JPH03183141A - Wire bonding apparatus - Google Patents

Wire bonding apparatus

Info

Publication number
JPH03183141A
JPH03183141A JP1320694A JP32069489A JPH03183141A JP H03183141 A JPH03183141 A JP H03183141A JP 1320694 A JP1320694 A JP 1320694A JP 32069489 A JP32069489 A JP 32069489A JP H03183141 A JPH03183141 A JP H03183141A
Authority
JP
Japan
Prior art keywords
ball
wire
tip
relative position
heating source
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP1320694A
Other languages
Japanese (ja)
Other versions
JP2890347B2 (en
Inventor
Shuichi Shimada
修一 嶋田
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Toshiba Mechatronics Co Ltd
Original Assignee
Toshiba Seiki Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Toshiba Seiki Co Ltd filed Critical Toshiba Seiki Co Ltd
Priority to JP1320694A priority Critical patent/JP2890347B2/en
Publication of JPH03183141A publication Critical patent/JPH03183141A/en
Application granted granted Critical
Publication of JP2890347B2 publication Critical patent/JP2890347B2/en
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L24/00Arrangements for connecting or disconnecting semiconductor or solid-state bodies; Methods or apparatus related thereto
    • H01L24/74Apparatus for manufacturing arrangements for connecting or disconnecting semiconductor or solid-state bodies
    • H01L24/78Apparatus for connecting with wire connectors
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/42Wire connectors; Manufacturing methods related thereto
    • H01L2224/47Structure, shape, material or disposition of the wire connectors after the connecting process
    • H01L2224/48Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
    • H01L2224/4805Shape
    • H01L2224/4809Loop shape
    • H01L2224/48091Arched
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/74Apparatus for manufacturing arrangements for connecting or disconnecting semiconductor or solid-state bodies and for methods related thereto
    • H01L2224/78Apparatus for connecting with wire connectors
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/74Apparatus for manufacturing arrangements for connecting or disconnecting semiconductor or solid-state bodies and for methods related thereto
    • H01L2224/78Apparatus for connecting with wire connectors
    • H01L2224/7825Means for applying energy, e.g. heating means
    • H01L2224/78268Discharge electrode
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/74Apparatus for manufacturing arrangements for connecting or disconnecting semiconductor or solid-state bodies and for methods related thereto
    • H01L2224/78Apparatus for connecting with wire connectors
    • H01L2224/7825Means for applying energy, e.g. heating means
    • H01L2224/783Means for applying energy, e.g. heating means by means of pressure
    • H01L2224/78301Capillary
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/80Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected
    • H01L2224/85Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected using a wire connector
    • H01L2224/85009Pre-treatment of the connector or the bonding area
    • H01L2224/8503Reshaping, e.g. forming the ball or the wedge of the wire connector
    • H01L2224/85035Reshaping, e.g. forming the ball or the wedge of the wire connector by heating means, e.g. "free-air-ball"
    • H01L2224/85045Reshaping, e.g. forming the ball or the wedge of the wire connector by heating means, e.g. "free-air-ball" using a corona discharge, e.g. electronic flame off [EFO]
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/01Chemical elements
    • H01L2924/01004Beryllium [Be]
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/01Chemical elements
    • H01L2924/01005Boron [B]
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/01Chemical elements
    • H01L2924/01006Carbon [C]
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/01Chemical elements
    • H01L2924/01023Vanadium [V]
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/01Chemical elements
    • H01L2924/01033Arsenic [As]
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/01Chemical elements
    • H01L2924/01075Rhenium [Re]
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/01Chemical elements
    • H01L2924/01082Lead [Pb]

Landscapes

  • Engineering & Computer Science (AREA)
  • Manufacturing & Machinery (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Wire Bonding (AREA)

Abstract

PURPOSE:To automatically form a ball again without stopping the operation of an apparatus when a ball formation operation has failed and to execute a bonding operation by a method wherein, when a detector detects the abnormality of the ball formation operation, the relative position between the tip of a wire and a wire heating source is made closer and the relative position is set again in order to execute the ball formation operation again. CONSTITUTION:A ball diameter becomes too small, the amount of eccentricity of the ball center line becomes too large and so on by a bad influence such as a bend, an irregularity in a length or the like of a wire 32. When a detector detects this abnormality, a control apparatus 19 brings the relative position between the tip of the wire 32 and a wire heating source close to the relative position for a ball formation operation at this time. In a reset state to execute the ball formation operation again, a torch electrode 25 heats an abnormal ball again. At this reheating operation, the relative position between the tip of the wire 32 and the torch electrode 25 is made closer as compared with an initial heating operation; as a result, an optimum ball in which the ball diameter and the amount of eccentricity of the ball center line have been improved can be formed again by the reheating operation. Thereby, a bonding operation whose reliability is high can be executed.

