JPH03160619A - Production of glass substrate for magnetic disk and production of thin film magnetic disk - Google Patents

Production of glass substrate for magnetic disk and production of thin film magnetic disk

Info

Publication number
JPH03160619A
JPH03160619A JP29745289A JP29745289A JPH03160619A JP H03160619 A JPH03160619 A JP H03160619A JP 29745289 A JP29745289 A JP 29745289A JP 29745289 A JP29745289 A JP 29745289A JP H03160619 A JPH03160619 A JP H03160619A
Authority
JP
Japan
Prior art keywords
glass
glass substrate
magnetic disk
substrate
etching
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP29745289A
Other languages
Japanese (ja)
Other versions
JP3012660B2 (en
Inventor
Yoshio Nakagawa
宣雄 中川
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi Ltd
Original Assignee
Hitachi Ltd
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Filing date
Publication date
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Application filed by Hitachi Ltd filed Critical Hitachi Ltd
Priority to JP1297452A priority Critical patent/JP3012660B2/en
Publication of JPH03160619A publication Critical patent/JPH03160619A/en
Priority to US08/112,255 priority patent/US5494721A/en
Application granted granted Critical
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Classifications

    • CCHEMISTRY; METALLURGY
    • C03GLASS; MINERAL OR SLAG WOOL
    • C03CCHEMICAL COMPOSITION OF GLASSES, GLAZES OR VITREOUS ENAMELS; SURFACE TREATMENT OF GLASS; SURFACE TREATMENT OF FIBRES OR FILAMENTS MADE FROM GLASS, MINERALS OR SLAGS; JOINING GLASS TO GLASS OR OTHER MATERIALS
    • C03C15/00Surface treatment of glass, not in the form of fibres or filaments, by etching
    • CCHEMISTRY; METALLURGY
    • C03GLASS; MINERAL OR SLAG WOOL
    • C03CCHEMICAL COMPOSITION OF GLASSES, GLAZES OR VITREOUS ENAMELS; SURFACE TREATMENT OF GLASS; SURFACE TREATMENT OF FIBRES OR FILAMENTS MADE FROM GLASS, MINERALS OR SLAGS; JOINING GLASS TO GLASS OR OTHER MATERIALS
    • C03C2204/00Glasses, glazes or enamels with special properties
    • C03C2204/08Glass having a rough surface

Abstract

PURPOSE:To obtain good floating property for a head and low cohesion property in radial and circumference directions by subjecting the surface of crystallized glass in which a crystal phase is dispersed in an amorphous glass phase to mirror treatment, dipping the glass in an aqueous solution of hydrofluoric acid to make a rough surface of the glass plate. CONSTITUTION:A disk cut from a glass substrate material (processes 3,4) is subjected to heat treatment to generate crystalization seeds (process 5) in a heat treatment furnace, and the crystallized glass disk (process 6) is mechanically polished to have a mirror surface (process 7). Then the disk is dipped in an aqueous solution of hydrofluoric acid containing at least hydrogen fluoride for chemical etching (process 8). By etching, an amorphous phase which is continuous in the crystallized glass is selectively etched, and the dispersed crystalized phase remains to form projections. Thus, the surface of the substrate is made rough (process 9). The concentration of hydrogen fluoride in the aqueous solution of hydrofluoric acid is 0.05 -2.5 mol/l, and etching is performed to 0.005 - 0.2 mum depth.

