JPH0279033U - - Google Patents

Info

Publication number
JPH0279033U
JPH0279033U JP15776288U JP15776288U JPH0279033U JP H0279033 U JPH0279033 U JP H0279033U JP 15776288 U JP15776288 U JP 15776288U JP 15776288 U JP15776288 U JP 15776288U JP H0279033 U JPH0279033 U JP H0279033U
Authority
JP
Japan
Prior art keywords
sample
damage
frequency
amount
difference
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP15776288U
Other languages
English (en)
Japanese (ja)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP15776288U priority Critical patent/JPH0279033U/ja
Publication of JPH0279033U publication Critical patent/JPH0279033U/ja
Pending legal-status Critical Current

Links

Landscapes

  • Length Measuring Devices By Optical Means (AREA)
  • Investigating Or Analyzing Materials Using Thermal Means (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
JP15776288U 1988-12-03 1988-12-03 Pending JPH0279033U (US07179912-20070220-C00144.png)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP15776288U JPH0279033U (US07179912-20070220-C00144.png) 1988-12-03 1988-12-03

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP15776288U JPH0279033U (US07179912-20070220-C00144.png) 1988-12-03 1988-12-03

Publications (1)

Publication Number Publication Date
JPH0279033U true JPH0279033U (US07179912-20070220-C00144.png) 1990-06-18

Family

ID=31437492

Family Applications (1)

Application Number Title Priority Date Filing Date
JP15776288U Pending JPH0279033U (US07179912-20070220-C00144.png) 1988-12-03 1988-12-03

Country Status (1)

Country Link
JP (1) JPH0279033U (US07179912-20070220-C00144.png)

Similar Documents

Publication Publication Date Title
SE8702244D0 (sv) Method and apparatus for noncontacting tension measurement in a flat foil and especially in a paper web
JPS60108043A (ja) 血管位置指示装置
KR890014990A (ko) 광학식 측정장치
JPH0279033U (US07179912-20070220-C00144.png)
KR920001184A (ko) 레이저빔 파장 검출방법 및 장치
JP3325670B2 (ja) 塗膜厚測定装置
JPH0446374B2 (US07179912-20070220-C00144.png)
JPS5942955U (ja) 物体表面の欠陥検出装置
JPH03122339U (US07179912-20070220-C00144.png)
JP2515343Y2 (ja) 光導波路型吸光光度計
JPH0241135U (US07179912-20070220-C00144.png)
JPH0286232U (US07179912-20070220-C00144.png)
SU715941A1 (ru) Устройство дл неконтактного определени параметров вибрации
JPS6138410B2 (US07179912-20070220-C00144.png)
JPS6355123U (US07179912-20070220-C00144.png)
JPH0336908U (US07179912-20070220-C00144.png)
JPS54156599A (en) Thermal diffusivity measuring apparatus
JPS622111A (ja) 反射光による表面粗さ計
JPS6237705U (US07179912-20070220-C00144.png)
JPH0269702U (US07179912-20070220-C00144.png)
JPS6079110U (ja) 距離測定装置
JPH0658348B2 (ja) 超音波の振動モ−ド判定装置
JPS598141U (ja) 吸光光度計
JPS5811248U (ja) 半導体特性測定装置
JPS58180655U (ja) レ−ザ出力検出装置