Description

【発明の詳細な説明】 [産業上の利用分野] 本発明は、ワイヤボンディング装置に関する。[Detailed description of the invention] [Industrial application field] The present invention relates to a wire bonding device.

[従来の技術] ワイヤボンディング装置にあっては、第6図に示す如く
、キャピラリ1より突出するワイヤ2の先端と、トーチ
電極3とを、ボール形成のための相対位置に設定し、電
気トーチユニット4にて制御されるトーチ電極3により
ワイヤ2の先端を放電加熱し、該ワイヤ2の先端にボー
ルを形成する。そして、このワイヤ2のボールを用いて
、ワイヤを被接合部(ICベレットの電極とリードフレ
ームのリード)に接合する。
[Prior Art] As shown in FIG. 6, in a wire bonding apparatus, the tip of a wire 2 protruding from a capillary 1 and a torch electrode 3 are set at relative positions for forming a ball, and an electric torch is used. A torch electrode 3 controlled by a unit 4 discharges and heats the tip of the wire 2 to form a ball at the tip of the wire 2. Then, using the ball of the wire 2, the wire is joined to the part to be joined (the electrode of the IC pellet and the lead of the lead frame).

上記ボールは、ワイヤ2の接合を好適ならしめるもので
あるが、その前提として、ワイヤ2の素線径に対するボ
ール径の適正、ワイヤ2の輪線に対するボール中心線の
偏心量の適正量を確保する必要がある。これにより、ワ
イヤ2を被接合部の電極に対して高信頼度で接合できる
のである。
The above-mentioned ball is used to suitably join the wire 2, but the premise is that the diameter of the ball is appropriate for the wire diameter of the wire 2, and that the eccentricity of the ball center line with respect to the ring line of the wire 2 is appropriate. There is a need to. Thereby, the wire 2 can be joined to the electrode of the part to be joined with high reliability.

[発明が解決しようとする課題] 然しなから、上述のボール形成に際しては、キャピラリ
1より突出しているワイヤ2の曲がリ、長さのばらつき
等の悪影響により、ボール径の適正、ボール中心線の偏
心量の適正等、ボールを正常には形成できず失敗するこ
とがある。
[Problems to be Solved by the Invention] However, when forming the above-mentioned ball, the wire 2 protruding from the capillary 1 is bent, the length is uneven, and other negative effects occur, making it difficult to determine the appropriate diameter of the ball and the center line of the ball. If the eccentricity of the ball is not correct, the ball may not be formed properly and the ball may fail.

尚、ボール形成の失敗時には、装置の稼動を停止し、オ
ペレータにてワイヤ2を適正な真直状態に修正して異常
ボールまわりに再放電したり、オ・ベレータのマニュア
ル操作にて異常ボールを捨てボンディングした後に新た
にボンディングを行なう等、異常回復のための煩雑な操
作が必要となる。
If ball formation fails, stop the operation of the device, have the operator correct the wire 2 to the proper straightness, and discharge around the abnormal ball again, or discard the abnormal ball by manual operation of the operator. Complicated operations are required to recover from abnormalities, such as performing new bonding after bonding.

又、特公昭61−11464号公報に記載の如く、異常
ボール形成時に、自動的に異常ボールまわりに再放電す
ることも考えられる。然しなから、ワイヤの先端とトー
チ電極との相対位置を、初回放電時と再放電時とで同一
とするものであるため、再放電により必ずしも正常なボ
ール形成を果たすには至らない。
Furthermore, as described in Japanese Patent Publication No. 61-11464, it is also conceivable that when an abnormal ball is formed, the electric discharge is automatically re-discharged around the abnormal ball. However, since the relative position between the tip of the wire and the torch electrode is the same during the initial discharge and during the re-discharge, the re-discharge does not necessarily result in normal ball formation.

