JPH03175333A - Light transmission line measuring device - Google Patents
Light transmission line measuring deviceInfo
- Publication number
- JPH03175333A JPH03175333A JP32308589A JP32308589A JPH03175333A JP H03175333 A JPH03175333 A JP H03175333A JP 32308589 A JP32308589 A JP 32308589A JP 32308589 A JP32308589 A JP 32308589A JP H03175333 A JPH03175333 A JP H03175333A
- Authority
- JP
- Japan
- Prior art keywords
- light
- optical
- output
- transmission line
- semiconductor laser
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 230000005540 biological transmission Effects 0.000 title claims description 32
- 239000004065 semiconductor Substances 0.000 claims abstract description 42
- 230000003287 optical effect Effects 0.000 claims description 63
- 238000001228 spectrum Methods 0.000 claims description 14
- 238000010408 sweeping Methods 0.000 claims description 12
- 239000000835 fiber Substances 0.000 abstract description 8
- 230000000694 effects Effects 0.000 abstract description 3
- 239000013307 optical fiber Substances 0.000 description 12
- 238000005259 measurement Methods 0.000 description 8
- 238000010586 diagram Methods 0.000 description 6
- 230000010355 oscillation Effects 0.000 description 6
- 230000003595 spectral effect Effects 0.000 description 4
- 238000002347 injection Methods 0.000 description 3
- 239000007924 injection Substances 0.000 description 3
- 238000002955 isolation Methods 0.000 description 2
- 230000006866 deterioration Effects 0.000 description 1
- 238000005305 interferometry Methods 0.000 description 1
- 238000000034 method Methods 0.000 description 1
- 238000000253 optical time-domain reflectometry Methods 0.000 description 1
- 230000001131 transforming effect Effects 0.000 description 1
Landscapes
- Testing Of Optical Devices Or Fibers (AREA)
Abstract
Description
【発明の詳細な説明】
〈産業上の利用分野〉
本発明は、光伝送線路の障害点測定装置で特に近距離の
障害点を測定するものに関する。DETAILED DESCRIPTION OF THE INVENTION <Industrial Application Field> The present invention relates to a fault point measuring device for an optical transmission line, particularly one that measures short-distance fault points.
〈従来の技術〉
光ファイバの破断点等を検出するために、光ファイバの
一端から光パルスを送り、後方散乱光を観測する０ＴＤ
Ｒ（Ｏｐｔｉｃａｌ Ｔｉｎｅ Ｄｏｎａｉｎ Ｒｅｆ
ｌｅｃｔａｒ ）が従来から用いられている。<Prior art> 0TD, which sends a light pulse from one end of an optical fiber and observes the backscattered light in order to detect the break point of the optical fiber.
R (Optical Tine Donain Ref
lectar) has been used conventionally.
〈発明が解決しようとする課題〉
しかしながら、０ＴＤＲは破断点からの後方散乱光の時
間遅れを測定しているため、短距離（５ｍ以下）の測定
は不可能である。<Problems to be Solved by the Invention> However, since 0TDR measures the time delay of backscattered light from the breaking point, short-distance measurement (5 m or less) is impossible.
本発明は上記のような課題を解決するためになされたも
ので、光伝送線路の短距離の破断点の位置を測定可能な
破断点測定装置を実現することを目的とする。The present invention was made in order to solve the above problems, and an object of the present invention is to realize a break point measuring device that can measure the position of a short distance break point of an optical transmission line.
〈課題を解決するための手段〉
本発明の＃１は入射光の少なくとも一部を反射するミラ
ーと光伝送線路の障害点との間で光源からの光を干渉さ
せ、光源の光周波数を掃引したときの干渉光出力から前
記ミラーと前記障害点との間の共振器長を演算すること
により、障害点位置を測定するように構成したことを特
徴とする光伝送線路測定器に関する。<Means for Solving the Problems> The first aspect of the present invention is to interfere the light from the light source between a mirror that reflects at least a portion of the incident light and a failure point of the optical transmission line, and sweep the optical frequency of the light source. The present invention relates to an optical transmission line measuring instrument characterized in that the position of the fault point is measured by calculating the resonator length between the mirror and the fault point from the output of interference light when the interference occurs.
