JPH0261404B2 - - Google Patents

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Publication number
JPH0261404B2
JPH0261404B2 JP3330085A JP3330085A JPH0261404B2 JP H0261404 B2 JPH0261404 B2 JP H0261404B2 JP 3330085 A JP3330085 A JP 3330085A JP 3330085 A JP3330085 A JP 3330085A JP H0261404 B2 JPH0261404 B2 JP H0261404B2
Authority
JP
Japan
Prior art keywords
hydrofluoric acid
arsenic
ppm
purified
compounds
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP3330085A
Other languages
Japanese (ja)
Other versions
JPS61191502A (en
Inventor
Masahiro Miki
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
HASHIMOTO CHEMICAL IND
Original Assignee
HASHIMOTO CHEMICAL IND
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Priority to JP3330085A priority Critical patent/JPS61191502A/en
Publication of JPS61191502A publication Critical patent/JPS61191502A/en
Publication of JPH0261404B2 publication Critical patent/JPH0261404B2/ja
Granted legal-status Critical Current

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Description

【発明の詳細な説明】 本発明はフツ化水素酸中に不純物として存在す
るヒ素化合物を除去し精製フツ化水素酸を得る全
く新規な方法に関するものである。
DETAILED DESCRIPTION OF THE INVENTION The present invention relates to a completely new method for removing arsenic compounds present as impurities in hydrofluoric acid to obtain purified hydrofluoric acid.

本発明の方法によつて精製されたフツ化水素酸
は電子材料工業および金属工業で特にシリコンの
洗浄剤および触刻剤として広く使用されるもので
ある。
The hydrofluoric acid purified by the method of the present invention is widely used in the electronic material industry and the metal industry, especially as a cleaning agent and engraving agent for silicone.

従来のフツ化水素酸中に含まれる不純物のうち
とりわけヒ素およびヒ素化合物は、高性能の半導
体素子の作製に重大な悪影響を及ぼしていること
が明らかになり、このような用途に特にヒ素の少
いフツ化水素酸の需要が増大している。
Among the impurities contained in conventional hydrofluoric acid, it has become clear that arsenic and arsenic compounds, in particular, have a serious negative impact on the production of high-performance semiconductor devices. The demand for hot hydrofluoric acid is increasing.

フツ化水素酸の精製法としてこれまでよく知ら
れている方法は(a)フツ化水素酸を蒸留する方法、
(b)特別に精製された原料を用いてフツ化水素ガス
を発生させる方法、(c)不純物をアルカリ金属塩ま
たはアルカリ土金属塩として除去する方法、(d)ア
ルカリイオン存在下においてフツ化水素酸に酸化
剤を添加して反応させる方法などによつている、
(特公昭39−5606号公報、特公昭47−16407号公報
参照)。
Well-known methods for purifying hydrofluoric acid include (a) distillation of hydrofluoric acid;
(b) A method of generating hydrogen fluoride gas using specially purified raw materials, (c) A method of removing impurities as an alkali metal salt or alkaline earth metal salt, (d) A method of generating hydrogen fluoride gas in the presence of alkali ions. It depends on the method of adding an oxidizing agent to acid and causing a reaction.
(Refer to Japanese Patent Publication No. 39-5606 and Japanese Patent Publication No. 16407-1983).

これらの方法のうちとくに(d)の方法が高純度フ
ツ化水素酸を得るにもつとも適していると言われ
ている。
Among these methods, method (d) is said to be particularly suitable for obtaining high purity hydrofluoric acid.

しかしながらこの(d)の方法では高価な酸化剤例
えば過マンガン酸カリウム、重クロム酸カリウム
などを使用するを常とし、不純物の含有量が高い
場合には非常に不経済な方法であり、また用いる
薬剤が精製フツ化水素酸中に混入して汚染をおこ
す致命的な欠点があるため、工業的精製法として
は不向きである。
However, method (d) usually uses expensive oxidizing agents such as potassium permanganate and potassium dichromate, making it a very uneconomical method when the content of impurities is high. This method is unsuitable as an industrial purification method because it has the fatal disadvantage of contaminating the purified hydrofluoric acid by mixing the drug with it.