本発明は、ボール形成の失敗時に、装置の稼動を停止す
ることなく自動的にボールを再形成し、常に適正なボー
ルを得て信頼度の高いボンディングを行なうことを目的
とする。
An object of the present invention is to automatically re-form the ball without stopping the operation of the device when a ball formation fails, to always obtain a proper ball and to perform highly reliable bonding.

[課題を解決するための手段] 本発明は、ワイヤの先端とワイヤの加熱源とを、ボール
形成のための相対位置に設定し、該ワイヤ加熱源により
ワイヤの先端を加熱し、該ワイヤの先端にボールを形成
するワイヤボンディング装置において、ワイヤ加熱源に
よるボールの形成状態を検出する検出器を備え、検出器
が今回のボール形成の異常を検出したことを条件に、ワ
イヤの先端とワイヤ加熱源との相対位置を、今回のボー
ル形成のための相対位置より近づけたボール再形成のた
めの相対位置に再設定し、該ワイヤ加熱源によりワイヤ
の先端を再加熱し、ボールの再形成を試行せしめる制御
装置を備えるようにしたものである。
[Means for Solving the Problems] The present invention sets the tip of a wire and a heating source of the wire at relative positions for forming a ball, heats the tip of the wire with the wire heating source, and heats the tip of the wire. A wire bonding device that forms a ball at the tip is equipped with a detector that detects the state of ball formation due to the wire heating source, and if the detector detects an abnormality in the current ball formation, the wire bonding device The relative position with respect to the source is reset to a relative position for re-forming the ball that is closer than the relative position for forming the ball this time, and the tip of the wire is reheated by the wire heating source to re-form the ball. The system is equipped with a control device that allows the test to be carried out.

[作用] 本発明において、通常のボンディング作業時には、ワイ
ヤの先端とワイヤ加熱源とを、ボール形成のための相対
位置に設定し、ボール形成を行ない、ボンディング作業
を続ける。
[Operation] In the present invention, during normal bonding work, the tip of the wire and the wire heating source are set at relative positions for forming a ball, the ball is formed, and the bonding work is continued.

他方、ワイヤの曲がり、長さのばらつき等の悪影響によ
り、今回のボール形成によるボール径の過小、ボール中
心線の偏心量の過大等を生じ、この異常を検出器が検出
したことを条件に、制御装置は、ワイヤの先端とワイヤ
加熱源との相対位置を今回のボール形成のための相対位
置より近づける。そして、このボール再形成のための再
設定状態下で、ワイヤ加熱源は異常ボールを再加熱する
。この再加熱時、初回加熱時に比してワイヤの先端とワ
イヤ加熱源との相対位置は、近づけられているから、再
加熱によりボール径、ボール中心線の偏心量を改善した
適正ボールを再形成できることになる。これにより、信
頼度の高いボンディングを行なうことができる。
On the other hand, on the condition that due to adverse effects such as bending of the wire or variations in length, the ball diameter is too small or the eccentricity of the ball center line is too large due to the current ball formation, and the detector detects this abnormality, The control device brings the relative position between the tip of the wire and the wire heating source closer than the relative position for forming the current ball. Then, under this reset state for ball reformation, the wire heating source reheats the abnormal ball. During this reheating, the relative position between the tip of the wire and the wire heating source is brought closer than during the initial heating, so reheating regenerates a proper ball with improved ball diameter and eccentricity of the ball center line. It will be possible. Thereby, highly reliable bonding can be performed.

即ち、本発明によれば、ボール形成の失敗時に、装置の
稼動を停止することなく自動的にボールを再形成し、常
に適正なボールを得て信頼度の高いボンディングを行な
うことができる。
That is, according to the present invention, when ball formation fails, the ball is automatically re-formed without stopping the operation of the apparatus, and it is possible to always obtain a proper ball and perform highly reliable bonding.

