JPH03125988A - Detection level setting for metal detecting machine - Google Patents

Detection level setting for metal detecting machine

Info

Publication number
JPH03125988A
JPH03125988A JP1263065A JP26306589A JPH03125988A JP H03125988 A JPH03125988 A JP H03125988A JP 1263065 A JP1263065 A JP 1263065A JP 26306589 A JP26306589 A JP 26306589A JP H03125988 A JPH03125988 A JP H03125988A
Authority
JP
Japan
Prior art keywords
metal
detection level
detection
level
inspected
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP1263065A
Other languages
Japanese (ja)
Inventor
Hachiro Shinohara
篠原 八郎
Kyoichi Yokota
横田 恭一
Takashi Abe
阿部 俊
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Anritsu Corp
Original Assignee
Anritsu Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Anritsu Corp filed Critical Anritsu Corp
Priority to JP1263065A priority Critical patent/JPH03125988A/en
Publication of JPH03125988A publication Critical patent/JPH03125988A/en
Pending legal-status Critical Current

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  • Geophysics And Detection Of Objects (AREA)

Abstract

PURPOSE:To eliminate the need for the preparation of a sample by detecting metal material using a regular object to be inspected having the metal material to set values of 1/2-2/3 of peak levels of detection signals obtained in a receiving coil as metal detection level. CONSTITUTION:An object W to be inspected having metal material M is applied to a metal detecting machine MD and a detection level obtained in a receiving coil 3b is set as LM. A value 1/2-2/3 times as large as the level LM is set as detection criterion level Lth. With such an arrangement, there is no need for preparing a sample for setting a detection level as in the past and hence, the setting of detection level is accomplished simply by feeding an acceptable project. This allows the setting of a detection level easily regardless of the shape, type and dimension of the object W to be inspected or the metal material M attached thereto thereby achieving quick judgment of the quality of a diversifying object to be inspected.

Description

【発明の詳細な説明】 〔産業上の利用分野〕 この発明は、コンベア等で搬送されてくる被検査体中に
正規の金属物、例えばインスタントラーメン中のアルミ
箔入りスープが入っているかなどを検出するための金属
検出機の検出レベル設定方法に関するものである。
[Detailed Description of the Invention] [Industrial Application Field] This invention detects whether or not a regular metal object, such as soup containing aluminum foil in instant noodles, is contained in an object to be inspected that is being conveyed by a conveyor or the like. The present invention relates to a method of setting a detection level of a metal detector for detection.

〔従来の技術〕[Conventional technology]

まず、従来から使用されている金属検出機の概要につい
て第4図により説明する。この図において、1は発振器
、2は前記発振器1に接続されている送信コイル、3a
、3bはこの送信コイル2に対向して配置されている受
信コイルで、この受信コイル3a、3bは送信コイル2
の交番磁界中におかれ、その磁力線が等しく鎖交するよ
うに配置されている。4a、4bは前記受信コイル3a
、3bの誘起電圧み1.み2の位相およ、び振幅の調整
用のボリュームを示し、このボリューム4a、4bの調
整によって通常はel−ez=oとなるように設定され
る。5は差動誘起電圧ミ、−62を増幅する増幅器、6
a、6bはそれぞれ鉄および非鉄金属を検出する同期検
波器、7a。
First, an overview of a conventionally used metal detector will be explained with reference to FIG. In this figure, 1 is an oscillator, 2 is a transmitting coil connected to the oscillator 1, and 3a
, 3b are receiving coils arranged opposite to this transmitting coil 2;
They are placed in an alternating magnetic field and arranged so that the lines of magnetic force are equally interlinked. 4a and 4b are the receiving coils 3a
, 3b induced voltage 1. 2 shows a volume for adjusting the phase and amplitude of the signal 2, and is normally set so that el-ez=o by adjusting the volumes 4a and 4b. 5 is an amplifier that amplifies the differential induced voltage Mi, -62; 6
a and 6b are synchronous detectors that detect ferrous and nonferrous metals, respectively; 7a;

7bは2〜20Hz程度のアナログフィルタ、8a、8
bは判別回路である。なお、9a、9bは前記同期検波
器6a、 6bに供給する同期信号を形成する第1.第
2の移相器を示す。また、er、agは第5図により後
述する。
7b is an analog filter of about 2 to 20Hz, 8a, 8
b is a discrimination circuit. Note that 9a and 9b are first . A second phase shifter is shown. Further, er and ag will be described later with reference to FIG.

かかる構成からなる金属検出機は、送信コイル2および
受信コイル3a、3b間に被検査体Wが通過し、該被検
査体Wに金属が混入している時はその金属の種類(鉄ま
たは非鉄)によって判別回路8a、8bに検出信号が発
生する。
In a metal detector having such a configuration, an object to be inspected W passes between the transmitting coil 2 and receiving coils 3a and 3b, and when metal is mixed in the object to be inspected, the type of metal (ferrous or non-ferrous) is detected. ) generates a detection signal in the discrimination circuits 8a and 8b.

