JPH0255102U - - Google Patents
Info
- Publication number
- JPH0255102U JPH0255102U JP13388688U JP13388688U JPH0255102U JP H0255102 U JPH0255102 U JP H0255102U JP 13388688 U JP13388688 U JP 13388688U JP 13388688 U JP13388688 U JP 13388688U JP H0255102 U JPH0255102 U JP H0255102U
- Authority
- JP
- Japan
- Prior art keywords
- circuit board
- printed circuit
- base plate
- pin
- right angles
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 239000000523 sample Substances 0.000 claims description 5
- 238000007689 inspection Methods 0.000 claims description 4
- 230000006835 compression Effects 0.000 description 1
- 238000007906 compression Methods 0.000 description 1
Landscapes
- A Measuring Device Byusing Mechanical Method (AREA)
- Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
- Testing Electric Properties And Detecting Electric Faults (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP1988133886U JPH0720622Y2 (ja) | 1988-10-13 | 1988-10-13 | プリント基板検査用治具 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP1988133886U JPH0720622Y2 (ja) | 1988-10-13 | 1988-10-13 | プリント基板検査用治具 |
Publications (2)
Publication Number | Publication Date |
---|---|
JPH0255102U true JPH0255102U (no) | 1990-04-20 |
JPH0720622Y2 JPH0720622Y2 (ja) | 1995-05-15 |
Family
ID=31392162
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP1988133886U Expired - Lifetime JPH0720622Y2 (ja) | 1988-10-13 | 1988-10-13 | プリント基板検査用治具 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPH0720622Y2 (no) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2006220627A (ja) * | 2005-02-14 | 2006-08-24 | Sony Corp | プローブピン、プローブピンユニット及びこれを用いた被検査物の検査方法 |
JP5720845B1 (ja) * | 2014-10-14 | 2015-05-20 | 富士ゼロックス株式会社 | 検査装置 |
Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS63129873U (no) * | 1987-02-18 | 1988-08-24 |
-
1988
- 1988-10-13 JP JP1988133886U patent/JPH0720622Y2/ja not_active Expired - Lifetime
Patent Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS63129873U (no) * | 1987-02-18 | 1988-08-24 |
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2006220627A (ja) * | 2005-02-14 | 2006-08-24 | Sony Corp | プローブピン、プローブピンユニット及びこれを用いた被検査物の検査方法 |
JP4556698B2 (ja) * | 2005-02-14 | 2010-10-06 | ソニー株式会社 | プローブピンユニット |
JP5720845B1 (ja) * | 2014-10-14 | 2015-05-20 | 富士ゼロックス株式会社 | 検査装置 |
Also Published As
Publication number | Publication date |
---|---|
JPH0720622Y2 (ja) | 1995-05-15 |
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