JPH0249453A - Cap for semiconductor device - Google Patents

Cap for semiconductor device

Info

Publication number
JPH0249453A
JPH0249453A JP20067888A JP20067888A JPH0249453A JP H0249453 A JPH0249453 A JP H0249453A JP 20067888 A JP20067888 A JP 20067888A JP 20067888 A JP20067888 A JP 20067888A JP H0249453 A JPH0249453 A JP H0249453A
Authority
JP
Japan
Prior art keywords
cap
amorphous metal
semiconductor device
plate
thin plate
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP20067888A
Other languages
Japanese (ja)
Inventor
Takayuki Nakamoto
高行 中本
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
IWATA DENKO KK
Original Assignee
IWATA DENKO KK
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by IWATA DENKO KK filed Critical IWATA DENKO KK
Priority to JP20067888A priority Critical patent/JPH0249453A/en
Publication of JPH0249453A publication Critical patent/JPH0249453A/en
Pending legal-status Critical Current

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  • Thin Magnetic Films (AREA)

Abstract

PURPOSE:To protect data in a semiconductor device from accidental erasure by shielding the device from magnetism or electromagnetic waves by a method wherein a cap for a semiconductor device is a double structure of an amorphous metal thin plate and a thin substrate made of a crystalline material. CONSTITUTION:A cap A is a double structure of an amorphous metal thin plate 1 and a thin substrate 2 made of a crystalline material. The cap A is so designed as to detachably cover the upper surface and the circumference of a semiconductor device B, and for this purpose the four sides of the ceiling 3 of the cap A are bent down for the formation of side panes 4. The side panes 4 hold the entirety of the side walls 5 of the metal thin plate 1 by applying holders 7 which are side walls 6 of the thin substrate 2. At the ends of the shorter of the side panes 4, there are engaging sections 8 formed by press- forming the ends of the substrate 2 into jaws. This design shields a semiconductor device from magnetism and electromagnetic waves, protecting the data therein from accidental erasure.

Description

【発明の詳細な説明】 (産業上の利用分野) 本発明は半導体用キャップに関する。[Detailed description of the invention] (Industrial application field) The present invention relates to a semiconductor cap.

(従来の技術) たとえば遮光用カバーフィルムがあり、半導体における
窓に同カバーフィルムをマスクし、窓より紫外線が入ら
ぬようにして、プログラムされたデーターの内容が紫外
線で消去されないようにしている。
(Prior art) For example, there is a light-shielding cover film, which is used to mask the window of a semiconductor device to prevent ultraviolet rays from entering through the window, thereby preventing programmed data from being erased by ultraviolet rays.

(発明が解決しようとする問題点) ところで、半導体におけるプログラムされたデータの内
容は、磁気、電磁波によっても消去されてしまう問題が
あり、これら磁気、電磁波に対する対策が全くなされて
いないのが現状である。
(Problem to be Solved by the Invention) By the way, there is a problem that the content of data programmed in semiconductors can be erased by magnetic and electromagnetic waves, and at present no countermeasures have been taken against these magnetic and electromagnetic waves. be.

一方、非晶質材料のアモルファス金属はその優れた高透
磁性により半導体工場、lf子機器工場。
On the other hand, amorphous metal, which is an amorphous material, is used in semiconductor factories and IF device factories due to its excellent high magnetic permeability.

磁気計測研究施設などの建築物の磁気シールド材として
使用可能である。
It can be used as a magnetic shielding material for buildings such as magnetic measurement research facilities.

そこで、磁気シールドについて、建築物全体を磁気シー
ルド構造とする間接的な手法によろず、半導体そのもの
をアモルファス金属でカバーして、直接に磁気シールド
することが考えられる。
Therefore, regarding magnetic shielding, instead of using an indirect method in which the entire building has a magnetic shielding structure, it is possible to cover the semiconductor itself with an amorphous metal and provide direct magnetic shielding.

しかしながら、アモルファス金属の優れた特性の一つで
ある高強靭性および高硬度性が欠点として働いてしまう
問題がある。
However, there is a problem in that the high strength and toughness, which are one of the excellent properties of amorphous metals, and high hardness act as drawbacks.

