JPH0317913B2 - - Google Patents
Info
- Publication number
- JPH0317913B2 JPH0317913B2 JP30096289A JP30096289A JPH0317913B2 JP H0317913 B2 JPH0317913 B2 JP H0317913B2 JP 30096289 A JP30096289 A JP 30096289A JP 30096289 A JP30096289 A JP 30096289A JP H0317913 B2 JPH0317913 B2 JP H0317913B2
- Authority
- JP
- Japan
- Prior art keywords
- bath
- copper
- mol
- plated
- plating
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
- 238000007747 plating Methods 0.000 claims description 23
- QAOWNCQODCNURD-UHFFFAOYSA-N Sulfuric acid Chemical compound OS(O)(=O)=O QAOWNCQODCNURD-UHFFFAOYSA-N 0.000 claims description 22
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 claims description 20
- 239000010949 copper Substances 0.000 claims description 20
- 229910052802 copper Inorganic materials 0.000 claims description 20
- 229910052751 metal Inorganic materials 0.000 claims description 19
- 239000002184 metal Substances 0.000 claims description 19
- 238000000034 method Methods 0.000 claims description 18
- 150000002739 metals Chemical class 0.000 claims description 15
- 229910000365 copper sulfate Inorganic materials 0.000 claims description 9
- ARUVKPQLZAKDPS-UHFFFAOYSA-L copper(II) sulfate Chemical compound [Cu+2].[O-][S+2]([O-])([O-])[O-] ARUVKPQLZAKDPS-UHFFFAOYSA-L 0.000 claims description 9
- 239000008367 deionised water Substances 0.000 claims description 9
- 229910021641 deionized water Inorganic materials 0.000 claims description 9
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Chemical compound O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 claims description 9
- 239000003795 chemical substances by application Substances 0.000 claims description 8
- WFKWXMTUELFFGS-UHFFFAOYSA-N tungsten Chemical compound [W] WFKWXMTUELFFGS-UHFFFAOYSA-N 0.000 claims description 8
- 239000010937 tungsten Substances 0.000 claims description 8
- 229910052721 tungsten Inorganic materials 0.000 claims description 8
- 239000000080 wetting agent Substances 0.000 claims description 8
- XSQUKJJJFZCRTK-UHFFFAOYSA-N Urea Chemical compound NC(N)=O XSQUKJJJFZCRTK-UHFFFAOYSA-N 0.000 claims description 7
- 239000004202 carbamide Substances 0.000 claims description 7
- 239000000203 mixture Substances 0.000 claims description 7
- 229910052782 aluminium Inorganic materials 0.000 claims description 6
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 claims description 6
- 230000002378 acidificating effect Effects 0.000 claims description 5
- 238000009499 grossing Methods 0.000 claims description 4
- 238000003756 stirring Methods 0.000 claims description 4
- 238000005282 brightening Methods 0.000 claims description 3
- 238000004070 electrodeposition Methods 0.000 claims description 2
- LSNNMFCWUKXFEE-UHFFFAOYSA-M Bisulfite Chemical compound OS([O-])=O LSNNMFCWUKXFEE-UHFFFAOYSA-M 0.000 description 4
- 238000012360 testing method Methods 0.000 description 4
- DBMJMQXJHONAFJ-UHFFFAOYSA-M Sodium laurylsulphate Chemical compound [Na+].CCCCCCCCCCCCOS([O-])(=O)=O DBMJMQXJHONAFJ-UHFFFAOYSA-M 0.000 description 3
- 230000015572 biosynthetic process Effects 0.000 description 3
- 239000003093 cationic surfactant Substances 0.000 description 3
- 238000009713 electroplating Methods 0.000 description 3
- 235000019333 sodium laurylsulphate Nutrition 0.000 description 3
- KRHYYFGTRYWZRS-UHFFFAOYSA-N Fluorane Chemical compound F KRHYYFGTRYWZRS-UHFFFAOYSA-N 0.000 description 2
- QVGXLLKOCUKJST-UHFFFAOYSA-N atomic oxygen Chemical compound [O] QVGXLLKOCUKJST-UHFFFAOYSA-N 0.000 description 2
