JPH03109096U - - Google Patents
Info
- Publication number
- JPH03109096U JPH03109096U JP1532890U JP1532890U JPH03109096U JP H03109096 U JPH03109096 U JP H03109096U JP 1532890 U JP1532890 U JP 1532890U JP 1532890 U JP1532890 U JP 1532890U JP H03109096 U JPH03109096 U JP H03109096U
- Authority
- JP
- Japan
- Prior art keywords
- time
- delay
- digital data
- fraction
- reference clock
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 238000005259 measurement Methods 0.000 claims description 7
- 230000003111 delayed effect Effects 0.000 claims 1
- 238000001514 detection method Methods 0.000 description 2
- 238000010586 diagram Methods 0.000 description 2
Landscapes
- Measurement Of Unknown Time Intervals (AREA)
Description
第1図は本考案の時間測定回路の一実施例の構
成を示すブロツク図、第2図〜第4図は本実施例
の動作を説明するためのタイミングチヤート(第
3図および第4図は要部の拡大チヤート)であり
、第2図は時間測定の全体動作を、第3図はスタ
ート端数時間TRの検出動作を、第4図はストツ
プ端数TPの検出動作をそれぞれ示し、第5図は
端数測定により分解能を高めた時間測定回路の従
来例の構成を示すブロツク図、第6図は従来例の
動作を説明するためのタイミングチヤートである
。
1……カウンタ、2……スタート端数ラツチ、
3……ストツプ端数ラツチ、4……RSフリツプ
フロツプ、5……アンドゲート、6……遅延素子
、7……遅延回路、8……時間算出回路(CPU
)、T1〜Tn……遅延信号(遅延信号用タツプ
)、CL……基準クロツク、SR……スタート信
号、SP……ストツプ信号、TR……スタート端
数時間、TP……ストツプ端数時間、TC……計
数時間、TS……測定値。
FIG. 1 is a block diagram showing the configuration of one embodiment of the time measurement circuit of the present invention, and FIGS. 2 to 4 are timing charts for explaining the operation of this embodiment (FIGS. 3 and 4 are Fig. 2 shows the overall operation of time measurement, Fig. 3 shows the detection operation of the start fraction time TR, Fig. 4 shows the detection operation of the stop fraction TP, and Fig. 5 shows the operation of detecting the stop fraction TP. 6 is a block diagram showing the configuration of a conventional example of a time measuring circuit with improved resolution through fractional measurement, and FIG. 6 is a timing chart for explaining the operation of the conventional example. 1...Counter, 2...Start fraction latch,
3... Stop fractional latch, 4... RS flip-flop, 5... AND gate, 6... Delay element, 7... Delay circuit, 8... Time calculation circuit (CPU
), T1 to Tn...delay signal (tap for delay signal), CL...reference clock, SR...start signal, SP...stop signal, TR...start fractional time, TP...stop fractional time, TC... ...Counting time, TS...Measurement value.
Claims (1)
ツクの周波数により決定される分解能以上の高精
度の測定を行う、クロツク計数タイプの時間測定
回路であつて、 時間措定の開始タイミングを決定するスタート
信号SRが入力されると、前記基準クロツクCL
の数のカウントを開始し、時間測定の終了タイミ
ングを決定するストツプ信号SPが入力されると
、前記カウントを停止し、そのカウント値をカウ
ント計数時間として出力するカウンタ1と、 所定の遅延時間tを有する遅延素子6がn(n
は2以上の自然数)個直列に接続されてなる遅延
線を具備し、該遅延線の一方の開放端から前記基
準クロツクCLを入力し、各遅延素子6を通過し
て得られる遅延量が異なるn個の遅延信号T1〜
Tnを出力する遅延回路7と、 前記スタート信号SRの入力タイミングで前記
押n個の遅延信号T1〜Tnを、その電圧レベル
に応じたデジタルデータとして並列にラツチし、
ラツチしたデジタルデータをスタート端数時間と
して出力するスタート端数ラツチ2と、 前記ストツプ信号SPの入力タイミングで前記
n個の遅延信号T1〜Tnの電圧レベルを、その
電圧レベルに応じたデジタルデータとして並列に
ラツチし、ラツチしたデジタルデータをストツプ
端数時間として出力するストツプ端数ラツチ3と
を有することを特徴とする時間測定回路。[Claims for Utility Model Registration] A clock counting type time measuring circuit that uses a reference clock with a predetermined frequency and performs measurement with a higher precision than the resolution determined by the frequency of the reference clock, which starts time determination. When the start signal SR that determines the timing is input, the reference clock CL
a counter 1 that starts counting the number of t and determines the end timing of time measurement when a stop signal SP is input, stops the counting and outputs the count value as a count counting time; and a predetermined delay time t. The delay element 6 having n(n
is a natural number of 2 or more) connected in series, the reference clock CL is inputted from one open end of the delay line, and the amount of delay obtained by passing through each delay element 6 is different. n delayed signals T1~
a delay circuit 7 that outputs Tn, and latches the n delay signals T1 to Tn in parallel as digital data according to their voltage levels at the input timing of the start signal SR;
A start fraction latch 2 outputs the latched digital data as a start fraction time, and a voltage level of the n delay signals T1 to Tn is connected in parallel as digital data corresponding to the voltage level at the input timing of the stop signal SP. A time measurement circuit comprising a stop fraction latch 3 for latching and outputting the latched digital data as a stop fraction time.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP1532890U JPH03109096U (en) | 1990-02-19 | 1990-02-19 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP1532890U JPH03109096U (en) | 1990-02-19 | 1990-02-19 |
Publications (1)
Publication Number | Publication Date |
---|---|
JPH03109096U true JPH03109096U (en) | 1991-11-08 |
Family
ID=31518639
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP1532890U Pending JPH03109096U (en) | 1990-02-19 | 1990-02-19 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPH03109096U (en) |
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO2006041162A1 (en) * | 2004-10-15 | 2006-04-20 | High Energy Accelerator Research Organization | Microtime difference circuit and time measuring circuit using two plls |
JP2016038212A (en) * | 2014-08-05 | 2016-03-22 | 株式会社デンソー | Time measurement circuit |
KR20190003247U (en) * | 2018-06-20 | 2019-12-30 | 주식회사 휴브아이웨어 | An assembling structure of an eyeglass frame and a hinge with improved fixing force |
Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS6279387A (en) * | 1985-10-02 | 1987-04-11 | Iwatsu Electric Co Ltd | Time interval measuring apparatus |
JPH01267491A (en) * | 1988-04-19 | 1989-10-25 | Nec Corp | Time difference measuring circuit |
-
1990
- 1990-02-19 JP JP1532890U patent/JPH03109096U/ja active Pending
Patent Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS6279387A (en) * | 1985-10-02 | 1987-04-11 | Iwatsu Electric Co Ltd | Time interval measuring apparatus |
JPH01267491A (en) * | 1988-04-19 | 1989-10-25 | Nec Corp | Time difference measuring circuit |
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO2006041162A1 (en) * | 2004-10-15 | 2006-04-20 | High Energy Accelerator Research Organization | Microtime difference circuit and time measuring circuit using two plls |
JP2016038212A (en) * | 2014-08-05 | 2016-03-22 | 株式会社デンソー | Time measurement circuit |
KR20190003247U (en) * | 2018-06-20 | 2019-12-30 | 주식회사 휴브아이웨어 | An assembling structure of an eyeglass frame and a hinge with improved fixing force |
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