JPH0314437U - - Google Patents
Info
- Publication number
- JPH0314437U JPH0314437U JP7399989U JP7399989U JPH0314437U JP H0314437 U JPH0314437 U JP H0314437U JP 7399989 U JP7399989 U JP 7399989U JP 7399989 U JP7399989 U JP 7399989U JP H0314437 U JPH0314437 U JP H0314437U
- Authority
- JP
- Japan
- Prior art keywords
- semiconductor thin
- wavelength
- radiation thermometer
- measured object
- thin films
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 239000010409 thin film Substances 0.000 claims description 6
- 230000005855 radiation Effects 0.000 claims description 3
- 239000004065 semiconductor Substances 0.000 claims 3
- 238000001514 detection method Methods 0.000 claims 1
- 230000003287 optical effect Effects 0.000 claims 1
- 230000035945 sensitivity Effects 0.000 claims 1
- 238000010586 diagram Methods 0.000 description 2
- 238000006243 chemical reaction Methods 0.000 description 1
Landscapes
- Radiation Pyrometers (AREA)
Description
第１図は本考案の一実施例を示す概略図、第２
図は上記実施例における積層薄膜セルを拡大して
示した拡大図、第３図は上記積層薄膜セルの変換
効率を示すグラフ、第４〜６図は従来の多色放射
温度計の概略図、第７図は波長、輝度、絶対温度
との関係を示したグラフである。
１０……被測定物体、２０……集光レンズ、３
０……積層薄膜セル、４０……スイツチング回路
、５１〜５４……補正器、６０……演算装置。
Figure 1 is a schematic diagram showing one embodiment of the present invention;
The figure is an enlarged view showing the laminated thin film cell in the above example, FIG. 3 is a graph showing the conversion efficiency of the laminated thin film cell, and FIGS. 4 to 6 are schematic diagrams of a conventional multicolor radiation thermometer. FIG. 7 is a graph showing the relationship between wavelength, brightness, and absolute temperature. 10...Object to be measured, 20...Condensing lens, 3
0... Laminated thin film cell, 40... Switching circuit, 51-54... Corrector, 60... Arithmetic device.
Claims (1)
た信号をウイーンの公式に基づき演算処理する事
により、該被測定物の温度を測定するようにした
多色放射温度計において、 光検出手段として複数の半導体薄膜が光軸方向
に積層された積層セルを用い、 上記各々の半導体薄膜は、波長に対する感度特
性がそれぞれ異なるように構成されて波長別輝度
信号をそれぞれの半導体薄膜から分離出力するよ
うに構成されている事を特徴とする多色放射温度
計。[Claims for Utility Model Registration] A multicolor device that measures the temperature of a measured object by detecting light emitted from the measured object and processing the detected signal based on Vienna's formula. In a radiation thermometer, a stacked cell in which a plurality of semiconductor thin films are stacked in the optical axis direction is used as a light detection means, and each of the semiconductor thin films is configured to have different sensitivity characteristics with respect to wavelength to generate a luminance signal for each wavelength. A multicolor radiation thermometer characterized by being configured to separate output from each semiconductor thin film.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP7399989U JPH0314437U (en) | 1989-06-23 | 1989-06-23 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP7399989U JPH0314437U (en) | 1989-06-23 | 1989-06-23 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPH0314437U true JPH0314437U (en) | 1991-02-14 |
Family
ID=31613306
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP7399989U Pending JPH0314437U (en) | 1989-06-23 | 1989-06-23 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH0314437U (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO2020080368A1 (en) * | 2018-10-16 | 2020-04-23 | 古河電気工業株式会社 | Temperature measuring system, temperature measuring method, and laser processing device |
-
1989
- 1989-06-23 JP JP7399989U patent/JPH0314437U/ja active Pending
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO2020080368A1 (en) * | 2018-10-16 | 2020-04-23 | 古河電気工業株式会社 | Temperature measuring system, temperature measuring method, and laser processing device |
| JPWO2020080368A1 (en) * | 2018-10-16 | 2021-09-16 | 古河電気工業株式会社 | Temperature measurement system, temperature measurement method and laser machining equipment |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| KR102071325B1 (en) | Optical sensor sensing illuminance and proximity | |
| JPS5958306A (en) | Range finder | |
| JPS5950579A (en) | Semiconductor optical position detector | |
| JPH0314437U (en) | ||
| JPS57167002A (en) | Focus detecting element | |
| JPS5629112A (en) | Distance measurement unit | |
| JPH03202732A (en) | Color sensor | |
| JPS59148372A (en) | Photosensitive device | |
| JPS6183921A (en) | Illuminometer | |
| JPS5511606A (en) | Photoelectric conversion device | |
| JPS5954811U (en) | camera ranging device | |
| JPS58100807A (en) | Focusing device | |
| JP2546335Y2 (en) | Light sensor | |
| JPS5870106A (en) | Detector for edge position | |
| Kato et al. | Integrated transducer for color distinction | |
| JPS61100607A (en) | Apparatus for detecting distance | |
| JPH089700Y2 (en) | Laser pointer device | |
| JPH0322433U (en) | ||
| JPS594451U (en) | radiation thermometer | |
| JPS60125526A (en) | Photoelectric transducer for photometry of camera | |
| JPS5749264A (en) | Photoelectric transducer | |
| JPS6192840U (en) | ||
| JPS63313856A (en) | Image read sensor | |
| JPH02126437U (en) | ||
| JPS6271511U (en) |