本発明の第２は光源と、この光源の出力波長を掃引する
掃引手段と、前記光源の出力光を入射する光分岐手段と
、この光分岐手段の出力光を入射してその透過光を光伝
送線路に導くハーフミラ−と、このハーフミラ−と前記
光伝送線路の障害点との間で干渉した光が前記ハーフミ
ラ−を介して前記分岐手段に戻り前記光源からの光と分
離された後入射する受光素子と、この受光素子の出力が
示す干渉ピーク同士の間隔から前記障害点の位置を演算
する演算手段とを備えたことを特徴とする光伝送線路測
定器に存する。A second aspect of the present invention is a light source, a sweeping means for sweeping the output wavelength of the light source, a light branching means for inputting the output light of the light source, and a light branching means for inputting the output light of the light branching means and transmitting the transmitted light. A half mirror guided to a transmission line, and the light interfered between this half mirror and a failure point of the optical transmission line returns to the branching means via the half mirror and enters after being separated from the light from the light source. An optical transmission line measuring instrument characterized by comprising a light receiving element and a calculation means for calculating the position of the fault point from the interval between interference peaks indicated by the output of the light receiving element.
本発明の第３は後面に反射ミラーを有する半導体レーザ
と、この半導体レーザの出力周波数を掃引する掃引手段
と、前記半導体レーザの前面からの出射光を２つに分岐
して一方の出力光を前記光伝送線路に導く光分岐手段と
、この光分岐手段の他方の出力光を入射する光スペクト
ル線幅測定装置と、前記反射ミラーと前記障害点との間
の干渉により生ずる前記光スペクトル線幅測定装置の出
力変化から前記障害点の位置を演算する演算手段とを備
えたことを特徴とする光伝送線路測定器に間する。A third aspect of the present invention includes a semiconductor laser having a reflection mirror on the rear surface, a sweeping means for sweeping the output frequency of the semiconductor laser, and a device that splits the light emitted from the front surface of the semiconductor laser into two and outputs one of the output lights. the optical spectrum linewidth caused by interference between the optical branching means guiding the optical transmission line to the optical transmission line, the optical spectrum linewidth measurement device into which the other output light of the optical branching means is incident, and the reflecting mirror and the failure point; The present invention provides an optical transmission line measuring instrument characterized by comprising: computing means for computing the position of the fault point from changes in the output of the measuring device.
く作用〉
本発明によれば、ミラーと障害点との間の距離に対応し
て干渉周波数の間隔が変化するので、この間隔から障害
点の位置を演算することができる。Effects> According to the present invention, since the interval between interference frequencies changes in accordance with the distance between the mirror and the failure point, the position of the failure point can be calculated from this interval.
〈実施例〉 以下本発明を図面を用いて詳しく説明する。<Example> The present invention will be explained in detail below using the drawings.
第１図は本発明に係る光伝送線路測定器の第１の実施例
を示す構成ブロック図である。半導体レーザ駆動電′ａ
１１は光源を構成するＤＦＢ半導体レーザ１の注入ｔｈ
ｍを駆動する。半導体レーザ１を出射した光はコリメ
ートレンズ２で平行光にされ、戻り光防止用の光アイソ
レータ３を通って、光分岐手段を構成するビームスプリ
ッタ４に入射する。ビームスプリッタ４を透過した光は
レンズ５で絞られ、ハーフミラ−６を介して被測定ファ
イバ７に入射する。被測定ファイバ７の破断点Ａからの
後方散乱光は干渉後ハーフミラ−６を透過し、レンズ５
で平行光となり、ビームスプリッタ４で反射し、受光素
子を構成するフォトダイオード８に入射する。フォトダ
イオード８の出力はフィルタ付カウンタ９で計数され、
さらに演算表示部１０で破断点Ａの位置が演算され、表
示される。FIG. 1 is a block diagram showing a first embodiment of an optical transmission line measuring instrument according to the present invention. Semiconductor laser drive electric 'a'
11 is the injection th of the DFB semiconductor laser 1 constituting the light source.