- 239000002894 chemical waste Substances 0.000 description 2
- 238000005530 etching Methods 0.000 description 2
- 238000002474 experimental method Methods 0.000 description 2
- 239000001301 oxygen Substances 0.000 description 2
- 229910052760 oxygen Inorganic materials 0.000 description 2
- 125000000542 sulfonic acid group Chemical group 0.000 description 2
- 239000002699 waste material Substances 0.000 description 2
- 239000000654 additive Substances 0.000 description 1
- 238000013019 agitation Methods 0.000 description 1
- 239000010953 base metal Substances 0.000 description 1
- 239000003153 chemical reaction reagent Substances 0.000 description 1
- 238000004140 cleaning Methods 0.000 description 1
- 239000000356 contaminant Substances 0.000 description 1
- 238000007796 conventional method Methods 0.000 description 1
- 230000007547 defect Effects 0.000 description 1
- 238000000151 deposition Methods 0.000 description 1
- 238000007598 dipping method Methods 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 230000001747 exhibiting effect Effects 0.000 description 1
- 238000001914 filtration Methods 0.000 description 1
- 238000007654 immersion Methods 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
- 238000002156 mixing Methods 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- QGLKJKCYBOYXKC-UHFFFAOYSA-N nonaoxidotritungsten Chemical compound O=[W]1(=O)O[W](=O)(=O)O[W](=O)(=O)O1 QGLKJKCYBOYXKC-UHFFFAOYSA-N 0.000 description 1
- 239000002245 particle Substances 0.000 description 1
- 238000010791 quenching Methods 0.000 description 1
- 230000000171 quenching effect Effects 0.000 description 1
- 239000004094 surface-active agent Substances 0.000 description 1
- 238000010998 test method Methods 0.000 description 1
- 229910001930 tungsten oxide Inorganic materials 0.000 description 1
Classifications
-
- C—CHEMISTRY; METALLURGY
- C25—ELECTROLYTIC OR ELECTROPHORETIC PROCESSES; APPARATUS THEREFOR
- C25D—PROCESSES FOR THE ELECTROLYTIC OR ELECTROPHORETIC PRODUCTION OF COATINGS; ELECTROFORMING; APPARATUS THEREFOR
- C25D5/00—Electroplating characterised by the process; Pretreatment or after-treatment of workpieces
- C25D5/34—Pretreatment of metallic surfaces to be electroplated
- C25D5/42—Pretreatment of metallic surfaces to be electroplated of light metals
- C25D5/44—Aluminium
-
- C—CHEMISTRY; METALLURGY
- C25—ELECTROLYTIC OR ELECTROPHORETIC PROCESSES; APPARATUS THEREFOR
- C25D—PROCESSES FOR THE ELECTROLYTIC OR ELECTROPHORETIC PRODUCTION OF COATINGS; ELECTROFORMING; APPARATUS THEREFOR
- C25D3/00—Electroplating: Baths therefor
- C25D3/02—Electroplating: Baths therefor from solutions
- C25D3/38—Electroplating: Baths therefor from solutions of copper
-
- C—CHEMISTRY; METALLURGY
- C25—ELECTROLYTIC OR ELECTROPHORETIC PROCESSES; APPARATUS THEREFOR
- C25D—PROCESSES FOR THE ELECTROLYTIC OR ELECTROPHORETIC PRODUCTION OF COATINGS; ELECTROFORMING; APPARATUS THEREFOR
- C25D5/00—Electroplating characterised by the process; Pretreatment or after-treatment of workpieces
- C25D5/34—Pretreatment of metallic surfaces to be electroplated
- C25D5/38—Pretreatment of metallic surfaces to be electroplated of refractory metals or nickel
Description
【発明の詳細な説明】
〔産業上の利用分野〕
本発明は電気鍍金浴に関する。より具体的には
特にアルミニウムおよびタングステンのような著
しく陽性の金属に電気鍍金するために適した浴組
成物に関する。DETAILED DESCRIPTION OF THE INVENTION [Industrial Field of Application] The present invention relates to electroplating baths. More particularly, it relates to bath compositions suitable for electroplating highly positive metals, such as aluminum and tungsten in particular.
