JPH0251221A - Apparatus for formation of semiconductor thin film - Google Patents

Apparatus for formation of semiconductor thin film

Info

Publication number
JPH0251221A
JPH0251221A JP20303688A JP20303688A JPH0251221A JP H0251221 A JPH0251221 A JP H0251221A JP 20303688 A JP20303688 A JP 20303688A JP 20303688 A JP20303688 A JP 20303688A JP H0251221 A JPH0251221 A JP H0251221A
Authority
JP
Japan
Prior art keywords
substrate
thin film
semiconductor thin
mombe
laser
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP20303688A
Other languages
Japanese (ja)
Inventor
Takeshi Yamada
武 山田
Hideo Sugiura
杉浦 英雄
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Nippon Telegraph and Telephone Corp
Original Assignee
Nippon Telegraph and Telephone Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nippon Telegraph and Telephone Corp filed Critical Nippon Telegraph and Telephone Corp
Priority to JP20303688A priority Critical patent/JPH0251221A/en
Priority to EP89909240A priority patent/EP0394462B1/en
Priority to US07/477,870 priority patent/US5186750A/en
Priority to PCT/JP1989/000827 priority patent/WO1990001794A1/en
Publication of JPH0251221A publication Critical patent/JPH0251221A/en
Priority to US07/935,067 priority patent/US5273932A/en
Pending legal-status Critical Current

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  • Physical Deposition Of Substances That Are Components Of Semiconductor Devices (AREA)

Abstract

PURPOSE:To project a small pattern by maintaining a constant relative position of a substrate in an organic metal molecular beam epitaxie(MOMBE) apparatus to an optical system for irradiating it with a light. CONSTITUTION:A MOMBE apparatus body 1, a laser 2, and an optical element 3 are fixed on a vibration-free base 4 so that the positional relationship of them is not deviated due to a vibration or the like. A light incidence window 5 is opened oppositely to a substrate 8 in a MOMBE apparatus, and a semiconductor thin film can be irradiated with a laser light during the growth of the film. Since such a structure is provided, a mirror, a lens, a mask, etc., are associated on the base, and a small pattern on the substrate can be radiated in the apparatus, and the mirror, the lens are moved on the base to scan a small laser beam focused by the lens on the substrate. Thus, the semiconductor thin film having a pattern of micron order which is impossible by a prior art can be grown.

Description

【発明の詳細な説明】 (産業上の利用分野) 本発明は、半導体薄膜を成長させる際に基板上に光を照
射し薄膜成長反応を促進することにより、部分的に17
い、もしくは部分的にのみ成長した半導体薄膜を形成す
るだめの半導体薄膜形成装置に関する。
DETAILED DESCRIPTION OF THE INVENTION (Industrial Application Field) The present invention partially provides 17% growth by irradiating light onto a substrate to promote a thin film growth reaction when growing a semiconductor thin film.
The present invention relates to a semiconductor thin film forming apparatus for forming a semiconductor thin film that is grown only partially or only partially.

(従来の技術) オプトエレクトロニクス用をはじめとした半導体素子の
高度化、高機能化にともない、その作製プロセスは複雑
化の一途をたどっている。そのプロセスの簡易化のため
、素子構造の提案のみならず半導体薄膜製造プロセスの
提案もなされている。
(Prior Art) As semiconductor devices, including those for optoelectronics, become more sophisticated and functional, their manufacturing processes are becoming increasingly complex. In order to simplify the process, not only device structures but also semiconductor thin film manufacturing processes have been proposed.

たとえばアブライドフィジクスレターズ(^pplie
dPhysics Letters ) 52巻13号
(1988年) 1065頁にあるように、半導体薄膜
を形成する際に、有機全屈分子線エピタキシー(以下M
OMBEと呼ぶ)装置内の半導体基板上に部分的にエキ
シマレーザ光を照射することにより半導体基板上の一部
に選択的に半導体IDQを形成する技術が開発されてい
る。この半導体薄膜形成方法においては所望の半導体y
l膜パターンを得るために、半導体基板を照射するレー
ザービームの制御が重要である。
For example, Abride Physics Letters (^pplie
dPhysics Letters) Vol. 52, No. 13 (1988), p. 1065, organic total refractive molecular beam epitaxy (hereinafter M
A technique has been developed in which a semiconductor IDQ is selectively formed on a portion of a semiconductor substrate by partially irradiating excimer laser light onto the semiconductor substrate within a device (referred to as OMBE). In this semiconductor thin film forming method, a desired semiconductor y
In order to obtain a film pattern, it is important to control the laser beam that irradiates the semiconductor substrate.