Drive m. The light emitted from the semiconductor laser 1 is made into parallel light by a collimating lens 2, passes through an optical isolator 3 for preventing return light, and enters a beam splitter 4 constituting a light branching means. The light transmitted through the beam splitter 4 is condensed by a lens 5 and enters a fiber to be measured 7 via a half mirror 6. The backscattered light from the break point A of the fiber to be measured 7 is transmitted through the half mirror 6 after interference, and then passes through the lens 5.
The light becomes parallel light, is reflected by the beam splitter 4, and enters the photodiode 8 that constitutes the light receiving element. The output of the photodiode 8 is counted by a counter 9 with a filter,
Furthermore, the position of the breaking point A is calculated and displayed on the calculation display section 10.
また演算表示部１０は半導体レーザ駆動電源１１に電流
値の指示を与えることにより、光源の出力周波数を掃引
する掃引手段をも構成する。The calculation display section 10 also constitutes a sweeping means for sweeping the output frequency of the light source by giving a current value instruction to the semiconductor laser drive power supply 11.
上記の構成の光伝送線路測定器の動作を次に説明する。The operation of the optical transmission line measuring instrument having the above configuration will be explained next.
この光伝送線路測定器は、半導体レーザ１の駆動電流を
変えることにより、発振波長を変化させ、ハーフミラ−
６と被測定ファイバ７の破断点Ａとで形成される共振器
の共振器長を測定することにより、短距離の破断点位置
を正確に測定するものである０周波数が掃引された光が
ハーフミラ−６を介して被測定ファイバ７に入射すると
、破断点Ａとハーフミラ−６との間における干渉により
、ハーフミラ−６からビームスプリッタ４へ戻る光は上
記共振器長に対応した周波数間隔で干渉ピークを生じる
。被測定ファイバ７の直前に配！したハーフミラ−６と
破断点Ａとの間で形成される共振器の出力が強められる
条件は、共振器長すなわちハーフミラ−６と破断点Ａと
の間の距離を２、光速をＣ２半導体レーザ１の発振周波
数をｆ、光ファイバ７の屈折率をｎとすると、次式で表
される。This optical transmission line measuring instrument changes the oscillation wavelength by changing the drive current of the semiconductor laser 1, and
By measuring the resonator length of the resonator formed by 6 and the break point A of the fiber to be measured 7, the 0 frequency swept light is used to accurately measure the short distance break point position. -6, the light returns to the beam splitter 4 from the half mirror 6 due to interference between the break point A and the half mirror 6, and the interference peaks at a frequency interval corresponding to the resonator length. occurs. Placed just before the fiber under test 7! The conditions for intensifying the output of the resonator formed between the half mirror 6 and the breaking point A are as follows: the resonator length, that is, the distance between the half mirror 6 and the breaking point A, is 2, the speed of light is C2, the semiconductor laser is 1 When the oscillation frequency of is f and the refractive index of the optical fiber 7 is n, it is expressed by the following equation.
ｇ＝ｍ（ｃ／２ｆ）（１／ｎ） ＝１１）ただ
しｍ＝１．２．３・・・
ここで半導体レーザ１の発振周波数を変化させ、次に出
力が強められるときの発振周波数をｆ−とすると、
Ｒ＝ｃ／２ｎ （ｆ−ｆ −） −（２＞と
なる、したがって第３図に示すように、半導体レーザ１
の注入電流と中心波長の関係が分かっていれば、ｆ−ｆ
−の値を知ることができ、共振器長２を測定することが
できる０、ｔた半一体レーザ１の中心波長が分かってい
なくても、第３図の傾き（ここでは約１．３ＧＨｚ／ｍ
Ａ）が分かっていれば測定可能である。g=m(c/2f)(1/n) =11) However, m=1.2.3... Here, change the oscillation frequency of the semiconductor laser 1, and then calculate the oscillation frequency when the output is increased. f-, then R=c/2n (f-f-)-(2>, so as shown in FIG. 3, the semiconductor laser 1
If the relationship between the injection current and the center wavelength is known, f−f
- can be known and the cavity length 2 can be measured. Even if the center wavelength of the semi-integral laser 1 is not known, the slope of Fig. 3 (here approximately 1.3 GHz/ m
If A) is known, it can be measured.