[実施例] 第1図は本発明の一実施例に係るワイヤボンディング装
置を示す模式図、第2図は第1図の要部を示す模式図、
第3図は第2図のキャピラリ駆動部を示す模式図、第4
図は第2図のトーチ駆動部を示す模式図、第5図は第4
図のv−V線に沿う断面図である。
[Example] Fig. 1 is a schematic diagram showing a wire bonding device according to an embodiment of the present invention, Fig. 2 is a schematic diagram showing the main part of Fig. 1,
Figure 3 is a schematic diagram showing the capillary drive section in Figure 2;
The figure is a schematic diagram showing the torch drive unit in Figure 2, and Figure 5 is a schematic diagram showing the torch drive unit in Figure 2.
It is a sectional view along the vV line of a figure.

ボンディング装置10は、第2図に示す如く、XYテー
ブル11上にボンディングヘッド12を設置し、ボンデ
ィングヘッド12にアーム13を揺動可能に備え、アー
ム13の先端部にキャピラリ14を着脱自在に装着して
いる。
As shown in FIG. 2, the bonding apparatus 10 includes a bonding head 12 installed on an XY table 11, an arm 13 swingably attached to the bonding head 12, and a capillary 14 detachably attached to the tip of the arm 13. are doing.

そして、アーム13の基端部には、第3図に示す如く、
一対の平行板15が設けられ、モータ16の駆動により
回転する回転板17に突設したピン18が平行板15間
に位lするように構成されている。これによりモータ1
6の回転量、回転方向を後述する制御装置F19にて制
御することにより、アーム13及びキャピラリ14の移
動量をデジタル設定できる。
At the base end of the arm 13, as shown in FIG.
A pair of parallel plates 15 are provided, and a pin 18 protruding from a rotary plate 17 rotated by the drive of a motor 16 is positioned between the parallel plates 15. This allows motor 1
By controlling the amount and direction of rotation of arm 13 and capillary 14 with a control device F19, which will be described later, the amount of movement of arm 13 and capillary 14 can be digitally set.

ボンディング装?&10のフレーム21には、第4図、
第5図に示す如く、軸受22を介して、播動レバー23
の支軸23Aが回転自在に支持され、揺動レバー23の
先端部にはトーチ棒24が固定されている。トーチ棒2
4の先端にはトーチ電極25が設けられる。
Bonding equipment? In frame 21 of &10, Fig. 4,
As shown in FIG. 5, the seeding lever 23 is
A support shaft 23A is rotatably supported, and a torch rod 24 is fixed to the tip of the swing lever 23. torch stick 2
A torch electrode 25 is provided at the tip of 4.

揺動レバー23における支軸23Aを挟む両側には、フ
レーム21と揺動レバー23との間にそれぞれ介装され
る、ソレノイド26と引張ばね27が配置される。
A solenoid 26 and a tension spring 27 are arranged on both sides of the swing lever 23 across the support shaft 23A, which are interposed between the frame 21 and the swing lever 23, respectively.

制御装置19は、第1図に示す如く、電気トーチユニッ
ト31を介してキャピラリ14から突出するワイヤ32
の先端とトーチ電極25との間に放電を発生させる。
The control device 19, as shown in FIG.
A discharge is generated between the tip of the torch electrode 25 and the torch electrode 25.

又、制御装置19は、第1図に示す如く、モータドライ
ブ回路33を介して前述のモータ16を駆動制御し、ア
ーム13及びキャピラリ14の移動量を前述の如く、デ
ジタル設定する。
Further, as shown in FIG. 1, the control device 19 drives and controls the aforementioned motor 16 via the motor drive circuit 33, and digitally sets the movement amount of the arm 13 and capillary 14 as described above.

又、制御装置19は、第1図に示す如く、ソレノイドド
ライブ回路34を介して前述のソレノイド26を駆動制
御し、キャピラリ14に対するトーチ電極25の設定位
置を下記(1)  (2)の如く制御する。
Further, as shown in FIG. 1, the control device 19 drives and controls the aforementioned solenoid 26 via the solenoid drive circuit 34, and controls the set position of the torch electrode 25 with respect to the capillary 14 as shown in (1) and (2) below. do.

(1)即ち、トーチ電極25は、引張ばね27の引張力
により、キャピラリ14の例えば移動軌跡外に定めたボ
ール形成位置に保持される。これにより、制御装置19
は、ワイヤ32の先端とトーチ電極25とをボール形成
のための相対位置に設定する。
(1) That is, the torch electrode 25 is held by the tensile force of the tension spring 27 at a ball forming position set, for example, outside the movement trajectory of the capillary 14. As a result, the control device 19
The tip of the wire 32 and the torch electrode 25 are set at relative positions for forming a ball.

