JPH03124026A - Liquid treatment device - Google Patents

Liquid treatment device

Info

Publication number
JPH03124026A
JPH03124026A JP26196089A JP26196089A JPH03124026A JP H03124026 A JPH03124026 A JP H03124026A JP 26196089 A JP26196089 A JP 26196089A JP 26196089 A JP26196089 A JP 26196089A JP H03124026 A JPH03124026 A JP H03124026A
Authority
JP
Japan
Prior art keywords
gate
carrying
mist
chemical
processing
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP26196089A
Other languages
Japanese (ja)
Inventor
Kinya Ueno
欽也 上野
Hisashi Kondo
久 近藤
Naruhito Ibuka
井深 成仁
Takeshi Wakabayashi
剛 若林
Masazumi Nakarai
半井 正澄
Hiroshi Yamaguchi
弘 山口
Tetsuo Koyanagi
小柳 哲雄
Toshio Taketatsu
竹達 敏雄
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
SUGAI KK
Tokyo Electron Ltd
Original Assignee
SUGAI KK
Tokyo Electron Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by SUGAI KK, Tokyo Electron Ltd filed Critical SUGAI KK
Priority to JP26196089A priority Critical patent/JPH03124026A/en
Publication of JPH03124026A publication Critical patent/JPH03124026A/en
Pending legal-status Critical Current

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  • Cleaning Or Drying Semiconductors (AREA)

Abstract

PURPOSE:To prevent scattering of mist produced during treatment and secure clean properties of a wafer by forming each gate for carrying in a substance to be treated into a slit shape and covering the gate with a long circular surface body. CONSTITUTION:When each semiconductor wafer 1 is carried in, each rotating piece 20 rotates and each long circular surface body 19 slides in each circular arc groove 18 and then, each gate 4 is opened by making the circular body 19 separate from the slit like carrying-in gate 4 at the upper opening part of a treatment vessel 3. After carrying its water in the treatment vessel through the gate 4, the rotating piece 20 rotates and the circular body 19 abuts upon the gate 4 and then, the gate 4 is covered with each lid. In such a state, the water 1 is immersed in a heated chemical and chemical washing treatment is performed. Even though mist is produced from the chemical in washing, mist is not scattered into the outside because the carrying-in gate is blocked up surely and lowering of cleanliness properties does not take place in this way.

Description

【発明の詳細な説明】 光乳の目的 (産業上の利用分野) 本発明は、液体処理装置に関する。[Detailed description of the invention] Purpose of light milk (Industrial application field) The present invention relates to a liquid treatment device.

(従来の技術) 半導体製造工程は、各工程を経て製造されるが、この工
程の橋渡しをする必須工程が洗浄工程である。特に、最
近の半導体集積回路の高集積化、高密度化に伴って超洗
浄環境が必要となり、洗浄技術の良否がデバイス性能や
歩留まりに極めて影響されている。
(Prior Art) In a semiconductor manufacturing process, a semiconductor is manufactured through various steps, and an essential step that bridges these steps is a cleaning step. In particular, with the recent increase in the degree of integration and density of semiconductor integrated circuits, an ultra-cleaning environment is required, and the quality of cleaning technology is extremely influenced by device performance and yield.

従来の洗浄方法には、各種の化学的方法や物理的方法が
採用されており、このうち、キャリアに収納した半導体
ウェハを、薬液槽中に浸漬して洗浄したり、また、精密
洗浄を必要とする場合は、ウェハを一枚ごとに洗浄する
枚葉式の洗浄方法も行なわれている。
Conventional cleaning methods employ various chemical and physical methods, including cleaning semiconductor wafers housed in carriers by immersing them in a chemical bath, and cleaning methods that require precision cleaning. In this case, a single wafer cleaning method is also used in which the wafers are cleaned one by one.

(発明が解決しようとする課題) しかしながら、上記の従来例によると、薬液槽中の薬液
は、加熱された状態であるから、使用中に薬液のミスト
が発生して、槽内にミストが充満する恐れがあり、その
ため、クリーンルーム内の雰囲気中に浮遊して、クリー
ン度の低下を起こす等の問題がある。
(Problem to be Solved by the Invention) However, according to the above-mentioned conventional example, since the chemical liquid in the chemical liquid tank is in a heated state, a mist of the chemical liquid is generated during use, and the tank is filled with mist. Therefore, there is a problem that the particles may float in the atmosphere in the clean room and cause a decrease in the cleanliness level.