アルミニウムやタングステンのような強い陽性
の金属は電気鍍金するのが全く困難である。この
ような金属は雰囲気酸素に対して強い親和性を有
する。この性質のためにその金属表面には永久的
に存在する緻密な酸化物層が形成される。この層
の形成はこれらの金属の新鮮な表面が酸素に曝さ
れた後数秒以内でおこる。この酸化層のためにこ
れらの金属を鍍金するのは非常に難しくなる。そ
してもし鍍金がされたとしても多くの場合密着性
が非常に劣る。
Strongly positive metals such as aluminum and tungsten are quite difficult to electroplate. Such metals have a strong affinity for atmospheric oxygen. Because of this property, a dense oxide layer is formed on the surface of the metal that is permanently present. Formation of this layer occurs within seconds after the fresh surface of these metals is exposed to oxygen. This oxide layer makes these metals very difficult to plate. And even if plated, the adhesion is often very poor.
このような金属を鍍金するための慣用の方法で
は大規模な表面前処理を含んでいる。タングステ
ンの場合には鍍金すべき部品を電気的バイアスを
かけながら槽から槽に頻繁に移動させねばならず
そのため感電の可能性による安全上の問題が生じ
る。更にこれらの金属のための慣用の鍍金方法で
はフツ素化水素酸のような苛烈な廃棄物が相当量
発生する。 Conventional methods for plating such metals include extensive surface pretreatment. In the case of tungsten, the parts to be plated must be frequently moved from bath to bath while being electrically biased, creating a safety problem due to the possibility of electric shock. Additionally, conventional plating methods for these metals generate significant amounts of harsh wastes such as hydrofluoric acid.
従つてこれらの鍍金の困難な金属を鍍金するた
めのより良い方法と鍍金浴の化学組成が求められ
ている。米国特許第3769179、米国特許第4242181
号および第3923613号には銅鍍金の従来技術が例
示されている。特に初めの2つはプリント回路製
造工業に応用されている。 Therefore, there is a need for better methods and plating bath chemistries for plating these difficult to plate metals. U.S. Patent No. 3769179, U.S. Patent No. 4242181
No. 3,923,613 exemplify the prior art of copper plating. In particular, the first two are applied to the printed circuit manufacturing industry.
本発明はアルミニウムおよびタングステンのよ
うな鍍金の困難な金属に銅を析出するための浴組
成物を包含する方法を提供するものである。本発
明の浴組成物は酸性の銅の浴であり特定の目的の
ための添加剤を含有している。本発明の方法は鍍
金する前の表面前処理またはエツチングが不要で
ありこのためにこの方法に付随する化学廃棄物の
量を減らすことができる。更に本発明は鍍金槽の
中で鍍金困難な金属からの酸化物の除去を提供す
るので清浄な表面上で新しい酸化物が生成する機
会を最小にしこれによつて電析した銅とベース金
属との間の良好な金属結合が達成されることが可
能になる。
The present invention provides a method including a bath composition for depositing copper on difficult to plate metals such as aluminum and tungsten. The bath composition of the present invention is an acidic copper bath containing additives for specific purposes. The method of the present invention does not require surface pretreatment or etching prior to plating, thereby reducing the amount of chemical waste associated with the method. Additionally, the present invention provides for the removal of oxides from hard-to-plate metals in the plating bath, thereby minimizing the chance of new oxide formation on the clean surface, thereby reducing the chance of formation of new oxides on the deposited copper and base metal. A good metallurgical bond between the two can be achieved.
本発明の方法はより高い収率とよい密着性を提
供する一方で廃棄物処理に付随するコストを最小
とする。 The method of the present invention provides higher yields and better adhesion while minimizing costs associated with waste disposal.
好ましい水性鍍金溶液は硫酸0.5〜0.75モル/
、水和した硫酸銅0.3〜0.5モル/、尿素1〜
2g/、湿潤剤1〜2g/、スルホン酸1〜
2g/および脱イオン水800〜1000mlを含有す
る。
A preferred aqueous plating solution contains 0.5 to 0.75 moles of sulfuric acid/
, hydrated copper sulfate 0.3-0.5 mol/, urea 1-
2g/, wetting agent 1~2g/, sulfonic acid 1~
2 g/and 800-1000 ml of deionized water.