(2)又、トーチ電極25は、ソレノイド26の励磁状
態下で上記ボール形成位置から揺動され、キャピラリ1
4の例えば移動軌跡上に定められるボール再形成位置に
設定替えされる。これにより、ワイヤ32の先端とトー
チ電極25との相対位置を上記(1)による今回のボー
ル形成のための相対位置より近づけたボール再形成のた
めの相対位置に再設定する。
(2) Also, the torch electrode 25 is swung from the ball forming position under the excitation state of the solenoid 26, and the capillary 1
For example, the ball re-forming position is set to the ball re-forming position determined on the movement trajectory of No. 4. As a result, the relative position between the tip of the wire 32 and the torch electrode 25 is reset to a relative position for re-forming the ball, which is closer than the relative position for forming the current ball according to (1) above.

然るに、IIIm装置19は、トーチ電極25を上記(
1)のボール形成位置に設定する状態下で、電気トーチ
ユニット31を制御し、トーチ電極25とワイヤ32の
先端との間に放電を発生させてワイヤ32の先端を加熱
し、ワイヤ32の先端にボールを形成する。
However, in the IIIm device 19, the torch electrode 25 is
1), the electric torch unit 31 is controlled to generate electric discharge between the torch electrode 25 and the tip of the wire 32 to heat the tip of the wire 32, and the tip of the wire 32 is heated. form a ball.

この時、制御装置19は、第1図に示す如く、上記トー
チ電極25によるボールの形成状態を検出する検出器4
1を備えている。制御装置19は、トーチ電極25が上
記(1)のボール形成位置に設定される状態下で上述の
如くボール形成された度に、検出器41の上述の検出結
果を得る。そして、制御装置19は、検出器41が今回
のボール形成の異常を検出したことを条件に、トーチ電
極25を上記(1)のボール形成位置から上記(2)の
ボール再形成位置に設定替えし、更に、トーチユニット
31を再制御し、トーチ電極25とワイヤ32の先端と
の間に再放電を発生させてワイヤ32の先端を再加熱し
、ワイヤ32の先端にボールを再形成する。
At this time, as shown in FIG.
1. The control device 19 obtains the above-mentioned detection result of the detector 41 every time a ball is formed as described above under the condition that the torch electrode 25 is set at the ball-forming position of (1) above. Then, on the condition that the detector 41 detects an abnormality in the current ball formation, the control device 19 changes the setting of the torch electrode 25 from the ball formation position (1) above to the ball reformation position (2) above. However, the torch unit 31 is further controlled again, and a re-discharge is generated between the torch electrode 25 and the tip of the wire 32 to reheat the tip of the wire 32 and re-form a ball at the tip of the wire 32.

尚、検出器41は、キャピラリ14を挟んでトーチ電f
li25に相対する位置に配置され、ボールの外径と偏
心量を検出する。又ボール径の外径と偏心量の検出には
、例えば先に述べた特公昭61−11464号公報に記
載された検出技術をそのまま用いることができるので、
詳細な説明は省略する。
Note that the detector 41 is connected to the torch current f with the capillary 14 in between.
It is placed at a position opposite to the li 25 and detects the outer diameter and eccentricity of the ball. In addition, to detect the outer diameter and eccentricity of the ball diameter, for example, the detection technique described in Japanese Patent Publication No. 61-11464 mentioned above can be used as is.
Detailed explanation will be omitted.

次に、上記ボンディング装置10の動作について説明す
る。
Next, the operation of the bonding apparatus 10 will be explained.

■通常のボンディングに際し、制御装y119は、ソレ
ノイド26を非励磁とし、トーチ電極25をキャピラリ
14の移動軌跡外に定めた前記(1)のボール形成位置
に設定する。そして、制御装置19は、モータ16を制
御することにて、キャピラリ14より突出するワイヤ3
2の先端とトーチ電極25とをボール形成のための相対
位置に設定する。
(2) During normal bonding, the control device y119 de-energizes the solenoid 26 and sets the torch electrode 25 to the ball forming position of (1) above, which is outside the movement trajectory of the capillary 14. The control device 19 controls the wire 3 protruding from the capillary 14 by controlling the motor 16.
2 and the torch electrode 25 are set at relative positions for forming a ball.