そこで、従来よりこの薬液のミストを廃棄するための廃
棄装置を設けてクリーン性の欠陥をカバーしていたが、
従来の廃棄装置はコンパクト性に劣るために、大型で、
コストアップの要因にもなっていた。
Therefore, conventionally, a disposal device was installed to dispose of this chemical mist to cover up the lack of cleanliness.
Conventional disposal equipment is not compact, so it is large and
This was also a factor in increasing costs.

本発明は、上記の実情に鑑み、処理容器の開口部にコン
パクトなゲート機構を設けることにより、コストダウン
を図ることはもとより、処理中に液体から発生するミス
トを外部に飛散するのを確実に防止してクリーン度の確
保を図ることを目的としている。
In view of the above circumstances, the present invention provides a compact gate mechanism at the opening of the processing container, which not only reduces costs but also ensures that the mist generated from the liquid during processing is not scattered to the outside. The purpose is to prevent this and ensure cleanliness.

発明の構成 (課題を解決するための手段) 上記の目的を達成するため、本発明は、処理液を収容し
た処理容器内に被処理体を搬入して処理する液体処理装
置において、被処理体を搬入する搬入ゲートをスリット
状に形成し、この搬入ゲートを長尺状の表面円形体によ
り被蓋するように構成した液体処理装置である。
Structure of the Invention (Means for Solving the Problems) In order to achieve the above object, the present invention provides a liquid processing apparatus that carries a processing object into a processing container containing a processing liquid and processes the processing object. This is a liquid processing apparatus in which a carry-in gate for carrying in liquid is formed in the shape of a slit, and this carry-in gate is covered with an elongated circular body.

(作 用) 本発明は、上述のように被処理体を搬入する搬入ゲート
を処理容器の上部にスリット状に形成し、この搬入ゲー
トを長尺状の表面円形体により被蓋するように構成した
から、搬送機構により搬送された被処理体を搬入する場
合、処理容器のスリット状の搬入ゲー1〜より長尺状の
表面円形体を離間させてゲートを開口させ、次いで、予
めオリフラ合わせを完了した被処理体を搬入ゲートより
搬入した後に1表面円形体をゲートに当接させてゲート
を被蓋する。この状態において、処理液例えば加熱され
た薬液内に被処理体が浸漬されているから、被処理体は
洗浄処理が施され、洗浄中において、処理液よりミスト
が発生しても処理容器の搬入ゲートは確実に閉塞されて
いるので、発生したミストが外部に飛散してクリーン性
の低下を起こすおそれがない。また、処理工程を終了す
ると、表面円形体を搬入ゲートより離間させて処理容器
より被処理体を取りだし次工程に搬送する。
(Function) As described above, the present invention is configured such that the carry-in gate for carrying in the object to be processed is formed in the shape of a slit in the upper part of the processing container, and this carry-in gate is covered with an elongated circular body. Therefore, when carrying in the object to be processed that has been carried by the carrying mechanism, the slit-shaped carry-in gate 1 of the processing container to the longer-shaped surface circular body are spaced apart to open the gate, and then the orientation flat alignment is carried out in advance. After the completed object to be processed is carried in through the carry-in gate, the one-surface circular body is brought into contact with the gate to cover the gate. In this state, since the object to be processed is immersed in the processing liquid, for example, a heated chemical solution, the object to be processed is subjected to cleaning treatment, and even if mist is generated from the processing liquid during cleaning, the processing container cannot be brought in. Since the gate is reliably closed, there is no risk that the generated mist will scatter to the outside and cause a reduction in cleanliness. Further, when the processing step is completed, the surface circular body is separated from the carry-in gate, and the object to be processed is taken out from the processing container and transported to the next step.

(実施例) 以下に1本発明における液体処理装置を半4体ウェハの
洗浄装置に適用した例を図面に従って説明する。
(Example) An example in which a liquid processing apparatus according to the present invention is applied to a cleaning apparatus for half-quad wafers will be described below with reference to the drawings.