Description

【発明の詳細な説明】 [産業上の利用分野] 本発明は、磁気ディスク用基板、特に磁気記録媒体をス
バッタ法にて形成する、いわゆる薄膜磁気ディスク用基
板に用いるガラス基板のII造方法および薄膜磁気ディ
スクの製造方法に関する.【従来の技術」 従来,薄膜磁気ディスク用基板としては、M合金基板表
面にNi−P化学めっき膜を形成したものが巾広−く使
用されている.通常,これをNi−P基板と呼ぶが,こ
のNi−P基板では,例えば、特開昭62−24813
3に記載されているように、その表面に伺心円状の微細
な加工溝を形戒することが、広く行なわれている.この
微細加工溝の形成は、一般にテキスチャー加工と呼ばれ
ているもので,その本質は,面粗し加工であり,予め鏡
面加工された平坦な面を敢えて粗らす加工である.その
主目的は、磁気ヘッドとディスク表面の粘射防止にある
.つまり、磁気ディスクの表面を鏡面ミラー面にして、
平滑化し過ぎてしまうと、ディスクの回転により生じる
空気流の動圧によりディスク面とわずかな間隔で浮上し
ている磁気ヘッド面との間に潤滑油や水分が集まり,磁
気ヘッドがディスク表面に粘着を生じてしまうのである
. [発明が解決しようとする課題] 上記従来技術では、Ni−P基板表面にテキスチャー加
工を行なって磁気ヘッドの粘着を低減すると,逆に磁気
ヘッドの浮上特性が劣化するという木質的な問題を有し
ていた.そのため,基板の表面粗さを非常に狭い範囲で
粘着性とヘッド浮上性との両特性がほどほどに満足する
範囲で制御せねばならないという欠点を有していた。
Detailed Description of the Invention [Industrial Application Field] The present invention relates to a second method for manufacturing a glass substrate used for a so-called thin-film magnetic disk substrate in which a magnetic disk substrate, particularly a magnetic recording medium, is formed by a sputtering method; Concerning the manufacturing method of thin film magnetic disks. [Prior Art] Conventionally, M alloy substrates with a Ni--P chemical plating film formed on the surface have been widely used as substrates for thin-film magnetic disks. Usually, this is called a Ni-P substrate, but this Ni-P substrate, for example,
As described in Section 3, it is widely practiced to form fine grooves in the shape of a concentric circle on the surface. The formation of this micro-machined groove is generally called texturing, and its essence is surface roughening, which is a process in which a flat surface that has been mirror-finished in advance is intentionally roughened. Its main purpose is to prevent adhesion between the magnetic head and disk surface. In other words, by making the surface of the magnetic disk a mirror surface,
If it is smoothed too much, the dynamic pressure of the air flow generated by the rotation of the disk will cause lubricant oil and moisture to collect between the disk surface and the magnetic head surface, which is floating at a small distance, causing the magnetic head to stick to the disk surface. This results in the following. [Problems to be Solved by the Invention] The above conventional technology has a wood-like problem in that when the surface of the Ni-P substrate is textured to reduce the adhesion of the magnetic head, the flying characteristics of the magnetic head deteriorate. Was. Therefore, it has had the disadvantage that the surface roughness of the substrate must be controlled within a very narrow range within which both properties of adhesiveness and head flying properties are reasonably satisfied.

また,従来のテキスチャー加工は,同心円状の一方向性
加工であるため、磁気ヘッドの半径方向での動き,いわ
ゆるシークモードの動作に対しては、粘着低減の効果が
低いという問題点があった.さらにまた,この微細溝加
工により溝の両側には盛り上がった突起が形成されるた
め、これが必要なディスクと磁気ヘッドとの間の狭スベ
ーシング確保に妨げとなっていた。
In addition, because conventional texture processing is a unidirectional process in concentric circles, there is a problem in that it is less effective in reducing adhesion when the magnetic head moves in the radial direction, the so-called seek mode operation. .. Furthermore, this fine groove processing results in the formation of raised protrusions on both sides of the grooves, which hinders the necessary narrow spacing between the disk and the magnetic head.

本発明の目的は,これら従来技術での問題点を解決する
ことにあり、その第1の目的は,磁気ヘッドが狭スペー
シングにおいても、安定に必要な浮上量だけ浮上できる
面を保持したまま,磁気ヘッドの粘着が生じず,しかも
半径方向にも田周方向にも等方的な低粘着特性を実現す
ることのできる磁気ディスク基板のm造方法を,そして
第2の目的は、この磁気ディスク基板の!2造方法を用
いた改良された薄膜磁気ディスクのIl!造方法を、そ
れぞれ提供することにある。
The purpose of the present invention is to solve these problems with the conventional technology, and the first purpose is to maintain a surface on which the magnetic head can stably fly by the required flying height even in narrow spacing. The second purpose is to develop a method for manufacturing a magnetic disk substrate that does not cause adhesion of the magnetic head and can achieve isotropic low adhesion characteristics in both the radial and circumferential directions. Disc board! Il! of an improved thin-film magnetic disk using the 2-manufacturing method. The goal is to provide each method of construction.