■制御装置19は、電気トーチユニット31を制御し、
ワイヤ32の先端とトーチ電極25との間で放電し、こ
の放電によってワイヤ32の先端にボールを形成する。
■The control device 19 controls the electric torch unit 31,
A discharge is generated between the tip of the wire 32 and the torch electrode 25, and a ball is formed at the tip of the wire 32 by this discharge.

■制御装置19は、検出器41の検出結果を得る。この
検出結果がボール正常信号である時、制御装置19は、
xYテーブル11、モータ16を制御し、上記正常ボー
ルを用いて、ワイヤ32をアーム13とともに移動せし
められるキャピラリ14にて被接合部(ICペレット5
1の電極とリードフレーム52のリード)に接合する。
(2) The control device 19 obtains the detection results of the detector 41. When this detection result is a ball normal signal, the control device 19:
The xY table 11 and the motor 16 are controlled, and the capillary 14, which moves the wire 32 together with the arm 13, uses the normal ball to connect the part to be joined (IC pellet 5).
1 electrode and the lead of the lead frame 52).

■(al検出器41の検出結果がボール異常信号である
時、制御装置19は、ソレノイド26を励磁し、トーチ
電極25をキャピラリ14の移動軌跡上に定めた前記(
2)のボール再形成位置に設定する。
(When the detection result of the al detector 41 is a ball abnormality signal, the control device 19 excites the solenoid 26 and sets the torch electrode 25 on the movement trajectory of the capillary 14.
2) Set the ball to the re-forming position.

■(b)制御装置19は、電気トーチユニット31を再
制御し、ワイヤ32の先端とトーチ電極25との間で再
放電し、この再放電によってワイヤ32の先端にボール
を再形成する。
(b) The control device 19 re-controls the electric torch unit 31 to re-discharge between the tip of the wire 32 and the torch electrode 25, and this re-discharge re-forms the ball at the tip of the wire 32.

■(c)そして、制御装置19は、ソレノイド26を非
励磁として、トーチ電極25を前記(1)のボール形成
位置である、キャピラリ14の移動軌跡外に設定替えす
るとともに、XYテーブル11、モータ16を制御し、
上記再形成ボールを用いて、ワイヤ32をアーム13と
ともに移動せしめられるキャピラリ14にて被接合部に
接合する。
(c) Then, the control device 19 de-energizes the solenoid 26 and changes the setting of the torch electrode 25 to a position outside the movement trajectory of the capillary 14, which is the ball forming position in (1), and also controls the XY table 11 and the motor. control 16;
Using the re-formed ball, the wire 32 is joined to the part to be joined by the capillary 14 which is moved together with the arm 13.

尚、制御袋″1119は、上記■(b)にてボール再形
成後、検出器41の検出結果を得て、この検出結果がボ
ール正常信号であることを確認できたことを条件に上記
■(c)の接合作業を実行するものとしても良い、この
時、検出器41の検出結果が異常信号であれば、検出器
41が最終的にボール正常信号を出力するまで、上記■
(b)の再放電、ボールの再形成を繰返した後、上記■
(c)の接合作業を実行することができる。
In addition, the control bag "1119 can be used in the above-mentioned (1) on the condition that after the ball is re-formed in (b) above, the detection result of the detector 41 has been obtained and this detection result has been confirmed to be a ball normal signal. (c) may be performed. At this time, if the detection result of the detector 41 is an abnormal signal, the above-mentioned
After repeating the re-discharge and re-forming of the ball in (b), the above
The joining operation (c) can be performed.

次に、上記実施例の作用について説明する。Next, the operation of the above embodiment will be explained.

上記実施例において、通常のボンディング作業時には、
ワイヤ32の先端とトーチ電ti25とを、ボール形成
のための相対位置に設定し、ボール形成を行ない、ボン
ディング作業を続ける。
In the above embodiment, during normal bonding work,
The tip of the wire 32 and the electric torch ti25 are set at relative positions for forming a ball, forming a ball, and continuing the bonding work.

