JPH0249452B2 - - Google Patents
Info
- Publication number
- JPH0249452B2 JPH0249452B2 JP57137324A JP13732482A JPH0249452B2 JP H0249452 B2 JPH0249452 B2 JP H0249452B2 JP 57137324 A JP57137324 A JP 57137324A JP 13732482 A JP13732482 A JP 13732482A JP H0249452 B2 JPH0249452 B2 JP H0249452B2
- Authority
- JP
- Japan
- Prior art keywords
- hydrogen concentration
- water
- change
- rate
- calculation circuit
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
- 229910052739 hydrogen Inorganic materials 0.000 claims description 58
- 239000001257 hydrogen Substances 0.000 claims description 58
- UFHFLCQGNIYNRP-UHFFFAOYSA-N Hydrogen Chemical compound [H][H] UFHFLCQGNIYNRP-UHFFFAOYSA-N 0.000 claims description 54
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 claims description 37
- 238000001514 detection method Methods 0.000 claims description 16
- 229910001338 liquidmetal Inorganic materials 0.000 claims description 4
- PXHVJJICTQNCMI-UHFFFAOYSA-N Nickel Chemical compound [Ni] PXHVJJICTQNCMI-UHFFFAOYSA-N 0.000 description 12
- 229910052708 sodium Inorganic materials 0.000 description 12
- 239000011734 sodium Substances 0.000 description 12
- DGAQECJNVWCQMB-PUAWFVPOSA-M Ilexoside XXIX Chemical compound C[C@@H]1CC[C@@]2(CC[C@@]3(C(=CC[C@H]4[C@]3(CC[C@@H]5[C@@]4(CC[C@@H](C5(C)C)OS(=O)(=O)[O-])C)C)[C@@H]2[C@]1(C)O)C)C(=O)O[C@H]6[C@@H]([C@H]([C@@H]([C@H](O6)CO)O)O)O.[Na+] DGAQECJNVWCQMB-PUAWFVPOSA-M 0.000 description 11
- 238000012545 processing Methods 0.000 description 8
- 239000012528 membrane Substances 0.000 description 6
- 229910052759 nickel Inorganic materials 0.000 description 6
- 238000010586 diagram Methods 0.000 description 4
- 150000002431 hydrogen Chemical class 0.000 description 4
- 238000000034 method Methods 0.000 description 4
- HEMHJVSKTPXQMS-UHFFFAOYSA-M Sodium hydroxide Chemical compound [OH-].[Na+] HEMHJVSKTPXQMS-UHFFFAOYSA-M 0.000 description 3
- 238000009792 diffusion process Methods 0.000 description 3
- NASFKTWZWDYFER-UHFFFAOYSA-N sodium;hydrate Chemical compound O.[Na] NASFKTWZWDYFER-UHFFFAOYSA-N 0.000 description 3
- 239000002184 metal Substances 0.000 description 2
- 229910052751 metal Inorganic materials 0.000 description 2
- 238000012544 monitoring process Methods 0.000 description 2
- 230000005856 abnormality Effects 0.000 description 1
- 238000007796 conventional method Methods 0.000 description 1
- 239000002826 coolant Substances 0.000 description 1
- 238000013461 design Methods 0.000 description 1
- 239000007788 liquid Substances 0.000 description 1
- 230000035699 permeability Effects 0.000 description 1
- 230000004043 responsiveness Effects 0.000 description 1
- 238000005070 sampling Methods 0.000 description 1
- 150000003385 sodium Chemical class 0.000 description 1
- 230000002123 temporal effect Effects 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
- G01M3/00—Investigating fluid-tightness of structures
- G01M3/02—Investigating fluid-tightness of structures by using fluid or vacuum
- G01M3/04—Investigating fluid-tightness of structures by using fluid or vacuum by detecting the presence of fluid at the leakage point
- G01M3/20—Investigating fluid-tightness of structures by using fluid or vacuum by detecting the presence of fluid at the leakage point using special tracer materials, e.g. dye, fluorescent material, radioactive material
- G01M3/22—Investigating fluid-tightness of structures by using fluid or vacuum by detecting the presence of fluid at the leakage point using special tracer materials, e.g. dye, fluorescent material, radioactive material for pipes, cables or tubes; for pipe joints or seals; for valves; for welds; for containers, e.g. radiators
- G01M3/226—Investigating fluid-tightness of structures by using fluid or vacuum by detecting the presence of fluid at the leakage point using special tracer materials, e.g. dye, fluorescent material, radioactive material for pipes, cables or tubes; for pipe joints or seals; for valves; for welds; for containers, e.g. radiators for containers, e.g. radiators
- G01M3/228—Investigating fluid-tightness of structures by using fluid or vacuum by detecting the presence of fluid at the leakage point using special tracer materials, e.g. dye, fluorescent material, radioactive material for pipes, cables or tubes; for pipe joints or seals; for valves; for welds; for containers, e.g. radiators for containers, e.g. radiators for radiators
Description
【発明の詳細な説明】
本発明は水漏洩検出装置に係り、特に液体金属
領域と水領域が存在する機器の水漏洩現象を検出
するための水漏洩検出装置に関する。DETAILED DESCRIPTION OF THE INVENTION The present invention relates to a water leak detection device, and more particularly to a water leak detection device for detecting a water leak phenomenon in a device in which a liquid metal region and a water region are present.