[課題を解決するための手段] 上記第1の目的は, (1)磁気ディスク用基板として非晶質ガラス相中に結
晶相が敗存する結晶化ガラスを用い、その表面を鏡面機
械加工処理した後,少なくともフフ化水素を含むフッ化
水素酸水溶液中に浸漬して前記ガラス基板表面の結晶相
を残し、非晶質相を選択的に所定の深さまで優先的にエ
ッチングし,前記ガラス基板表面に凹凸を形成して成る
磁気ディスク用ガラス基板の製造方法により、達戒され
る.そして好ましくは、 (2)上記フッ化水素酸水溶液中のフッ化水素の濃度を
モル濃度で0.05〜2.5 mol/ Qとすること
により、また、 (3)上記ガラス基板表面からのエッチング深さをo.
oos〜0.2.とすることにより,達成される.つま
り,本発明では、基板材料として結晶化ガラスを用い、
これに微細な凹凸を形或する手段として機械研磨と化学
エッチング法とをそれぞれの特長を活用して用いたもの
である. 第一段としての機械研磨加工法について,さらに詳述す
れば,結晶化ガラス表面を非常に平滑な鏡面に仕上加工
する訳であるが,その鏡面の程度は、例えば表面粗さの
Rmaxで言えば,150八以下が必要であり,さらに
好ましくは100人以下である。ディスク性能で示せば
,磁気ヘッドが0.1μ一前後のスペーシングで研磨面
の突起に衝突することなく浮上可能な程度の鏡面である
. 第二段としての化学エッチング法については、この鏡面
に仕上げた,基板をフフ化水素酸溶液中に浸漬して,化
学的にエッチングすることにある.このエッチングの際
に,結晶化ガラス中の連統相である、ガラス相が優先的
にフッ酸により選択エッチングされ、その表面に、結晶
化ガラス中の結晶相を孤立相として突起状に残すことに
ある.このエッチングにより,表面が平滑化され,かつ
高さのそろった結晶相が多数敗在し、各結晶相の間のア
モルファス相はフッ酸によりエッチングされて凹むため
,ミクロな凹凸を有する基板表面を創生できる. ?晶化ガラス材料はアルカリ金属酸化物,アルカリ士類
酸化物、Afi20,、SiO■等を含有するため、こ
れらを化学的にエッチングするには、フッ化水素酸が最
も好適である. さらに,本発明者等の実験によれば、フッ酸の濃度は上
述のようにモル濃度で0.05〜2.5mol/ Q(
高純度のフッ酸を水で稀釈した場合には重量%で0.1
〜5.Owt%に相当)が本発明の実施には好適である
ことを見出している。
[Means for Solving the Problems] The first object is as follows: (1) Crystallized glass in which a crystalline phase exists in an amorphous glass phase is used as a substrate for a magnetic disk, and its surface is mirror-machined. After that, the glass substrate is immersed in an aqueous solution of hydrofluoric acid containing at least hydrogen fluoride to leave the crystalline phase on the surface of the glass substrate and selectively and preferentially etch the amorphous phase to a predetermined depth, thereby removing the surface of the glass substrate. The method of manufacturing a glass substrate for magnetic disks, which is made by forming unevenness on the surface of the glass substrate, achieves this precept. Preferably, (2) by setting the concentration of hydrogen fluoride in the hydrofluoric acid aqueous solution to a molar concentration of 0.05 to 2.5 mol/Q, and (3) reducing the concentration of hydrogen fluoride from the surface of the glass substrate. The etching depth is o.
oos~0.2. This is achieved by doing this. In other words, in the present invention, crystallized glass is used as the substrate material,
Mechanical polishing and chemical etching were used to create fine irregularities by taking advantage of the advantages of each. To be more specific about the mechanical polishing method as the first step, it finishes the crystallized glass surface to a very smooth mirror surface. For example, the number should be 1,508 or less, and more preferably 100 or less. In terms of disk performance, the mirror surface is such that the magnetic head can fly with a spacing of around 0.1 μm without colliding with the protrusions on the polishing surface. The second step, chemical etching, involves immersing the mirror-finished substrate in a hydrofluoric acid solution and chemically etching it. During this etching, the glass phase, which is a continuous phase in the crystallized glass, is preferentially and selectively etched by hydrofluoric acid, leaving the crystalline phase in the crystallized glass as an isolated phase in the form of protrusions on the surface. It is in. As a result of this etching, the surface is smoothed and many crystal phases with uniform height are destroyed, and the amorphous phase between each crystal phase is etched by hydrofluoric acid and becomes depressed, so that the surface of the substrate with microscopic irregularities is removed. It can be created. ? Since crystallized glass materials contain alkali metal oxides, alkali metal oxides, Afi20, SiO2, etc., hydrofluoric acid is most suitable for chemically etching these. Furthermore, according to experiments conducted by the present inventors, the concentration of hydrofluoric acid is 0.05 to 2.5 mol/Q (
When high-purity hydrofluoric acid is diluted with water, it is 0.1% by weight.
~5. Owt%) has been found to be suitable for the practice of the present invention.

このフッ酸の濃度が0.05 vgog/ Q (0.
lwt%)以下であると,エッチング作用が低く、エッ
チング速度が低くて実川的でないのが理由である。また
、逆に2.5 mo1/ Q (5.Owt%)以上の
高濃度であると,エッチング速度が高過ぎて、エッチン
グ量の制御が難しくなり実用的でない.最も好ましい範
囲は0.25 mol/ Q  (0.5vt%) 〜
1.5 mo1/ (1 (31%)である. なお,フッ酸溶液に例えばフッ化アンモンやフッ化ナト
リウム等を混入させてpHを調整し,エッチング速度を
適度に低下させ作業し易くすることも可能である。
The concentration of this hydrofluoric acid is 0.05 vgog/Q (0.
This is because if it is less than 1wt%, the etching effect is low and the etching rate is low, making it unsuitable for practical use. On the other hand, if the concentration is as high as 2.5 mo1/Q (5.Owt%) or more, the etching rate will be too high and it will be difficult to control the etching amount, making it impractical. The most preferable range is 0.25 mol/Q (0.5vt%) ~
1.5 mo1/ (1 (31%)). In addition, for example, ammonium fluoride or sodium fluoride may be mixed into the hydrofluoric acid solution to adjust the pH and reduce the etching rate appropriately to make the work easier. is also possible.