(発明が解決しようとする課題) しかるにMOMBE装置内の基板にレーザー光を照射す
る場合、MOMBE装置とレーザーを含む光学系とは分
離独立していた。そのため、MOMBE装置で生ずる振
動や他装置からの振動によりMOMBE装匠と光学系の
相対位置が一定せず、ずれを起こし、微少なビームや微
少なパターンを投影することは不可能であった。
(Problem to be Solved by the Invention) However, when a substrate in a MOMBE device is irradiated with laser light, the MOMBE device and the optical system including the laser are separated and independent. Therefore, due to vibrations generated in the MOMBE device and vibrations from other devices, the relative positions of the MOMBE decoration and the optical system are not constant and shift occurs, making it impossible to project a minute beam or minute pattern.

本発明は上記の欠点を改善するために提案されたもので
、その目的は、半導体基板に光を照射しながら半導体薄
膜を選択的に成長させる装置において、MOMBE装置
内の基板と光照射するための光学系との相対的位置を一
定させることにより微少なパターンの投影を可能とする
半導体薄膜形成装置を提供するにある。
The present invention was proposed in order to improve the above-mentioned drawbacks, and its purpose is to provide an apparatus for selectively growing a semiconductor thin film while irradiating a semiconductor substrate with light, in order to irradiate the same with a substrate in a MOMBE apparatus. An object of the present invention is to provide a semiconductor thin film forming apparatus that enables projection of minute patterns by keeping the relative position of the semiconductor thin film with respect to the optical system constant.

(課題を解決するための手段) 上記の目的を達成するため、本発明はを機金属分子線エ
ピタキシー(MOMBE)装置と、前記有機金属分子線
エピタキシー装置内の基板を照射するためのレーザー光
学系とを具備した半導体薄膜形成装置において、前記有
機金属分子線エピタキシー装置と前記レーザー光学系と
を除震台上に設置し、一体化したことを特徴とする半導
体薄膜形成装置を発明の要旨とするものである。
(Means for Solving the Problems) In order to achieve the above object, the present invention provides a metal organic molecular beam epitaxy (MOMBE) apparatus and a laser optical system for irradiating a substrate in the metal organic molecular beam epitaxy apparatus. The gist of the invention is a semiconductor thin film forming apparatus, characterized in that the organometallic molecular beam epitaxy apparatus and the laser optical system are installed on a vibration isolation table and are integrated. It is something.

(作用) 本発明は、半導体基板に光を照射しなから半導体薄膜を
選択的に成長させるMOMBE@置において、MOMB
E装置とレーザーを含む光学系とを一体にしたこと、特
に除震台上に設置したことを最も主要な特徴とする。そ
のために微細な形状を有する半導体薄膜を形成すること
が可能である。
(Function) The present invention provides MOMB
The main feature is that the E device and the optical system including the laser are integrated, and in particular, it is installed on a seismic isolation table. Therefore, it is possible to form a semiconductor thin film having a fine shape.

(実施例) 次に本発明の実施例について説明する。なお、実施例は
一つの例示であって、本発明の精神を逸脱しない範囲で
、種々の変更あるいは改良を行いうることは言うまでも
ない。
(Example) Next, an example of the present invention will be described. Note that the embodiments are merely illustrative, and it goes without saying that various changes and improvements can be made without departing from the spirit of the present invention.

