JPH03163507A - Range-finding method and auxiliary light projecting device - Google Patents

Range-finding method and auxiliary light projecting device

Info

Publication number
JPH03163507A
JPH03163507A JP30433289A JP30433289A JPH03163507A JP H03163507 A JPH03163507 A JP H03163507A JP 30433289 A JP30433289 A JP 30433289A JP 30433289 A JP30433289 A JP 30433289A JP H03163507 A JPH03163507 A JP H03163507A
Authority
JP
Japan
Prior art keywords
image
pattern
deviation
auxiliary light
amount
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP30433289A
Other languages
Japanese (ja)
Inventor
Akira Suzuki
明 鈴木
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Ricoh Co Ltd
Original Assignee
Ricoh Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Ricoh Co Ltd filed Critical Ricoh Co Ltd
Priority to JP30433289A priority Critical patent/JPH03163507A/en
Publication of JPH03163507A publication Critical patent/JPH03163507A/en
Pending legal-status Critical Current

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  • Measurement Of Optical Distance (AREA)
  • Focusing (AREA)
  • Automatic Focus Adjustment (AREA)

Abstract

PURPOSE:To easily and surely correct an error caused by chromatic aberration in the case of executing range-finding by the use of auxiliary light by successively projecting two or more pattern images by light beams having different wavelengths and obtaining the deviation of the image every pattern. CONSTITUTION:The method is such a range-finding method that the pattern image IP is projected on an object 0 by an auxiliary light projecting device 1 and the image of the pattern image IP is formed on image sensors 4 and 5 by a pair of image-formation lenses 2 and 3 so that an object distance may be measured based on the deviation of the mutual images on the respective image sensors 4 and 5. By successively projecting two or more pattern images IP by the light beams having different wavelengths to the object 0, the deviation of the image is obtained corresponding to the respective pattern images IP. Thus, the deviation of the image is obtained every wavelength and how the error of the deviation of the image caused by the chromatic aberration is changed by the wavelength is known, thereby recognizing the object distance for a standard object.

Description

【発明の詳細な説明】 [産業上の利用分野] 本発明は測距方法および補助投光装置に関する.本発明
はパッシブ測距装置に利用できる。
DETAILED DESCRIPTION OF THE INVENTION [Field of Industrial Application] The present invention relates to a distance measuring method and an auxiliary floodlight device. INDUSTRIAL APPLICATION This invention can be utilized for a passive ranging device.

[従来の技術] TTL位相差測距方式や外光三角測距方式等のパッシブ
測距方式では一般に、被写体の明るさが十分でない場合
には補助投光装置による補助光によりパターン像を被写
体上に投影して測距を行い、被写体の明るさが十分に明
るいときは補助光以外の所謂「通常光」で測距が行われ
る。この通常光による測距は波長550nm程度の緑色
光に対して適正な測距がなされるように設定されている
[Prior art] In passive ranging methods such as the TTL phase difference ranging method and the external light triangular ranging method, if the brightness of the subject is not sufficient, a pattern image is projected onto the subject using auxiliary light from an auxiliary light projector. When the brightness of the subject is sufficiently bright, distance measurement is performed using so-called "normal light" other than the auxiliary light. This distance measurement using normal light is set so that appropriate distance measurement can be performed for green light having a wavelength of about 550 nm.

補助投光装置の光源には一般にLEDが用いられる。L
EDは発光波長の幅が狭く、一般に波長領域も赤から赤
外領域の波長のものが多い。
Generally, an LED is used as a light source of the auxiliary floodlight device. L
ED has a narrow range of emission wavelengths, and generally many wavelengths range from red to infrared.

このため補助光を用いた場合には,通常先のみによる測
距に対し色収差による誤差が発生することが知られてい
る。
For this reason, it is known that when auxiliary light is used, errors due to chromatic aberration occur compared to normal distance measurement using only the tip.

