JPH03101431U - - Google Patents

Info

Publication number
JPH03101431U
JPH03101431U JP904890U JP904890U JPH03101431U JP H03101431 U JPH03101431 U JP H03101431U JP 904890 U JP904890 U JP 904890U JP 904890 U JP904890 U JP 904890U JP H03101431 U JPH03101431 U JP H03101431U
Authority
JP
Japan
Prior art keywords
light beams
light
irradiates
reflects
optical system
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP904890U
Other languages
English (en)
Japanese (ja)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP904890U priority Critical patent/JPH03101431U/ja
Publication of JPH03101431U publication Critical patent/JPH03101431U/ja
Pending legal-status Critical Current

Links

Landscapes

  • Spectrometry And Color Measurement (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
JP904890U 1990-01-31 1990-01-31 Pending JPH03101431U (no)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP904890U JPH03101431U (no) 1990-01-31 1990-01-31

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP904890U JPH03101431U (no) 1990-01-31 1990-01-31

Publications (1)

Publication Number Publication Date
JPH03101431U true JPH03101431U (no) 1991-10-23

Family

ID=31512652

Family Applications (1)

Application Number Title Priority Date Filing Date
JP904890U Pending JPH03101431U (no) 1990-01-31 1990-01-31

Country Status (1)

Country Link
JP (1) JPH03101431U (no)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2002323726A (ja) * 2001-04-25 2002-11-08 Mac Science Co Ltd 放射線画像読取装置
JP2015007659A (ja) * 2014-10-16 2015-01-15 セイコーエプソン株式会社 分光測定装置及び波長可変干渉フィルター

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5315870A (en) * 1976-07-28 1978-02-14 Toshiba Betsukuman Kk Two wave length spectrophotometer
JPS636427A (ja) * 1986-06-27 1988-01-12 Hitachi Ltd 紫外可視分光光度計

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5315870A (en) * 1976-07-28 1978-02-14 Toshiba Betsukuman Kk Two wave length spectrophotometer
JPS636427A (ja) * 1986-06-27 1988-01-12 Hitachi Ltd 紫外可視分光光度計

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2002323726A (ja) * 2001-04-25 2002-11-08 Mac Science Co Ltd 放射線画像読取装置
JP2015007659A (ja) * 2014-10-16 2015-01-15 セイコーエプソン株式会社 分光測定装置及び波長可変干渉フィルター

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