JPH03104878U - - Google Patents
Info
- Publication number
- JPH03104878U JPH03104878U JP1211990U JP1211990U JPH03104878U JP H03104878 U JPH03104878 U JP H03104878U JP 1211990 U JP1211990 U JP 1211990U JP 1211990 U JP1211990 U JP 1211990U JP H03104878 U JPH03104878 U JP H03104878U
- Authority
- JP
- Japan
- Prior art keywords
- power supply
- group
- board group
- upside down
- board
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Landscapes
- Testing Of Individual Semiconductor Devices (AREA)
- Testing Electric Properties And Detecting Electric Faults (AREA)
- Tests Of Electronic Circuits (AREA)
- Cooling Or The Like Of Electrical Apparatus (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1211990U JPH082628Y2 (ja) | 1990-02-09 | 1990-02-09 | Ic試験装置 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1211990U JPH082628Y2 (ja) | 1990-02-09 | 1990-02-09 | Ic試験装置 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPH03104878U true JPH03104878U (enExample) | 1991-10-30 |
| JPH082628Y2 JPH082628Y2 (ja) | 1996-01-29 |
Family
ID=31515609
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP1211990U Expired - Fee Related JPH082628Y2 (ja) | 1990-02-09 | 1990-02-09 | Ic試験装置 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH082628Y2 (enExample) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2014048202A (ja) * | 2012-08-31 | 2014-03-17 | Advantest Corp | 電子部品試験装置 |
-
1990
- 1990-02-09 JP JP1211990U patent/JPH082628Y2/ja not_active Expired - Fee Related
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2014048202A (ja) * | 2012-08-31 | 2014-03-17 | Advantest Corp | 電子部品試験装置 |
Also Published As
| Publication number | Publication date |
|---|---|
| JPH082628Y2 (ja) | 1996-01-29 |
Similar Documents
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| LAPS | Cancellation because of no payment of annual fees |