本発明者らはフツ化水素酸中のヒ素化合物の除
去方法について、多数の研究を行つてきた結果、
上記のような公知の方法とは全く異つた新規なヒ
素化合物の除去方法を究明したのである。
The present inventors have conducted numerous studies on methods for removing arsenic compounds from hydrofluoric acid, and as a result,
They have discovered a new method for removing arsenic compounds that is completely different from the known methods mentioned above.

すなわち本発明者らは、ヒ素化合物を含有する
フツ化水素酸にフツ化ハロゲンを添加してヒ素化
合物と反応させた後、原料フツ化水素酸を蒸留す
ることにより原料中に含まれていたヒ素化合物は
除去し易い型のヒ素化合物に変わり、単にフツ化
水素酸を蒸留することによつてヒ素分を完全に分
離除去できる事実を見出したのである。
That is, the present inventors added a fluorinated halogen to hydrofluoric acid containing an arsenic compound and reacted with the arsenic compound, and then distilled the raw material hydrofluoric acid to remove the arsenic contained in the raw material. They discovered that the compound changes into an easily removable type of arsenic compound, and that the arsenic content can be completely separated and removed simply by distilling hydrofluoric acid.

フツ化ハロゲンは一般式XF2o+1で表わされる。
式中Xは塩素、臭素、沃素のいずれかを示し、F
はフツ素を示しまたnは0、1、2または3のい
ずれかの値をとるものとする。
Halogen fluoride is represented by the general formula XF 2o+1 .
In the formula, X represents either chlorine, bromine, or iodine, and F
represents fluorine, and n takes a value of 0, 1, 2, or 3.

具体的な化合物は次のような分子式で表わされ
るものである。
A specific compound is represented by the following molecular formula.

フツ化塩素化合物:ClF、ClF3、ClF5 フツ化臭素化合物:BrF、BrF3、BrF5BrF7 フツ化ヨウ素化合物:IF、IF3、IF5、IF7 これらの化合物はそれぞれ単独であるいは混合
物の形で実際に使用される。
Fluorinated chlorine compounds: ClF, ClF 3 , ClF 5 Fluorinated bromine compounds: BrF, BrF 3 , BrF 5 BrF 7 Fluorinated iodine compounds: IF, IF 3 , IF 5 , IF 7 These compounds can be used alone or in mixtures. actually used in the form of

フツ化ハロゲンによるヒ素化合物の除去作用は
フツ化ハロゲン中のFがフツ化水素酸中のヒ素化
合物を五フツ化ヒ素もしくは高沸点難揮発性ヒ素
化合物例えばポリフルオロアルゼン酸に変えるこ
とによるものと考えられるが、その反応機構の詳
細な学理的説明を現在簡明ならしめることは容易
ではない。
The removal effect of arsenic compounds by fluorinated halogens is thought to be due to F in fluorinated halogens converting arsenic compounds in hydrofluoric acid into arsenic pentafluoride or high boiling point refractory arsenic compounds such as polyfluoroarzenic acid. However, it is currently difficult to provide a detailed theoretical explanation of the reaction mechanism.

フツ化ハロゲンの強力な酸化作用によつて、ヒ
素は五フツ化ヒ素にまず酸化される。このものは
フツ化水素酸よりも沸点の低い化合物であるた
め、適当な条件下ではフツ化水素以外のハロゲン
化水素あるいはハロゲンガスと共に蒸留によつて
フツ化水素酸よりも低沸点側に前もつて留出され
ることになり、またさらに刮目すべきことはヒ素
化合物が高沸点化合物に移行した場合にはポリフ
ルオロアルゼン酸等として確実に釜残となつて残
留し、蒸留されるフツ化水素酸留分中にはほとん
どヒ素が含有されなくなるという事実である。
Due to the strong oxidizing action of halogen fluoride, arsenic is first oxidized to arsenic pentafluoride. Since this compound has a lower boiling point than hydrofluoric acid, under appropriate conditions it can be distilled together with hydrogen halides other than hydrogen fluoride or halogen gas to a lower boiling point than hydrofluoric acid. What is more important is that when arsenic compounds migrate to high-boiling compounds, they will definitely remain as residue in the pot as polyfluoroarzenic acid, and the hydrogen fluoride that will be distilled will be distilled. The fact is that the acid fraction contains almost no arsenic.