また、上記第2の目的は、 (4)上記(1)、(2)もしくは(3)記載の磁気デ
ィスク用ガラス基板の製造方法に引き続き.得られたガ
ラス基板上に磁性wtna及び炭素系保護膜をスパッタ
リングにより順次MKIjする工程を有して成る薄膜磁
気ディスクの製造方法により,そしてまた、 (5)上記スパッタリングに先立ち,上記基板を真空ベ
ークする工程と、上記炭素系保護膜形或後に潤滑剤を塗
布する工程とを有して成る上記(4)記載の磁気ディス
クの製造方法により、達成される. [作用] 本発明は,結晶化ガラス材料を用いて.磁気ディスク基
板を形成する際の製造法およびこの基板を用いて薄膜磁
気デスクをI1造する方法に関するものであり、本発明
の製造方法によれば磁気ヘッドが粘着を生じに<<,か
つ、低スペーシングで磁気ヘッドが浮上できる面を形或
できる。その理由を以下に記す. 結晶化ガラス中の結晶相は,非晶質相中に分散して各々
が孤立して存在する.このためフッ酸溶液でエッチング
した後の基板表面には,半径方向、円周方向で方向性の
ない均一な突超の分布を持つ.これが、磁気ヘッドの半
径方向、円周方向の各々の動作モードに対して,相等し
い粘着特性を実現する. 先に説明したように,従来のNi−PJ&板のテクスチ
ャー加工では、円周方向の溝堀加工であるため、磁気ヘ
ッドの接触がテクスチャー加工により溝の両側に生じた
盛り上がり部(尾根部)と線接触に近くなり,接触面積
が広くなり粘着力が大きくなる欠点を持ち、さらに,半
径方向と円周方向で粘着特性が異なり、特に半径方向の
シークモードでは粘着力が大きいという欠点を有してい
た.本発明の作用効果を要約すると,結晶化ガラスの第
一段階の機械的な鏡面研磨加工がヘッドの低スペーシン
グ浮上特性を達成することに密接に関連作用し,引続く
第二段階のフッ酸による化学的エッチングが,凹部形戒
による磁気ヘッドの低粘着特性に作用する. 重要なことは、第二段階のエッチングが,鏡面加工面か
ら、基板内部方向へ向けての一方的な溶解,除却加工で
あるため、機械加工で太きむ問題となるパリ(溝の両側
に形成される盛り上がり)を生じないことである。パリ
は機械加工時のミクロな砥粒や刃先が被加工材を掘起す
作用で生じるものであるが,これが生じると突起となり
、ヘッドの低スペーシング浮上特性の重大な障害となる
.化学的エッチング加工では,本質的に各原子がイオン
化して除却されるため,上記従来技術で問題となったパ
リを生ぜず,加工後にも加工歪や応力を残存させること
のない、穏やかな加工法である.このため,機械的研磨
加工で鏡面状態に仕上げられ、磁気ヘッドの低スペーシ
ング浮上特性を実現した表面の好特性を損なうことなく
、粘着特性を付与することが,このフッ酸エッチング加
工により可能となる.この作用効果が本発明の要点であ
る. [実施例] 実施例1. 磁気ディスク用結晶化ガラス基板の製造工程を、第1図
のダイヤグラムにしたがって説明する.先ずこの製造工
程の全体的な構或は.図示の通リリ、ガラス材料調整、
加熱溶融、ガラス板成形,円板加工,結晶核発生熱処理
、結晶核成長熱処理、機械研磨加工、およびフッ酸によ
る化学エッチング加工から成る。
Further, the second object is as follows: (4) Continuing from the method for manufacturing a glass substrate for a magnetic disk described in (1), (2) or (3) above. A method for manufacturing a thin-film magnetic disk comprising the steps of sequentially MKIjing a magnetic wtna and a carbon-based protective film on the obtained glass substrate by sputtering, and (5) vacuum baking the substrate prior to the sputtering. This is achieved by the method for manufacturing a magnetic disk described in (4) above, which comprises the steps of applying a lubricant after forming the carbon-based protective film. [Function] The present invention uses a crystallized glass material. The present invention relates to a manufacturing method for forming a magnetic disk substrate and a method for manufacturing a thin film magnetic disk using this substrate. The spacing can form a surface on which the magnetic head can fly. The reason is described below. The crystalline phases in crystallized glass are dispersed within the amorphous phase and each exists in isolation. Therefore, after etching with a hydrofluoric acid solution, the substrate surface has a uniform distribution of protrusions with no directionality in the radial and circumferential directions. This achieves the same adhesive properties for the magnetic head's radial and circumferential operating modes. As explained earlier, in the conventional texturing of Ni-PJ and plates, grooves are carved in the circumferential direction, so the contact of the magnetic head is caused by the bulges (ridges) formed on both sides of the grooves due to the texturing. It has the disadvantage that it becomes close to line contact, the contact area is wide, and the adhesive force is large.Furthermore, the adhesive properties are different in the radial direction and the circumferential direction, and the adhesive force is particularly large in the seek mode in the radial direction. It was. To summarize the effects of the present invention, the first step of mechanical mirror polishing of crystallized glass is closely related to achieving the low spacing flying characteristics of the head, and the subsequent step of hydrofluoric acid polishing works in the second step. This chemical etching affects the low adhesion properties of the magnetic head due to the concave shape. What is important is that the second stage of etching is a unilateral dissolution and removal process from the mirror-finished surface toward the inside of the substrate, which eliminates paris (formed on both sides of the groove), which is a problem that becomes thicker during machining. It is important not to create any excitement. Pars are caused by the action of microscopic abrasive grains and cutting edges digging into the workpiece during machining, and when they occur, they form protrusions that seriously impede the low-spacing flying characteristics of the head. In the chemical etching process, each atom is essentially ionized and removed, so it is a gentle process that does not cause the problems with the conventional techniques mentioned above, and does not leave any processing strain or stress after processing. It is a law. Therefore, this hydrofluoric acid etching process makes it possible to impart adhesive properties to the surface, which has been mechanically polished to a mirror-like finish and achieves the low-spacing flying characteristics of the magnetic head. Become. This effect is the main point of the present invention. [Example] Example 1. The manufacturing process of a crystallized glass substrate for a magnetic disk will be explained according to the diagram in Figure 1. First, the overall structure of this manufacturing process. Through the illustration, glass material adjustment,
It consists of heating melting, glass plate forming, disk processing, crystal nucleation heat treatment, crystal nucleation growth heat treatment, mechanical polishing, and chemical etching using hydrofluoric acid.