第1図は本発明の一実施例の概観図を示す。図において
、lはMOMBE装置本体、2はレーザー源、3はミラ
ー、レンズ、回折格子等の光学素子、4は除震台、5は
光入射窓、6は原料供給用ライン、7は真空排気系、8
は基板である。MOMBE装置本体lおよびレーザー2
.光学素子3は除震台4上に固定されており、振動等に
より互いの位置関係がずれないようになっている。光入
射窓5はMOMBE装置内の基板8に対向して開いてお
り、半導体薄膜成長中にレーザー光の照射を可能として
いる。真空排気系7は拡散ポンプを用いることによりM
OMBB装置で発生する振動を無くすことができる。原
料供給用ライン6等、除震台外部と接続している部分は
フレキシブルなものを用いることにより、外部で発生す
る振動を除震台上に伝達しないようにすることができる
FIG. 1 shows an overview of an embodiment of the present invention. In the figure, l is the main body of the MOMBE device, 2 is a laser source, 3 is an optical element such as a mirror, lens, or diffraction grating, 4 is an anti-seismic table, 5 is a light entrance window, 6 is a raw material supply line, and 7 is a vacuum exhaust. system, 8
is the substrate. MOMBE device main body l and laser 2
.. The optical elements 3 are fixed on a vibration isolation table 4 so that their relative positions do not shift due to vibrations or the like. The light entrance window 5 is open facing the substrate 8 in the MOMBE apparatus, and enables laser light irradiation during the growth of a semiconductor thin film. The vacuum evacuation system 7 uses a diffusion pump to
Vibrations generated in the OMBB device can be eliminated. By using flexible parts such as the raw material supply line 6 and the like that are connected to the outside of the vibration isolation table, it is possible to prevent vibrations generated outside from being transmitted to the vibration isolation table.

例えば、微小に絞ったレーザービームを基板8に照射す
る場合など、レンズにより絞られたビームの最も細い部
分(焦点)における直径はレンズの焦点距離に比例する
。そのため、できるだけ焦点距離の短いレンズを用いる
ことが好ましく、光入射窓5と基板8は可能な限り近づ
けることが望ましい。そのため、本発明におけるMOM
BE装置においては、円筒状のチャンバに光照射窓5を
設置して用いており、光照射窓5と基板8の距離は10
cn+以下となっている。
For example, when the substrate 8 is irradiated with a finely focused laser beam, the diameter at the narrowest part (focal point) of the beam focused by a lens is proportional to the focal length of the lens. Therefore, it is preferable to use a lens with a focal length as short as possible, and it is desirable to place the light entrance window 5 and the substrate 8 as close as possible. Therefore, MOM in the present invention
In the BE device, a light irradiation window 5 is installed in a cylindrical chamber, and the distance between the light irradiation window 5 and the substrate 8 is 10
It is below cn+.

このような構造になっているため、ミラーやレンズ、マ
スクなどを除震台上で組み合わせることにより、微小な
パターンをMOMBB装置内の基板上に照射することが
可能であり、またミラーやレンズを除震台上で移動させ
ることによりレンズで絞った微小なレーザービームを基
板上で走査することも可能である。さらにレーザー光の
可干渉性を利用し、各種のミラー、回折格子を用いるこ
とにより、回折パターンや干渉パターンを基板上に投影
することが可能である。そのため従来技術では不可能で
あったミクロンオーダーのパターンを存する半導体薄膜
が成長可能である。
With this structure, by combining mirrors, lenses, masks, etc. on the vibration isolation table, it is possible to irradiate a minute pattern onto the substrate inside the MOMBB device, and it is also possible to combine mirrors, lenses, masks, etc. It is also possible to scan the substrate with a minute laser beam focused by a lens by moving it on a vibration isolation table. Furthermore, by utilizing the coherence of laser light and using various mirrors and diffraction gratings, it is possible to project a diffraction pattern or an interference pattern onto a substrate. Therefore, it is possible to grow a semiconductor thin film having a pattern on the micron order, which was impossible with conventional techniques.

第2図には本発明の半導体薄膜形成装置を用いて成長し
たr、a A s Fi!膜の断面図を示す。アルゴン
レーザ(波長514.5nm)を光源に用い、これを/
X−フミラーで部分し基板上に照射し干渉パターンを形
成することにより成長を行った。得られた薄膜は、ピッ
チ約2μ■、高さ800nmの凹凸を存していることが
第2図のグラフよりみとめられる。
FIG. 2 shows r, a A s Fi! grown using the semiconductor thin film forming apparatus of the present invention. A cross-sectional view of the membrane is shown. An argon laser (wavelength 514.5 nm) is used as a light source, and this
Growth was performed by partially irradiating the substrate with an X-fum mirror to form an interference pattern. It can be seen from the graph in FIG. 2 that the obtained thin film has irregularities with a pitch of about 2 μm and a height of 800 nm.