他方、ワイヤ32の曲がり、長さのばらつき等の悪影響
により、今回のボール形成によるボール径の過小、ボー
ル中心線の偏心量の過大等を生じ、この異常を検出器4
1が検出したことを条件に、制御装置19は、ワイヤ3
2の先端とワイヤ加熱源との相対位置を今回のボール形
成のための相対位置より近づける。そして、このボール
再形成のための再設定状態下で、トーチ電極25は異常
ボールを再加熱する。この再加熱時、初回加熱時に比し
てワイヤ32の先端とトーチ電極25との相対位置は、
近づけられているから、再加熱によりボール径、ボール
中心線の偏心量を改善した適正ボールを再形成できるこ
とになる。これにより、信頼度の高いボンディングを行
なうことができる。
On the other hand, due to the bending of the wire 32, variations in length, etc., the ball diameter may be too small or the eccentricity of the ball center line may be too large due to the current ball formation, and this abnormality may be detected by the detector 4.
1 has been detected, the control device 19 controls the wire 3
The relative position between the tip of No. 2 and the wire heating source is made closer than the relative position for forming the ball this time. Then, under this reset state for re-forming the ball, the torch electrode 25 reheats the abnormal ball. During this reheating, the relative position between the tip of the wire 32 and the torch electrode 25 compared to the initial heating is as follows:
Since they are brought close to each other, it is possible to re-form a proper ball with improved ball diameter and eccentricity of the ball center line by reheating. Thereby, highly reliable bonding can be performed.

即ち、上記実施例によれば、ボール形成の失敗時に、装
?1tlOの稼動を停止することなく、自動的にボール
を再形成し、常に適正なボールを得て信頼度の高いボン
ディングを行なうことができる。
That is, according to the above embodiment, when the ball formation fails, the It is possible to automatically re-form the ball without stopping the operation of the 1tlO, always obtain a proper ball, and perform highly reliable bonding.

尚、上記実施例は、トーチ電極25をボール形成位置と
ボール再形成位置とに2位置制御するものとしたが、ボ
ール形成の異常が正常化されるまで、ボール再形成後の
異常再検出の度に、順次ワイヤ32の先端に近づける3
位置以上の多位置制御するものであっても良い。
In the above embodiment, the torch electrode 25 is controlled in two positions, the ball forming position and the ball re-forming position. 3, gradually approaching the tip of the wire 32.
It may be possible to control multiple positions.

又、本発明の実施においては、検出器により検出したボ
ール異常状態をレベル分けし、ワイヤの先端とワイヤ加
熱源との相対位置の変更量を、上記レベル分けされた異
常レベルの程度に応じてアナログもしくはデジタル設定
するものであっても良い。
Furthermore, in implementing the present invention, the abnormal state of the ball detected by the detector is classified into levels, and the amount of change in the relative position between the tip of the wire and the wire heating source is determined according to the degree of the abnormality level classified into the above levels. It may be set analog or digitally.

又、本発明の実施において、キャピラリの移動軌跡上に
ワイヤ加熱装置を配設した状態で初回のボール形成を行
ない、今回のボール形成の異常を検出器が検出したこと
を条件に、ワイヤの先端とワイヤ加熱装置との相対位置
を、今回のボール形成のための相対位置より近づけた状
態で再放電させてボールの再形成を行なうものであって
も良い。
In addition, in carrying out the present invention, the initial ball formation is performed with the wire heating device disposed on the movement trajectory of the capillary, and on the condition that the detector detects an abnormality in the current ball formation, the tip of the wire is The ball may be re-formed by causing discharge again with the relative positions of the wire heating device and the wire heating device being closer to each other than the current relative position for forming the ball.

又、本発明の実施において、ボール形成のための相対位
置を再設定するに際しては、ワイヤ位置とワイヤ加熱源
位置のいずれを設定替えするものであっても良く、両者
を設定替えするものであっても良い。
Furthermore, in carrying out the present invention, when resetting the relative position for ball formation, either the wire position or the wire heating source position may be set, and both may be set. It's okay.

又、本発明の実施において、ワイヤ加熱源は、トーチ電
極に限らず、ガストーチ等を用いることもできる。
Further, in carrying out the present invention, the wire heating source is not limited to a torch electrode, but a gas torch or the like can also be used.

