JPH0317579U - - Google Patents
Info
- Publication number
- JPH0317579U JPH0317579U JP7756289U JP7756289U JPH0317579U JP H0317579 U JPH0317579 U JP H0317579U JP 7756289 U JP7756289 U JP 7756289U JP 7756289 U JP7756289 U JP 7756289U JP H0317579 U JPH0317579 U JP H0317579U
- Authority
- JP
- Japan
- Prior art keywords
- semiconductor device
- suction collet
- collet
- probe
- holder
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 239000000523 sample Substances 0.000 claims description 5
- 239000004065 semiconductor Substances 0.000 claims description 4
- 238000001179 sorption measurement Methods 0.000 description 1
Landscapes
- Testing Of Individual Semiconductor Devices (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP7756289U JPH0317579U (en:Method) | 1989-06-30 | 1989-06-30 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP7756289U JPH0317579U (en:Method) | 1989-06-30 | 1989-06-30 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPH0317579U true JPH0317579U (en:Method) | 1991-02-21 |
Family
ID=31620066
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP7756289U Pending JPH0317579U (en:Method) | 1989-06-30 | 1989-06-30 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH0317579U (en:Method) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2012173003A (ja) * | 2011-02-17 | 2012-09-10 | Ueno Seiki Kk | 電子部品測定装置 |
-
1989
- 1989-06-30 JP JP7756289U patent/JPH0317579U/ja active Pending
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2012173003A (ja) * | 2011-02-17 | 2012-09-10 | Ueno Seiki Kk | 電子部品測定装置 |