高速中性子型原子炉において、液体金属である
液体ナトリウムは優れた冷却材であるが、一方化
学的に極めて活性であるために、原子炉を用いた
原子力発電プラントにおいては、蒸気発生器の蒸
気管から水、水蒸気が漏洩してナトリウム−水反
応が発生した場合には大事故に発展する可能性が
大きく、この反応が生じた場合には早期に検出す
ることがプラント設計上不可欠であつた。 Liquid sodium, a liquid metal, is an excellent coolant in fast neutron reactors, but because it is chemically extremely active, it is used in steam pipes of steam generators in nuclear power plants using nuclear reactors. If a sodium-water reaction were to occur due to leakage of water or steam from the reactor, there is a high possibility that a major accident would develop, so early detection of this reaction was essential in plant design.
そこで従来は、蒸気発生器において、小規模な
水漏洩事故が発生した場合、水漏洩検出の最も好
適な手段として金属拡散模型水素検出法が採用さ
れてきた。 Therefore, conventionally, when a small-scale water leakage accident occurs in a steam generator, a metal diffusion model hydrogen detection method has been adopted as the most suitable means for detecting water leakage.
この検出法は、ニツケルのような水素透過係数
の大きい金属の膜を水素拡散膜として用い、ナト
リウムと漏洩水とが反応した際に生ずる水素を上
記拡散膜を通して真空中に導き、この水素濃度レ
ベルを監視することによつて水漏洩を検出するも
のである。 This detection method uses a metal membrane with a high hydrogen permeability coefficient, such as nickel, as a hydrogen diffusion membrane. Hydrogen, which is generated when sodium and leaked water react, is guided into a vacuum through the diffusion membrane, and the hydrogen concentration level Water leakage is detected by monitoring the water leakage.
第１図に従来の水漏洩検出装置の全体構成図を
示す。ナトリウム系１を流れるナトリウムは、蒸
気発生器２（蒸発器および過熱器）において水蒸
気系３と配管により遮断されており、ナトリウム
の一部の任意の流量が電磁ポンプ５によつて蒸気
発生器２の出口から弁４ａ、電磁流量計６、加熱
器７を通して検出部８に導かれ、その後、弁４ｂ
を通して元のナトリウムループに戻るようになつ
ている。電磁流量計６はこのナトリウムサンプリ
ング流量を測定するものである。検出部８内には
ニツケル膜９が設置されており、ニツケル膜９の
内側をナトリウムが流れ、外側は真空ポンプ１１
により真空状態に保たれている。 FIG. 1 shows an overall configuration diagram of a conventional water leak detection device. The sodium flowing through the sodium system 1 is cut off from the steam system 3 by piping at the steam generator 2 (evaporator and superheater), and a certain flow rate of a part of the sodium is supplied to the steam generator 2 by an electromagnetic pump 5. from the outlet of the valve 4b through the valve 4a, the electromagnetic flowmeter 6, and the heater 7, and then the valve 4b.
It is designed to return to the original sodium loop through the sodium loop. The electromagnetic flowmeter 6 measures this sodium sampling flow rate. A nickel membrane 9 is installed inside the detection unit 8, sodium flows inside the nickel membrane 9, and a vacuum pump 11 is installed outside the nickel membrane 9.
is kept in a vacuum state.
この状態において水漏洩が蒸気発生器２内で発
生するとナトリウム−水反応を起こす。 If water leaks in the steam generator 2 in this state, a sodium-water reaction will occur.