分析学的な実験から本発明者はフツ化ハロゲン
とヒ素化合物の反応により、これまで知られてい
なかつた高沸点化合物(例えばポリフルオロアル
ゼン酸)が円滑に生成すること、且つフツ化ハロ
ゲンからくるハロゲン化合物が効果的にフツ化水
素酸と分離しうることを見いだし本発明を完成し
たのである。
Based on analytical experiments, the present inventor has found that a hitherto unknown high boiling point compound (e.g. polyfluoroarzenic acid) is smoothly produced by the reaction of a fluorinated halogen and an arsenic compound, and also They discovered that halogen compounds can be effectively separated from hydrofluoric acid and completed the present invention.

そしてフツ化ハロゲンによるヒ素化合物の除去
作用はフツ化ハロゲンの強力な酸化作用のために
最初に本発明者が予想していたよりも極めて効果
的に行なわれるのである。
The action of removing arsenic compounds by the halogen fluoride is much more effective than originally anticipated by the inventors due to the strong oxidizing action of the halogen fluoride.

従来の方法では用いる処理剤の添加量が原料
HFに対し過マンガン酸カリウムの場合100ppm
〜10000ppm、過酸化水素の場合、9000ppmと非
常に多く必要である。
In conventional methods, the amount of processing agent used is the raw material.
100ppm for potassium permanganate to HF
~10,000ppm, and in the case of hydrogen peroxide, a very large amount of 9,000ppm is required.

本発明の方法によるフツ化ハロゲンの場合には
原料HFに対し多くの場合100ppm以下、好まし
くは10ppm〜100ppmで充分その効果を発揮する。
In the case of using halogen fluoride according to the method of the present invention, the effect is sufficiently exhibited at a concentration of 100 ppm or less, preferably 10 ppm to 100 ppm, based on the raw material HF.

本発明の方法で加えるべきフツ化ハロゲンの量
は、原料フツ化水素酸中のヒ素濃度が数ppm〜数
十ppmの場合には、ほぼ50ppm〜100ppmで充分
な効果が発揮されるが、フツ化水素酸にはヒ素化
合物のほか一般に不純物として、被酸化性のイオ
ウ化合物、リン化合物、アンチモン化合物が存在
しており、これらの不純物もフツ化ハロゲンを消
費するため、これらの存在量を測定してフツ化ハ
ロゲンの添加量の調整をしなければならないのは
当然である。
The amount of fluorinated halogen to be added in the method of the present invention is approximately 50 ppm to 100 ppm to achieve a sufficient effect when the arsenic concentration in the raw material hydrofluoric acid is several ppm to several tens of ppm. In addition to arsenic compounds, hydrohydric acid generally contains oxidizable sulfur compounds, phosphorus compounds, and antimony compounds as impurities, and since these impurities also consume halogen fluoride, the amount of these present must be measured. Naturally, the amount of fluorinated halogen must be adjusted accordingly.

本発明の方法はフツ化水素酸水溶液から無水フ
ツ化水素酸に至る広範囲のフツ化水素酸に適用出
来るのであるが、フツ化ハロゲンは水分と反応し
て部分的に消費されることになるので、水分はで
きるだけ少ない方が好ましく、また水分量に応じ
て添加量を多くしなければならない。
The method of the present invention can be applied to a wide range of hydrofluoric acids ranging from aqueous solutions of hydrofluoric acid to anhydrous hydrofluoric acid; however, the halogen fluoride reacts with moisture and is partially consumed. It is preferable that the amount of water is as low as possible, and the amount added must be increased depending on the amount of water.

多くの実験結果から本発明の方法は水分3%以
下の無水フツ化水素酸に適用した場合極めて合理
的かつ経済的に達成しうるものであり、すぐれた
工業的価値を有するものである。
Many experimental results show that the method of the present invention can be achieved very rationally and economically when applied to hydrofluoric anhydride with a water content of 3% or less, and has excellent industrial value.

本発明の方法で用いるフツ化ハロゲンの形態は
その化合物の物性に従つて気体状、液体状、固体
状のいずれの形態であつてもよく、またフツ化水
素酸溶液、塩素溶液あるいは臭素溶液のような形
にして用いてもよい。
The form of the fluorinated halogen used in the method of the present invention may be gaseous, liquid, or solid depending on the physical properties of the compound, and may be in the form of a hydrofluoric acid solution, a chlorine solution, or a bromine solution. It may also be used in this form.

