JPH03102734U - - Google Patents
Info
- Publication number
- JPH03102734U JPH03102734U JP1125290U JP1125290U JPH03102734U JP H03102734 U JPH03102734 U JP H03102734U JP 1125290 U JP1125290 U JP 1125290U JP 1125290 U JP1125290 U JP 1125290U JP H03102734 U JPH03102734 U JP H03102734U
- Authority
- JP
- Japan
- Prior art keywords
- flat
- measuring instrument
- signals
- signal
- instrument probe
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 239000000523 sample Substances 0.000 claims description 6
- 238000005259 measurement Methods 0.000 claims description 2
- 238000010586 diagram Methods 0.000 description 2
- WABPQHHGFIMREM-UHFFFAOYSA-N lead(0) Chemical compound [Pb] WABPQHHGFIMREM-UHFFFAOYSA-N 0.000 description 1
Landscapes
- Measuring Leads Or Probes (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
Description
第１図は、この考案の一実施例によるフラツト
ＩＣ用計測器プローブの接続構成図であり、第２
図は、従来のフラツトＩＣ用計測器プローブの接
続構成図である。
図において、１……プリント基板、２……フラ
ツトＩＣ、３……計測器用プローブ、４……アー
ス用端子、５……信号測定用端子、６……リード
線、７……計測器、８……プローブケーブル部、
９……計測器接続用端子、１０……アースポイン
ト、１１……接触子、１２……ピン番選択ボツク
スである。なお、図中、同一符号は同一、又は相
当部分を示す。
FIG. 1 is a connection configuration diagram of a flat IC measuring instrument probe according to an embodiment of this invention, and the second
The figure is a connection configuration diagram of a conventional measuring instrument probe for flat IC. In the figure, 1...Printed circuit board, 2...Flat IC, 3...Measuring instrument probe, 4...Grounding terminal, 5...Signal measurement terminal, 6...Lead wire, 7...Measuring instrument, 8 ...probe cable section,
9...Measuring instrument connection terminal, 10...Earth point, 11...Contactor, 12...Pin number selection box. In addition, in the figures, the same reference numerals indicate the same or equivalent parts.
Claims (1)
定において、計測器用プローブをフラツトＩＣ１
個分固定可能とし各信号を時分割で測定器へ送信
しフラツトＩＣ１個分の各信号を一度に測定でき
、また任意の信号のみを測定することも可能であ
るこを特徴とするフラツトＩＣ用計測器プローブ
。 When measuring signals on a printed circuit board with a flat IC mounted, the measuring instrument probe is connected to the flat IC1.
Measurement for flat ICs, which is characterized in that it is possible to fix individual signals and to transmit each signal to a measuring instrument in a time-division manner so that each signal for one flat IC can be measured at once, and it is also possible to measure only arbitrary signals. instrument probe.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1125290U JPH03102734U (en) | 1990-02-07 | 1990-02-07 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1125290U JPH03102734U (en) | 1990-02-07 | 1990-02-07 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPH03102734U true JPH03102734U (en) | 1991-10-25 |
Family
ID=31514786
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP1125290U Pending JPH03102734U (en) | 1990-02-07 | 1990-02-07 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH03102734U (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2010101163A (en) * | 2009-12-04 | 2010-05-06 | Yuji Sakurai | Working platform disassembling method |
-
1990
- 1990-02-07 JP JP1125290U patent/JPH03102734U/ja active Pending
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2010101163A (en) * | 2009-12-04 | 2010-05-06 | Yuji Sakurai | Working platform disassembling method |
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