Na＋H2O→NaOH＋1/2H2↑
このナトリウム−水反応によつて発生する水素
は、ナトリウムと共に弁４ａ、電磁ポンプ５、電
磁流量計６、加熱器７を通り、検出部８内に達し
た後、検出部８内のニツケル膜９を透過して真空
計１０に出てくる。このようにして真空系１０に
導かれた水素を用いて、ゲージ１２、真空計１３
で検出される真空度により水素の濃度が測定さ
れ、この水素濃度出力１４が信号処理装置１５に
より処理される。 Na+H 2 O→NaOH+1/2H 2 ↑ Hydrogen generated by this sodium-water reaction passes through the valve 4a, electromagnetic pump 5, electromagnetic flowmeter 6, and heater 7 together with sodium, and after reaching the detection part 8. , passes through the nickel film 9 in the detection section 8 and comes out to the vacuum gauge 10. Using the hydrogen introduced into the vacuum system 10 in this way, the gauge 12 and the vacuum gauge 13 are
The concentration of hydrogen is measured based on the degree of vacuum detected by the sensor, and this hydrogen concentration output 14 is processed by a signal processing device 15.
従来はこの水素濃度出力を信号処理装置１５
で、警報設定値及びトリツプ設定値と比較し、
各々の設定値を超えた場合に、警報信号及びトリ
ツプ信号を出力していた。 Conventionally, this hydrogen concentration output was processed by the signal processing device 15.
and compare it with the alarm set value and trip set value,
When each set value was exceeded, an alarm signal and a trip signal were output.
このような従来技術における水漏洩検出装置に
おいては、警報出力信号１６及びトリツプ出力信
号１７は各々予め定められた設定値を越えるか越
えないかによつて左右されるために、瞬時的な電
気的ノイズ、水素濃度のバツクグラウンドの変動
及びナトリウム流量、温度等のプロセス量の変化
等により濃度出力１４が変動することによつて警
報設定値またはトリツプ設定値に達すると、実質
上は水素濃度が増大していないにも拘らず、警報
出力信号又はトリツプ出力信号が誤信号として出
力されるという欠点があつた。また、ごく小規模
の水漏洩が生じた場合、水素濃度出力の変化が極
めてゆつくりとなり、警報設定値及びトリツプ設
定値に達するまでに非常に長い時間がかかるとい
う欠点があつた。これらの従来技術における欠点
は原子力発電プラントの運転上、機器の異常監視
としては信頼性、応答性の点で大きな問題であつ
た。 In such a conventional water leak detection device, the alarm output signal 16 and the trip output signal 17 depend on whether or not each exceeds a predetermined set value, so instantaneous electrical noise is generated. When the concentration output 14 reaches the alarm set value or trip set value due to fluctuations in the background of the hydrogen concentration and changes in process quantities such as sodium flow rate and temperature, the hydrogen concentration essentially increases. However, there is a drawback that the alarm output signal or trip output signal is output as an erroneous signal even though the alarm output signal or trip output signal is not detected. Another disadvantage is that when a very small water leak occurs, the hydrogen concentration output changes very slowly, and it takes a very long time to reach the alarm and trip settings. These shortcomings in the conventional techniques have caused major problems in terms of reliability and responsiveness when it comes to operating nuclear power plants and monitoring equipment abnormalities.
本発明の目的は、蒸気発生器における水漏洩
を、早期にかつ誤信号を発することのない高い信
頼性で検出することのできる水漏洩検出装置を提
供することにある。 An object of the present invention is to provide a water leakage detection device that can detect water leakage in a steam generator early and with high reliability without generating false signals.
本発明は、経時的に変化のある水素濃度のデー
タを、信号処理装置で前処理した後、水素濃度の
変化率を算出し、その変化率が予め定めた変化率
設定値を越えたかどうかの判定を行い、ある規定
時間内に存在する上記判定結果の総数のうち、変
化率設定値を越えた判定結果の総和が、規定した
割合以上あるかで水漏洩の有無を判定することに
より水漏洩を早期にかつ高い信頼性で検出するこ
とができることを特徴とした検出方式である。 The present invention preprocesses hydrogen concentration data that changes over time using a signal processing device, calculates the rate of change in hydrogen concentration, and determines whether the rate of change exceeds a predetermined change rate setting value. Water leakage is detected by determining the presence or absence of water leakage based on whether the total number of determination results that exceed the change rate setting value exceeds a specified percentage of the total number of determination results that exist within a certain specified time. This detection method is characterized by its ability to detect early and with high reliability.
