JPH03122370U - - Google Patents
Info
- Publication number
- JPH03122370U JPH03122370U JP3090990U JP3090990U JPH03122370U JP H03122370 U JPH03122370 U JP H03122370U JP 3090990 U JP3090990 U JP 3090990U JP 3090990 U JP3090990 U JP 3090990U JP H03122370 U JPH03122370 U JP H03122370U
- Authority
- JP
- Japan
- Prior art keywords
- measurement
- terminal
- spacer
- probe
- stopper
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 238000005259 measurement Methods 0.000 claims description 28
- 239000000523 sample Substances 0.000 claims description 21
- 125000006850 spacer group Chemical group 0.000 claims description 9
- 238000003780 insertion Methods 0.000 claims description 3
- 230000037431 insertion Effects 0.000 claims description 3
- 239000000758 substrate Substances 0.000 claims 1
Landscapes
- Measuring Leads Or Probes (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP3090990U JPH03122370U (US20100223739A1-20100909-C00025.png) | 1990-03-26 | 1990-03-26 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP3090990U JPH03122370U (US20100223739A1-20100909-C00025.png) | 1990-03-26 | 1990-03-26 |
Publications (1)
Publication Number | Publication Date |
---|---|
JPH03122370U true JPH03122370U (US20100223739A1-20100909-C00025.png) | 1991-12-13 |
Family
ID=31533631
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP3090990U Pending JPH03122370U (US20100223739A1-20100909-C00025.png) | 1990-03-26 | 1990-03-26 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPH03122370U (US20100223739A1-20100909-C00025.png) |
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US7573279B2 (en) | 2006-08-15 | 2009-08-11 | Yokowo Co., Ltd. | Jig for Kelvin test |
JP2013253785A (ja) * | 2012-06-05 | 2013-12-19 | Mitsubishi Electric Corp | プローブカード |
JP2014071091A (ja) * | 2012-10-02 | 2014-04-21 | Hioki Ee Corp | プローブユニットおよび検査装置 |
Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5540338B2 (US20100223739A1-20100909-C00025.png) * | 1974-01-23 | 1980-10-17 | ||
JPS6183966A (ja) * | 1984-10-01 | 1986-04-28 | Olympus Optical Co Ltd | 電子回路基板の検査装置 |
-
1990
- 1990-03-26 JP JP3090990U patent/JPH03122370U/ja active Pending
Patent Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5540338B2 (US20100223739A1-20100909-C00025.png) * | 1974-01-23 | 1980-10-17 | ||
JPS6183966A (ja) * | 1984-10-01 | 1986-04-28 | Olympus Optical Co Ltd | 電子回路基板の検査装置 |
Cited By (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US7573279B2 (en) | 2006-08-15 | 2009-08-11 | Yokowo Co., Ltd. | Jig for Kelvin test |
JP2013253785A (ja) * | 2012-06-05 | 2013-12-19 | Mitsubishi Electric Corp | プローブカード |
US9157931B2 (en) | 2012-06-05 | 2015-10-13 | Mitsubishi Electric Corporation | Probe card |
JP2014071091A (ja) * | 2012-10-02 | 2014-04-21 | Hioki Ee Corp | プローブユニットおよび検査装置 |