JPH0276400U - - Google Patents

Info

Publication number
JPH0276400U
JPH0276400U JP15475488U JP15475488U JPH0276400U JP H0276400 U JPH0276400 U JP H0276400U JP 15475488 U JP15475488 U JP 15475488U JP 15475488 U JP15475488 U JP 15475488U JP H0276400 U JPH0276400 U JP H0276400U
Authority
JP
Japan
Prior art keywords
crc
circuit
data
cell array
memory cell
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP15475488U
Other languages
English (en)
Japanese (ja)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP15475488U priority Critical patent/JPH0276400U/ja
Publication of JPH0276400U publication Critical patent/JPH0276400U/ja
Pending legal-status Critical Current

Links

JP15475488U 1988-11-30 1988-11-30 Pending JPH0276400U (cs)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP15475488U JPH0276400U (cs) 1988-11-30 1988-11-30

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP15475488U JPH0276400U (cs) 1988-11-30 1988-11-30

Publications (1)

Publication Number Publication Date
JPH0276400U true JPH0276400U (cs) 1990-06-12

Family

ID=31431768

Family Applications (1)

Application Number Title Priority Date Filing Date
JP15475488U Pending JPH0276400U (cs) 1988-11-30 1988-11-30

Country Status (1)

Country Link
JP (1) JPH0276400U (cs)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2004327036A (ja) * 2004-08-06 2004-11-18 Matsushita Electric Ind Co Ltd 半導体集積回路および半導体集積回路の検査方法

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS60201595A (ja) * 1984-03-23 1985-10-12 Hitachi Ltd 検査容易な記憶装置
JPS6112000A (ja) * 1984-06-28 1986-01-20 Toshiba Corp 読出し専用メモリの内部試験回路

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS60201595A (ja) * 1984-03-23 1985-10-12 Hitachi Ltd 検査容易な記憶装置
JPS6112000A (ja) * 1984-06-28 1986-01-20 Toshiba Corp 読出し専用メモリの内部試験回路

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2004327036A (ja) * 2004-08-06 2004-11-18 Matsushita Electric Ind Co Ltd 半導体集積回路および半導体集積回路の検査方法

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