本例における洗浄装置は、前工程例えばエツチング工程
を終了した1枚毎の半導体ウェハ1を搬送装置であるア
ーム機構のピンセット(図示せず)により垂直状態に吸
着保持して、洗浄工程に搬送し、処理液2を収容した処
理容器3内に1枚毎に垂直状態で搬入し、その後、スリ
ット状の搬入ゲート4を被蓋した状態で洗浄するもので
ある。
The cleaning apparatus in this embodiment suctions and holds each semiconductor wafer 1, which has completed a previous process, for example, an etching process, in a vertical position using tweezers (not shown) of an arm mechanism, which is a transport device, and transports it to the cleaning process. Each sheet is vertically transported into a processing container 3 containing a processing liquid 2, and then cleaned with a slit-shaped transport gate 4 covered.

第1図において、内部に90℃程度に保温された液体5
を収容した保温槽6内に複数個本例においては4個の断
面方形状の縦長の処理容器3を下方部分を保温槽6内に
臨ませ、処理容器3の途中に設けた取付部8を介して保
温槽6に固着されている。また、液体5を収容した保温
槽6は、処理容器3内の処理液2の保温と、保温槽6内
に設けた超音波振動子7の振動を各処理容器3に伝達す
る機能を有している。
In Figure 1, liquid 5 is kept at a temperature of about 90°C inside.
A plurality of vertically elongated processing containers 3 with a rectangular cross-section (in this example, four) are placed in a heat-retaining tank 6 containing a plurality of heat-retaining containers 3, with the lower part facing into the heat-retaining tank 6, and a mounting portion 8 provided in the middle of the processing container 3. It is fixed to the heat-retaining tank 6 via the heat insulating tank 6. Further, the heat-retaining tank 6 containing the liquid 5 has the function of keeping the processing liquid 2 in the processing container 3 warm and transmitting the vibrations of the ultrasonic vibrator 7 provided in the heat-retaining tank 6 to each processing container 3. ing.

この処理容器3は、石英ガラスで形成されており、底部
は円弧状を呈し、内部の両側面に石英ガラスで形成され
たスペーサ9,10を処理容器3と一体に又は別体に形
成されており、底面に半導体ウェハ1の垂直状態を保持
する保持部11を設け、更に、半導体ウェハ1を収納す
る収納空間12の一面、ウェハ1の裏面と対面する側に
U字形状の挿入溝13を形成している。
The processing container 3 is made of quartz glass, has an arcuate bottom, and has spacers 9 and 10 made of quartz glass on both sides of the interior, either integrally with the processing container 3 or separately. A holding portion 11 for holding the semiconductor wafer 1 in a vertical state is provided on the bottom surface, and a U-shaped insertion groove 13 is provided on one side of the storage space 12 for storing the semiconductor wafer 1, on the side facing the back surface of the wafer 1. is forming.

また、処理容器3の上方開口部に形成した鍔部14にバ
ッキング15を介してゲート部材16を固着し、このゲ
ート部材16の上方にスリット状の搬入ゲート4を設け
、更に、ゲー1へ部材16の両側部に保持板17を設け
、この保持板17に円弧溝18を形成し、この円弧溝1
8に長尺状に表面円形体19を摺動自在に設け、この表
面円形体19の両端に回動片20を固着し1回動片2o
は、保持板17の回動軸21に軸着させ、この回動軸2
1を駆動系の駆動軸25と連動させ、回動軸21を中心
に回動片2oを回動させ1表面円形体19を円弧溝18
に案内されながら搬入ゲート4を表面円形体19が閉塞
したり、開放したりするように構成されている。
Further, a gate member 16 is fixed to a flange 14 formed at the upper opening of the processing container 3 via a backing 15, and a slit-shaped carry-in gate 4 is provided above the gate member 16. A retaining plate 17 is provided on both sides of the retaining plate 17, and an arcuate groove 18 is formed in the retainer plate 17.
A long circular surface body 19 is slidably provided on the surface circular body 8, and rotating pieces 20 are fixed to both ends of this circular surface body 19.
is attached to the rotating shaft 21 of the holding plate 17, and this rotating shaft 2
1 is interlocked with the drive shaft 25 of the drive system, and the rotating piece 2o is rotated around the rotating shaft 21, so that the circular body 19 on the surface of 1 is connected to the arcuate groove 18.
The circular surface body 19 is configured to close and open the carry-in gate 4 while being guided by.