この点を第5図(a)、(b)のベクトル図で説明する
と、通常、受信コイル3a、3bの誘起電圧e+、e*
は増幅器5の入力側においてみ1−6.=Oとなるよう
に設定されているが、鉄を含んだ被検査体Wが矢印の方
向から通過すると、まず、第5図(a)に示すように、
受信コイル3aの誘起電圧61が6′1に増大し、次に
、受信コイル3bの誘起電圧み2が6′2に増大する。
To explain this point using the vector diagrams in FIGS. 5(a) and 5(b), normally the induced voltages e+, e* of the receiving coils 3a, 3b
1-6 only on the input side of the amplifier 5. =O, but when the inspected object W containing iron passes from the direction of the arrow, first, as shown in Fig. 5(a),
The induced voltage 61 of the receiving coil 3a increases to 6'1, and then the induced voltage 2 of the receiving coil 3b increases to 6'2.

したがって、みr−8m=e。、の差動誘起電圧が同期
検波器6aに入力され、この同期検波器6aに供給され
ている同位相の同期検波用の信号み、によって検出され
る。
Therefore, r−8m=e. , is input to the synchronous detector 6a, and is detected by only the same phase synchronous detection signal supplied to the synchronous detector 6a.

一方、非鉄金属(ステンレス、アルミ等)が混入した被
検査体Wが通過すると、発振器1の交流磁界の影響を受
けて非鉄金属内に渦電流が流れる。すると、この渦電流
の影響によって受信コイル3a、3bの誘起電圧er、
e*の位相が変化することになる。
On the other hand, when the inspected object W containing non-ferrous metal (stainless steel, aluminum, etc.) passes through, an eddy current flows in the non-ferrous metal under the influence of the alternating current magnetic field of the oscillator 1. Then, due to the influence of this eddy current, the induced voltages er,
The phase of e* will change.

すわなち、第5図(b)に示すように、受信コイル3a
の誘起電圧み、の位相が6″″1に変化すると、差動誘
起電圧e”zez=6゜、は図示したように、はぼ90
°位相がずれた点に発生する。そこで、この差動誘起電
圧み。3とほぼ同相となっているみ、で示す同期検波信
号が供給されている同期検波器6bにおいて位相検波す
ることにより非鉄金属を検出することができる。
That is, as shown in FIG. 5(b), the receiving coil 3a
When the phase of the induced voltage changes to 6''1, the differential induced voltage e''zez = 6°, as shown in the figure, becomes approximately 90°.
° Occurs at out-of-phase points. So, look at this differential induced voltage. Non-ferrous metals can be detected by phase detection in the synchronous detector 6b to which the synchronous detection signal shown by 3 is supplied.

上記した金属検出機は、被検査体Wの中に異物としての
金属が混入されているかどうかを検出することに要点が
あり、したがって、異物金属は、通常、微小のものも検
出できるように検出レベルが設定される。すなわち、例
えば袋詰の味噌中に異物金属が混入されていないかどう
かを検出する場合、微小な異物金属でも検出しなければ
ならない。したがって、従来の検出レベルの設定方法は
異物金属が混入していない良品を流し、受信コイル3a
に若干の誘起電圧を検出する。そこで第6図のように、
この誘起電圧を良品検出レベルL1とし、この良品検出
レベルL1の2倍〜3倍のところを金属検出レベルL2
として設定し、この金属検出レベルLヨな超えた出力が
得られたとき、異物金属が混入されていると判断してい
る。
The key point of the above-mentioned metal detector is to detect whether metal as a foreign substance is mixed into the object W to be inspected. Therefore, foreign metals are usually detected so that even minute ones can be detected The level is set. That is, for example, when detecting whether foreign metals are mixed in packed miso, it is necessary to detect even minute foreign metals. Therefore, the conventional method of setting the detection level is to pass a good product with no foreign metals mixed in, and to
A slight induced voltage is detected. Therefore, as shown in Figure 6,
This induced voltage is defined as the non-defective product detection level L1, and the metal detection level L2 is 2 to 3 times the non-defective product detection level L1.
When an output exceeding this metal detection level L is obtained, it is determined that foreign metal is mixed in.