以下,上記工程にしたがい順次詳細に説明する.ガラス
基板材料として本実施例では,LiO.−SiO2−P
,O,系を用いた.Lid.成分が10.4vt%.S
in.戊分が77.9wt%,p,o,或分が2.7w
t%にむるように原料を秤量し,通常の方法で混合した
.この混合物を1400℃にて加熱溶融した後、液体金
属スズを用いる通常のフロート法を用いて、厚さ2.0
−のガラス板に或形した.このガラス板から.外径13
0mwφ,内径40a*φの寸法の円板を機械加工によ
り切り出した。
The steps above will be explained in detail below. In this example, LiO. -SiO2-P
,O, system was used. Lid. Ingredients are 10.4vt%. S
in. Boru is 77.9wt%, p,o, Arubu is 2.7w
The raw materials were weighed so as to be equal to t% and mixed in the usual manner. After heating and melting this mixture at 1,400°C, a thickness of 2.0
- It was shaped into a glass plate. From this glass plate. Outer diameter 13
A disk having dimensions of 0 mwφ and an inner diameter of 40a*φ was cut out by machining.

次に、このガラス円板を熱処理炉に投入し、10℃/m
inの昇温速度で550℃まで加熱後に1分間保持し、
その後lO℃/winの昇温速度で600℃まで昇温し
、1分間保持した後に5℃/winの冷却速度で冷却し
た。
Next, this glass disk was placed in a heat treatment furnace at a temperature of 10°C/m.
After heating to 550°C at a heating rate of in, hold for 1 minute,
Thereafter, the temperature was raised to 600° C. at a temperature increase rate of 10° C./win, held for 1 minute, and then cooled at a cooling rate of 5° C./win.

上記の550℃の熱処理はガラス中に結晶核を発生する
ための結晶核発生熱処理であり,600℃の熱処理は結
品核を成長させ、所定の寸法にするための結晶核威長熱
処理である。
The above heat treatment at 550°C is a crystal nucleation heat treatment to generate crystal nuclei in the glass, and the 600°C heat treatment is a crystal nucleation lengthening heat treatment to grow the nodule nucleus and make it into a predetermined size. .

結晶核の寸法と密度はこの熱処理条件により制御できる
ため、磁気ディスクの特性に対応して、これら熱処理条
件およびさらにはガラス材料を適宜変えることができる
. 次に,熱処理して結晶化ガラスとなった円板を、研磨加
工機を用いて機械的に鏡面研磨加工した。
Since the size and density of the crystal nuclei can be controlled by these heat treatment conditions, these heat treatment conditions and even the glass material can be changed as appropriate depending on the characteristics of the magnetic disk. Next, the disk, which had been heat-treated to become crystallized glass, was mechanically mirror-polished using a polishing machine.

研磨機は上下2枚の定盤の間にスペーサーを介してガラ
ス円板をセットし,アルミナ粉末あるいはSiCの粉末
を含む、加工液を供給しつつ,定盤を加圧して回転させ
て加工した.この時ガラス門板はスペーサを用いて遊星
歯車運動をさせて加工量の均一化と鏡面平滑性の付与を
図った。
In the polishing machine, a glass disk was set between two upper and lower surface plates via a spacer, and the surface plates were pressurized and rotated while supplying machining fluid containing alumina powder or SiC powder. .. At this time, the glass gate plate was moved by planetary gears using spacers in order to equalize the amount of processing and give it a mirror-like smoothness.