また、図中22はオーバーフロー管、23は薬液の供給
管、24は排液管である。
Further, in the figure, 22 is an overflow pipe, 23 is a chemical supply pipe, and 24 is a drain pipe.

次に上記した実施例の作用を説明する。Next, the operation of the above embodiment will be explained.

搬送機構により搬送された半導体ウェハ1を搬入する場
合、駆動系の駆動軸25の駆動力を回動軸21に伝達さ
れ、回動片20が回動して円弧溝18内を表面円弧体1
9が摺動して処理容器3のF方間口部のスリット状の搬
入ゲート4より長尺状の表面円形体19が離間してゲー
ト4を開口させ。
When loading the semiconductor wafer 1 transported by the transport mechanism, the driving force of the drive shaft 25 of the drive system is transmitted to the rotation shaft 21, and the rotation piece 20 rotates to move the surface arc body 1 inside the arc groove 18.
9 slides, and the elongated circular surface body 19 is separated from the slit-shaped import gate 4 at the F-side opening of the processing container 3, thereby opening the gate 4.

次いで、予めオリフラ合わせを完了した半導体ウェハ1
を吸着固定したピンセットによりゲート4の側壁に接触
することのないように位置決めして搬入ゲート4より搬
入した後に、上記の駆動軸25を上記とは反対側に駆動
させると、表面円形体19がゲート4に当接してゲート
4を被蓋する。
Next, the semiconductor wafer 1 whose orientation flat alignment has been completed in advance
After transporting through the loading gate 4 by positioning it using tweezers to avoid contact with the side wall of the gate 4, when the drive shaft 25 is driven in the opposite direction, the circular surface body 19 is moved. It comes into contact with the gate 4 and covers the gate 4.

この状態においては、加熱された薬液(例えば過酸化水
素水、フッ酸等の薬液)内に半導体ウェハ1が浸漬され
、超音波を動力とし、ウェハ1を振動回転などさせ、半
導体ウェハ1は化学的洗浄処理が施される。この洗浄中
において、薬液よりミストが発生しても処理容器3の搬
入ゲート4は確実に閉塞されているので、発生したミス
トが外部に飛散してクリーン性の低下を起こすおそれが
ない。また、処理工程が終了すると、表面円形体19を
搬入ゲート4より離間させて処理容器3より半導体ウェ
ハ1を取りだし次工程に搬送することができる。
In this state, the semiconductor wafer 1 is immersed in a heated chemical solution (for example, a chemical solution such as hydrogen peroxide solution or hydrofluoric acid), and the wafer 1 is vibrated and rotated using ultrasonic waves as power. A special cleaning process is applied. During this cleaning, even if mist is generated from the chemical solution, the carry-in gate 4 of the processing container 3 is reliably closed, so there is no risk that the generated mist will scatter to the outside and cause a reduction in cleanliness. Further, when the processing step is completed, the semiconductor wafer 1 can be taken out from the processing container 3 with the circular surface body 19 separated from the carry-in gate 4 and transported to the next step.

発明の効果 以上のことから明らかなように、本発明によると1次の
ような有用な効果がある。
Effects of the Invention As is clear from the above, the present invention has the following useful effects.

処理容器の開口部にコンバク1〜なゲート機構を設ける
ことにより、従来に比して著しいコストダウンを図るこ
とはもとより、処理中に液体から発生するミストが外部
に飛散するおそれが全くないので、クリーン度の確保を
図ることことができる等の効果がある。
By providing a compact gate mechanism at the opening of the processing container, not only can costs be significantly reduced compared to conventional methods, but there is also no risk of mist generated from the liquid scattering to the outside during processing. This has the effect of ensuring cleanliness.

上記実施例では、半導体ウェハの洗浄処理に適用した例
について説明したが、その他LCDの洗浄工程など液体
処理工程にも適用できる。
In the above embodiment, an example in which the present invention is applied to a semiconductor wafer cleaning process has been described, but the present invention can also be applied to other liquid processing processes such as an LCD cleaning process.

