JPH0294687A - Mask semiconductor laser - Google Patents

Mask semiconductor laser

Info

Publication number
JPH0294687A
JPH0294687A JP24781088A JP24781088A JPH0294687A JP H0294687 A JPH0294687 A JP H0294687A JP 24781088 A JP24781088 A JP 24781088A JP 24781088 A JP24781088 A JP 24781088A JP H0294687 A JPH0294687 A JP H0294687A
Authority
JP
Japan
Prior art keywords
semiconductor laser
mask
mask layer
transparent
light
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP24781088A
Other languages
Japanese (ja)
Inventor
Hiroshi Kobayashi
寛 小林
Haruhiko Machida
町田 晴彦
Yasushi Ide
井出 ▲やすし▼
Masato Harigai
真人 針谷
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Ricoh Co Ltd
Original Assignee
Ricoh Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Ricoh Co Ltd filed Critical Ricoh Co Ltd
Priority to JP24781088A priority Critical patent/JPH0294687A/en
Publication of JPH0294687A publication Critical patent/JPH0294687A/en
Pending legal-status Critical Current

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  • Semiconductor Lasers (AREA)

Abstract

PURPOSE:To eliminate a trouble of residue at a conventional formation of a projection hole through evaporation and to improve durability of the projection area by making a light-screening mask layer transparent to form a pin-hole projection area. CONSTITUTION:A transparent insulating layer 2A is formed at a light projection edge side of a semiconductor laser, and a light screening mask layer 3 is further formed on the layer 2A. In a mask semiconductor laser wherein a pin-hole projection area 4 is formed by making a semiconductor laser light emitting section at a mask layer 3 transparent through light emission of the semiconductor laser itself, Cr is used as a material of the mask. That is, the mask layer 3 using Cr is made transparent in a shape of pin-hole through a laser hole from a semiconductor laser. According to this constitution, a problem of residue can be eliminated different from the case of projection hole formation by evaporation of a mask layer and the projection area 4 can be formed even under a normal pressure.

Description

【発明の詳細な説明】 [産業上の利用分野] 本発明はマスク半導体レーザーに関する。[Detailed description of the invention] [Industrial application field] The present invention relates to a mask semiconductor laser.

[従来の技術] 発明者等は従来からマスク半導体レーザーを種々提案し
てきた。
[Prior Art] The inventors have proposed various mask semiconductor lasers.

マスク半導体レーザニは、半導体レーザーの光射出端面
に遮光性のマスク層を設け、このマスク層の一部にピン
ホール状の光通過部を設け、このピンホール状の射出孔
から半導体レーザーによるレーザー光を取り出し得るよ
うにしたものであり、実質的な点光源用光源等として利
用することができる。
A mask semiconductor laser is a masked semiconductor laser in which a light-shielding mask layer is provided on the light emitting end face of the semiconductor laser, a pinhole-shaped light passage part is provided in a part of this mask layer, and the laser beam from the semiconductor laser is emitted from the pinhole-shaped emission hole. can be taken out, and can be used as a substantial point light source.

[発明が解決しようとする課題] 従来、提案されたマスク半導体レーザーは、半導体レー
ザーの光射出端面に遮光性のマスク層を蒸着等により層
形成し、半導体レーザー自体の発光によりマスク層の一
部を蒸発させて除去し、ピンホール状の射出孔を形成す
ることにより作製されるものであるが、上述のごとく射
出孔はマスク層の一部を蒸発させて除去して形成するの
で、射出孔の縁部に残渣が残って、射出孔の形状がきれ
いな円形状にならなかったりする問題があり、また、耐
久性の面でも問題があった。
[Problems to be Solved by the Invention] Conventionally proposed masked semiconductor lasers include forming a light-shielding mask layer on the light-emitting end face of the semiconductor laser by vapor deposition, etc. The injection hole is formed by evaporating and removing a part of the mask layer to form a pinhole-shaped injection hole.As mentioned above, the injection hole is formed by evaporating and removing a part of the mask layer. There was a problem in that residue remained on the edges of the injection hole, and the shape of the injection hole could not be perfectly circular, and there was also a problem in terms of durability.

本発明は上述した事情に鑑みてなされたものであって、
その目的とするところは上記残渣による問題がなく、し
かも耐久性に優れた新規なマスク半導体レーザーの提供
にある。
The present invention has been made in view of the above-mentioned circumstances, and
The purpose is to provide a novel mask semiconductor laser that is free from the problems caused by the above-mentioned residues and has excellent durability.