研磨加工後に純水を用いたブラッシング等により円板表
面を洗浄し、乾燥させた. このようにして得られたガラス円板研磨加工面の表面粗
さは、タリステップの接触式表面粗さ計による計測でR
 IIax 100人であった.加工条件によりこの粗
さは異なり、50八程度の鏡面も実現できるが、本発明
の目的からは、l50入以下を実現することが望ましい
。これは、磁気ヘッドを0.10μ鴎程度の狭スペーシ
ングで凸起に衝突することなく安定に浮上させるために
必要な数値である.次に円板は、高純度フッ化水素酸を
2.5wt%含有する水溶液中に、ポリテトラフルオロ
エチレン製のラック治具を用いて浸漬して,化学エッチ
ング加工した.エッチング液は20℃であり撹拌,連続
口過し、エッチング時間は20秒間であった。
After polishing, the disk surface was cleaned by brushing with pure water and dried. The surface roughness of the polished surface of the glass disk obtained in this way was measured by Talystep's contact type surface roughness meter.
IIax There were 100 people. This roughness varies depending on processing conditions, and a mirror surface of about 508 can be achieved, but for the purposes of the present invention, it is desirable to achieve a roughness of 150 or less. This is the value necessary to allow the magnetic head to fly stably with a narrow spacing of about 0.10μ without colliding with any protrusions. Next, the disk was chemically etched by immersing it in an aqueous solution containing 2.5 wt% of high-purity hydrofluoric acid using a rack jig made of polytetrafluoroethylene. The etching solution was kept at 20° C., stirred and passed through continuously, and the etching time was 20 seconds.

なお,好ましい液温としては、30℃以下,15〜25
℃がより望ましい.エッチング時間は,所望とするエッ
チング深さに応じて設定すればよい.このエッチングは
,結晶化ガラス中の連続相である非晶質相を選択エッチ
ングするものであり,分散する結晶相を突起として残存
させて,基板面に凹凸を形成する.従ってエッチング時
間や.フッ酸濃度を高めると、凹凸が大きくなり,R■
axが増加するのは当然である. 粘着を低減するに必要かつ十分な凹凸の大きさ、つまり
Rmaxの値の設定は、磁気ディスク装置の性能や磁気
ヘッドの特性から決定されるものであり、一義的に決ま
るものではなく、数値範囲はある程度の自由度を持つ. 但し、エッチング不足ではヘッド粘着低下の効果が少な
く、エッチング過多では表面粗さが大きくなり過ぎて、
ヘッドの低スペーシング浮上特性が損なわれて、実用に
供せなくなるのは言うまでもない. この化学エッチング加工で重要なことは、フッ酸エッチ
ング液に好適な濃度範囲として0.1〜5.Owt%が
あり、これ以下でも以上でも、先に述べたように、エッ
チング量や速度の制御が難しくなり,実用的でなくなる
. 以上の工程により、目的のガラス基板を得るこ?ができ
た。
Note that the preferred liquid temperature is 30°C or lower, 15 to 25°C.
℃ is more desirable. The etching time can be set according to the desired etching depth. This etching selectively etches the amorphous phase, which is the continuous phase in crystallized glass, and leaves the dispersed crystalline phase remaining as protrusions, forming irregularities on the substrate surface. Therefore, the etching time. When the concentration of hydrofluoric acid is increased, the unevenness becomes larger and R■
It is natural that ax increases. The size of the unevenness necessary and sufficient to reduce adhesion, that is, the setting of the value of Rmax, is determined by the performance of the magnetic disk device and the characteristics of the magnetic head, and is not determined uniquely, but depends on the numerical range. has a certain degree of freedom. However, if there is insufficient etching, the effect of reducing head adhesion will be small, and if there is too much etching, the surface roughness will become too large.
Needless to say, the low spacing and flying characteristics of the head will be impaired, making it unusable. What is important in this chemical etching process is that the suitable concentration range for the hydrofluoric acid etching solution is 0.1 to 5. There is a certain Owt%, and if it is less or more than this, as mentioned earlier, it becomes difficult to control the etching amount and speed, making it impractical. Is it possible to obtain the desired glass substrate through the above steps? was completed.