ここで実際の動作例を以下に示す。An example of actual operation is shown below.
（イ）半導体レーザ１の注入電流を例えば３０ｍＡから
１０ｍＡ／秒で上げてゆき、このときのフォトダイオー
ド８の出力が第２図の１２のようになっなとする。(a) Suppose that the injection current of the semiconductor laser 1 is increased, for example, from 30 mA to 10 mA/sec, and the output of the photodiode 8 at this time becomes as shown in 12 in FIG.
（ロ）この出力はフィルタ付カウンタ９においてフィル
タでスロープ成分１３を取除さ、カウンタで計数され２
力ウント／秒となる。(b) This output is filtered in a filter equipped counter 9 to remove the slope component 13, and then counted by the counter 2.
The force is expressed in units of force per second.
（ハ＞ＳＸ表示部１０で（イ）および（ロ）の数値を用
いてピークからピーク迄の電流ｆｉｉ ５ ｍ Ａを求
め、レーザ発振周波数差
１．３ＧＨｚ／ｍＡｘ５ｍＡ
より、共振器長Ｐは
ｇ＝３ｘ１０８／２ｘ１．３ｘ５Ｇ
０．０２ｍ
となる、なお半導体レーザ１に電流が流れ過ぎないよう
に、演算表示部１０より駆動電源１１にリミッタをかけ
ている。(C> Find the current fii 5 mA from peak to peak using the values in (a) and (b) on the SX display unit 10, and from the laser oscillation frequency difference of 1.3 GHz/mA x 5 mA, the resonator length P is g =3x108/2x1.3x5G 0.02m.A limiter is applied to the drive power source 11 from the arithmetic display section 10 to prevent too much current from flowing through the semiconductor laser 1.
上記の手順により、半導体レーザ１の電流掃引幅を３０
〜１６０ｍＡ（周波数差で１８０ＧＨｚ）、レーザ線幅
をＩＭＨｚとしたとき、最短測定距離（ＯＴＤＲでデッ
ドゾーン）は掃引幅で決まり、０．５ｍｍ、最長測定距
離は線幅で決まり、１００ｍとなる。ただし最長測定距
離は、現在数も線幅の狭い（１ｋＨｚ ）半導体レーザ
を用いれば、１１００ｋ迄測定可能となる。By the above procedure, the current sweep width of the semiconductor laser 1 is set to 30
~160 mA (180 GHz in frequency difference) and when the laser line width is IMHz, the shortest measurement distance (dead zone in OTDR) is determined by the sweep width and is 0.5 mm, and the longest measurement distance is determined by the line width and is 100 m. However, the longest measurement distance can be measured up to 1100 km if a semiconductor laser with a narrow linewidth (1 kHz) is used.
このような構成の光伝送線路測定器によれば、光源の波
長を変えて、干渉法を用いることにより、被測定ファイ
バの短距離の破断点の位置を高精度で測定することがで
きる。According to the optical transmission line measuring instrument having such a configuration, by changing the wavelength of the light source and using interferometry, it is possible to measure the position of a short-distance break point of the fiber under test with high precision.
また光分岐手段として、ビームスプリッタの代りに超音
波光変調器を用いて出射光に変関をかけ、受光素子の出
力をロックインアンプで同期検波すれば、Ｓ／Ｎ比が向
上する。Furthermore, the S/N ratio can be improved by using an ultrasonic optical modulator instead of a beam splitter as the optical branching means to transform the emitted light, and by synchronously detecting the output of the light receiving element with a lock-in amplifier.
またフィルタ付きカウンタの代りにＡ／Ｄ変換器を用い
てコンピュータで演算処理してもよい。Further, instead of a counter with a filter, an A/D converter may be used to perform arithmetic processing on a computer.
また破断点が多数個ある場合にも、ＦＦＴアナライザを
用いて破断点の分布を知ることができる。Furthermore, even when there are many breaking points, the distribution of the breaking points can be determined using an FFT analyzer.