尿素は平滑剤としての性質のために含有されて
いる。スルホン酸はその光沢特性のために使用さ
れる。適当な湿潤剤としてはラウリル硫酸ナトリ
ウムのような陽イオン性表面活性剤が挙げられ
る。 Urea is included for its properties as a smoothing agent. Sulfonic acid is used for its gloss properties. Suitable wetting agents include cationic surfactants such as sodium lauryl sulfate.
この浴は前掲したすべての化学試薬を順番に脱
イオン水に加えることにより調製される。この溶
液を混合しそして溶解しなかつた粒子をすべて除
去する必要がある場合過する。鍍金する金属は
最初に清浄にして土、泥および他の表面汚染物を
条去し次に脱イオン水中ですすぐ。この金属を次
に調製した浴を溜めた鍍金槽に入れる。 This bath is prepared by sequentially adding all of the chemical reagents listed above to deionized water. This solution is mixed and filtered if necessary to remove any undissolved particles. The metal to be plated is first cleaned to remove dirt, mud and other surface contaminants and then rinsed in deionized water. This metal is then placed in a plating tank containing the prepared bath.
好ましくは部品を鍍金溶液中に2〜3分間静置
して後、負にバイアスを印加して銅の電気鍍金を
開始する。しかしながら特に不溶性で自然に生長
した酸化層があるような困難な場合は部品に負の
バイアスを印加する前に正のバイアスを30〜60秒
間印加して除去しても良いことが特記される。 Preferably, the part is allowed to sit in the plating solution for 2 to 3 minutes before electroplating of the copper begins by applying a negative bias. However, it is noted that in difficult cases, especially where there is an insoluble naturally grown oxide layer, it may be removed by applying a positive bias for 30 to 60 seconds before applying a negative bias to the part.
通常の鍍金方法のパラメーターには20〜30℃の
範囲の浴温度、電流密度約11〜22mA/cm2(10〜
20A/ft2)および連続的な強い撹拌が含まれる。
鍍金工程の継続時間は所望とする銅の厚みにより
変更可能である。 Typical plating process parameters include bath temperature in the range of 20-30℃, current density of about 11-22mA/cm2 (10-22mA/cm2 ) ,
20A/ft 2 ) and continuous strong agitation.
The duration of the plating process can be varied depending on the desired copper thickness.
鍍金浴中の硫酸は電流を導入する前の2〜3分
の浸漬の間に酸化物層を除去するのに十分な濃度
とする。鍍金前に本格的な表面前処理やエツチン
グを必要としないのでこれにより工数と発生する
化学廃棄物の量とそれに付随するコスト等を低減
できる。 The sulfuric acid in the plating bath is at a sufficient concentration to remove the oxide layer during the 2-3 minute soak before introducing the electrical current. Since no full-scale surface pretreatment or etching is required before plating, the number of man-hours, the amount of chemical waste generated, and the associated costs can be reduced.
以下の実施例は本発明の種々な態様を示すもの
である。
The following examples illustrate various aspects of the invention.
実施例 1
アルミニウムとタングステンの作業片を温和な
アルカリ性清浄液中で清浄にし、以下の溶液中で
鍍金する。硫酸74g/、硫酸銅72g/、尿素
(平滑化剤)1g/、スルホン酸(光沢剤)1
g/、ラウリル硫酸ナトリウム(表面活性剤)
1g/、脱イオン水1。Example 1 Aluminum and tungsten workpieces are cleaned in a mild alkaline cleaning solution and plated in the following solution. Sulfuric acid 74g/, copper sulfate 72g/, urea (smoothing agent) 1g/, sulfonic acid (brightening agent) 1
g/, sodium lauryl sulfate (surfactant)
1 g/1 part of deionized water.
作業片をこの溶液中に2〜3分間浸漬した後バ
イアス電圧をかける。鍍金を室温で約11mA/cm2
(10A/ft2)で20分間実施する。析出した銅は平
滑でありメツキむら(skip plating)のような欠
陥が無い。基盤目試験法および急冷法による密着
強度試験では密着不良は示さなかつた。 The work piece is immersed in this solution for 2-3 minutes and then a bias voltage is applied. Approximately 11mA/cm 2 for plating at room temperature
(10A/ft 2 ) for 20 minutes. The deposited copper is smooth and free of defects such as skip plating. Adhesion strength tests using the base grain test method and the quenching method showed no poor adhesion.