従来、このような色収差による測距誤差は、一般的被写
体に対する通常光と補助光との測距誤差分を補正値とし
て補助光使用時に補正を行っていた。しかし、この補正
値は代表的な値に過ぎず、実際には十分な補正が出来て
いなかった。
Conventionally, such distance measurement errors due to chromatic aberration have been corrected when using the auxiliary light by using the distance measurement error between the normal light and the auxiliary light for a general subject as a correction value. However, this correction value is only a typical value, and in reality, sufficient correction has not been achieved.

この理由としては被写体の反射率の違いや外光の影響で
測距を行っている被写体の反射光が外光と補助光の混合
となるため色収差による測距誤差が一定にならないこと
が考えられる。
The reason for this is thought to be that due to differences in the reflectance of the subject and the influence of external light, the reflected light from the subject during distance measurement becomes a mixture of external light and auxiliary light, so the distance measurement error due to chromatic aberration is not constant. .

[発明が解決しようとする課題] このような色収差による誤差を除去するため、可視光専
用の測距と赤外光専用の測距を別個の測距装置で行うこ
とも提案されている(特開昭59−l16626号公N
)が,測距装置を2つ必要とし,装置が大型化し且つ高
コストとなる問題がある。
[Problems to be Solved by the Invention] In order to eliminate errors caused by such chromatic aberrations, it has been proposed to perform distance measurement exclusively for visible light and for distance measurement exclusively for infrared light using separate distance measuring devices (particularly 1985-116626 public N
) requires two distance measuring devices, which increases the size and cost of the device.

本発明は上述した事情に鑑みてなされたものであって、
小型・低コストの装置で実現でき、且つ色収差による誤
差を確実に除去できる新規な測距方法およびこの測距方
法の実施に用いられる補助投光装置の提供を目的とする
The present invention was made in view of the above-mentioned circumstances, and
The object of the present invention is to provide a novel distance measuring method that can be realized with a small, low-cost device and that can reliably eliminate errors caused by chromatic aberration, and an auxiliary light projector used to implement this distance measuring method.

[課題を解決するための手段] 以下、本発明を説明する. 本発明の測距方法は「補助投光装置によりパタ一ン像を
被写体上に投影し、1対の結像レンズにより上記パター
ン像の像を各結像レンズに対応するイメージセンサー上
に結像させ、各イメージセンサー上の像相互のずれ量を
求め、この像のずれ量に基いて被写体距離を測定するパ
ッシブ測距方式の測距方法」であって、その特徴とする
ところは「同一被写体に対し、波長の異なる光による2
以上のパターン像を順次投影して像のずれ量を各パター
ンごとに求め、これら像のずれ量に基づき色収差の影響
を除去した被写体距離を求めるJ点にある。
[Means for Solving the Problems] The present invention will be explained below. The distance measuring method of the present invention is to project a pattern image onto a subject using an auxiliary light projector, and form an image of the pattern image onto an image sensor corresponding to each imaging lens using a pair of imaging lenses. This is a passive ranging method that calculates the amount of deviation between the images on each image sensor and measures the distance to the subject based on the amount of deviation between the images. In contrast, 2 due to light of different wavelengths
The above-mentioned pattern images are sequentially projected, the amount of image deviation is determined for each pattern, and the object distance is determined based on the amount of image deviation with the influence of chromatic aberration removed at point J.

また本発明の補助投光装置は「投影レンズと、波長の異
なる2種以上のパターンを発生するパターン発生手段」
とを有する。
Further, the auxiliary light projection device of the present invention includes a projection lens and a pattern generating means for generating two or more types of patterns with different wavelengths.
and has.

[作  用] 補助光を使用する場合、本発明の測距方法では被写体に
対し波長の異なる2以上のパターン像を順次投影し、各
パターン像に対応して像のずれ量が求められる.これら
像のずれ量は色収差による誤差を含んでいるが,像のず
れ量が各波長ごとに得られるので、色収差による像のず
れ量の誤差が波長によりどのように変化するかを知るこ
とができ、このことを利用すると標準的な被写体(波長
550nm)に対する被写体距離を知ることができる。
[Function] When using auxiliary light, the distance measuring method of the present invention sequentially projects two or more pattern images with different wavelengths onto the subject, and calculates the amount of image shift corresponding to each pattern image. These amounts of image deviation include errors due to chromatic aberration, but since the amount of image deviation can be obtained for each wavelength, it is possible to know how the error in the amount of image deviation due to chromatic aberration changes with wavelength. By utilizing this fact, it is possible to know the object distance to a standard object (wavelength 550 nm).