第４図は本発明に係る光伝送線路測定器の第２の実施例
を示す構成ブロック図である。第１図と同じ部分は同一
の記号を付しである。半導体レーザ駆動電源１１は演算
表示部２０の指示に基づいて、ＤＦＢ半導体レーザ１を
ある電流で発振させる。ここでＤＦ８半導体レーザ１は
少なくともレーザ光の一部を反射する後面のミラーと反
射を抑えな前面の端面を備えている。ＤＦＢ半導体レー
ザ１の前面の端面から出射された光はレンズ２で平行光
にされ、光アイソレータ１３に入射する。FIG. 4 is a block diagram showing a second embodiment of the optical transmission line measuring instrument according to the present invention. The same parts as in FIG. 1 are given the same symbols. The semiconductor laser drive power supply 11 causes the DFB semiconductor laser 1 to oscillate with a certain current based on instructions from the calculation display section 20 . Here, the DF8 semiconductor laser 1 includes a rear mirror that reflects at least a portion of the laser beam and a front end surface that suppresses reflection. Light emitted from the front end face of the DFB semiconductor laser 1 is converted into parallel light by a lens 2 and enters an optical isolator 13.
ここで光アイソレータ１３はアイソレーション比が２０
〜３０ｄＢ程度で、ＤＦＢ半導体レーザ１に戻り光を与
えて半導体レーザ１の後面のミラーと被測定光ファイバ
破断点との間で共振器を形成するとともに、半導体し〜
ザ１の破損あるいは劣化を防止するためのものである。Here, the optical isolator 13 has an isolation ratio of 20
Return light is given to the DFB semiconductor laser 1 at about ~30 dB to form a resonator between the mirror on the rear surface of the semiconductor laser 1 and the break point of the optical fiber to be measured, and the semiconductor
This is to prevent damage or deterioration of the housing 1.
光アイソレータ１３を通過した光はビームスグリツタ１
４で２つに分岐され、一方の出射光（透過光）はレンズ
５で絞られ、被測定光ファイバ７に入射する。被測定光
ファイバ７の破断点Ａで生じた後方散乱光は元の経路を
たどってＤＦＢ半導体レーザ１に戻る。The light that has passed through the optical isolator 13 is sent to the beam sinter 1
4, the emitted light (transmitted light) is divided into two parts, and one of the emitted lights (transmitted light) is condensed by a lens 5 and enters an optical fiber 7 to be measured. The backscattered light generated at the break point A of the optical fiber 7 to be measured returns to the DFB semiconductor laser 1 following the original path.
ビームスプリッタ１４の他方の分岐光（反射光）はアイ
ソレーション比が３０〜６０ｄＢの光アイソレータ２３
を通り、レンズ１５で絞られ、光ファイバ２１を介して
光スペクトル線幅測定装置２２に入射する。光スペクト
ル線幅測定装置２２はこの入射光の光スペクトル線幅を
測定し、その出力に基づいて演算表示部２０が破断点Ａ
の位置を演算する。The other branched light (reflected light) of the beam splitter 14 is passed through an optical isolator 23 with an isolation ratio of 30 to 60 dB.
The light is condensed by a lens 15 and enters an optical spectrum linewidth measuring device 22 via an optical fiber 21 . The optical spectrum linewidth measurement device 22 measures the optical spectrum linewidth of this incident light, and based on the output, the calculation display unit 20 determines the breaking point A.
Calculate the position of.