勿論本発明に用いられるフツ化ハロゲンは単独
でも二種以上の混合物でもよくまたハロゲン
(F2、Cl2、Br2、I2)との混合物の形でもよい。
Of course, the fluorinated halogen used in the present invention may be used alone or in a mixture of two or more, or may be in the form of a mixture with halogen (F 2 , Cl 2 , Br 2 , I 2 ).

一般的には、フツ化ハロゲンのうち常温付近で
液体状を示すClF3,BrF3,BrF5,IF5が保存、
計量、仕込み等に対しとくに取扱いやすいもので
あり、これについで気体状のものが使用し易い。
Generally, among the fluorinated halogens, ClF 3 , BrF 3 , BrF 5 , and IF 5 , which are liquid at around room temperature, are stored.
It is particularly easy to handle for measuring, preparing, etc., and gaseous forms are also easy to use.

本発明の方法においてフツ化ハロゲンとヒ素化
合物との反応は温度、圧力に限定されないが、常
温常圧下でも迅速に進行するので、特別な条件や
装置を必要とせず無水フツ化水素酸ではその沸点
以下の温度すなわち10〜20℃で実施されるのが好
ましい。
In the method of the present invention, the reaction between the halogen fluoride and the arsenic compound is not limited to temperature or pressure, but since it proceeds rapidly even at room temperature and pressure, no special conditions or equipment are required. Preferably, the reaction is carried out at the following temperatures: 10-20°C.

本発明のフツ化水素酸の蒸留方法は、回分式蒸
留精製法或いは連続式蒸留精製法等が採用され効
率のよい分留塔が付設されているならばより充分
な成果が得られる。
The method for distilling hydrofluoric acid of the present invention can achieve more satisfactory results if a batch distillation purification method or a continuous distillation purification method is employed and an efficient fractionation column is attached.

本発明者らは本発明の方法に関し、多数の実験
を行い本発明の優秀性を確認したのであるが、そ
れらの実験例のことごとくについて示すことは繁
雑にすぎるので多数の実験例の中から数列を抽出
して以下に実施例1として示すことにする。
The present inventors conducted a large number of experiments regarding the method of the present invention and confirmed the superiority of the present invention, but it would be too complicated to list all of the experimental examples, so we will select only a few from among the numerous experimental examples. will be extracted and shown below as Example 1.

従つて本発明の方法は、単に以下に示す実施例
のみに限定して解釈されるべきでなく、本発明の
趣旨と精神を逸脱せざる限りにおいて、任意にそ
の実施態様を変更して、実施し得ることは当然で
ある。
Therefore, the method of the present invention should not be construed as being limited to the examples shown below, but may be carried out by arbitrarily changing the embodiments without departing from the spirit and spirit of the present invention. Of course it can be done.

実施例 1 還流冷却器および蒸留管を備えたポリ(トリフ
ルオロクロルエチレン)製容器(容量1)に、
フツ化水素酸(HF99.9% AS 10ppm)800gを
入れ、三フツ化塩素(ClF3)を原料のHFに対し
ClF3中のFが80ppmになるように添加して5〜
6時間煮沸して反応させたのち、容器をさらに加
熱してフツ化水素酸を分留し精製フツ化水素酸を
得た。
Example 1 In a poly(trifluorochloroethylene) container (capacity 1) equipped with a reflux condenser and a distillation tube,
Add 800g of hydrofluoric acid (HF99.9% AS 10ppm) and add chlorine trifluoride (ClF 3 ) to the raw HF.
Add so that F in ClF3 becomes 80ppm and
After reacting by boiling for 6 hours, the container was further heated to fractionally distill the hydrofluoric acid to obtain purified hydrofluoric acid.

この精製フツ化水素酸のヒ素含有量を測定した
ところ0.001ppm以下であり、電子材料用のフツ
化水素酸として有用なものであつた。
When the arsenic content of this purified hydrofluoric acid was measured, it was 0.001 ppm or less, and it was found to be useful as hydrofluoric acid for electronic materials.