[課運を解決するための手段] 以下、本発明を説明する。[Means to solve the problem] The present invention will be explained below.

本発明のマスク半導体レーザーは、半導体レーザーの光
射出端面に透明絶縁層を形成し、この透明絶縁層上にさ
らに遮光性のマスク層を形成し、上記半導体レーザー自
体の発光により上記マスク層における半導体レーザー発
光部の部分を透明化してピンホール状の射出部を形成し
てなるマスク半導体レーザーであって、上記マスクの材
料としてCrを用いたことを特徴とする。
In the mask semiconductor laser of the present invention, a transparent insulating layer is formed on the light emitting end face of the semiconductor laser, a light-blocking mask layer is further formed on the transparent insulating layer, and the semiconductor laser in the mask layer is caused to emit light from the semiconductor laser itself. This is a mask semiconductor laser in which a laser emitting part is made transparent to form a pinhole-shaped emission part, and is characterized in that Cr is used as the material of the mask.

Crを用いたマスク層の透明化は常圧下でも可能である
が、10− ”Torr以下の減圧下では、より小さい
注入電流でピンホール状射出部を形成できる。
Although it is possible to make the mask layer transparent using Cr under normal pressure, pinhole-shaped injection parts can be formed with a smaller injection current under reduced pressure of 10-'' Torr or less.

半導体レーザーとしては特に制限がなく、種々のものが
利用可能であるが、市販されているものの内では、波長
780na+、830nmで代表されるAlGaAsの
3元系半導体レーザーが好適である。
The semiconductor laser is not particularly limited and various types can be used, but among commercially available ones, AlGaAs ternary semiconductor lasers with wavelengths of 780 na+ and 830 nm are suitable.

半導体レーザーの光射出端面上に直接に形成される透明
絶縁層としては、SiO,5iO1ysiN等の薄膜が
用いられる。ここに、絶縁層が透明であるとは、透明絶
縁層の形成された半導体レーザーから放射されるレーザ
ー光に対して絶縁層が透明であることを意味することは
言うまでもない。
A thin film of SiO, 5iO1ysiN, etc. is used as the transparent insulating layer formed directly on the light emitting end face of the semiconductor laser. Here, it goes without saying that the insulating layer is transparent means that the insulating layer is transparent to laser light emitted from the semiconductor laser on which the transparent insulating layer is formed.

[作  用] 本発明のマスク半導体レーザーは、上述の如く、Crを
用いたマスク層を半導体レーザーからのレーザー光でピ
ンホール状に透明化して作製する。
[Function] As described above, the mask semiconductor laser of the present invention is produced by making a mask layer using Cr transparent in the form of pinholes with laser light from a semiconductor laser.

従って、射出孔をマスク層の蒸発によって形成する場合
とことなり、残渣発生の問題がなく、また常圧下でも射
出部の形成が可能になる。
Therefore, unlike the case where the injection holes are formed by evaporation of the mask layer, there is no problem of residue generation, and the injection portion can be formed even under normal pressure.

[実施例] 以下、具体的な実施例に即して説明する。[Example] Hereinafter, description will be given based on specific examples.

図面を参照すると、図中の符号lはマスク半導体レーザ
ーを示し、このマスク半導体レーザー1は、半導体レー
ザー2と透明絶縁層2Aと、マスク層3とこのマスク層
3に形成されたピンホール状の射出部4とにより構成さ
れている。
Referring to the drawings, reference numeral l in the drawings indicates a mask semiconductor laser, and this mask semiconductor laser 1 consists of a semiconductor laser 2, a transparent insulating layer 2A, a mask layer 3, and a pinhole-like structure formed in the mask layer 3. and an injection section 4.

実施例1 半導体レーザー2として、GaAlAsダブルへテロ型
、最大定格出力5mw 、発振波長780nm 、最大
動作電流100mAのものを用い、その光射出端面に透
明絶縁/12AとしてSiNの薄膜を上記発振波長の1
72の厚さにコーティングした。
Example 1 A GaAlAs double hetero type semiconductor laser 2 with a maximum rated output of 5 mW, an oscillation wavelength of 780 nm, and a maximum operating current of 100 mA was used as the semiconductor laser 2. A thin film of SiN was used as a transparent insulator/12A on the light emitting end face of the semiconductor laser 2. 1
Coated to a thickness of 72 mm.