[実施例コ 以下、具体的な実施例に即して説明する。[Example code] Hereinafter, description will be given based on specific examples.

第1図(I)で、符号0は被写体を示している。In FIG. 1(I), code 0 indicates the subject.

この被写体OにパターンPのパターン像IPを投影レン
ズ1により投影する。
A pattern image IP of a pattern P is projected onto this object O by a projection lens 1.

パターン像IPの像を一対の結像レンズ2,3により対
応するイメージセンサー4,5に結像させ、これをイメ
ージセンサー4,5で読取ってイメージセンサー4と5
の読取った像相互のずれ量を求め、その結果を用いて測
距演算を行い被写体距離を算出する8 パターンPは透明フィルムに例えば第1図(II)に示
すような透明部と遮光部をパターン化したものである。
The image of the pattern image IP is formed on the corresponding image sensors 4 and 5 by a pair of imaging lenses 2 and 3, and is read by the image sensors 4 and 5.
The amount of deviation between the read images is calculated, and the distance measurement calculation is performed using the result to calculate the object distance.8 Pattern P is a transparent film with a transparent part and a light-shielding part as shown in Figure 1 (II), for example. It is a pattern.

補助投光装置は略示すると,第2図に示すようにパター
ンPを2種のLEDA,Bで独立に照射?きるようにな
っている。パターンPとLEDA,Bがパターン発生手
段を構戒する。
The auxiliary floodlight device, as shown in Figure 2, irradiates pattern P independently with two types of LEDAs and B? It is now possible to Pattern P, LEDA, and B monitor the pattern generation means.

これらLEDA,Bの輝度の分光特性は例えば第l図(
III)の曲線Al,Blの如くである。
For example, the spectral characteristics of the brightness of these LEDAs and B are shown in Figure 1 (
III) curves Al and Bl.

今、強い外光のもとで補助光の照射も行って測距を行う
場合を考えてみる。′a距演算の基本となるのはパッシ
ブ測距方式では,イメージセンサー4,5がそれぞれ読
取る同一のパターン像の像相互のずれ量dである。
Now, let's consider a case where distance measurement is performed under strong external light while also irradiating an auxiliary light. In the passive distance measuring method, the basis of distance calculation 'a' is the amount of deviation d between the images of the same pattern read by the image sensors 4 and 5, respectively.