実施例 2
本発明の他の例として実施例1と同様の方法で
実施した。但し硫酸の量を50g/に減じた。析
出した銅の品質と密着性は実施例1と同様であつ
た。Example 2 Another example of the present invention was carried out in the same manner as in Example 1. However, the amount of sulfuric acid was reduced to 50g/. The quality and adhesion of the deposited copper were the same as in Example 1.
実施例 3
実施例1および2の様にして他の実験を実施し
た。但し、硫酸の濃度を更に30g/に減じた。
引き続いて密着性の試験を行つた結果試験領域の
25%以上で不良を示した。Example 3 Other experiments were conducted as in Examples 1 and 2. However, the concentration of sulfuric acid was further reduced to 30g/.
A subsequent adhesion test revealed that the test area
25% or more showed failure.
実施例 4
他の実験として実施例1の様な条件で行つたが
但し硫酸銅の量は50g/とした。電析物は平滑
であり鍍金むらは無くしかも密着性が良好であつ
た。Example 4 Another experiment was carried out under the same conditions as in Example 1, except that the amount of copper sulfate was 50 g. The deposits were smooth, free from uneven plating, and had good adhesion.
実施例 5
若干青味がかかつた色を呈する(酸化タングス
テン)タングステンの角片を清浄にし次に実施例
1の様に鍍金した。引き続く密着性の試験では貧
弱な密着性を示した。しかしながらこの角片を最
初に1分間正のバイアスをかけ次に負のバイアス
下で鍍金した場合は鍍金された角片は良好な密着
性を示した。ここまで本発明では参考としての特
に好ましい実施態様を記述したが当業者にとつて
は本発明の請求の範囲の様な思想と目的から逸脱
すること無く種々の変法および細かい点を実施す
ることは容易であると考えられるであろう。Example 5 A tungsten corner piece exhibiting a slightly bluish color (tungsten oxide) was cleaned and then plated as in Example 1. Subsequent adhesion tests showed poor adhesion. However, when the square piece was plated first under a positive bias for 1 minute and then under a negative bias, the plated square piece showed good adhesion. Up to this point, the present invention has described particularly preferred embodiments for reference, but it will be apparent to those skilled in the art that various modifications and details can be made without departing from the spirit and purpose of the present invention as defined in the claims. would be considered easy.
以上本発明を詳細に説明したが、本発明は更に
以下の実施態様により要約して示すことが出来
る。 Although the present invention has been described in detail above, the present invention can be further summarized by the following embodiments.
(1) 陽性金属に銅鍍金をする方法において硫酸
0.5〜0.75モル/、水和した硫酸銅0.3〜0.5モ
ル/、尿素1〜2g/、湿潤剤1〜2ml/
、光沢剤1〜2g/、および脱イオン水
800〜1000mlを含む浴を調製し、
この浴中に鍍金すべき部品を浸漬しそして約
20℃〜30℃の温度下、で電流密度約11〜
22mA/cm2(10〜20A/ft2)で連続的撹拌をし
ながらこの浴からの銅の電析を行うことからな
る上記銅の鍍金方法。(1) Sulfuric acid is used in the method of copper plating on positive metals.
0.5-0.75 mol/, hydrated copper sulfate 0.3-0.5 mol/, urea 1-2 g/, wetting agent 1-2 ml/
, brightener 1-2g/, and deionized water
Prepare a bath containing 800-1000 ml, immerse the parts to be plated in this bath and approx.
Under the temperature of 20℃~30℃, the current density is about 11~
The method for plating copper as described above, comprising electrodepositing copper from this bath with continuous stirring at 22 mA/cm 2 (10-20 A/ft 2 ).
(2) 上記の浸漬工程が2〜3分間である前項1に
記載の方法。(2) The method according to item 1 above, wherein the dipping step is for 2 to 3 minutes.
(3) 正バイアスの影響下で上記浸漬工程を30〜60
秒間持続する前項1に記載の方法。(3) Under the influence of positive bias, repeat the above immersion process for 30 to 60 minutes.
