JPH03110847A - Semiconductor integrated circuit - Google Patents

Semiconductor integrated circuit

Info

Publication number
JPH03110847A
JPH03110847A JP24979789A JP24979789A JPH03110847A JP H03110847 A JPH03110847 A JP H03110847A JP 24979789 A JP24979789 A JP 24979789A JP 24979789 A JP24979789 A JP 24979789A JP H03110847 A JPH03110847 A JP H03110847A
Authority
JP
Japan
Prior art keywords
power
wiring
power supply
integrated circuit
semiconductor integrated
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP24979789A
Other languages
Japanese (ja)
Inventor
Hiroshige Matsumoto
博成 松本
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NEC Corp
Original Assignee
NEC Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by NEC Corp filed Critical NEC Corp
Priority to JP24979789A priority Critical patent/JPH03110847A/en
Publication of JPH03110847A publication Critical patent/JPH03110847A/en
Pending legal-status Critical Current

Links

Landscapes

  • Internal Circuitry In Semiconductor Integrated Circuit Devices (AREA)

Abstract

PURPOSE:To eliminate reduction in signal wiring region due to power wirings by a method wherein trenches with conductors buried in them are used as the power wirings. CONSTITUTION:A trench 21 with conductors buried in it is used as GND power wiring as shown by a section between A and A', a GND power supply is fed to a collector electrode of a transistor, a trench 22 with conductors buried in it is used as a VEE power wiring and a VEE power supply is fed to a terminal on one side of a resistor. In such a way, by using the trenches with the conductors buried in them as the power wirings, the need to have each power wiring in the same layers as those of signal wirings is eliminated and a reduction in signal wiring region is eliminated. Thereby, a reduction in the signal wiring region due to the power wrings is eliminated.

Description

【発明の詳細な説明】 〔産業上の利用分野〕 本発明は、情報処理装置等に用いられる半導体集積回路
に関する。
DETAILED DESCRIPTION OF THE INVENTION [Field of Industrial Application] The present invention relates to a semiconductor integrated circuit used in information processing devices and the like.

〔従来の技術〕[Conventional technology]

半導体集積回路は、半導体基板表面付近に形成した、ト
ランジスタ、抵抗等の素子間を、A4等の配線材料で接
続して、所望の回路を形成する。
In a semiconductor integrated circuit, a desired circuit is formed by connecting elements such as transistors and resistors formed near the surface of a semiconductor substrate using a wiring material such as A4.

従来の半導体集積回路では、第4図に示す様に、回路へ
電源を供給する電源配線と、回路の入出力配線すなわち
信号配線とが同一配線層で形成されていた。
In a conventional semiconductor integrated circuit, as shown in FIG. 4, a power supply wiring for supplying power to the circuit and an input/output wiring of the circuit, that is, a signal wiring, are formed in the same wiring layer.

第5図に、第3図のB−B’間の断面図を示す。FIG. 5 shows a sectional view taken along line B-B' in FIG. 3.

また第5図のトレンチ51.52の様に、トレンチは素
子分離用として用いられていた。
Further, trenches, such as trenches 51 and 52 in FIG. 5, were used for element isolation.

〔発明が解決しようとする課題〕[Problem to be solved by the invention]

上述した従来の半導体集積回路では、電源配線と信号配
線とが同じ配線層に形成されるので、信号配線領域が電
源配線の分だけ減少してしまうという欠点があった。
In the conventional semiconductor integrated circuit described above, since the power supply wiring and the signal wiring are formed in the same wiring layer, there is a drawback that the signal wiring area is reduced by the amount of the power supply wiring.

〔課題を解決するための手段〕[Means to solve the problem]

本発明の半導体集積回路は、導電体を埋め込んだトレン
チを電源配線として使用することにより、電源配線によ
る信号配線領域の減少をなくしている。トレンチに埋め
込む導電体としては、たとえばリン、ボロン等をドーピ
ングしたポリシリコン、 CV D (chemica
l vapor depos山on)アルミ等がある。
The semiconductor integrated circuit of the present invention eliminates the reduction in signal wiring area due to the power supply wiring by using a trench filled with a conductor as the power supply wiring. As the conductor to be buried in the trench, for example, polysilicon doped with phosphorus, boron, etc., CVD (chemical
l vapor depos (mountain on) aluminum, etc.