この透明絶縁層2Aの上に、真空蒸着法によりCrの薄
膜を1026人に形成してマスクM3とした。
On this transparent insulating layer 2A, 1026 thin films of Cr were formed by vacuum evaporation to form a mask M3.

蒸着条件は以下の通りである。The vapor deposition conditions are as follows.

蒸着材料:Cr 、蒸着温度:1800°C9蒸着源ボ
ート:タングステン、真空度: I X 1O−5To
rr次いで、半導体レーザーを発光させた。このレーザ
ー光は透明絶縁層2Aを透過してマスク層3を内側から
照射し、マスク層3をピンホール状に透明化する。
Vapor deposition material: Cr, Vapor deposition temperature: 1800°C9 Vapor deposition source boat: Tungsten, Vacuum degree: IX 1O-5To
rr Then, the semiconductor laser was made to emit light. This laser light passes through the transparent insulating layer 2A and irradiates the mask layer 3 from the inside, making the mask layer 3 transparent in the form of pinholes.

半導体レーザーの射出端面にパワーメーターを設置して
半導体レーザーの出力をモニターすると、ピンホール状
の射出部が形成されると上記出力が徐々に増大するので
、このことを利用して射出部の形成を判断する。
If a power meter is installed on the emission end face of the semiconductor laser to monitor the output of the semiconductor laser, the output will gradually increase as the pinhole-shaped emission part is formed.Use this fact to determine the formation of the emission part. to judge.

その結果、しきい値電流51.:44mAでピンホール
系約2μmのピンホール状射出部が形成されたマスク半
導体レーザーが得られた。
As a result, the threshold current 51. : At 44 mA, a mask semiconductor laser was obtained in which a pinhole-like emission part of about 2 μm was formed.

上記射出部を光学顕微鏡で観察したところ2μmの黒縁
で、中心部が淡いブルーを呈する透明部分が、半導体レ
ーザーの発光部の直上部に形成されているのが確認され
た。
When the above-mentioned emission part was observed with an optical microscope, it was confirmed that a transparent part with a black edge of 2 μm and a pale blue center was formed directly above the light-emitting part of the semiconductor laser.

また、定格動作電流の最大値まで注入電流を増加させて
もピンホール状の射出部の径、形状とも変化は見られな
かった。
Further, even when the injection current was increased to the maximum value of the rated operating current, no change was observed in the diameter or shape of the pinhole-shaped injection part.

実施例2 実施例1と同じ型の半導体レーザーの光射出端面に透明
絶縁層2AとしてSjNの薄膜を上記発振波長の172
の厚さにコーティングし、その上に実施例1におけると
同じ条件でCrの薄膜を960人に形成してマスク層3
とした。
Example 2 A thin film of SjN was coated as a transparent insulating layer 2A on the light emitting end face of a semiconductor laser of the same type as in Example 1.
A thin film of Cr was formed on the mask layer 3 under the same conditions as in Example 1 to form a mask layer 3.
And so.

実施例1と同様にしてピンホール状の射出部を形成して
マスク半導体レーザーを得、光学顕微鏡で観察したとこ
ろ約1.2μm径の透明な射出部の形成を確認できた。
A mask semiconductor laser was obtained by forming a pinhole-shaped emission part in the same manner as in Example 1, and when observed with an optical microscope, it was confirmed that a transparent emission part with a diameter of about 1.2 μm was formed.

実施例3 実施例1と同じ型の半導体レーザーの光射出端面に透明
絶縁層2AとしてSiNの薄膜を上記発振波長の1/2
の厚さにコーティングし、その上に実施例1におけると
同じ条件でCrの薄膜を1570人に形成してマスク層
3とした。
Example 3 A thin film of SiN was coated as a transparent insulating layer 2A on the light emitting end face of a semiconductor laser of the same type as in Example 1, with the oscillation wavelength being 1/2 of the above-mentioned oscillation wavelength.
A thin film of 1,570 Cr was formed thereon under the same conditions as in Example 1 to form a mask layer 3.

実施例1と同様にしてピンホール状の射出部を形成して
マスク半導体レーザーを得た。
A pinhole-shaped injection portion was formed in the same manner as in Example 1 to obtain a mask semiconductor laser.