[発明の効果] 以上のように本発明によれば、ボール形成の失敗時に、
装置の稼動を停止することなく自動的にボールを再形成
し、常に適正なボールを得て信頼度の、高いボンディン
グを行なうことができる。
[Effects of the Invention] As described above, according to the present invention, when ball formation fails,
It is possible to automatically re-form the ball without stopping the operation of the device, always obtain a proper ball, and perform highly reliable bonding.

【図面の簡単な説明】[Brief explanation of drawings]

第1図は本発明の一実施例に係るワイヤボンディング装
置を示す模式図、第2図は第1図の要部を示す模式図、
第3図は第2図のキャピラリ駆動部を示す模式図、第4
図は第2図のトーチ駆動部を示す模式図、第5図は第4
図のV−■線に沿う断面図、第6図は従来例を示す模式
図である。 10・・・ボンディング装置、 14・・・キャピラリ、 19・・・制御装置、 25・・・トーチ電極、 26・・・ソレノイド、 1・・・検出器。
FIG. 1 is a schematic diagram showing a wire bonding apparatus according to an embodiment of the present invention, FIG. 2 is a schematic diagram showing the main parts of FIG. 1,
Figure 3 is a schematic diagram showing the capillary drive section in Figure 2;
The figure is a schematic diagram showing the torch drive unit in Figure 2, and Figure 5 is a schematic diagram showing the torch drive unit in Figure 2.
FIG. 6, which is a sectional view taken along the line V-■ in the figure, is a schematic diagram showing a conventional example. DESCRIPTION OF SYMBOLS 10... Bonding device, 14... Capillary, 19... Control device, 25... Torch electrode, 26... Solenoid, 1... Detector.

Claims (1)

【特許請求の範囲】[Claims] (1)ワイヤの先端とワイヤの加熱源とを、ボール形成
のための相対位置に設定し、該ワイヤ加熱源によりワイ
ヤの先端を加熱し、該ワイヤの先端にボールを形成する
ワイヤボンディング装置において、ワイヤ加熱源による
ボールの形成状態を検出する検出器を備え、検出器が今
回のボール形成の異常を検出したことを条件に、ワイヤ
の先端とワイヤ加熱源との相対位置を、今回のボール形
成のための相対一位置より近づけたボール再形成のため
の相対位置に再設定し、該ワイヤ加熱源によりワイヤの
先端を再加熱し、ボールの再形成を試行せしめる制御装
置を備えることを特徴とするワイヤボンディング装置。
(1) In a wire bonding apparatus in which the tip of the wire and the heating source of the wire are set at relative positions for forming a ball, the tip of the wire is heated by the wire heating source, and a ball is formed at the tip of the wire. , is equipped with a detector that detects the state of ball formation due to the wire heating source, and on the condition that the detector detects an abnormality in the current ball formation, the relative position between the tip of the wire and the wire heating source is It is characterized by comprising a control device that resets the relative position for re-forming the ball to a position closer to the relative position for re-forming the ball, reheats the tip of the wire by the wire heating source, and attempts to re-form the ball. wire bonding equipment.
JP1320694A 1989-12-12 1989-12-12 Wire bonding method Expired - Lifetime JP2890347B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP1320694A JP2890347B2 (en) 1989-12-12 1989-12-12 Wire bonding method

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP1320694A JP2890347B2 (en) 1989-12-12 1989-12-12 Wire bonding method

Publications (2)

Publication Number Publication Date
JPH03183141A true JPH03183141A (en) 1991-08-09
JP2890347B2 JP2890347B2 (en) 1999-05-10

Family

ID=18124300

Family Applications (1)

Application Number Title Priority Date Filing Date
JP1320694A Expired - Lifetime JP2890347B2 (en) 1989-12-12 1989-12-12 Wire bonding method

Country Status (1)

Country Link
JP (1) JP2890347B2 (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100309129B1 (en) * 1995-12-01 2001-12-17 박종섭 Wire bonding apparatus and bonding method using the same

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6352462A (en) * 1986-08-22 1988-03-05 Hitachi Ltd Semiconductor device

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6352462A (en) * 1986-08-22 1988-03-05 Hitachi Ltd Semiconductor device

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100309129B1 (en) * 1995-12-01 2001-12-17 박종섭 Wire bonding apparatus and bonding method using the same

Also Published As

Publication number Publication date
JP2890347B2 (en) 1999-05-10

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