以下、本発明の一実施例を第２図と第３図によ
り説明する。 An embodiment of the present invention will be described below with reference to FIGS. 2 and 3.
真空計１３よりの水素濃度出力１４を、ある時
間内（本実施例ではΔTと仮定する）に、ある一
定周期（本実施例ではΔT／ｈと仮定する）でｎ
回、信号処理装置１５に取り込む。信号処理装置
１５は、水素濃度計算回路１８、水素濃度変化率
計算回路１９、水漏洩判定回路２０より構成され
る。まず水素濃度計算回路１８では、取り込んだ
水素濃度出力１４を信号処理し、ΔT間の平均水
素濃度を計算する。この信号処理とは、例えば
ΔT間の水素濃度信号C11，C12，……，C1oの平均
値を平均水素濃度C1とするケース、
C1＝C11＋C12＋……＋C1o／ｎ
C11，C12，……，C1oのうち、高い方の値から
順にｋ個、低い方の値から順にｋ個除いたものの
平均値を平均水素濃度C1とするケース等が考え
られる。上記方式により得られた時間ＴからＴ＋
ΔT間の平均水素濃度をC1、時間Ｔ＋ΔTからＴ
＋2ΔT間の平均水素濃度をC2、……、時間Ｔ＋
12ΔTからＴ＋13ΔT間の平均水素濃度をC13と仮
定する。 The hydrogen concentration output 14 from the vacuum gauge 13 is calculated as n within a certain period (assumed to be ΔT in this embodiment) and at a certain period (assumed to be ΔT/h in this embodiment).
times, the signal is taken into the signal processing device 15. The signal processing device 15 includes a hydrogen concentration calculation circuit 18, a hydrogen concentration change rate calculation circuit 19, and a water leakage determination circuit 20. First, the hydrogen concentration calculation circuit 18 processes the input hydrogen concentration output 14 and calculates the average hydrogen concentration during ΔT. This signal processing is, for example, a case where the average value of the hydrogen concentration signals C 11 , C 12 , ..., C 1o during ΔT is set as the average hydrogen concentration C 1 , C 1 = C 11 + C 12 + ... + C 1o / A case may be considered in which the average hydrogen concentration C 1 is the average value of n C 11 , C 12 , ..., C 1o , by removing k values in order from the highest value and k values in order from the lowest value. . From the time T obtained by the above method to T+
C 1 is the average hydrogen concentration during ΔT, and time T + ΔT to T
The average hydrogen concentration during +2ΔT is C 2 , ..., time T+
Assume that the average hydrogen concentration between 12ΔT and T+13ΔT is C 13 .
水素濃度変化率計算回路１９では、平均水素濃
度C1、C2、……、Coより、ある時間間隔（本実
施例ではaΔTとする）での水素濃度の変化率
ΔCo+a＝Co+a−Co／aΔT
を計算する。その時点で得られた平均水素濃度
と、それよりaΔT前の時点での平均水素濃度を
比較し、aΔT間にどれほど水素濃度が変化した
かを順次求める。このようにして得られた平均水
素濃度C1を基準にしたaΔT間の水素濃度変化率
をΔC1、平均水素濃度C2を基準にしたaΔT間の
水素濃度変化率をΔC2、……、平均水素濃度C13
を基準にしたaΔT間の水素濃度変化率をΔC13と
仮定する。 The hydrogen concentration change rate calculation circuit 19 calculates the rate of change in hydrogen concentration in a certain time interval (in this example, aΔT ) from the average hydrogen concentrations C 1 , C 2 , ..., C o ΔC o+a = C Calculate o+a −C o /aΔT. The average hydrogen concentration obtained at that point in time is compared with the average hydrogen concentration at a point aΔT before that point, and how much the hydrogen concentration has changed during aΔT is sequentially determined. The rate of change in hydrogen concentration between aΔT based on the average hydrogen concentration C 1 obtained in this way is ΔC 1 , and the rate of change in hydrogen concentration between aΔT based on the average hydrogen concentration C 2 is ΔC 2 ,... Average hydrogen concentration C 13
Assume that the rate of change in hydrogen concentration between aΔT and ΔC is 13 .