The method according to item 1 above, which lasts for seconds.
(4) 上記の調製するための工程として脱イオン水
中で前項1で述べた順序で浴成分を混合し、そ
してその浴溶液を過することを含む前項1に
記載の方法。(4) The method according to item 1, which includes mixing the bath components in deionized water in the order described in item 1 and filtering the bath solution as the step for preparing the above.
(5) 湿潤剤がラウリル硫酸ナトリウムであり、光
沢剤がスルホン酸である前項1,2,3もしく
は4に記載の方法。(5) The method according to item 1, 2, 3 or 4 above, wherein the wetting agent is sodium lauryl sulfate and the brightening agent is sulfonic acid.
(6) 硫酸0.5〜0.75モル/、水和した硫酸銅0.3
〜0.5モル/、平滑化剤1〜2g/、湿潤
剤1〜2ml/、光沢剤1〜2g/、脱イオ
ン水800〜1000ml、からなる浴に鍍金すべき部
品を浸漬しそして約20〜30℃の温度下約11〜
22mA/cm2(10〜20A/ft2)の電流密度で、こ
の浴から銅を電析させる陽性金属のための酸性
銅鍍金浴。(6) Sulfuric acid 0.5-0.75 mol/, hydrated copper sulfate 0.3
The part to be plated is immersed in a bath consisting of ~0.5 mol/, leveling agent 1-2 g/, wetting agent 1-2 ml/, brightener 1-2 g/, deionized water 800-1000 ml and about 20-30 Temperature below about 11 ~
Acidic copper plating bath for positive metals with a current density of 22 mA/cm 2 (10-20 A/ft 2 ) to deposit copper from this bath.
(7) 湿潤剤が陽イオン表面活性剤である前項6に
記載の浴。(7) The bath according to item 6 above, wherein the wetting agent is a cationic surfactant.
(8) 光沢剤がスルホン酸である前項6に記載の
浴。(8) The bath according to item 6 above, wherein the brightener is sulfonic acid.
(9) 平滑化剤が尿素である前項6,7もしくは8
に記載の浴。(9) Item 6, 7 or 8 above, where the smoothing agent is urea.
The bath described in.
(10) 硫酸30〜50g/、水和した硫酸銅50〜72
g/、尿素1g/、スルホン酸1g/お
よび陽イオン表面活性剤1g/からなる浴組
成物を連続的に撹拌しながら鍍金するアルミニ
ウムおよびタングステンのような強い陽性金属
のための、水性の酸性銅電析浴組成物。(10) Sulfuric acid 30-50g/, hydrated copper sulfate 50-72
Aqueous acidic copper for strongly positive metals such as aluminum and tungsten plated with continuous stirring of a bath composition consisting of 1 g/g/g of urea, 1 g/g of sulfonic acid, and 1 g/g of cationic surfactant. Electrodeposition bath composition.
Claims (1)
0.5〜0.75モル/、水和した硫酸銅0.3〜0.5モ
ル/、尿素1〜2g/、湿潤剤1〜2ml/
、光沢剤1〜2g/、および脱イオン水800
〜1000mlを含む浴を調製し、 この浴中に鍍金すべき部品を浸漬しそして約20
℃〜30℃の温度下、電流密度約11〜22mA/cm2
(10〜20A/ft2)で連続的に撹拌しながらこの浴
からの銅の電析を行うことからなる上記銅の鍍金
方法。 2 硫酸0.5〜0.75モル/、水和した硫酸銅0.3
〜0.5モル/、平滑化剤1〜2g/、湿潤剤
1〜2ml/、光沢剤1〜2g/、脱イオン水
800〜1000ml、からなる浴に鍍金すべき部品を浸
漬し、約20〜30℃の温度下約11〜22mA/cm2(10
〜20A/ft2)の電流密度で、この浴から銅を電析
させる陽性金属のための酸性銅鍍金浴。 3 硫酸30〜50g/、水和した硫酸銅50〜72
g/、尿素1g/、スルホン酸1g/およ
び陽イオン表面活性剤1g/、からなる浴組成
物を連続的に撹拌しながら鍍金するアルミニウム
およびタングステンのような強い陽性金属のため
の水性の酸性銅電析浴組成物。[Claims] 1. In a method of copper plating a positive metal, sulfuric acid
0.5-0.75 mol/, hydrated copper sulfate 0.3-0.5 mol/, urea 1-2 g/, wetting agent 1-2 ml/
, brightener 1-2g/, and deionized water 800ml
Prepare a bath containing ~1000 ml, immerse the parts to be plated in this bath and approx.