【図面の簡単な説明】[Brief explanation of the drawing]

図面は、本発明における液体処理装置の一実施例を示し
たもので、第1図は処理装置の断面図、第2図は第1図
のA−A線断面図である。 1・・・・半導体ウェハ(被処理板) 2・・・・処理液 3・・・・処理容器4・・・・搬入
ゲート 19・・・・表面円形体第2図
The drawings show an embodiment of the liquid processing apparatus according to the present invention, and FIG. 1 is a sectional view of the processing apparatus, and FIG. 2 is a sectional view taken along the line A--A in FIG. 1. 1...Semiconductor wafer (substrate to be processed) 2...Processing liquid 3...Processing container 4...Carrying gate 19...Circular surface body Fig. 2

Claims (1)

【特許請求の範囲】[Claims] (1)処理液を収容した処理容器内に被処理体を搬入し
て処理する液体処理装置において、被処理体を搬入する
搬入ゲートをスリット状に形成し、この搬入ゲートを長
尺状の表面円形体により被蓋するように構成したことを
特徴とする液体処理装置。
(1) In a liquid processing apparatus in which an object to be processed is transported into a processing container containing a processing liquid for processing, a carry-in gate through which the object to be processed is carried in is formed in the shape of a slit, and this carry-in gate is connected to a long surface. A liquid processing device characterized in that it is configured to be covered by a circular body.
JP26196089A 1989-10-09 1989-10-09 Liquid treatment device Pending JPH03124026A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP26196089A JPH03124026A (en) 1989-10-09 1989-10-09 Liquid treatment device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP26196089A JPH03124026A (en) 1989-10-09 1989-10-09 Liquid treatment device

Publications (1)

Publication Number Publication Date
JPH03124026A true JPH03124026A (en) 1991-05-27

Family

ID=17369046

Family Applications (1)

Application Number Title Priority Date Filing Date
JP26196089A Pending JPH03124026A (en) 1989-10-09 1989-10-09 Liquid treatment device

Country Status (1)

Country Link
JP (1) JPH03124026A (en)

Cited By (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5571337A (en) * 1994-11-14 1996-11-05 Yieldup International Method for cleaning and drying a semiconductor wafer
US5634978A (en) * 1994-11-14 1997-06-03 Yieldup International Ultra-low particle semiconductor method
US5849104A (en) * 1996-09-19 1998-12-15 Yieldup International Method and apparatus for cleaning wafers using multiple tanks
US5891256A (en) * 1994-11-14 1999-04-06 Yieldup International Ultra-low particle semiconductor cleaner
US5958146A (en) * 1994-11-14 1999-09-28 Yieldup International Ultra-low particle semiconductor cleaner using heated fluids
US6047717A (en) * 1998-04-29 2000-04-11 Scd Mountain View, Inc. Mandrel device and method for hard disks
JP2007062726A (en) * 2005-08-29 2007-03-15 Zahnradfab Friedrichshafen Ag Power transmitting system of hybrid car
US7226514B2 (en) 1999-04-08 2007-06-05 Applied Materials, Inc. Spin-rinse-dryer

Cited By (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5571337A (en) * 1994-11-14 1996-11-05 Yieldup International Method for cleaning and drying a semiconductor wafer
US5634978A (en) * 1994-11-14 1997-06-03 Yieldup International Ultra-low particle semiconductor method
US5891256A (en) * 1994-11-14 1999-04-06 Yieldup International Ultra-low particle semiconductor cleaner
US5932027A (en) * 1994-11-14 1999-08-03 Yieldup International Cleaning and drying photoresist coated wafers
US5958146A (en) * 1994-11-14 1999-09-28 Yieldup International Ultra-low particle semiconductor cleaner using heated fluids
US5849104A (en) * 1996-09-19 1998-12-15 Yieldup International Method and apparatus for cleaning wafers using multiple tanks
US6047717A (en) * 1998-04-29 2000-04-11 Scd Mountain View, Inc. Mandrel device and method for hard disks
US7226514B2 (en) 1999-04-08 2007-06-05 Applied Materials, Inc. Spin-rinse-dryer
JP2007062726A (en) * 2005-08-29 2007-03-15 Zahnradfab Friedrichshafen Ag Power transmitting system of hybrid car

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