すなわち、天板部と側板部そして掛合部を有するキャッ
プ形状に折り曲げ成形した場合、そのコーナーの屈曲部
分が裂損し易くなり、しかも内部応力が生じて透磁性お
よび耐食性が低下した。
That is, when the cap is bent and formed into a cap shape having a top plate, side plates, and a hooking part, the bent portions at the corners tend to tear and break, and internal stress is generated, resulting in a decrease in magnetic permeability and corrosion resistance.

又、これら透磁性および耐食性の低下を避けるため、そ
のコーナ部分をアールを持たせた曲げ程度に加工しよう
としても、優れた高強靭性によるスプリングバックが強
すぎるために、原形の板状に弾性復帰してしまい、キャ
ップ形状にならなかった。
In addition, in order to avoid deterioration of magnetic permeability and corrosion resistance, attempts were made to bend the corner portions with a radius, but the springback caused by the excellent high strength and toughness was too strong, making the original plate shape less elastic. It returned and did not take the cap shape.

又、板状のアモルファス金属を半導体における上面部中
に埋設することも考えられるが、そのプログラムされた
データーの内容を積極的に消去したい場合には、埋設さ
れているアモルファス金属が妨げとなり、しかも半導体
の側面が磁気、電磁波に対して無防備であるから消去の
心配が残り、結局、半導体を直接磁気シールドすること
は不可能であった。
It is also possible to bury a plate-shaped amorphous metal in the upper surface of the semiconductor, but if you want to actively erase the programmed data, the buried amorphous metal will be an obstacle. Since the sides of semiconductors are vulnerable to magnetic and electromagnetic waves, there remains a concern about erasure, and in the end, it was impossible to directly magnetically shield semiconductors.

そこで、発明者は、非晶質材料であるアモルファス金属
と結晶質材料を組合せることに着眼し、夫々キャップの
展開形状に型抜き成形したアモルファス金属薄板と結晶
質材料製の薄基板を接着して一体的に重合し、乾燥後に
プレスしてキャップ形状に成形した。
Therefore, the inventor focused on combining amorphous metal, which is an amorphous material, and crystalline material, and bonded an amorphous metal thin plate cut and formed into the expanded shape of the cap and a thin substrate made of crystalline material. The mixture was polymerized in one piece, dried, and then pressed to form a cap shape.

ところが、結晶質材料はその折り曲げ部が予測通りに所
望の異形状に塑性変形したのに対し、アモルファス金属
は長所である高強靭性が災いして折り曲げ部において接
着面から剥れてしまい、結果としてキャップ形状になら
なかった。
However, while the crystalline material plastically deforms into the desired irregular shape at the bend as predicted, the amorphous metal suffers from its high strength and toughness and peels off from the adhesive surface at the bend. It didn't take on a cap shape.

又、接着されたキャップは、結晶質材料の熱伸縮がアモ
ルファス金属に影響を及ぼして、アモルファスの軟磁性
や磁歪性等の特性が低下することを確認した。
In addition, it was confirmed that in the bonded cap, the thermal expansion and contraction of the crystalline material affects the amorphous metal, resulting in a decrease in the properties of the amorphous, such as soft magnetism and magnetostriction.

本発明はこのような事情に鑑みてなされたもので、その
目的とするところは、所望のキャップ形状をテしていて
且つ半導体に着脱自在であり、磁気、電磁波をシールド
することのできる半導体用キャップを提供しようとする
ものである。
The present invention was made in view of the above circumstances, and its purpose is to provide a cap for semiconductors that has a desired cap shape, is detachable from a semiconductor, and is capable of shielding magnetic and electromagnetic waves. It is intended to provide a cap.

(問題点を解決するための手段) 本発明の半導体用キャップでは、アモルファス金属薄板
と結晶質材料製薄基板との二重構造状で、天板部の四方
の折曲げ状の各側板部が、アモルファス金属薄板の側壁
部全体を薄基板の側壁部である把持部で挾み把持されて
いて、側板部の先端に顎状の掛合部が形成されたものと
したものである。
(Means for Solving the Problems) The semiconductor cap of the present invention has a double structure of an amorphous metal thin plate and a crystalline material thin substrate, and each of the four bent side plate portions of the top plate portion is , the entire side wall portion of the amorphous metal thin plate is sandwiched and held by gripping portions that are side wall portions of the thin substrate, and a jaw-shaped engaging portion is formed at the tip of the side plate portion.