At temperatures between ℃ and 30℃, current density is about 11 to 22 mA/cm 2
The copper plating method described above comprises electrodepositing copper from this bath while continuously stirring at (10 to 20 A/ ft2 ). 2 Sulfuric acid 0.5-0.75 mol/, hydrated copper sulfate 0.3
~0.5 mol/, smoothing agent 1-2 g/, wetting agent 1-2 ml/, brightening agent 1-2 g/, deionized water
The parts to be plated are immersed in a bath consisting of 800 to 1000 ml, and heated at a temperature of approximately 20 to 30°C at approximately 11 to 22 mA/cm 2 (10
An acidic copper plating bath for positive metals with a current density of ~20 A/ft 2 ) to deposit copper from this bath. 3 Sulfuric acid 30-50g/, hydrated copper sulfate 50-72
Aqueous acidic copper for strongly positive metals such as aluminum and tungsten is plated with continuous stirring of a bath composition consisting of: Electrodeposition bath composition.
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US28999388A | 1988-12-21 | 1988-12-21 | |
US289993 | 1988-12-21 |
Publications (2)
Publication Number | Publication Date |
---|---|
JPH02232390A JPH02232390A (en) | 1990-09-14 |
JPH0317913B2 true JPH0317913B2 (en) | 1991-03-11 |
Family
ID=23114070
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP30096289A Granted JPH02232390A (en) | 1988-12-21 | 1989-11-21 | Copper plating for hardly-plating metal |
Country Status (3)
Country | Link |
---|---|
EP (1) | EP0375179B1 (en) |
JP (1) | JPH02232390A (en) |
DE (1) | DE68915519T2 (en) |
Families Citing this family (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
FR2818294A1 (en) * | 2000-12-15 | 2002-06-21 | Thomson Csf | Electrolyte incorporating a basic inhibiting agent with a amine function for depositing anti-corrosion coatings of copper and its alloys on aluminium and its alloys |
JP2010150622A (en) * | 2008-12-26 | 2010-07-08 | Hitachi Ltd | Plating liquid, conductive body substrate having projecting metallic structure and method of manufacturing the same |
CN103668355B (en) * | 2013-12-06 | 2016-05-11 | 南京三乐电子信息产业集团有限公司 | The copper electroplating method on a kind of travelling-wave tubes tungsten helix surface |
FR3053352A1 (en) | 2016-07-04 | 2018-01-05 | Airbus Safran Launchers Sas | ANTI-CORROSION PROTECTIVE COMPOSITION |
DE102016113641A1 (en) | 2016-07-25 | 2018-01-25 | Christian-Albrechts-Universität Zu Kiel | Aluminum-copper connector having a heterostructure and method of making the heterostructure |
CN107447239B (en) * | 2017-08-21 | 2018-08-28 | 安徽省含山县兴建铸造厂 | A kind of preparation method of corrosion-resistant damper |
Family Cites Families (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
SU901363A1 (en) * | 1980-06-10 | 1982-01-30 | Предприятие П/Я А-7155 | Electrolyte for electrolytic precipitating of copper electrolyte for for electrolytic deposition of copper |
-
1989
- 1989-11-21 JP JP30096289A patent/JPH02232390A/en active Granted
- 1989-11-29 DE DE1989615519 patent/DE68915519T2/en not_active Expired - Fee Related
- 1989-11-29 EP EP19890312444 patent/EP0375179B1/en not_active Expired - Lifetime
Also Published As
Publication number | Publication date |
---|---|
DE68915519T2 (en) | 1994-12-01 |
EP0375179A2 (en) | 1990-06-27 |
JPH02232390A (en) | 1990-09-14 |
EP0375179B1 (en) | 1994-05-25 |
EP0375179A3 (en) | 1991-01-30 |
DE68915519D1 (en) | 1994-06-30 |
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