、上記基準線の位置から
上記主尺線に部分的に重ねて前記所定の間隔をn
±1目盛で等分した副尺線を引き、前記主尺線と
副尺線の一致する位置を、前記基準線からの主尺
線あるいは副尺線の目盛で数えることによつて基
準として選んだ描画ペンと、その他の描画ペンと
の相対誤差を検出することを特徴とする自動製図
機における描画ペンの取付位置誤差量測定方法。
1. In an automatic drawing machine in which a plurality of drawing pens are attached interchangeably to a head that can move relative to the paper, a main scale line is drawn by equally dividing a predetermined interval from the reference line in n scales using the drawing pen selected as a reference. Then, using another drawing pen, partially overlap the main scale line from the position of the reference line to draw the predetermined interval n.
Draw a vernier line equally divided by ±1 scale, and select the position where the main scale line and the vernier line match as a reference by counting the scale of the main scale line or the vernier line from the reference line. A method for measuring the amount of error in the mounting position of a drawing pen in an automatic drafting machine, characterized by detecting the relative error between a drawing pen and other drawing pens.
JP8033084A 1984-04-23 1984-04-23 Method of measuring quantity of error of position of fittingof drawing pen in automatic drawing machine Granted JPS60224597A (en)

Priority Applications (3)

Application Number Priority Date Filing Date Title
JP8033084A JPS60224597A (en) 1984-04-23 1984-04-23 Method of measuring quantity of error of position of fittingof drawing pen in automatic drawing machine
GB08509294A GB2158256B (en) 1984-04-23 1985-04-11 Coordinate plotter
DE19853514537 DE3514537A1 (en) 1984-04-23 1985-04-22 METHOD FOR MEASURING THE OFFSET OF THE ATTACHMENT POSITION OF A CHARACTER SPRING OF A COORDINATE PLOTTER

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP8033084A JPS60224597A (en) 1984-04-23 1984-04-23 Method of measuring quantity of error of position of fittingof drawing pen in automatic drawing machine

Publications (2)

Publication Number Publication Date
JPS60224597A JPS60224597A (en) 1985-11-08
JPH032077B2 true JPH032077B2 (en) 1991-01-14

Family

ID=13715239

Family Applications (1)

Application Number Title Priority Date Filing Date
JP8033084A Granted JPS60224597A (en) 1984-04-23 1984-04-23 Method of measuring quantity of error of position of fittingof drawing pen in automatic drawing machine

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JP (1) JPS60224597A (en)
DE (1) DE3514537A1 (en)
GB (1) GB2158256B (en)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2570066B2 (en) * 1992-08-06 1997-01-08 岩崎通信機株式会社 Multi-pen XY plotter

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Publication number Publication date
DE3514537C2 (en) 1988-09-22
GB2158256B (en) 1987-01-07
JPS60224597A (en) 1985-11-08
GB8509294D0 (en) 1985-05-15
GB2158256A (en) 1985-11-06
DE3514537A1 (en) 1985-10-24

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