本発明におけるアモルファス金属としては各種の合金が
挙げられ、又、電磁波のシールド効果を上げる銅メツキ
等しているものからも選択される。
The amorphous metal in the present invention includes various alloys, and is also selected from those coated with copper plating, etc., which enhances the electromagnetic wave shielding effect.

又、アモルファス金属薄板は二枚重ね以上の多層状のも
のであっても良く、シールド効率の向上に有効である。
Further, the amorphous metal thin plate may be in the form of two or more layers, which is effective in improving shielding efficiency.

結晶質材料としては塑性変形良好な金属が対象となるが
、一般金属に比べて透磁性、磁歪性、鉄損、^周波磁気
特性、!!場中の冷却効果が優れている高機能磁性薄鋼
板(但し、アモルファス金属と比べると一段劣る)たと
えばケイ素鋼板等が挙げられる。
The target crystalline materials are metals that have good plastic deformation, but compared to general metals, they have better magnetic permeability, magnetostriction, iron loss, ^frequency magnetic properties,! ! Examples of high-performance magnetic thin steel sheets that have excellent in-situ cooling effects (however, they are inferior to amorphous metals) include silicon steel sheets and the like.

(作用) 天板部、側板部、掛合部における結晶質材料製薄基板が
塑性変形していてキャップ形状を呈すると共にその把持
部がアモルファス金属薄板の側壁部全体を挾み把持して
、同キャップ形状にアモルファス金属薄板を保形してい
る。
(Function) The thin substrates made of crystalline material in the top plate, side plates, and hooking portions are plastically deformed and take on the shape of a cap, and their gripping portions sandwich and grip the entire side wall portion of the amorphous metal thin plate, thereby creating the same cap. The shape is held by an amorphous metal thin plate.

天板部および側板部における薄基板とアモルファス金y
A薄板とは相互に面方向に干渉しない重合関係になる。
Thin substrate and amorphous gold in the top and side panels
It has a superposition relationship with the A thin plate that does not interfere with each other in the plane direction.

(実施例) 以下図面を参照して本発明の実施の一例を詳細に説明す
る。
(Example) An example of implementation of the present invention will be described in detail below with reference to the drawings.

第1図乃至第4図には本発明の半導体用キャップを例示
しており、このキャップ(A)はアモルファス金属薄板
(1)と、結晶質材料製薄基板(2)との二重構造状の
もので、半導体(B)にその上面および周側面を覆うよ
うに被着可能に、天板部(3)の四方に側板部(4)を
夫々折曲げ形成している。
1 to 4 illustrate the semiconductor cap of the present invention, and this cap (A) has a double structure of an amorphous metal thin plate (1) and a crystalline material thin substrate (2). Side plate portions (4) are formed by bending on each side of the top plate portion (3) so as to be able to be attached to the semiconductor (B) so as to cover the upper surface and peripheral side surfaces thereof.

そして、各側板部(4)はアモルファス金R薄板(1)
における側壁部(5)全体を薄基板(2)の側壁部(6
)である把持部(7)で挾み把持してしている。具体的
には、プレスして、把持部(7)における外側部(7a
)を側壁部(5)面に折返して挾み把持し、この把持部
(7)を側壁部(5)ともども外側部(7a)先端を谷
部として折り曲げすることにより形成している。
Each side plate part (4) is made of amorphous gold R thin plate (1).
The entire side wall portion (5) of the thin substrate (2) is
) is held between the gripping parts (7). Specifically, the outer part (7a) of the grip part (7) is pressed.
) is folded back to the surface of the side wall (5) and held between them, and this gripping part (7) is formed by bending the tip of the outer part (7a) together with the side wall (5) as a valley.

又、半導体(B)におけるビン(B+ )が並列してい
る側面と対面する長辺側の側板部(4)はその下端がビ
ン(8+ )に触れない程度にする。
Further, the side plate portion (4) on the long side of the semiconductor (B) facing the side surface on which the bottles (B+) are arranged in parallel is designed to such an extent that its lower end does not touch the bottles (8+).