水漏洩判定回路２０では、水素濃度変化率
ΔC1、ΔC2、……、ΔCoとその変化率に対する警
報設定値あるいはトリツプ設定値との比較を行
い、設定値を超えたかどうか判定すると同時に、
ある規定時間内に存在する判定結果の総数のう
ち、変化率設定値を越えた判定結果の総和が、規
定した割合以上であるかどうかで水漏洩の有無を
判定する。第３図では、水素濃度変化率と設定変
化率を比較した結果を次のように仮定する。 The water leakage determination circuit 20 compares the rate of change in hydrogen concentration ΔC 1 , ΔC 2 , .
The presence or absence of water leakage is determined based on whether or not the sum of the determination results that exceed the change rate setting value out of the total number of determination results that exist within a certain prescribed time is equal to or greater than a prescribed percentage. In FIG. 3, the results of comparing the rate of change in hydrogen concentration and the set rate of change are assumed as follows.
ただし 水素濃度変化率＜設定変化率……０ 水素濃度変化率＞設定変化率……１ とする。 however Hydrogen concentration change rate < Setting change rate...0 Hydrogen concentration change rate > Setting change rate...1 shall be.
ΔC1……０、ΔC2……０、ΔC3……０
ΔC4……１、ΔC5……０、ΔC6……０
ΔC7……１、ΔC8……１、ΔC9……０
ΔC10……１、ΔC11……１、ΔC12……１
ΔC13……１
上記ケースにおいて、多数決論理として３回の
うち２回以上が“１”と判定された場合に水漏洩
が生じたと判断する例を示す。ΔC 1 …0, ΔC 2 …0, ΔC 3 …0 ΔC 4 …1, ΔC 5 …0, ΔC 6 …0 ΔC 7 …1, ΔC 8 …1, ΔC 9 … 0 ΔC 10 …1, ΔC 11 …1, ΔC 12 …1 ΔC 13 …1 In the above case, if two or more out of three times are determined to be “1” based on majority logic, water leakage will occur. An example of determining that this has occurred is shown below.
ΔC1、ΔC2、ΔC3……０、０、０→無
ΔC2、ΔC3、ΔC4……０、０、１→無
ΔC3、ΔC4、ΔC5……０、１、０→無
ΔC4、ΔC5、ΔC6……１、０、０→無
ΔC5、ΔC6、ΔC7……０、０、１→無
ΔC6、ΔC7、ΔC8……０、１、１→有
ΔC7、ΔC8、ΔC9……１、１、０→有
ΔC8、ΔC9、ΔC10……１、０、１→有
ΔC9、ΔC10、ΔC11……０、１、１→有
ΔC10、ΔC11、ΔC12……１、１、１→有
ΔC11、ΔC12、ΔC13……１、１、１→有
本ケースにおいては、時刻Ｔ＋7ΔTに水漏洩
発生が検出される。ΔC 1 , ΔC 2 , ΔC 3 ...0, 0, 0 → No ΔC 2 , ΔC 3 , ΔC 4 ...0, 0, 1 → No ΔC 3 , ΔC 4 , ΔC 5 ...0, 1, 0 → No ΔC 4 , ΔC 5 , ΔC 6 ... 1, 0, 0 → No ΔC 5 , ΔC 6 , ΔC 7 ...0, 0, 1 → No ΔC 6 , ΔC 7 , ΔC 8 ...0, 1, 1 → ΔC 7 , ΔC 8 , ΔC 9 ... 1, 1, 0 → ΔC 8 , ΔC 9 , ΔC 10 ... 1, 0, 1 → ΔC 9 , ΔC 10 , ΔC 11 ... 0, 1, 1 → present ΔC 10 , ΔC 11 , ΔC 12 ... 1, 1, 1 → present ΔC 11 , ΔC 12 , ΔC 13 ... 1, 1, 1 → present In this case, water leak occurrence was detected at time T+7ΔT be done.
本発明によれば、水素濃度変化率が設定変化率
を超えた回数の多数決論理を取ることにより、水
漏洩の有無を判定するため、変化率を計算する時
間間隔に応じて、極めて小規模の水漏洩から大規
模の水漏洩を検出できると同時に、瞬時的な電気
的ノイズ、水素濃度のバツクグラウンドの変動及
びプロセス量変化による濃度出力の変動に対して
も誤まつた警報信号やトリツプ信号の発信を防止
することができる。 According to the present invention, the presence or absence of water leakage is determined by taking majority logic of the number of times the rate of change in hydrogen concentration exceeds a set rate of change. It is possible to detect large-scale water leaks from water leaks, and at the same time, it can prevent false alarm signals and trip signals from instantaneous electrical noise, background fluctuations in hydrogen concentration, and fluctuations in concentration output due to changes in process volume. It is possible to prevent outgoing calls.
