JPH03123205U - - Google Patents
Info
- Publication number
- JPH03123205U JPH03123205U JP3103990U JP3103990U JPH03123205U JP H03123205 U JPH03123205 U JP H03123205U JP 3103990 U JP3103990 U JP 3103990U JP 3103990 U JP3103990 U JP 3103990U JP H03123205 U JPH03123205 U JP H03123205U
- Authority
- JP
- Japan
- Prior art keywords
- phase
- electro
- imaging
- measurement
- changing
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 230000003287 optical effect Effects 0.000 claims description 5
- 238000003384 imaging method Methods 0.000 claims description 4
- 238000005259 measurement Methods 0.000 claims 3
- 230000000694 effects Effects 0.000 claims 2
- 230000010363 phase shift Effects 0.000 claims 1
- 230000010287 polarization Effects 0.000 claims 1
- 238000010586 diagram Methods 0.000 description 2
- 239000013078 crystal Substances 0.000 description 1
Landscapes
- Instruments For Measurement Of Length By Optical Means (AREA)
- Length Measuring Devices By Optical Means (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP3103990U JPH03123205U (bg) | 1990-03-28 | 1990-03-28 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP3103990U JPH03123205U (bg) | 1990-03-28 | 1990-03-28 |
Publications (1)
Publication Number | Publication Date |
---|---|
JPH03123205U true JPH03123205U (bg) | 1991-12-16 |
Family
ID=31533766
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP3103990U Pending JPH03123205U (bg) | 1990-03-28 | 1990-03-28 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPH03123205U (bg) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2009152000A (ja) * | 2007-12-19 | 2009-07-09 | Nec Electronics Corp | 半導体装置用ソケット |
-
1990
- 1990-03-28 JP JP3103990U patent/JPH03123205U/ja active Pending
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2009152000A (ja) * | 2007-12-19 | 2009-07-09 | Nec Electronics Corp | 半導体装置用ソケット |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
US7564568B2 (en) | Phase shifting interferometry with multiple accumulation | |
Millerd et al. | Instantaneous phase-shift point-diffraction interferometer | |
Brock et al. | Dynamic interferometry | |
US7057737B2 (en) | Common optical-path testing of high-numerical-aperture wavefronts | |
US5953137A (en) | Linear conoscopic holography | |
Kiire et al. | Quadrature phase-shifting interferometer with a polarization imaging camera | |
Anna et al. | Sinusoidal fringe projection system based on compact and non-mechanical scanning low-coherence Michelson interferometer for three-dimensional shape measurement | |
Blain et al. | An in-line shearography setup based on circular polarization gratings | |
US11719531B2 (en) | Methods and systems of holographic interferometry | |
JPH03123205U (bg) | ||
Ferrari et al. | A new scheme for phase-shifting ESPI using polarized light | |
Pérez et al. | Dynamic Mach–Zehnder interferometer based on a Michelson configuration and a cube beam splitter system | |
Schmit et al. | Improved polarization Mirau interference microscope | |
JPH02287107A (ja) | 2次元情報取得装置 | |
Kranz et al. | Fiber optical single-frame speckle interferometer for measuring industrial surfaces | |
JP2964467B2 (ja) | 多重反射素子 | |
JPH09280811A (ja) | 干渉計 | |
JPH05141915A (ja) | 位相差可変素子 | |
JPH03278022A (ja) | 干渉装置 | |
JP2521324Y2 (ja) | 干渉計 | |
Sun et al. | Low-coherence snapshot phase-shifting diffraction phase microscope | |
JP3933856B2 (ja) | 位相差増幅システム | |
JPH06273238A (ja) | 光学装置 | |
Delage et al. | Analysis of polarisation requirements in a fiber-linked stellar interferometer | |
JPS6321503A (ja) | 縞走査干渉測定方法 |