上記のような構成の光伝送線路測定器の動作を次に説明
する。演算表示部２０は特定のレーザ周波数における光
スペクトル線幅出力を入力した後、半導体レーザ駆動電
源１１に指示を出して半導体レーザ１の駆動電流を変化
させ、異なったレーザ周波数における光スペクトル線幅
を入力する。以下同様に半導体レーザ駆動電源１１に順
次指示を出して、半導体レーザ１の駆動電流値を変化さ
せ、変化するレーザ周波数に対応する各周波数光スペク
トル線幅を入力する。スペクトル線幅はレーザの発振周
波数に対して一定周波数て変化するので、この周期を演
算表示部２０で測定し、（２）式を用いて半導体レーザ
１（の後面の端面）と被測定ファイバ７中の破断点Ａの
間の距ＩＩＱを測定することができる。この距離ｅから
半導体レーザ１と光ファイバ７入射口との間の距離を引
算すれば、被測定光ファイバ７における破断点距離を求
めることかできる。ｇ／Ｊえば第５図のようなスペクト
ル線幅データが得られた場合、（２）式に代入すると、
ｇ＝（３Ｘ１０β）／（２Ｘ１０．８Ｘ１．５）＝９．
３ｍｍ
となる、なお第５図において、半導体レーザ１への戻り
光が無い場合を比較のために示している。The operation of the optical transmission line measuring instrument configured as described above will be explained next. After inputting the optical spectrum linewidth output at a specific laser frequency, the calculation display section 20 issues an instruction to the semiconductor laser drive power supply 11 to change the driving current of the semiconductor laser 1, thereby changing the optical spectrum linewidth at different laser frequencies. input. Thereafter, instructions are sequentially issued to the semiconductor laser drive power supply 11 in the same manner to change the drive current value of the semiconductor laser 1, and input the optical spectrum linewidth of each frequency corresponding to the changing laser frequency. Since the spectral linewidth changes at a constant frequency with respect to the oscillation frequency of the laser, this period is measured on the calculation display section 20, and using equation (2), the semiconductor laser 1 (rear end face) and the fiber under test 7 are measured. The distance IIQ between the breaking points A in the middle can be measured. By subtracting the distance between the semiconductor laser 1 and the entrance of the optical fiber 7 from this distance e, the distance at the break point in the optical fiber 7 to be measured can be determined. If spectral linewidth data such as g/J is obtained as shown in FIG. 5, substituting it into equation (2) yields g=(3X10β)/(2X10.8X1.5)=9.
In FIG. 5, the case where there is no return light to the semiconductor laser 1 is shown for comparison.
第４図のような構成の場合、ＤＦＢ半導体レーザ１から
被測定光ファイバ７迄の距離を１ｍｍ以上とすれば、ス
ペクトル線幅ＩＭＨｚ、電流変化による周波数掃引幅１
８０ＧＨｚの一般的なりＦＢレーザでも、理論的にデヅ
ドゾーンＯｍｍ、Ｉｋ長測定距離！ ＯＯｍの性能を得
ることができる。In the case of the configuration shown in FIG. 4, if the distance from the DFB semiconductor laser 1 to the optical fiber 7 to be measured is 1 mm or more, the spectral line width IMHz and the frequency sweep width due to current change 1
Even with a general 80GHz FB laser, theoretically the dedu zone Omm and Ik long measurement distance! Performance of OOm can be obtained.
このような構成の光伝送線路測定器によれば、半導体レ
ーザと破断点の間で共振器を構成し、光スペクトル幅変
化を観測することにより、光ファイバの極短距離の破断
点の位置が高分解能で測定可能となる。特に破断点の位
置が短距離の場合には干渉光の明暗が低周波になるので
、スペクトル幅の方が測定が容易である。According to an optical transmission line measuring instrument with such a configuration, a resonator is configured between the semiconductor laser and the break point, and by observing changes in the optical spectrum width, the position of the break point over an extremely short distance in the optical fiber can be determined. It becomes possible to measure with high resolution. In particular, when the break point is located over a short distance, the brightness and darkness of the interference light will be at a low frequency, so it is easier to measure the spectral width.
なお上記の実施例においてＤＦＢ半導体レーザの波長掃
引は、電流でなく温度で行ってもよい。Note that in the above embodiments, the wavelength sweeping of the DFB semiconductor laser may be performed using temperature instead of current.
またＤＦＢ半導体レーザ１の代りにシングルモードで発
振する任意の半導体レーザを用いることができる。Further, instead of the DFB semiconductor laser 1, any semiconductor laser that oscillates in a single mode can be used.
まな破断点が多数ある場合でも、線幅−電流の関係をフ
ーリエ変換すれば、破断点の分布を測定することができ
る。Even if there are many breaking points, the distribution of the breaking points can be measured by Fourier transforming the relationship between line width and current.
またビームスプリヅタ１４からの分岐光を光スペクトル
線幅装置２２に入射する代りに、半導体レーザ１の側面
光（モニタ側出射光）を光スペクトル線幅装置２２に入
射してもよい。Further, instead of inputting the branched light from the beam splitter 14 into the optical spectrum linewidth device 22, the side light of the semiconductor laser 1 (light emitted from the monitor side) may be inputted into the optical spectrum linewidth device 22.