又、短辺側の側板部(4)先端には同先端部の薄基板(
2)部分を顎状にプレス成形することにより掛合部(8
)を形成している。
In addition, a thin substrate (
2) The engaging part (8
) is formed.

掛合部(8)は外側に伸びる指掛は部(9)を有してい
て、同指掛け3部(9)を側板部(4)に近づくように
押すことにより、半導体(B)に対して着脱し易くして
いる。
The engaging portion (8) has a finger hook portion (9) that extends outward, and by pushing the finger hook portion (9) closer to the side plate portion (4), it is attached to the semiconductor (B). Makes it easy to put on and take off.

第6図では他の実施例の半導体用キャップ(A)を例示
しており、このキャップ(A)は前記実施例のものと基
本的に同構成で、相違点は側板部(4)を、外側部(1
a)先端を山部として折り曲げ形成している。
FIG. 6 shows a semiconductor cap (A) according to another embodiment. This cap (A) has basically the same structure as that of the previous embodiment, and the difference is that the side plate part (4) is Outer part (1
a) The tip is bent to form a peak.

又、上記実施例において、掛合部(8)を短辺側の両側
面部(4)に形成したが、その片側にのみ形成する態様
とするも任意である。
Further, in the above embodiment, the engaging portions (8) are formed on both side surfaces (4) of the short side, but it is also possible to form them only on one side.

又、ビン(B+ )側の鋼板部(4)について、ビン(
B+ )位置の側板部分(10)がビン(B1)に触れ
ぬように離れた段違い状とするも良い。
Also, regarding the steel plate part (4) on the bottle (B+) side, the steel plate part (4) on the bottle (B+) side is
The side plate portion (10) at position B+) may be spaced apart so as not to touch the bottle (B1).

(第7図) (発明の効果) したがって本発明によれば次の利点がある。(Figure 7) (Effect of the invention) Therefore, the present invention has the following advantages.

■ 結晶質材料製W2N板とアモファス金属薄板との二
重構造状の天板部および鋼板部からなるキャップ形状を
呈していて、半導体をその上面および周側面から磁気、
電磁波をシールドすることができ、不用意にデーターの
内容が消去されてしまうような事故を解消することがで
きる。
■ It has a cap shape consisting of a top plate part and a steel plate part with a double structure of a W2N plate made of crystalline material and an amorphous metal thin plate, and the semiconductor is magnetically and
It can shield electromagnetic waves and eliminate accidents such as data being inadvertently erased.

■ 天板部および銅板部におけるアモルファス金WVI
J板と結晶質材料製i1基板とが相互に面に沿う方向に
干渉しない関係の二重構造状になっていることにより、
薄基板の熱伸縮がアモルファス金属におよばず、アモル
ファス金属の特性を維持して当初のシールド効果を持続
することができる。
■ Amorphous gold WVI in the top plate and copper plate
Due to the double structure in which the J plate and the i1 substrate made of crystalline material do not interfere with each other in the direction along the plane,
Thermal expansion and contraction of the thin substrate does not reach that of amorphous metal, and the characteristics of amorphous metal can be maintained and the original shielding effect can be maintained.

■ 各側板部の折曲げ部におけるアモルファス金属薄板
部分は必要最少限の屈曲角度状になっていて、同部分の
内部応力も僅かに生じるだけで、シールド効果にほとん
ど影響しない。
■ The amorphous metal thin plate portion at the bent portion of each side plate has the minimum required bending angle, and only a small amount of internal stress is generated in the same portion, which has almost no effect on the shielding effect.

■ アモルファス金属が半導体の熱を奪って放熱し且つ
外圧を防いで、半導体を保護することができる。
(2) The amorphous metal absorbs heat from the semiconductor, dissipates it, and protects the semiconductor by preventing external pressure.

■ 半導体に対して掛合部を掛脱して容易に着脱するこ
とができ、データーの内容の消去に際しては外して、自
在に消去することができる自在性がある。
(2) It can be easily attached and detached by attaching and detaching the hooking part to the semiconductor, and it has the flexibility of being detachable and erasing data at will.

