JPH0285350U - - Google Patents

Info

Publication number
JPH0285350U
JPH0285350U JP16400988U JP16400988U JPH0285350U JP H0285350 U JPH0285350 U JP H0285350U JP 16400988 U JP16400988 U JP 16400988U JP 16400988 U JP16400988 U JP 16400988U JP H0285350 U JPH0285350 U JP H0285350U
Authority
JP
Japan
Prior art keywords
filter paper
drip
type filter
fluorescence
predetermined area
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP16400988U
Other languages
English (en)
Japanese (ja)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP16400988U priority Critical patent/JPH0285350U/ja
Publication of JPH0285350U publication Critical patent/JPH0285350U/ja
Pending legal-status Critical Current

Links

Landscapes

  • Sampling And Sample Adjustment (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
JP16400988U 1988-12-20 1988-12-20 Pending JPH0285350U (fr)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP16400988U JPH0285350U (fr) 1988-12-20 1988-12-20

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP16400988U JPH0285350U (fr) 1988-12-20 1988-12-20

Publications (1)

Publication Number Publication Date
JPH0285350U true JPH0285350U (fr) 1990-07-04

Family

ID=31449242

Family Applications (1)

Application Number Title Priority Date Filing Date
JP16400988U Pending JPH0285350U (fr) 1988-12-20 1988-12-20

Country Status (1)

Country Link
JP (1) JPH0285350U (fr)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2008122144A (ja) * 2006-11-09 2008-05-29 Rigaku Industrial Co 全反射蛍光ｘ線分析用試料点滴基板および全反射蛍光ｘ線分析装置ならびに全反射蛍光ｘ線分析方法

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5737446B2 (fr) * 1978-02-20 1982-08-10
JPS62276447A (ja) * 1986-05-26 1987-12-01 Matsushita Electric Works Ltd 螢光ｘ線定量分析用濾紙

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5737446B2 (fr) * 1978-02-20 1982-08-10
JPS62276447A (ja) * 1986-05-26 1987-12-01 Matsushita Electric Works Ltd 螢光ｘ線定量分析用濾紙

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2008122144A (ja) * 2006-11-09 2008-05-29 Rigaku Industrial Co 全反射蛍光ｘ線分析用試料点滴基板および全反射蛍光ｘ線分析装置ならびに全反射蛍光ｘ線分析方法
JP4537367B2 (ja) * 2006-11-09 2010-09-01 株式会社リガク 全反射蛍光ｘ線分析用試料点滴基板および全反射蛍光ｘ線分析装置ならびに全反射蛍光ｘ線分析方法

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