実施例2. 実施例1においては,ガラス材料としてL i, 0−
SiO,−P20,系材料を用いたが、他に以下に示す
組成のガラス材料系についても,同様に機械研磨と化学
エッチング加工とを行なった.これらについても実施例
1と同様に磁気ディスク用基板として良好な結果が得ら
れた. Li20−SiO.系, Li,O−At,O,−SiO■系, Li,O−MgO−At,O,−SiO■系、MgO−
AI,03−SiO,系、 Na.O−AI,O,−SiO,系、 BaO−AI,O,−Sto,系 実施例3. 実施例1で得られたガラス基板表面に第2図のダイヤグ
ラムに示したように,スパッタリング法等により,磁気
記録膜を形成し、さらにカーボン等の保護膜を形成し、
その上に潤滑剤を塗布して、薄膜磁気ディスクとして完
成する. 以下,この工程図にしたがって詳述すると,実施例1で
得られたガラス基板を,スパッタリング装置の基板ホル
ダーにセットし、300℃で真空ベーク処理した後に、
クロム下地膜, Co−Ni系磁性膜およびカーボン保
護膜を順次形成した.スパッタ装置より取り出し後、表
面に潤滑剤を塗Aiシて磁気ディスクとして完成した。
Example 2. In Example 1, the glass material is Li, 0-
Although SiO, -P20, and other materials were used, mechanical polishing and chemical etching were also performed on other glass materials with the compositions shown below. As with Example 1, good results were obtained with these as substrates for magnetic disks. Li20-SiO. system, Li,O-At,O,-SiO■ system, Li,O-MgO-At,O,-SiO■ system, MgO-
AI, 03-SiO, system, Na. O-AI, O, -SiO, system, BaO-AI, O, -Sto, system Example 3. As shown in the diagram in FIG. 2, a magnetic recording film was formed on the surface of the glass substrate obtained in Example 1 by sputtering, and a protective film of carbon or the like was further formed.
A lubricant is applied on top of it, and the thin film magnetic disk is completed. Hereinafter, detailed explanation will be given according to this process diagram. After setting the glass substrate obtained in Example 1 in a substrate holder of a sputtering device and vacuum baking at 300°C,
A chromium base film, a Co-Ni magnetic film, and a carbon protective film were successively formed. After taking it out from the sputtering device, a lubricant was applied to the surface to complete a magnetic disk.

このようにして↑!》られた磁気ディスクの特性評価を
、通常の評価法にしたがい実施した.その結果、磁気ヘ
ッドの最小浮上高さはO.Oaμ一を実呪し、磁気ヘッ
ドの粘着力も、従来のコーティングディスクの値の80
〜90%を示し,テクスチャー加工のNi−P基板の約
1/2を示しヘッド粘着と低浮上特性との両者を同時に
満足することのできる特性を実現し得た. また、CSS特性(Contact Start St
op)を評価したところ、so,ooo回後でもヘッド
クラッシュを生ぜず、磁気ヘッドスライダー面の汚れは
観察されなかった. [発明の効果] 本発明によれば、硬質材料で研磨加工性の良好なガラス
の特徴を活かして、低スペーシングで磁気ヘッドが浮上
できると同時に,結晶化ガラス中の結晶相を微小突起と
して活用できるため、磁気ヘッドとディスク間の粘着を
大巾に低減できる.つまり、従来のNi−P基板におい
て二律相反の関係にあったヘッド浮上特性と粘着特性と
を,本発明では同時に達或できるので、本基板を用いれ
ば非常に特性の優れた磁気ディスクを形或できる効果が
ある。
In this way↑! 》Characteristics of the magnetic disks were evaluated using standard evaluation methods. As a result, the minimum flying height of the magnetic head is O. The adhesive strength of the magnetic head is 80% lower than that of conventional coated disks.
~90%, which is about 1/2 that of a textured Ni-P substrate, and has achieved characteristics that can simultaneously satisfy both head adhesion and low flying characteristics. In addition, CSS characteristics (Contact Start St
When the magnetic head (op) was evaluated, no head crash occurred even after so and ooo times, and no stains on the magnetic head slider surface were observed. [Effects of the Invention] According to the present invention, by taking advantage of the characteristics of glass, which is a hard material and has good polishability, a magnetic head can be levitated with a small spacing, and at the same time, the crystal phase in crystallized glass can be formed into microprotrusions. This can greatly reduce the adhesion between the magnetic head and the disk. In other words, the present invention can simultaneously achieve the head flying characteristics and adhesion characteristics, which were in a trade-off relationship with conventional Ni-P substrates. Therefore, by using this substrate, it is possible to form magnetic disks with extremely excellent characteristics. There is a certain effect that can be achieved.

また、材料および本発明の加工法によって基板表面の断
面形状が、,どの方向においても等方的であるため、磁
気ヘッドの半径方向、円周方向の動作に対する粘着特性
も相等しくなり,従来Ni−P基板の問題であった反径
方向での粘着力が大きくなるという問題を解決すること
ができる.これは磁気ヘッドの翻動機構に対する負担を
軽減し、簡略化できる効果をもつ. 本発明は,従来のNi−P基板のテクスチャー加工に相
当する部分を,化学的エッチング加工により代替すると
も言えるため,加工コストを大巾低減し、加工設備の価
格も低減できる経済性も有する.又、化学エッチング加
工は多数の円板をラックに収めて同時に処理できる利点
を持つため,生産性・量産性にも優れている。
In addition, because the cross-sectional shape of the substrate surface is isotropic in any direction due to the material and the processing method of the present invention, the adhesion properties for the radial and circumferential movements of the magnetic head are also the same. - It is possible to solve the problem of increased adhesive force in the opposite radial direction, which was a problem with P substrates. This has the effect of reducing the burden on the swinging mechanism of the magnetic head and simplifying it. The present invention can be said to replace the portion of conventional Ni-P substrate texture processing with chemical etching processing, so it is economical in that processing costs can be greatly reduced and the price of processing equipment can also be reduced. In addition, chemical etching has the advantage of being able to process a large number of disks simultaneously in a rack, so it is also excellent in productivity and mass production.