〔発明が解決しようとする課題] 一方、被検査体Wとして金属物を必ず備えていなければ
ならない場合、つまり、第3図(a)のように、種々の
食品バック10内に鮮度保持剤として脱酸素剤11が入
れてあり、この脱酸素剤11は鉄の酸化物であるため金
属検出機に通すと金属混入として検出される。同様に、
第3図(b)のように、ラーメンバック20内にアルミ
箔入り粉末スープ21が入れである場合、第3図(c)
のように、菓子バック30にアルミ箔入りビニールシー
ル31が入れである場合、あるいは第3図(d)のよう
に、菓子容器40に金属で作った玩具41を付属させで
ある場合等のように、金属が検出されることが良品であ
る場合には、金属は異物でないので検出レベルを超えた
出力のとき良品となる。
[Problems to be Solved by the Invention] On the other hand, when a metal object must be provided as the object W to be inspected, that is, as shown in FIG. A deoxidizing agent 11 is contained, and since this deoxidizing agent 11 is an oxide of iron, when it is passed through a metal detector, it is detected as metal contamination. Similarly,
When the powdered soup 21 containing aluminum foil is placed inside the ramen bag 20 as shown in Fig. 3(b), Fig. 3(c)
As in the case where the candy bag 30 contains a vinyl sticker 31 containing aluminum foil, or as shown in FIG. 3(d), the candy container 40 has a toy 41 made of metal attached. Furthermore, if metal is detected, which indicates a good product, the metal is not a foreign object, and the product is considered good if the output exceeds the detection level.

この場合の検出レベルの設定方法としては、実際に検出
したい金属物C例えばアルミ袋)を局〜%の大きさに切
断したものを金属検出機に流し、第7図のように、金属
検出レベルL3を定め、この検出レベルLsの2〜3倍
のところに良品検出レベルL4を設定している。このよ
うに、金属物を局〜%に切断して試料とする煩わしさが
あり、特に金属物が不均一のときは試料作りがむずかし
いという問題点があった。
In this case, the method of setting the detection level is to cut the metal object (e.g., an aluminum bag) that you want to detect and cut it into pieces of ~% size and feed it into the metal detector, and set the metal detection level as shown in Figure 7. L3 is determined, and a non-defective product detection level L4 is set at 2 to 3 times the detection level Ls. As described above, there is a problem in that it is troublesome to cut the metal object into small pieces to prepare the sample, and it is difficult to prepare the sample especially when the metal object is non-uniform.

この発明は、上記の問題点を解決するためになされたも
ので、試料を作成する必要がない検出レベル設定方法を
提供することを目的とする。
The present invention was made in order to solve the above-mentioned problems, and an object of the present invention is to provide a detection level setting method that does not require preparing a sample.

[課題を解決するための手段1 この発明にかかる金属検出機の検出レベル設定方法は、
金属物を具備した正規の被検査体を用いて金属物の検出
を行い、その時に受信コイルに得られる検出信号のピー
クレベルを検出し、このピークレベルの坏〜%の値を金
属検出レベルとして設定するものである。
[Means for solving the problem 1 A detection level setting method for a metal detector according to the present invention is as follows:
Detect metal objects using a regular object to be inspected that is equipped with metal objects, detect the peak level of the detection signal obtained in the receiving coil at that time, and set the value of ~% of this peak level as the metal detection level. This is what you set.

〔作用〕[Effect]

この発明においては、良品を金属検出機に流し、その時
の検出信号を基にして検出レベルを設定するので、試料
の作成を必要としない。
In this invention, since a non-defective product is passed through a metal detector and the detection level is set based on the detection signal at that time, there is no need to prepare a sample.

〔実施例〕〔Example〕

第1図はこの発明の検出レベル設定方法を説明するため
の図である。
FIG. 1 is a diagram for explaining the detection level setting method of the present invention.

まず、金属物Mを具備した被検査体Wを金属検出機MD
に通し、受信コイル3bに得られる検出レベルをLMと
する。そして、この検出レベルL、の局〜%倍の値のと
ころを検出判定レベルL thとして設定する。
First, the object to be inspected W equipped with the metal object M is placed on the metal detector MD.
, and the detection level obtained at the receiving coil 3b is defined as LM. Then, a value multiplied by % of this detection level L is set as the detection judgment level L th.

第2図に検出レベルしい、検出判定レベルLthである
The detection level shown in FIG. 2 is the detection judgment level Lth.

なお、上記の実施例で説明した受信コイル3bで得られ
る信号とは、増幅器あるいは減衰器を通す場合も包含す
ることはいうまでもない。
It goes without saying that the signal obtained by the receiving coil 3b described in the above embodiment includes the case where the signal is passed through an amplifier or an attenuator.

