JPH025084U - - Google Patents
Info
- Publication number
- JPH025084U JPH025084U JP8310488U JP8310488U JPH025084U JP H025084 U JPH025084 U JP H025084U JP 8310488 U JP8310488 U JP 8310488U JP 8310488 U JP8310488 U JP 8310488U JP H025084 U JPH025084 U JP H025084U
- Authority
- JP
- Japan
- Prior art keywords
- heater
- temperature
- heat generation
- control section
- evaluated
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 229910001120 nichrome Inorganic materials 0.000 claims description 2
- 230000020169 heat generation Effects 0.000 claims 2
- 238000011156 evaluation Methods 0.000 claims 1
Landscapes
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
- Testing Of Individual Semiconductor Devices (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP8310488U JPH025084U (xx) | 1988-06-22 | 1988-06-22 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP8310488U JPH025084U (xx) | 1988-06-22 | 1988-06-22 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPH025084U true JPH025084U (xx) | 1990-01-12 |
Family
ID=31307828
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP8310488U Pending JPH025084U (xx) | 1988-06-22 | 1988-06-22 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH025084U (xx) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2016211921A (ja) * | 2015-05-01 | 2016-12-15 | 株式会社ヒットデバイス | 電子部品の温度特性評価装置およびそれに用いられる温度制御ユニット |
-
1988
- 1988-06-22 JP JP8310488U patent/JPH025084U/ja active Pending
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2016211921A (ja) * | 2015-05-01 | 2016-12-15 | 株式会社ヒットデバイス | 電子部品の温度特性評価装置およびそれに用いられる温度制御ユニット |