〔実施例〕〔Example〕

第1図は本発明の一実施例であり、第3図のエミッタホ
ロワ回路を半導体集積回路で実現している。第2図は、
第1図のA−A′間の断面を示す図である。第2図に示
す様に、導電体を埋め込んだトレンチ21をGND電源
配線として用いトランジスタのコレクタ電極にGND電
源を供給し、導電体を埋め込んだトレンチ22をVEE
電源配線として用い抵抗の一方の端子にVEE電源を供
給している。この様に、導電体を埋め込んだトレンチを
電源配線として用いることにより、信号配線と同じ層に
電源配線を持つ必要がなくなり信号配線領域の減少がな
くなる。なお、トレンチ23゜24は、トランジスタの
素子分離用に用いられているトレンチである。
FIG. 1 shows an embodiment of the present invention, in which the emitter follower circuit shown in FIG. 3 is realized by a semiconductor integrated circuit. Figure 2 shows
2 is a diagram showing a cross section taken along line A-A' in FIG. 1. FIG. As shown in FIG. 2, a trench 21 filled with a conductor is used as a GND power supply wiring to supply GND power to the collector electrode of the transistor, and a trench 22 filled with a conductor is used as a GND power wiring.
It is used as a power supply wiring to supply VEE power to one terminal of the resistor. In this way, by using a trench filled with a conductor as a power supply wiring, it is not necessary to have a power supply wiring in the same layer as the signal wiring, and there is no reduction in the signal wiring area. Note that the trenches 23 and 24 are trenches used for element isolation of transistors.

〔発明の効果〕〔Effect of the invention〕

以上説明した様に本発明は、導電体を埋め込んだトレン
チを電源配線として用いることにより、電源配線による
信号配線の減少がなくなるという効果がある。
As described above, the present invention has the advantage that by using a trench filled with a conductor as a power supply wiring, there is no reduction in signal wiring due to the power supply wiring.

4、4,

【図面の簡単な説明】[Brief explanation of drawings]

第1図は本発明の一実施例を表わす図、第2図は、第1
図の断面を示す図、第3図はエミッタホロワ回路を表わ
す図、第4図は従来技術を表わす図、第5図は第4図の
断面を示す図である。 21、  22.  23.  24.  51.  
52  ・・・・・・ ト レンチ。
FIG. 1 is a diagram showing one embodiment of the present invention, and FIG. 2 is a diagram showing one embodiment of the present invention.
3 is a diagram showing an emitter follower circuit, FIG. 4 is a diagram showing a conventional technique, and FIG. 5 is a diagram showing a cross section of FIG. 4. 21, 22. 23. 24. 51.
52... Trench.

Claims (1)

【特許請求の範囲】[Claims] 導電体を埋め込んだトレンチを電源配線として用いるこ
とを特徴とする半導体集積回路。
A semiconductor integrated circuit characterized by using a trench filled with a conductor as a power supply wiring.
JP24979789A 1989-09-25 1989-09-25 Semiconductor integrated circuit Pending JPH03110847A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP24979789A JPH03110847A (en) 1989-09-25 1989-09-25 Semiconductor integrated circuit

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP24979789A JPH03110847A (en) 1989-09-25 1989-09-25 Semiconductor integrated circuit

Publications (1)

Publication Number Publication Date
JPH03110847A true JPH03110847A (en) 1991-05-10

Family

ID=17198358

Family Applications (1)

Application Number Title Priority Date Filing Date
JP24979789A Pending JPH03110847A (en) 1989-09-25 1989-09-25 Semiconductor integrated circuit

Country Status (1)

Country Link
JP (1) JPH03110847A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100342797B1 (en) * 1996-08-20 2002-07-04 가나이 쓰도무 Semiconductor and method for manufacturing the same

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100342797B1 (en) * 1996-08-20 2002-07-04 가나이 쓰도무 Semiconductor and method for manufacturing the same

Similar Documents

Publication Publication Date Title
GB1214203A (en) Improvements in and relating to integrated semiconductor circuits
JP2998662B2 (en) Semiconductor device
JPH04251970A (en) Method for reducing noise of analog/digital hybrid semiconductor integrated circuit
JPH02210860A (en) Semiconductor integrated circuit device
JPH03110847A (en) Semiconductor integrated circuit
EP0104754B1 (en) Metal insulator semiconductor device with source region connected to a reference voltage
JPS577157A (en) Semiconductor device
WO1996030940A3 (en) METHOD OF MANUFACTURING A SEMICONDUCTOR DEVICE WITH BiCMOS CIRCUIT
EP0565332B1 (en) CCD delay line
JPH0666412B2 (en) Stacked semiconductor integrated circuit
JPS5857909B2 (en) Bipolar hand grip
JPH04343265A (en) Semiconductor device
US3482150A (en) Planar transistors and circuits including such transistors
JPH01109739A (en) Semiconductor integrated circuit
JPH03278533A (en) Semiconductor integrated circuit device
JPH0454386B2 (en)
JPS58143565A (en) Semiconductor circuit wiring body
JPH0194639A (en) Semiconductor device
JPH02202051A (en) Semiconductor device
JPH07106524A (en) Semiconductor integrated circuit device
KR970703619A (en) Electronic device comprising means for compensating an undesired capacitance
JPS5974663A (en) Semiconductor integrated circuit device
JPH0399463A (en) Semiconductor integrated circuit device
JPH0277152A (en) Semiconductor integrated circuit device
JPS62122147A (en) Semiconductor integrated circuit device