〔発明の効果1 この発明は、以上詳細に説明したように、金属物を具備
した正規の被検査体を用いて金属物の検出を行い、その
時に受信コイルに得られる検出信号のピークレベルを検
出し、このピークレベルの局〜%の値を検出判定レベル
として設定するようにしたので、従来のように検出レベ
ル設定のために試料を作成する必要がなく、良品を流す
だけで簡単に検出レベルの設定ができる。したがって、
被検査体あるいはそれに付属する金属物の形状。
[Effect of the invention 1] As explained in detail above, the present invention detects a metal object using a regular object to be inspected equipped with a metal object, and measures the peak level of the detection signal obtained at the receiving coil at that time. Since the value of ~% of this peak level is set as the detection judgment level, there is no need to prepare a sample to set the detection level as in the past, and detection can be easily performed by simply flowing a good product. You can set the level. therefore,
The shape of the object to be inspected or the metal object attached to it.

種類9寸法が変わっても検出レベルが容易に設定でき、
多様化する被検査体の良否判定を迅速に行える利点があ
る。
Type 9 Even if the dimensions change, the detection level can be easily set.
It has the advantage of being able to quickly determine the quality of the increasingly diverse objects to be inspected.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図はこの発明の一実施例を説明するための図、第2
図は、第1図で得られる各検出レベルの関係を示す図、
第3図(a)〜(d)は各種の被検査体を示す図、第4
図は金属検出機の一例を示すブロック図、第5図(a)
、(b)は、第4図の検出動作を説明するためのブロッ
ク図、第6図、第7図は従来の検出レベル設定方法を説
明するための各検出レベルの関係を示す図である。 図中、1は発振器、2は送信コイル、3a。 3bは受信コイル、4a、4bはボリューム、5は増幅
器、6a、6bは同期検波器、7a、7bはアナログフ
ィルタ、8a、8bは判別回路、9a、9bは第1.第
2の移相器、L&lは検出レベル、しいは検出判定レベ
ルである。 第1図 第2図 第 3 図 第 図 第 図 (a) (b)
FIG. 1 is a diagram for explaining one embodiment of the present invention, and FIG.
The figure shows the relationship between each detection level obtained in Figure 1,
Figures 3 (a) to (d) are diagrams showing various objects to be inspected;
The figure is a block diagram showing an example of a metal detector, Figure 5 (a)
, (b) are block diagrams for explaining the detection operation of FIG. 4, and FIGS. 6 and 7 are diagrams showing the relationship between each detection level for explaining the conventional detection level setting method. In the figure, 1 is an oscillator, 2 is a transmitting coil, and 3a. 3b is a receiving coil, 4a, 4b are volumes, 5 is an amplifier, 6a, 6b are synchronous detectors, 7a, 7b are analog filters, 8a, 8b are discrimination circuits, 9a, 9b are first... The second phase shifter, L&l, is a detection level or a detection judgment level. Figure 1 Figure 2 Figure 3 Figure Figure Figure (a) (b)

Claims (1)

【特許請求の範囲】[Claims] 交番磁界を発生する送信コイルと、この交番磁界を受け
る受信コイルとの間に金属物を具備した被検査体を通過
させ前記受信コイルに得られる検出信号の大きさを判別
回路で判別して前記金属物が具備されていることの検出
を行う金属検出機の検出レベル設定に際して、前記金属
物を具備した正規の被検査体を用いて金属物の検出を行
い、その時に前記受信コイルに得られる検出信号のピー
クレベルを検出し、このピークレベルの1/2〜2/3
の値を金属検出レベルとして設定することを特徴とする
金属検出機の検出レベル設定方法。
A test object having a metal object is passed between a transmitting coil that generates an alternating magnetic field and a receiving coil that receives this alternating magnetic field, and a discrimination circuit discriminates the magnitude of a detection signal obtained from the receiving coil. When setting the detection level of a metal detector that detects the presence of a metal object, detect the metal object using a regular object to be inspected that is equipped with the metal object, and at that time, detect the metal object obtained by the receiving coil. The peak level of the detection signal is detected, and 1/2 to 2/3 of this peak level is detected.
A detection level setting method for a metal detector, characterized in that a value of is set as a metal detection level.
JP1263065A 1989-10-11 1989-10-11 Detection level setting for metal detecting machine Pending JPH03125988A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP1263065A JPH03125988A (en) 1989-10-11 1989-10-11 Detection level setting for metal detecting machine

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP1263065A JPH03125988A (en) 1989-10-11 1989-10-11 Detection level setting for metal detecting machine

Publications (1)

Publication Number Publication Date
JPH03125988A true JPH03125988A (en) 1991-05-29

Family

ID=17384359

Family Applications (1)

Application Number Title Priority Date Filing Date
JP1263065A Pending JPH03125988A (en) 1989-10-11 1989-10-11 Detection level setting for metal detecting machine

Country Status (1)

Country Link
JP (1) JPH03125988A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH11118765A (en) * 1997-10-09 1999-04-30 Ishida Co Ltd Metal detection machine and metal detection system

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH11118765A (en) * 1997-10-09 1999-04-30 Ishida Co Ltd Metal detection machine and metal detection system

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