JPH0276400U - - Google Patents
Info
- Publication number
- JPH0276400U JPH0276400U JP15475488U JP15475488U JPH0276400U JP H0276400 U JPH0276400 U JP H0276400U JP 15475488 U JP15475488 U JP 15475488U JP 15475488 U JP15475488 U JP 15475488U JP H0276400 U JPH0276400 U JP H0276400U
- Authority
- JP
- Japan
- Prior art keywords
- crc
- circuit
- data
- cell array
- memory cell
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 230000006870 function Effects 0.000 claims description 2
- 238000010586 diagram Methods 0.000 description 4
- 238000012795 verification Methods 0.000 description 1
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP15475488U JPH0276400U (zh) | 1988-11-30 | 1988-11-30 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP15475488U JPH0276400U (zh) | 1988-11-30 | 1988-11-30 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPH0276400U true JPH0276400U (zh) | 1990-06-12 |
Family
ID=31431768
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP15475488U Pending JPH0276400U (zh) | 1988-11-30 | 1988-11-30 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH0276400U (zh) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2004327036A (ja) * | 2004-08-06 | 2004-11-18 | Matsushita Electric Ind Co Ltd | 半導体集積回路および半導体集積回路の検査方法 |
Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS60201595A (ja) * | 1984-03-23 | 1985-10-12 | Hitachi Ltd | 検査容易な記憶装置 |
| JPS6112000A (ja) * | 1984-06-28 | 1986-01-20 | Toshiba Corp | 読出し専用メモリの内部試験回路 |
-
1988
- 1988-11-30 JP JP15475488U patent/JPH0276400U/ja active Pending
Patent Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS60201595A (ja) * | 1984-03-23 | 1985-10-12 | Hitachi Ltd | 検査容易な記憶装置 |
| JPS6112000A (ja) * | 1984-06-28 | 1986-01-20 | Toshiba Corp | 読出し専用メモリの内部試験回路 |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2004327036A (ja) * | 2004-08-06 | 2004-11-18 | Matsushita Electric Ind Co Ltd | 半導体集積回路および半導体集積回路の検査方法 |