結晶化ガラス基板は,単一材料基板であり,従来のNi
−P基板がAl合金とNi−Pめっき膜の複合材料基板
であることと比較すると,工程敵,設備台数,材料費,
加工費のどれをとっても,約172程度に低減できるた
め,本質的に安価で、特性の優れた基板であることは言
うまでもない.
The crystallized glass substrate is a single material substrate, and the conventional Ni
-Compared to the fact that the P substrate is a composite material substrate of Al alloy and Ni-P plating film, the process disadvantage, number of equipment, material cost,
Since all processing costs can be reduced to about 172, it goes without saying that this is an essentially inexpensive substrate with excellent characteristics.

【図面の簡単な説明】[Brief explanation of the drawing]

Claims (1)

【特許請求の範囲】 1、磁気ディスク用基板として非晶質ガラス相中に結晶
相が散存する結晶化ガラスを用い、その表面を鏡面機械
加工処理した後、少なくともフッ化水素を含むフッ化水
素酸水溶液中に浸漬して前記ガラス基板表面の結晶相を
残し、非晶質相を選択的に所定の深さまで優先的にエッ
チングし、前記ガラス基板表面に凹凸を形成して成る磁
気ディスク用ガラス基板の製造方法。 2、上記フッ化水素酸水溶液中のフッ化水素の濃度をモ
ル濃度で0.05〜2.5mol/lとして成る請求項
1記載の磁気ディスク用ガラス基板の製造方法。 3、上記ガラス基板表面からのエッチング深さを0.0
05〜0.2μmとして成る請求項1もしくは2記載の
磁気ディスク用ガラス基板の製造方法。 4、請求項1、2もしくは3記載の磁気ディスク用ガラ
ス基板の製造方法に引き続き、得られたガラス基板上に
磁性薄膜及び炭素系保護膜をスパッタリングにより順次
積層する工程を有して成る薄膜磁気ディスクの製造方法
。 5、上記スパッタリングに先立ち、上記基板を真空ベー
クする工程と、上記炭素系保護膜形成後に潤滑剤を塗布
する工程とを有して成る請求項4記載の磁気ディスクの
製造方法。
[Claims] 1. Using crystallized glass in which a crystalline phase is dispersed in an amorphous glass phase as a substrate for a magnetic disk, after mirror-machining the surface, hydrogen fluoride containing at least hydrogen fluoride is used. A glass for a magnetic disk, which is formed by immersing the glass substrate in an aqueous acid solution to leave the crystalline phase on the surface of the glass substrate and selectively and preferentially etching the amorphous phase to a predetermined depth to form irregularities on the surface of the glass substrate. Substrate manufacturing method. 2. The method of manufacturing a glass substrate for a magnetic disk according to claim 1, wherein the concentration of hydrogen fluoride in the aqueous hydrofluoric acid solution is set to a molar concentration of 0.05 to 2.5 mol/l. 3. The etching depth from the surface of the glass substrate is 0.0.
3. The method of manufacturing a glass substrate for a magnetic disk according to claim 1, wherein the glass substrate has a thickness of 0.05 to 0.2 μm. 4. A thin film magnetic material comprising the step of sequentially laminating a magnetic thin film and a carbon-based protective film on the obtained glass substrate by sputtering, following the method for producing a glass substrate for a magnetic disk according to claim 1, 2 or 3. Disc manufacturing method. 5. The method of manufacturing a magnetic disk according to claim 4, further comprising the steps of vacuum baking the substrate prior to the sputtering, and applying a lubricant after forming the carbon-based protective film.
JP1297452A 1989-01-13 1989-11-17 Method of manufacturing glass substrate for magnetic disk and method of manufacturing thin-film magnetic disk Expired - Fee Related JP3012660B2 (en)

Priority Applications (2)

Application Number Priority Date Filing Date Title
JP1297452A JP3012660B2 (en) 1989-11-17 1989-11-17 Method of manufacturing glass substrate for magnetic disk and method of manufacturing thin-film magnetic disk
US08/112,255 US5494721A (en) 1989-01-13 1993-08-26 Magnetic disc substrate

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP1297452A JP3012660B2 (en) 1989-11-17 1989-11-17 Method of manufacturing glass substrate for magnetic disk and method of manufacturing thin-film magnetic disk

Publications (2)

Publication Number Publication Date
JPH03160619A true JPH03160619A (en) 1991-07-10
JP3012660B2 JP3012660B2 (en) 2000-02-28

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Country Link
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Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0604435A1 (en) * 1991-09-11 1994-07-06 Conner Peripherals, Inc. 1.8" winchester drive card

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0604435A1 (en) * 1991-09-11 1994-07-06 Conner Peripherals, Inc. 1.8" winchester drive card
EP0604435A4 (en) * 1991-09-11 1995-08-30 Conner Peripherals Inc 1.8" winchester drive card.

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