実施例 2 実施例1と同じ装置を用い、容器にフツ化水素
酸(HF99.9% As14ppm)800gを入れ、三フ
ツ化臭素(BrF3)を原料のHFに対しBrF3中の
Fが100ppmになるように添加してやや加圧して
30℃で2時間反応させたのち、フツ化水素酸を蒸
留し精製フツ化水素酸を得た。この精製フツ化水
素酸のヒ素含有量を測定したところ0.001ppm以
下であり電子材料用のフツ化水素酸として有用な
ものであつた。
Example 2 Using the same equipment as in Example 1, put 800 g of hydrofluoric acid (HF99.9% As14 ppm) into a container, and add bromine trifluoride (BrF 3 ) to the raw material HF so that the F in BrF 3 was 100 ppm. Add it and pressurize it slightly.
After reacting at 30°C for 2 hours, the hydrofluoric acid was distilled to obtain purified hydrofluoric acid. When the arsenic content of this purified hydrofluoric acid was measured, it was less than 0.001 ppm, and it was found to be useful as hydrofluoric acid for electronic materials.

実施例 3 実施例1と同じ装置を用い、容器にフツ化水素
酸(HF99.8% As8ppm)800gを入れ、五フツ
化ヨウ素(IF5)を原料のHFに対しIF5中のFが
75ppmになるように添加して15℃で1夜放置して
反応させたのち、フツ化水素酸を蒸留し精製フツ
化水素酸を得た。この精製フツ化水素酸のヒ素含
有量を測定したところ0.001ppm以下であり電子
材料用のフツ化水素酸として有用なものであつ
た。
Example 3 Using the same equipment as in Example 1, 800 g of hydrofluoric acid (HF99.8% As8ppm) was placed in a container, and iodine pentafluoride (IF 5 ) was added to the raw material HF to increase the amount of F in IF 5 .
After adding the solution to a concentration of 75 ppm and allowing it to react overnight at 15°C, the hydrofluoric acid was distilled to obtain purified hydrofluoric acid. When the arsenic content of this purified hydrofluoric acid was measured, it was less than 0.001 ppm, and it was found to be useful as hydrofluoric acid for electronic materials.

実施例 4 実施例1と同じ装置を用い容器にフツ化水素酸
(HF99.9% As10ppm)800gを入れ、塩素ガス
とフツ素ガスとを当モル反応させて得たガス状の
一塩化フツ素(ClF)を原料のHFに対しClF中の
Fが80ppmになるように吹き込んで1夜放置して
反応させたのち、フツ化水素酸を蒸留し精製フツ
化水素酸を得た。
Example 4 Using the same equipment as in Example 1, put 800 g of hydrofluoric acid (HF99.9% As10ppm) into a container, and react equimolar amounts of chlorine gas and fluorine gas to obtain gaseous fluorine monochloride. (ClF) was blown into the raw material HF so that the F content in ClF was 80 ppm, and the mixture was left to react overnight. Hydrofluoric acid was then distilled to obtain purified hydrofluoric acid.

この精製フツ化水素酸のヒ素含有量を測定した
ところ0.001ppm以下であり、電子材料用のフツ
化水素酸として有用なものであつた。
When the arsenic content of this purified hydrofluoric acid was measured, it was less than 0.001 ppm, and it was found to be useful as hydrofluoric acid for electronic materials.

実施例 5 実施例1と同じ装置を用い、容器にフツ化水素
酸(HF99.8% As9ppm)800gを入れ、液体状
の三フツ化臭素を冷却して得た固体状の三フツ化
臭素(BrF3)を原料のHFに対しBrF3中のFが
70〜80ppmになるように添加して3時間煮沸して
反応させたのち、フツ化水素酸を蒸留し精製フツ
化水素酸を得た。この精製フツ化水素酸のヒ素含
有量を測定したところ0.001ppm以下であり、電
子材料用のフツ化水素酸として有用なものであつ
た。
Example 5 Using the same equipment as in Example 1, 800 g of hydrofluoric acid (HF99.8% As9ppm) was placed in a container, and liquid bromine trifluoride was cooled to obtain solid bromine trifluoride ( BrF 3 ) to the raw material HF, F in BrF 3 is
After adding the mixture to a concentration of 70 to 80 ppm and reacting by boiling for 3 hours, the hydrofluoric acid was distilled to obtain purified hydrofluoric acid. The arsenic content of this purified hydrofluoric acid was measured to be less than 0.001 ppm, and it was found to be useful as hydrofluoric acid for electronic materials.