第１図は従来の水漏洩検出装置の全体構成図を
示す。第２図は本発明の実施例である信号処理装
置の構成図、第３図は水素濃度データと水素濃度
変化率、水漏洩判定結果の時間的変化の関係図を
示す。
１……ナトリウム系、２……蒸気発生器、３…
…水蒸気系、４ａ，４ｂ……弁、５……電磁ポン
プ、６……電磁流量計、７……加熱器、８……検
出部、９……ニツケル膜、１０……真空系、１１
……真空ポンプ、１２……ゲージ、１３……真空
計、１４……水素濃度出力、１５……信号処理装
置、１６……警報出力信号、１７……トリツプ出
力信号、１８……水素濃度計算回路、１９……水
素濃度変化率計算回路、２０……水漏洩判定回
路。
FIG. 1 shows an overall configuration diagram of a conventional water leak detection device. FIG. 2 is a block diagram of a signal processing device according to an embodiment of the present invention, and FIG. 3 is a diagram showing the relationship between hydrogen concentration data, hydrogen concentration change rate, and temporal changes in water leak determination results. 1...Sodium system, 2...Steam generator, 3...
...Water vapor system, 4a, 4b... Valve, 5... Electromagnetic pump, 6... Electromagnetic flow meter, 7... Heater, 8... Detection section, 9... Nickel film, 10... Vacuum system, 11
... Vacuum pump, 12 ... Gauge, 13 ... Vacuum gauge, 14 ... Hydrogen concentration output, 15 ... Signal processing device, 16 ... Alarm output signal, 17 ... Trip output signal, 18 ... Hydrogen concentration calculation Circuit, 19...Hydrogen concentration change rate calculation circuit, 20...Water leakage determination circuit.
Claims (1)
領域から液体金属領域への水漏洩を水素濃度出力
によつて検出する水漏洩検出装置において、経時
的に変化のある各水素濃度出力のデータを平均化
処理する水素濃度計算回路と、その平均化処理し
た平均水素濃度の変化率を一定時間間隔で計算す
る水素濃度変化率計算回路と、その変化率が予め
定めた変化率設定値を越えたかどうかの判断を行
い、ある規定時間内に存在する上記判断結果の総
数のうち、変化率設定値を越えた判定結果の総和
が、規定した割合以上あるかどうかで水漏洩の有
無を判断する水漏洩判定回路とを備えたことを特
徴とする水漏洩検出装置。1. Data on each hydrogen concentration output that changes over time in a water leak detection device that detects water leakage from the water region to the liquid metal region of a device in which a liquid metal region and a water region exist by hydrogen concentration output. a hydrogen concentration calculation circuit that averages the average hydrogen concentration, a hydrogen concentration change rate calculation circuit that calculates the rate of change of the averaged hydrogen concentration at fixed time intervals, and a hydrogen concentration change rate calculation circuit that calculates the rate of change of the averaged hydrogen concentration at fixed time intervals; The presence or absence of water leakage is determined based on whether or not the total number of judgment results that exceed the change rate setting value exceeds a specified percentage out of the total number of judgment results that exist within a certain specified time. A water leak detection device comprising a water leak determination circuit.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP57137324A JPS5927235A (en) | 1982-08-09 | 1982-08-09 | Apparatus for detecting water leakage |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP57137324A JPS5927235A (en) | 1982-08-09 | 1982-08-09 | Apparatus for detecting water leakage |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS5927235A JPS5927235A (en) | 1984-02-13 |
| JPH0249452B2 true JPH0249452B2 (en) | 1990-10-30 |
Family
ID=15196010
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP57137324A Granted JPS5927235A (en) | 1982-08-09 | 1982-08-09 | Apparatus for detecting water leakage |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS5927235A (en) |
-
1982
- 1982-08-09 JP JP57137324A patent/JPS5927235A/en active Granted
Also Published As
| Publication number | Publication date |
|---|---|
| JPS5927235A (en) | 1984-02-13 |
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