【図面の簡単な説明】 第1図は本発明の半導体用キャップの一実施例を示す平
面図。第2図はl−1部断面図。第3図は第2図の(P
)矢視拡大断面図。第4図はrV−IV拡大断面図。第
5図はアモルファス金属薄板と薄基板の縮小斜視図。第
6図は他の実施例のキャップの部分拡大断面図。第7図
はその他の実施例のキャップの部分拡大断面図。第8図
は第1図に例示したキャップを半導体に被着した状態の
一部切欠して示す縮小斜視図である。 図中 (1)はアモルファス金属薄板 は結晶質材料製薄基板 は天板部 は側板部 (6)は側壁部 は把持部 は掛合部
BRIEF DESCRIPTION OF THE DRAWINGS FIG. 1 is a plan view showing an embodiment of the semiconductor cap of the present invention. FIG. 2 is a sectional view taken along line 1-1. Figure 3 is the (P) of Figure 2.
) Enlarged cross-sectional view in the direction of arrows. FIG. 4 is an enlarged sectional view of rV-IV. FIG. 5 is a reduced perspective view of an amorphous metal thin plate and a thin substrate. FIG. 6 is a partially enlarged sectional view of a cap of another embodiment. FIG. 7 is a partially enlarged sectional view of a cap of another embodiment. FIG. 8 is a partially cutaway, reduced perspective view showing the cap shown in FIG. 1 attached to a semiconductor. In the figure (1), the amorphous metal thin plate is made of a crystalline material.

Claims (1)

【特許請求の範囲】[Claims] アモルファス金属薄板と、結晶質材料製薄基板との二重
構造状で、天板部の四方の折曲げ状の各側板部が、アモ
ルファス金属薄板の側壁部全体を薄基板の側壁部である
把持部で挾み把持されていて、側板部の先端に顎状の掛
合部が形成された半導体用キャップ。
It has a double structure of an amorphous thin metal plate and a thin substrate made of a crystalline material, and each of the four bent side plates of the top plate grips the entire side wall of the amorphous metal thin plate, which is the side wall of the thin substrate. A cap for semiconductors that is held between two parts and has a jaw-like engaging part formed at the tip of the side plate part.
JP20067888A 1988-08-10 1988-08-10 Cap for semiconductor device Pending JPH0249453A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP20067888A JPH0249453A (en) 1988-08-10 1988-08-10 Cap for semiconductor device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP20067888A JPH0249453A (en) 1988-08-10 1988-08-10 Cap for semiconductor device

Publications (1)

Publication Number Publication Date
JPH0249453A true JPH0249453A (en) 1990-02-19

Family

ID=16428428

Family Applications (1)

Application Number Title Priority Date Filing Date
JP20067888A Pending JPH0249453A (en) 1988-08-10 1988-08-10 Cap for semiconductor device

Country Status (1)

Country Link
JP (1) JPH0249453A (en)

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH04116148U (en) * 1991-03-29 1992-10-16 井関農機株式会社 Controller protection device for mobile agricultural machinery
US5394014A (en) * 1990-11-28 1995-02-28 Mitsubishi Denki Kabushiki Kaisha Semiconductor device improved in light shielding property and light shielding package
DE4143494C2 (en) * 1990-11-28 1998-05-14 Mitsubishi Electric Corp Semiconductor device with reduced housing thickness and wt.
JP2008031648A (en) * 2006-07-26 2008-02-14 Miwa Lock Co Ltd Mounting structure of base with lock hole
JP2008291448A (en) * 2007-05-22 2008-12-04 Alpha Corp Handle device

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5394014A (en) * 1990-11-28 1995-02-28 Mitsubishi Denki Kabushiki Kaisha Semiconductor device improved in light shielding property and light shielding package
DE4143494C2 (en) * 1990-11-28 1998-05-14 Mitsubishi Electric Corp Semiconductor device with reduced housing thickness and wt.
JPH04116148U (en) * 1991-03-29 1992-10-16 井関農機株式会社 Controller protection device for mobile agricultural machinery
JP2537019Y2 (en) * 1991-03-29 1997-05-28 井関農機株式会社 Protective device for controller in mobile agricultural machine
JP2008031648A (en) * 2006-07-26 2008-02-14 Miwa Lock Co Ltd Mounting structure of base with lock hole
JP2008291448A (en) * 2007-05-22 2008-12-04 Alpha Corp Handle device

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