JPH028037U - - Google Patents

Info

Publication number
JPH028037U
JPH028037U JP8359788U JP8359788U JPH028037U JP H028037 U JPH028037 U JP H028037U JP 8359788 U JP8359788 U JP 8359788U JP 8359788 U JP8359788 U JP 8359788U JP H028037 U JPH028037 U JP H028037U
Authority
JP
Japan
Prior art keywords
semiconductor wafer
needles
probe card
testing
sensor
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP8359788U
Other languages
English (en)
Japanese (ja)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP8359788U priority Critical patent/JPH028037U/ja
Publication of JPH028037U publication Critical patent/JPH028037U/ja
Pending legal-status Critical Current

Links

Landscapes

  • Testing Of Individual Semiconductor Devices (AREA)
  • Measuring Leads Or Probes (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
JP8359788U 1988-06-24 1988-06-24 Pending JPH028037U (US06582424-20030624-M00016.png)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP8359788U JPH028037U (US06582424-20030624-M00016.png) 1988-06-24 1988-06-24

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP8359788U JPH028037U (US06582424-20030624-M00016.png) 1988-06-24 1988-06-24

Publications (1)

Publication Number Publication Date
JPH028037U true JPH028037U (US06582424-20030624-M00016.png) 1990-01-18

Family

ID=31308310

Family Applications (1)

Application Number Title Priority Date Filing Date
JP8359788U Pending JPH028037U (US06582424-20030624-M00016.png) 1988-06-24 1988-06-24

Country Status (1)

Country Link
JP (1) JPH028037U (US06582424-20030624-M00016.png)

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