実施例 6 実施例1と同じ装置を用い、容器にフツ化水素
酸(HF97.5% As7ppm、H2O2.45%)800gを
入れ、三フツ化塩素(ClF3)を原料のHFに対し
ClF3中のFが100〜150ppmになるように添加し
て、1夜放置して反応させたのち、フツ化水素酸
を蒸留し精製フツ化水素酸を得た。この精製フツ
化水素酸のヒ素含有量を測定したところ
0.001ppm以下であり、電子材料用のフツ化水素
酸として有用なものであつた。
Example 6 Using the same equipment as in Example 1, 800 g of hydrofluoric acid (HF97.5% As7ppm, H2O2.45 %) was placed in a container, and chlorine trifluoride ( ClF3 ) was added to the raw material HF.
After adding F in ClF3 to 100 to 150 ppm and allowing it to react overnight, hydrofluoric acid was distilled to obtain purified hydrofluoric acid. The arsenic content of this purified hydrofluoric acid was measured.
It was 0.001 ppm or less, and was useful as hydrofluoric acid for electronic materials.

実施例 7 凝縮還流装置および蒸留管を備えたポリ(トリ
フルオロクロルエチレン)製容器(容量1)
に、液体状の三フツ化臭素(BrF3)が原料のHF
に対しBrF3中のFとして75〜100ppmになるよう
に加えられたフツ化水素酸(HF99.8%
As8ppm)を、連続的に200g/時の供給速度で
仕込んで加熱し精留する。
Example 7 Poly(trifluorochloroethylene) container (capacity 1) equipped with a condensing reflux device and a distillation tube
In addition, liquid bromine trifluoride (BrF 3 ) is the raw material for HF.
Hydrofluoric acid (HF99.8%) added to 75-100 ppm as F in BrF3
As8ppm) was continuously charged at a feed rate of 200g/hour, heated and rectified.

この方法で8時間連続運転して得た精製フツ化
水素酸のヒ素含有量を測定したところ0.001ppm
以下であり、電子材料用のフツ化水素酸として有
用なものであつた。
The arsenic content of purified hydrofluoric acid obtained by continuous operation for 8 hours using this method was measured to be 0.001 ppm.
It was found to be useful as hydrofluoric acid for electronic materials.

実施例 8 ステンレス容器(1)に無水フツ化水素酸
(HF99.9%、As10ppm)800gを入れ、これに五
フツ化塩素(ClF5,b.p.−13.1℃)10gを吹き込
んだ。次いで、この溶液を実施例1で用いた蒸留
装置に移し、実施例1と同様の条件で精留して精
製フツ化水素酸を得た。
Example 8 800 g of anhydrous hydrofluoric acid (HF 99.9%, As 10 ppm) was placed in a stainless steel container (1), and 10 g of chlorine pentafluoride (ClF 5 , bp-13.1°C) was blown into it. Next, this solution was transferred to the distillation apparatus used in Example 1, and rectified under the same conditions as in Example 1 to obtain purified hydrofluoric acid.

この精製フツ化水素酸のヒ素含有量を測定した
ところ0.001ppm以下であつた。
When the arsenic content of this purified hydrofluoric acid was measured, it was less than 0.001 ppm.

実施例 9 ステンレス容器(1)に無水フツ化水素酸
(HF99.8%、As10ppm)800gを入れ、これにフ
ツ化臭素(BrF,b.p.20℃)1gを添加し、10℃
で2時間放置した。次いで、この溶液を実施例1
で用いた蒸留装置に移し、実施例1と同様の条件
で精留して精製フツ化水素酸700gを得た。
Example 9 Put 800g of anhydrous hydrofluoric acid (HF99.8%, As10ppm) into a stainless steel container (1), add 1g of bromine fluoride (BrF, bp20℃), and heat at 10℃.
I left it for 2 hours. This solution was then used in Example 1.
The mixture was transferred to the distillation apparatus used in Example 1 and rectified under the same conditions as in Example 1 to obtain 700 g of purified hydrofluoric acid.

