JPH0288159U - - Google Patents

Info

Publication number
JPH0288159U
JPH0288159U JP16669388U JP16669388U JPH0288159U JP H0288159 U JPH0288159 U JP H0288159U JP 16669388 U JP16669388 U JP 16669388U JP 16669388 U JP16669388 U JP 16669388U JP H0288159 U JPH0288159 U JP H0288159U
Authority
JP
Japan
Prior art keywords
dry gas
gas supply
detection window
electronic
detection
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP16669388U
Other languages
English (en)
Japanese (ja)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP16669388U priority Critical patent/JPH0288159U/ja
Publication of JPH0288159U publication Critical patent/JPH0288159U/ja
Pending legal-status Critical Current

Links

Landscapes

  • Analysing Materials By The Use Of Radiation (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
JP16669388U 1988-12-23 1988-12-23 Pending JPH0288159U (enrdf_load_stackoverflow)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP16669388U JPH0288159U (enrdf_load_stackoverflow) 1988-12-23 1988-12-23

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP16669388U JPH0288159U (enrdf_load_stackoverflow) 1988-12-23 1988-12-23

Publications (1)

Publication Number Publication Date
JPH0288159U true JPH0288159U (enrdf_load_stackoverflow) 1990-07-12

Family

ID=31454309

Family Applications (1)

Application Number Title Priority Date Filing Date
JP16669388U Pending JPH0288159U (enrdf_load_stackoverflow) 1988-12-23 1988-12-23

Country Status (1)

Country Link
JP (1) JPH0288159U (enrdf_load_stackoverflow)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2009501320A (ja) * 2005-07-15 2009-01-15 ヤーウントエム アナリティッシェ メス− ウント レーゲルテクニーク ゲーエムベーハー 電磁スペクトル分析又は光学分析、特に測光分析、分光光度分析、又は画像分析用の装置

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2009501320A (ja) * 2005-07-15 2009-01-15 ヤーウントエム アナリティッシェ メス− ウント レーゲルテクニーク ゲーエムベーハー 電磁スペクトル分析又は光学分析、特に測光分析、分光光度分析、又は画像分析用の装置

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