(発明の効果) 以上説明したように、MOMBE装置と光学系とを、た
とえば除震台上に、一体化することにより微細な形状を
有する半導体薄膜を形成することが可能である。したが
って、コラゲーションが必須のDFB、DBF?レーザ
の作製をはじめとしたオプトエレクトロニクス用半導体
部品の作製に有用であるばかりでなく、シリコン上への
パターン化されたGaAs薄膜やInP薄膜の形成など
にも有用である。
(Effects of the Invention) As described above, it is possible to form a semiconductor thin film having a fine shape by integrating the MOMBE device and the optical system, for example, on a vibration isolation table. Therefore, DFB or DBF that requires collation? It is useful not only for manufacturing semiconductor components for optoelectronics such as laser manufacturing, but also for forming patterned GaAs thin films and InP thin films on silicon.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は本発明の一実施例の概観図、第2図は本発明の
半導体薄膜形成装置を用いて成長した半導体iW膜の断
面間を示す。 ■・・・・MOMBEvt71本体 2・ ・ ・ ・レーザー源 3・・・・ミラー、レンズ等の光学素子4・・・・除震
台 5・・・・光入射窓 6・・・・原料供給用ライン 7・・・・真空排気系 8・・・・基板 (3,+m)
FIG. 1 is a schematic diagram of an embodiment of the present invention, and FIG. 2 is a cross-sectional view of a semiconductor iW film grown using the semiconductor thin film forming apparatus of the present invention. ■・・MOMBEvt71 main body 2・・・・・Laser source 3・・・Optical elements such as mirrors and lenses 4・・・Seismic isolation table 5・・・Light entrance window 6・・・・For supplying raw materials Line 7... Vacuum exhaust system 8... Board (3, +m)

Claims (1)

【特許請求の範囲】[Claims] 有機金属分子線エピタキシー(MOMBE)装置と、前
記有機金属分子線エピタキシー装置内の基板を照射する
ためのレーザー光学系とを具備した半導体薄膜形成装置
において、前記有機金属分子線エピタキシー装置と前記
レーザー光学系とを除震台上に設置し、一体化したこと
を特徴とする半導体薄膜形成装置。
A semiconductor thin film forming apparatus comprising a metal organic molecular beam epitaxy (MOMBE) apparatus and a laser optical system for irradiating a substrate in the metal organic molecular beam epitaxy apparatus, the apparatus comprising: the metal organic molecular beam epitaxy apparatus and the laser optical system; A semiconductor thin film forming apparatus characterized in that a system is installed on an earthquake isolation table and integrated.
JP20303688A 1988-08-15 1988-08-15 Apparatus for formation of semiconductor thin film Pending JPH0251221A (en)

Priority Applications (5)

Application Number Priority Date Filing Date Title
JP20303688A JPH0251221A (en) 1988-08-15 1988-08-15 Apparatus for formation of semiconductor thin film
EP89909240A EP0394462B1 (en) 1988-08-15 1989-08-15 Method of forming a semiconductor thin film and apparatus therefor
US07/477,870 US5186750A (en) 1988-08-15 1989-08-15 Method and apparatus for forming semiconductor thin films
PCT/JP1989/000827 WO1990001794A1 (en) 1988-08-15 1989-08-15 Method of forming a semiconductor thin film and apparatus therefor
US07/935,067 US5273932A (en) 1988-08-15 1992-08-25 Method for forming semiconductor thin films where an argon laser is used to suppress crystal growth

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP20303688A JPH0251221A (en) 1988-08-15 1988-08-15 Apparatus for formation of semiconductor thin film

Publications (1)

Publication Number Publication Date
JPH0251221A true JPH0251221A (en) 1990-02-21

Family

ID=16467287

Family Applications (1)

Application Number Title Priority Date Filing Date
JP20303688A Pending JPH0251221A (en) 1988-08-15 1988-08-15 Apparatus for formation of semiconductor thin film

Country Status (1)

Country Link
JP (1) JPH0251221A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN108751127A (en) * 2018-05-28 2018-11-06 苏州大学 A method of large scale Ga drops are obtained based on MBE equipment in-situ low-temperatures

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN108751127A (en) * 2018-05-28 2018-11-06 苏州大学 A method of large scale Ga drops are obtained based on MBE equipment in-situ low-temperatures

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