この像のずれ量dとして、補助光の光源としてLEDA
を用いたときに得られるものをdA1.補助光の光源と
してLEDBを用いたときに得られるものをd■とする
と、外光の影響が大きいときは第1図(I■)に示すよ
うに外光のみの測定の場合に得られる適正な像のずれ量
d0とdAx −d■とは殆ど等しい.即ち外光により
被写体が十分に照明されているときは補助光は測距に殆
ど影響せず、色収差による誤差も殆ど現われない。なお
第l図(■V)でλ.、λ.はそれぞれLEDA,Hの
輝度のピーク値を与える波長である. しかるに被写体を照明する外光が次第に弱くなり、補助
光の影響が強くなってくると測厘に対して色収差の影響
が現われてくる。即ち、外光の影響が小さい状況の下で
,補助光の光源としてLEDAを用いたときに得られる
「像のずれ量」をdA、補助光の光源としてLEDBを
用いたときに得られるものをd.とすると、像のずれ量
dAとd.は色収差のために一般的に異なった値となる
。そして像のずれ量は一般に用いる補助光の波長ととも
に近似的に直線的に変化する。第1図(mの直線41は
d = {(da−dA)/(λ1λA)}λ+dA(
1)と表される. すると色収差の影響の無い適切な被写体距離を与える「
像のずれ量doJ即ち、十分な通常光のもとで測距を行
うとき得られる像のずれ量は、通常先の標準波長λa(
=550nm)に於ける直線(1)の値であるから、次
の(2)式により与えられる。
As the amount of deviation d of this image, the LED as the auxiliary light source is
What is obtained when using dA1. If the value obtained when using an LEDB as the auxiliary light source is d■, when the influence of external light is large, the appropriate value obtained when measuring only external light is shown in Figure 1 (I■). The amount of image shift d0 and dAx - d■ are almost equal. That is, when the subject is sufficiently illuminated by external light, the auxiliary light has little effect on distance measurement, and almost no error due to chromatic aberration appears. In addition, in Figure 1 (■V), λ. ,λ. are the wavelengths that give the peak brightness values of LEDA and H, respectively. However, as the external light illuminating the subject gradually becomes weaker and the influence of the auxiliary light becomes stronger, the influence of chromatic aberration appears on the measurement. In other words, dA is the "image shift amount" obtained when using LEDA as the auxiliary light source under conditions where the influence of external light is small, and dA is the "image shift amount" obtained when using LEDB as the auxiliary light source. d. Then, the image shift amount dA and d. generally have different values due to chromatic aberration. The amount of image shift generally changes approximately linearly with the wavelength of the auxiliary light used. Figure 1 (The straight line 41 of m is d = {(da-dA)/(λ1λA)}λ+dA(
1). This will give you an appropriate subject distance without the effects of chromatic aberration.
The amount of image deviation doJ, that is, the amount of image deviation obtained when distance measurement is performed under sufficient normal light, is usually the standard wavelength λa (
= 550 nm), it is given by the following equation (2).

a 6= {(dn−dA)/(λ1λA)}λO+d
A   (2)ここで λ。/(λ1λA)=Kとする
と(2)式は、d o = K (d+s−dA) +
 dA(3)と表される。この式(3)の右辺でdA,
daはLEDA,Bを用いたパターン像の投影により得
られる「像のずれ量」であり直接に求まる。
a6= {(dn-dA)/(λ1λA)}λO+d
A (2) where λ. /(λ1λA)=K, equation (2) is d o = K (d+s−dA) +
It is expressed as dA(3). On the right side of this equation (3), dA,
da is the "image shift amount" obtained by projecting the pattern image using LEDAs, B, and can be directly determined.

またKはλ。,λ8,λ6により定まるが、これらのう
ちでλ。は、通常先による測距条件として設定され,λ
9,λ6は補助光の光源として用いるLEDA,Bに応
じて定まる.従って、Kは測距装置に於ける定数である
。従って上記dAとdllとを測定することにより適切
な像のずれ量d0を知ることができ、このd0を用いて
測距演算を行えば色収差の影響を除去して正しい被写体
距離を得ることができる。
Also, K is λ. , λ8, and λ6, and among these, λ. is usually set as the distance measurement condition by the destination, and λ
9, λ6 is determined depending on the LEDA, B used as the auxiliary light source. Therefore, K is a constant in the distance measuring device. Therefore, by measuring the above dA and dll, it is possible to know the appropriate image shift amount d0, and by performing distance measurement calculations using this d0, it is possible to remove the influence of chromatic aberration and obtain the correct subject distance. .

第3図は補助投光装置の別例を酩示している。FIG. 3 shows another example of the auxiliary floodlight device.

この例では、波長の異なるLEDCとDとが同一基板B
S上に配備されている。LEDCのみを発光させればL
EDCを「明」、LEDDを「暗」とするパターンを発
生することができ、LEDDのみを発光させればLED
Dを「明」、LEDCを「暗」とするパターンを発生す
ることができる。
In this example, LEDC and D with different wavelengths are on the same board B.
It is deployed on S. If only the LEDC emits light, L
It is possible to generate a pattern in which the EDC is "bright" and the LEDD is "dark", and if only the LEDD emits light, the LED
A pattern in which D is "bright" and LEDC is "dark" can be generated.

