JPH0257865B2 - - Google Patents

Info

Publication number
JPH0257865B2
JPH0257865B2 JP58155160A JP15516083A JPH0257865B2 JP H0257865 B2 JPH0257865 B2 JP H0257865B2 JP 58155160 A JP58155160 A JP 58155160A JP 15516083 A JP15516083 A JP 15516083A JP H0257865 B2 JPH0257865 B2 JP H0257865B2
Authority
JP
Japan
Prior art keywords
piezoelectric crystal
circuit
moisture
capacitor
atmosphere
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP58155160A
Other languages
English (en)
Japanese (ja)
Other versions
JPS5965247A (ja
Inventor
Harisu Furoora Jon
Ii Hendason Jeimuzu
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Babcock and Wilcox Co
Original Assignee
Babcock and Wilcox Co
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Babcock and Wilcox Co filed Critical Babcock and Wilcox Co
Publication of JPS5965247A publication Critical patent/JPS5965247A/ja
Publication of JPH0257865B2 publication Critical patent/JPH0257865B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N27/00—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N27/00—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
    • G01N27/02—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating impedance
    • G01N27/22—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating impedance by investigating capacitance
    • G01N27/223—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating impedance by investigating capacitance for determining moisture content, e.g. humidity
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01K—MEASURING TEMPERATURE; MEASURING QUANTITY OF HEAT; THERMALLY-SENSITIVE ELEMENTS NOT OTHERWISE PROVIDED FOR
    • G01K5/00—Measuring temperature based on the expansion or contraction of a material
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2291/00—Indexing codes associated with group G01N29/00
    • G01N2291/02—Indexing codes associated with the analysed material
    • G01N2291/028—Material parameters
    • G01N2291/02845—Humidity, wetness
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2291/00—Indexing codes associated with group G01N29/00
    • G01N2291/02—Indexing codes associated with the analysed material
    • G01N2291/028—Material parameters
    • G01N2291/02863—Electric or magnetic parameters
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N33/00—Investigating or analysing materials by specific methods not covered by groups G01N1/00 - G01N31/00
    • G01N33/0004—Gaseous mixtures, e.g. polluted air
    • G01N33/0009—General constructional details of gas analysers, e.g. portable test equipment
    • G01N33/0062—General constructional details of gas analysers, e.g. portable test equipment concerning the measuring method or the display, e.g. intermittent measurement or digital display

Landscapes

  • Chemical & Material Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Physics & Mathematics (AREA)
  • Electrochemistry (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Or Analyzing Materials By The Use Of Ultrasonic Waves (AREA)
  • Investigating Or Analyzing Materials By The Use Of Electric Means (AREA)
JP58155160A 1982-08-31 1983-08-26 圧電湿気測定装置 Granted JPS5965247A (ja)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US413286 1982-08-31
US06/413,286 US4491784A (en) 1982-08-31 1982-08-31 Piezoelectric moisture measuring device

Publications (2)

Publication Number Publication Date
JPS5965247A JPS5965247A (ja) 1984-04-13
JPH0257865B2 true JPH0257865B2 (enExample) 1990-12-06

Family

ID=23636649

Family Applications (1)

Application Number Title Priority Date Filing Date
JP58155160A Granted JPS5965247A (ja) 1982-08-31 1983-08-26 圧電湿気測定装置

Country Status (12)

Country Link
US (1) US4491784A (enExample)
EP (1) EP0106470B1 (enExample)
JP (1) JPS5965247A (enExample)
KR (1) KR900005478B1 (enExample)
AR (1) AR241330A1 (enExample)
AT (1) ATE34846T1 (enExample)
BR (1) BR8304589A (enExample)
CA (1) CA1198908A (enExample)
DE (1) DE3376878D1 (enExample)
IN (1) IN162581B (enExample)
MX (1) MX154786A (enExample)
PH (1) PH20323A (enExample)

Families Citing this family (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS63226506A (ja) * 1987-03-16 1988-09-21 Matsushita Electric Ind Co Ltd 触媒燃焼装置
EP1173790A2 (en) 1999-03-01 2002-01-23 Boston Innovative Optics, Inc. System and method for increasing the depth of focus of the human eye
KR100815294B1 (ko) 2006-06-28 2008-03-19 한국폴리텍Iv대학 산학협력단 회복전압법과 유전특성을 이용한 수분량 검출 장치 및 방법
US20110133755A1 (en) * 2009-12-08 2011-06-09 Delphi Technologies, Inc. System and Method of Occupant Detection with a Resonant Frequency
GB2496136A (en) * 2011-11-01 2013-05-08 Isis Innovation Passive capacitive moisture detector
US9032792B2 (en) * 2012-01-19 2015-05-19 Nalco Company Fouling reduction device and method
US9545303B2 (en) 2011-12-02 2017-01-17 Acufocus, Inc. Ocular mask having selective spectral transmission
US9204962B2 (en) 2013-03-13 2015-12-08 Acufocus, Inc. In situ adjustable optical mask
US9427922B2 (en) 2013-03-14 2016-08-30 Acufocus, Inc. Process for manufacturing an intraocular lens with an embedded mask
JP6098724B2 (ja) * 2013-08-13 2017-03-22 株式会社村田製作所 温湿度センサ

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US2536111A (en) * 1945-07-04 1951-01-02 Karl S Van Dyke Dew point hygrometer
US3256482A (en) * 1962-02-23 1966-06-14 Nat Tank Co Basic sediment and water monitor utilizing a plurality of selectable compensating capacitors in a resonant detecting circuit
GB1340703A (en) * 1970-04-22 1973-12-12 Atomic Energy Authority Uk Transducers for measuring apparatus
JPS5255580A (en) * 1975-10-30 1977-05-07 Matsushita Electric Ind Co Ltd Humidity sensor
US4312228A (en) * 1979-07-30 1982-01-26 Henry Wohltjen Methods of detection with surface acoustic wave and apparati therefor
JPS56119474A (en) * 1980-02-25 1981-09-19 Nippon Denso Co Device for responding to refrigerang amount for refrigerant circulating apparatus

Also Published As

Publication number Publication date
JPS5965247A (ja) 1984-04-13
US4491784A (en) 1985-01-01
DE3376878D1 (en) 1988-07-07
ATE34846T1 (de) 1988-06-15
EP0106470A2 (en) 1984-04-25
AR241330A1 (es) 1992-05-29
BR8304589A (pt) 1984-04-03
KR900005478B1 (ko) 1990-07-30
MX154786A (es) 1987-12-11
IN162581B (enExample) 1988-06-11
PH20323A (en) 1986-11-25
CA1198908A (en) 1986-01-07
EP0106470B1 (en) 1988-06-01
EP0106470A3 (en) 1985-05-02
KR840006070A (ko) 1984-11-21

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