JPH0257653B2 - - Google Patents
Info
- Publication number
- JPH0257653B2 JPH0257653B2 JP57205343A JP20534382A JPH0257653B2 JP H0257653 B2 JPH0257653 B2 JP H0257653B2 JP 57205343 A JP57205343 A JP 57205343A JP 20534382 A JP20534382 A JP 20534382A JP H0257653 B2 JPH0257653 B2 JP H0257653B2
- Authority
- JP
- Japan
- Prior art keywords
- slit
- slits
- monochromator
- plate
- variable width
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
- 229910052751 metal Inorganic materials 0.000 claims description 7
- 239000002184 metal Substances 0.000 claims description 7
- 238000000034 method Methods 0.000 claims description 4
- 238000005530 etching Methods 0.000 claims description 2
- 238000004519 manufacturing process Methods 0.000 description 4
- PXHVJJICTQNCMI-UHFFFAOYSA-N Nickel Chemical compound [Ni] PXHVJJICTQNCMI-UHFFFAOYSA-N 0.000 description 2
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N Silicium dioxide Chemical compound O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 2
- 238000010521 absorption reaction Methods 0.000 description 2
- 238000004026 adhesive bonding Methods 0.000 description 2
- 230000000694 effects Effects 0.000 description 2
- 229910052782 aluminium Inorganic materials 0.000 description 1
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 description 1
- 239000011248 coating agent Substances 0.000 description 1
- 238000000576 coating method Methods 0.000 description 1
- 238000005553 drilling Methods 0.000 description 1
- 239000000463 material Substances 0.000 description 1
- 229910052759 nickel Inorganic materials 0.000 description 1
- 239000000377 silicon dioxide Substances 0.000 description 1
- 238000004611 spectroscopical analysis Methods 0.000 description 1
- 239000012780 transparent material Substances 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
- G01J3/02—Details
- G01J3/04—Slit arrangements slit adjustment
Landscapes
- Physics & Mathematics (AREA)
- Spectroscopy & Molecular Physics (AREA)
- General Physics & Mathematics (AREA)
- Spectrometry And Color Measurement (AREA)
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
GB08135219A GB2110833A (en) | 1981-11-23 | 1981-11-23 | Adjustable slit assembly for a monochromator |
GB8135219 | 1981-11-23 |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS58113728A JPS58113728A (ja) | 1983-07-06 |
JPH0257653B2 true JPH0257653B2 (en, 2012) | 1990-12-05 |
Family
ID=10526070
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP57205343A Granted JPS58113728A (ja) | 1981-11-23 | 1982-11-22 | モノクロメ−タ用可調整スリツト装置 |
Country Status (6)
Country | Link |
---|---|
US (1) | US4483590A (en, 2012) |
EP (1) | EP0081868B1 (en, 2012) |
JP (1) | JPS58113728A (en, 2012) |
AU (1) | AU557413B2 (en, 2012) |
DE (1) | DE3270025D1 (en, 2012) |
GB (1) | GB2110833A (en, 2012) |
Families Citing this family (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5981520A (ja) * | 1982-10-30 | 1984-05-11 | Shimadzu Corp | 分光器スリツト機構 |
US4590398A (en) * | 1984-01-26 | 1986-05-20 | Kabushiki Kaisha Yaskawa Denki Seisakusho | Brush holder |
US6426835B1 (en) * | 1999-03-23 | 2002-07-30 | Olympus Optical Co., Ltd. | Confocal microscope |
ITTO20020669A1 (it) * | 2002-07-26 | 2004-01-26 | Fiat Ricerche | Spettrofotometro con otturatore a film elettrostatico |
US9592719B2 (en) * | 2012-10-26 | 2017-03-14 | Toyota Motor Engineering & Manufacturing North America, Inc. | Anti-blinding device for an automotive vehicle |
CN107131954B (zh) * | 2017-05-16 | 2019-08-23 | 中国电子科技集团公司第四十一研究所 | 一种光栅光谱仪可变分辨带宽实现与调试系统及方法 |
DE102017130772A1 (de) * | 2017-12-20 | 2019-06-27 | Analytik Jena Ag | Spektrometeranordnung, Verfahren zur Erzeugung eines zweidimensionalen Spektrums mittels einer solchen |
Family Cites Families (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3508813A (en) * | 1967-03-24 | 1970-04-28 | Instrumentation Labor Inc | Adjustable slit system for use in spectroanalysis apparatus |
FR1591520A (en, 2012) * | 1968-11-13 | 1970-04-27 | ||
JPS56137117A (en) * | 1980-03-28 | 1981-10-26 | Hitachi Ltd | Slit for spectroscope |
-
1981
- 1981-11-23 GB GB08135219A patent/GB2110833A/en not_active Withdrawn
-
1982
- 1982-11-05 US US06/439,463 patent/US4483590A/en not_active Expired - Fee Related
- 1982-11-19 EP EP82201474A patent/EP0081868B1/en not_active Expired
- 1982-11-19 AU AU90723/82A patent/AU557413B2/en not_active Ceased
- 1982-11-19 DE DE8282201474T patent/DE3270025D1/de not_active Expired
- 1982-11-22 JP JP57205343A patent/JPS58113728A/ja active Granted
Also Published As
Publication number | Publication date |
---|---|
JPS58113728A (ja) | 1983-07-06 |
AU557413B2 (en) | 1986-12-18 |
GB2110833A (en) | 1983-06-22 |
DE3270025D1 (en) | 1986-04-24 |
EP0081868A1 (en) | 1983-06-22 |
EP0081868B1 (en) | 1986-03-19 |
US4483590A (en) | 1984-11-20 |
AU9072382A (en) | 1983-06-02 |
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