光学顕微鏡で1察したところ約1.2μm径の透明な射
出部の形成を確認できた。
Upon inspection with an optical microscope, it was confirmed that a transparent injection part with a diameter of about 1.2 μm was formed.

実施例4 実施例1と同じ型の半導体レーザーの光射出端面に透明
絶縁層2AとしてSiNの薄膜を上記発振波長の1/2
の厚さにコーティングし、その上に実施例1におけると
同じ条件でCrの薄膜を1880人に形成してマスク層
3とした。
Example 4 A thin film of SiN was coated as a transparent insulating layer 2A on the light emitting end face of a semiconductor laser of the same type as in Example 1, with the oscillation wavelength being 1/2 of the above oscillation wavelength.
A thin film of 1880 Cr was formed thereon under the same conditions as in Example 1 to form a mask layer 3.

実施例1と同様にしてピンホール状の射出部を形成して
マスク半導体レーザーを得た。
A pinhole-shaped injection portion was formed in the same manner as in Example 1 to obtain a mask semiconductor laser.

光学顕微鏡でwt察したところ約1μm径の透明な射出
部の形成を確認できた。
When observed with an optical microscope, it was confirmed that a transparent injection part with a diameter of about 1 μm was formed.

実施例1乃至4のマスク半導体レーザーとも定格動作電
流範囲内では、射出部径、射出部形状ともに変化がなか
った。
In all of the mask semiconductor lasers of Examples 1 to 4, there was no change in the diameter and shape of the injection part within the rated operating current range.

[発明の効果] 以上、本発明によれば新規なマスク半導体レーザーを提
供できる。
[Effects of the Invention] As described above, according to the present invention, a novel mask semiconductor laser can be provided.

このマスク半導体レーザーは、上述の如く、Crの遮光
性マスク層を透明化してピンホール状の射出部を形成す
るので、従来の蒸発による射出孔の形成の場合に問題と
なっていた残渣の問題がなく。
As mentioned above, in this mask semiconductor laser, a pinhole-shaped emission part is formed by making the Cr light-shielding mask layer transparent, so there is the problem of residue, which was a problem when forming an injection hole by conventional evaporation. There is no.

また射出部の耐久性も優れている。The injection part also has excellent durability.

【図面の簡単な説明】[Brief explanation of drawings]

図は、マスク半導体レーザーを説明するための図である
The figure is a diagram for explaining a mask semiconductor laser.

Claims (1)

【特許請求の範囲】 半導体レーザーの光射出端面上に透明絶縁層と遮光性の
マスク層とを、上記順序にて積層形成し、上記半導体レ
ーザー自体の発光により上記マスク層における半導体レ
ーザー発光部の部分を透明化してピンホール状の射出部
を形成してなるマスク半導体レーザーであって、 上記マスク層の材料としてCrを用いたことを特徴とす
るマスク半導体レーザー。
[Claims] A transparent insulating layer and a light-shielding mask layer are laminated in the above order on the light emitting end surface of a semiconductor laser, and the semiconductor laser light emitting portion in the mask layer is emitted by the semiconductor laser itself. What is claimed is: 1. A mask semiconductor laser comprising a pinhole-shaped emission portion formed by making the portion transparent, the mask semiconductor laser characterized in that Cr is used as a material for the mask layer.
JP24781088A 1988-09-30 1988-09-30 Mask semiconductor laser Pending JPH0294687A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP24781088A JPH0294687A (en) 1988-09-30 1988-09-30 Mask semiconductor laser

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP24781088A JPH0294687A (en) 1988-09-30 1988-09-30 Mask semiconductor laser

Publications (1)

Publication Number Publication Date
JPH0294687A true JPH0294687A (en) 1990-04-05

Family

ID=17169001

Family Applications (1)

Application Number Title Priority Date Filing Date
JP24781088A Pending JPH0294687A (en) 1988-09-30 1988-09-30 Mask semiconductor laser

Country Status (1)

Country Link
JP (1) JPH0294687A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5673087A (en) * 1994-11-25 1997-09-30 Samsung Electronics Co., Ltd. Screen overlay device for outputting cursor coordinates based on movement of a pointing device and an on-screen display relating to a menu and a method therefor

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5673087A (en) * 1994-11-25 1997-09-30 Samsung Electronics Co., Ltd. Screen overlay device for outputting cursor coordinates based on movement of a pointing device and an on-screen display relating to a menu and a method therefor

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