即ち、この例では基板BSの同一面上に隣接して配備さ
れ選択的に発光させられるLEDCとDがパターン発生
手段を構戒しているわけである。第3図に於いても符号
1は勿論投影レンズを示す。
That is, in this example, the LEDC and D, which are arranged adjacent to each other on the same surface of the substrate BS and selectively emit light, serve as pattern generating means. Also in FIG. 3, the reference numeral 1 naturally indicates the projection lens.

[発明の効果] 以上、本発明によれば新規な測距方法及び補助投光装置
を提供できる.本発明の方法によれば補助光を用いて測
距を行う場合に色収差による誤差を容易且つ確実に補正
できる。また本発明の補助投光装置によれば、上記方法
を実現するためのパターン像の投影を実現できる。
[Effects of the Invention] As described above, according to the present invention, a novel distance measuring method and an auxiliary floodlight device can be provided. According to the method of the present invention, errors caused by chromatic aberration can be easily and reliably corrected when distance measurement is performed using auxiliary light. Further, according to the auxiliary light projection device of the present invention, it is possible to realize the projection of a pattern image for realizing the above method.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は、本発明の測距方法の1実施例を説明するため
の図、第2図は、上記実施例に用いられた補助投光装置
を説明するための図、第3図は、補助投光装置の別実施
例を説明するための図である.
FIG. 1 is a diagram for explaining one embodiment of the distance measuring method of the present invention, FIG. 2 is a diagram for explaining the auxiliary floodlight device used in the above embodiment, and FIG. FIG. 7 is a diagram for explaining another embodiment of the auxiliary floodlight device.

Claims (1)

【特許請求の範囲】 1、補助投光装置によりパターン像を被写体上に投影し
、1対の結像レンズにより上記パターン像の像を各結像
レンズに対応するイメージセンサー上に結像させ、各イ
メージセンサー上の像相互のずれ量を求め、この像のず
れ量に基いて被写体距離を得るパッシブ測距方式の測距
方法であって、同一被写体に対し、波長の異なる光によ
る2以上のパターン像を順次投影して像のずれ量を各パ
ターンごとに求め、これら像のずれ量に基づき色収差の
影響を除去した被写体距離を求めることを特徴とする測
距方法。 2、投影レンズと、波長の異なる2種以上のパターンを
発生するパターン発生手段とを有する補助投光装置。
[Claims] 1. Projecting a pattern image onto a subject using an auxiliary light projection device, and forming an image of the pattern image onto an image sensor corresponding to each imaging lens using a pair of imaging lenses; A passive distance measuring method that calculates the amount of deviation between the images on each image sensor and obtains the object distance based on the amount of image deviation. A distance measuring method characterized in that pattern images are sequentially projected, the amount of image shift is determined for each pattern, and the distance to a subject is determined based on the amount of shift of these images, with the effects of chromatic aberration removed. 2. An auxiliary light projection device having a projection lens and pattern generation means for generating two or more types of patterns with different wavelengths.
JP30433289A 1989-11-22 1989-11-22 Range-finding method and auxiliary light projecting device Pending JPH03163507A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP30433289A JPH03163507A (en) 1989-11-22 1989-11-22 Range-finding method and auxiliary light projecting device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP30433289A JPH03163507A (en) 1989-11-22 1989-11-22 Range-finding method and auxiliary light projecting device

Publications (1)

Publication Number Publication Date
JPH03163507A true JPH03163507A (en) 1991-07-15

Family

ID=17931732

Family Applications (1)

Application Number Title Priority Date Filing Date
JP30433289A Pending JPH03163507A (en) 1989-11-22 1989-11-22 Range-finding method and auxiliary light projecting device

Country Status (1)

Country Link
JP (1) JPH03163507A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2006030816A (en) * 2004-07-21 2006-02-02 Canon Inc Imaging apparatus and focus deviation amount correction value calculating method

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2006030816A (en) * 2004-07-21 2006-02-02 Canon Inc Imaging apparatus and focus deviation amount correction value calculating method
JP4551708B2 (en) * 2004-07-21 2010-09-29 キヤノン株式会社 Imaging device

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