なお上記の各実施例において、被測定光伝送線路として
光ファイバを用いたが、光導波路等能の光伝送線路にも
同様に適用することができる。In each of the above embodiments, an optical fiber was used as the optical transmission line to be measured, but the present invention can be similarly applied to an optical transmission line having the function of an optical waveguide or the like.
また上記の各実施例において、破断点以外の短距離の障
害点位置を測定することもできる。Furthermore, in each of the embodiments described above, it is also possible to measure the position of a fault point over a short distance other than the breaking point.
〈発明の効果〉
以上述べたように本発明によれば、光伝送線路の短距離
の障害点の位置を測定可能な光伝送線路測定器を簡単な
構成で実現することができる。<Effects of the Invention> As described above, according to the present invention, an optical transmission line measuring instrument capable of measuring the position of a short distance fault point on an optical transmission line can be realized with a simple configuration.
第１図は本発明に係る光伝送線路測定器の第１の実施例
を示す構成ブロック図、第２図および第３図は第１図装
置の特性曲線図、第４図は本発明に係る光伝送線路測定
器の第２の実施例を示す構成ブロック図、第５図は類４
図装置の特性曲線図である。
１・・・光源または半導体レーザ、４，１４・・・光分
岐手段、６・・・ハーフミラ−１７・・・光伝送線路、
８・・・受光素子、１０．２０・・・演算表示部、１１
・・・掃引手段、２２・・・光スペクトル線幅測定装置
、Ａ・・・←瞥旨＋Ｌ’ｓ運、−勾一一
Δ−′Ｖ蟹廖歪FIG. 1 is a block diagram showing the configuration of a first embodiment of the optical transmission line measuring device according to the present invention, FIGS. 2 and 3 are characteristic curve diagrams of the device shown in FIG. A configuration block diagram showing the second embodiment of the optical transmission line measuring instrument, FIG. 5 is a class 4
FIG. 3 is a characteristic curve diagram of the device. DESCRIPTION OF SYMBOLS 1... Light source or semiconductor laser, 4, 14... Optical branching means, 6... Half mirror 17... Optical transmission line,
8... Light receiving element, 10.20... Calculation display section, 11
. . . Sweeping means, 22 . . . Optical spectrum linewidth measurement device, A .
Claims (3)
送線路の障害点との間で光源からの光を干渉させ、光源
の光周波数を掃引したときの干渉光出力から前記ミラー
と前記障害点との間の共振器長を演算することにより、
障害点位置を測定するように構成したことを特徴とする
光伝送線路測定器。(1) Light from a light source is caused to interfere between a mirror that reflects at least a part of the incident light and a fault point of the optical transmission line, and the interference light output when the optical frequency of the light source is swept is determined from the interference light output between the mirror and the fault point. By calculating the resonator length between the points,
An optical transmission line measuring device characterized in that it is configured to measure the position of a fault point.
と、前記光源の出力光を入射する光分岐手段と、この光
分岐手段の出力光を入射してその透過光を光伝送線路に
導くハーフミラーと、このハーフミラーと前記光伝送線
路の障害点との間で干渉した光が前記ハーフミラーを介
して前記分岐手段に戻り前記光源からの光と分離された
後入射する受光素子と、この受光素子の出力が示す干渉
ピーク同士の間隔から前記障害点の位置を演算する演算
手段とを備えたことを特徴とする光伝送線路測定器。(2) A light source, a sweeping means for sweeping the output wavelength of the light source, an optical branching means for inputting the output light of the light source, and an optical branching means for inputting the output light of the optical branching means and transmitting the transmitted light to an optical transmission line. a half mirror that guides the light; and a light receiving element on which the light that has interfered between the half mirror and the failure point of the optical transmission line returns to the branching means through the half mirror and is separated from the light from the light source. An optical transmission line measuring instrument comprising: a calculation means for calculating the position of the fault point from the interval between interference peaks indicated by the output of the light receiving element.