この精製フツ化水素酸のヒ素含有量を測定した
ところ0.001ppm以下であつた。
When the arsenic content of this purified hydrofluoric acid was measured, it was 0.001 ppm or less.

実施例 10 実施例1と同じ装置を用い、容器に無水フツ化
水素酸(HF99.9%、As8ppm)800gを入れ、こ
れに五フツ化臭素(BrF5,b.p.40.5℃)0.5gを添
加し、3時間全還流させた後、精製フツ化水素酸
を取り出した。
Example 10 Using the same equipment as in Example 1, 800 g of anhydrous hydrofluoric acid (HF99.9%, As8ppm) was placed in a container, and 0.5 g of bromine pentafluoride (BrF 5 , bp40.5°C) was added to this. After total reflux for 3 hours, purified hydrofluoric acid was taken out.

この精製フツ化水素酸のヒ素含有量を測定した
ところ0.001ppm以下であつた。
When the arsenic content of this purified hydrofluoric acid was measured, it was 0.001 ppm or less.

実施例 11 ステンレス容器(1)に無水フツ化水素酸
(HF99.8%、As10ppm)800gを入れ、これに七
フツ化ヨウ素(IF7,b.p.55℃)1gを添加し、
0℃で1夜放置した。次いで、この溶液を実施例
1で用いた蒸留装置に移し、実施例1と同様の条
件で精留して精製フツ化水素酸を得た。
Example 11 Put 800g of anhydrous hydrofluoric acid (HF99.8%, As10ppm) into a stainless steel container (1), add 1g of iodine heptafluoride ( IF7 , bp55℃),
It was left at 0°C overnight. Next, this solution was transferred to the distillation apparatus used in Example 1, and rectified under the same conditions as in Example 1 to obtain purified hydrofluoric acid.

この精製フツ化水素酸のヒ素含有量を測定した
ところ0.001ppm以下であつた。
When the arsenic content of this purified hydrofluoric acid was measured, it was 0.001 ppm or less.

Claims (1)

【特許請求の範囲】[Claims] 1 一般式XF2o+1(ただし式中、Xは塩素、臭
素、沃素のいずれかを示し、Fはフツ素を示し、
nは0、1、2または3のいずれかの値を示す)
で表わされる化合物群から選ばれた少くとも一つ
のフツ化ハロゲンを、ヒ素化合物を含有するフツ
化水素酸に添加してヒ素化合物と反応させた後フ
ツ化水素酸を蒸留することを特徴とするフツ化水
素酸の精製法。
1 General formula XF 2o+1 (wherein, X represents chlorine, bromine, or iodine;
n indicates a value of 0, 1, 2 or 3)
At least one fluorinated halogen selected from the group of compounds represented by is added to hydrofluoric acid containing an arsenic compound to react with the arsenic compound, and then the hydrofluoric acid is distilled. Method for purifying hydrofluoric acid.
JP3330085A 1985-02-20 1985-02-20 Method for purifying hydrofluoric acid Granted JPS61191502A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP3330085A JPS61191502A (en) 1985-02-20 1985-02-20 Method for purifying hydrofluoric acid

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP3330085A JPS61191502A (en) 1985-02-20 1985-02-20 Method for purifying hydrofluoric acid

Publications (2)

Publication Number Publication Date
JPS61191502A JPS61191502A (en) 1986-08-26
JPH0261404B2 true JPH0261404B2 (en) 1990-12-20

Family

ID=12382697

Family Applications (1)

Application Number Title Priority Date Filing Date
JP3330085A Granted JPS61191502A (en) 1985-02-20 1985-02-20 Method for purifying hydrofluoric acid

Country Status (1)

Country Link
JP (1) JPS61191502A (en)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2528854B2 (en) * 1987-01-27 1996-08-28 多摩化学工業株式会社 Method and apparatus for manufacturing high-purity chemicals
JP2005281048A (en) * 2004-03-29 2005-10-13 Stella Chemifa Corp Method and apparatus for refining hydrofluoric acid

Also Published As

Publication number Publication date
JPS61191502A (en) 1986-08-26

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