半導体レーザの出力周波数を掃引する掃引手段と、前記
半導体レーザの前面からの出射光を２つに分岐して一方
の出力光を前記光伝送線路に導く光分岐手段と、この光
分岐手段の他方の出力光を入射する光スペクトル線幅測
定装置と、前記反射ミラーと前記障害点との間の干渉に
より生ずる前記光スペクトル線幅測定装置の出力変化か
ら前記障害点の位置を演算する演算手段とを備えたこと
を特徴とする光伝送線路測定器。(3) a semiconductor laser having a reflection mirror on its rear surface; a sweeping means for sweeping the output frequency of the semiconductor laser; and a device that splits the light emitted from the front surface of the semiconductor laser into two and transmits one output light to the optical transmission. An optical branching means that guides the light to the line, an optical spectrum linewidth measuring device into which the other output light of the optical branching means is incident, and an optical spectrum linewidth measuring device that causes interference between the reflecting mirror and the failure point. 1. An optical transmission line measuring instrument comprising: calculation means for calculating the position of the fault point from a change in output.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP32308589A JP2626099B2 (en) | 1989-09-26 | 1989-12-13 | Optical transmission line measuring instrument |
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1-249926 | 1989-09-26 | ||
| JP24992689 | 1989-09-26 | ||
| JP32308589A JP2626099B2 (en) | 1989-09-26 | 1989-12-13 | Optical transmission line measuring instrument |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPH03175333A true JPH03175333A (en) | 1991-07-30 |
| JP2626099B2 JP2626099B2 (en) | 1997-07-02 |
Family
ID=26539555
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP32308589A Expired - Fee Related JP2626099B2 (en) | 1989-09-26 | 1989-12-13 | Optical transmission line measuring instrument |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JP2626099B2 (en) |
Cited By (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH08210944A (en) * | 1995-02-02 | 1996-08-20 | Yokogawa Electric Corp | Optical fiber inspection device |
| JPH08219947A (en) * | 1995-02-09 | 1996-08-30 | Yokogawa Electric Corp | Inspection apparatus for optical fiber |
| JP2007175433A (en) * | 2005-12-28 | 2007-07-12 | Olympus Corp | Endoscopic apparatus and lighting system for endoscope |
| CN113049227A (en) * | 2021-03-15 | 2021-06-29 | 深圳市杰普特光电股份有限公司 | Laser wavelength modulation measuring device and measuring method and measuring system thereof |
| CN114777822A (en) * | 2022-04-18 | 2022-07-22 | 南京大学 | Fiber grating array synchronous sensing system based on multi-wavelength tunable laser |
Families Citing this family (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN101232204B (en) * | 2008-01-11 | 2011-08-10 | 华中科技大学 | High pressure equipment insulating power supply based on electro-optical transformation |
-
1989
- 1989-12-13 JP JP32308589A patent/JP2626099B2/en not_active Expired - Fee Related
Cited By (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH08210944A (en) * | 1995-02-02 | 1996-08-20 | Yokogawa Electric Corp | Optical fiber inspection device |
| JPH08219947A (en) * | 1995-02-09 | 1996-08-30 | Yokogawa Electric Corp | Inspection apparatus for optical fiber |
| JP2007175433A (en) * | 2005-12-28 | 2007-07-12 | Olympus Corp | Endoscopic apparatus and lighting system for endoscope |
| CN113049227A (en) * | 2021-03-15 | 2021-06-29 | 深圳市杰普特光电股份有限公司 | Laser wavelength modulation measuring device and measuring method and measuring system thereof |
| CN113049227B (en) * | 2021-03-15 | 2024-04-02 | 深圳市杰普特光电股份有限公司 | Laser wavelength modulation measuring device, measuring method and measuring system thereof |
| CN114777822A (en) * | 2022-04-18 | 2022-07-22 | 南京大学 | Fiber grating array synchronous sensing system based on multi-wavelength tunable laser |
| CN114777822B (en) * | 2022-04-18 | 2024-03-19 | 南京大学 | Fiber bragg grating array synchronous sensing system based on multi-wavelength tunable laser |
Also Published As
| Publication number | Publication date |
|---|---|
| JP2626099B2 (en) | 1997-07-02 |
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