JPH0248624B2 - - Google Patents

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Publication number
JPH0248624B2
JPH0248624B2 JP62168977A JP16897787A JPH0248624B2 JP H0248624 B2 JPH0248624 B2 JP H0248624B2 JP 62168977 A JP62168977 A JP 62168977A JP 16897787 A JP16897787 A JP 16897787A JP H0248624 B2 JPH0248624 B2 JP H0248624B2
Authority
JP
Japan
Prior art keywords
vacuum chamber
cathode
film
sputtering
film forming
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP62168977A
Other languages
Japanese (ja)
Other versions
JPS6415368A (en
Inventor
Ichiro Araki
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
TOTSUKI KK
Original Assignee
TOTSUKI KK
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by TOTSUKI KK filed Critical TOTSUKI KK
Priority to JP16897787A priority Critical patent/JPS6415368A/en
Publication of JPS6415368A publication Critical patent/JPS6415368A/en
Publication of JPH0248624B2 publication Critical patent/JPH0248624B2/ja
Granted legal-status Critical Current

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Description

【発明の詳細な説明】 〔産業上の利用分野〕 本発明は基材に物質の成膜を行うスパツタリン
グ装置に関するものである。
DETAILED DESCRIPTION OF THE INVENTION [Field of Industrial Application] The present invention relates to a sputtering apparatus for forming a film of a substance on a substrate.

〔従来の技術〕[Conventional technology]

従来スパツタリングにより、成膜を行う場合、
第1図に示すようなスパツタリング装置が使用さ
れている。
When forming a film by conventional sputtering,
A sputtering device as shown in FIG. 1 is used.

このスパツタリング装置は真空室1内の底部に
ターゲツト材5と磁石2とよりなる陰極6を配置
し、この陰極6上方の真空室1の天井部に回転板
3を設けた構造で、この回転板3下面に基材4を
固定し、この回転板3を回転させて、成膜しよう
とする陰極6の真上に停止させた上、陰極6から
陽イオンの衝撃によりたたき出された物質を基材
4に飛散させてそれぞれの位置において成膜を行
つているものである。
This sputtering apparatus has a structure in which a cathode 6 consisting of a target material 5 and a magnet 2 is arranged at the bottom of a vacuum chamber 1, and a rotating plate 3 is provided on the ceiling of the vacuum chamber 1 above the cathode 6. A base material 4 is fixed on the lower surface of the substrate 3, and the rotary plate 3 is rotated and stopped directly above the cathode 6 on which a film is to be formed. The film is formed by scattering it onto the material 4 at each location.

しかし、この従来の構造の場合、陰極6を複数
取り付けようとした時、真空室1の容積が大きく
なり、それだけ装置自体が大型化し、場所を取る
欠点があつたり、また真空室1を排気するために
大型の真空ポンプを使用しなければならず、価格
も高くなつてしまう欠点がある。
However, in the case of this conventional structure, when attempting to attach multiple cathodes 6, the volume of the vacuum chamber 1 increases, which increases the size of the device itself, which has the drawback of taking up space, and also requires the vacuum chamber 1 to be evacuated. Therefore, a large vacuum pump must be used, which has the drawback of increasing the price.

更に排気時間が長くなり、それだけ作業性に劣
る欠点もあつた。
Furthermore, the evacuation time was longer, and the workability was correspondingly lower.

〔発明が解決しようとする問題点〕[Problem that the invention seeks to solve]

本発明はかかる欠点を解決したもので、装置自
体が小さくなり、真空ポンプも小型のものを使用
することが出来て安価な装置になり、また排気時
間も短縮されて成膜作業の能率がアツプしたスパ
ツタリング装置を提供することになる。
The present invention solves these drawbacks; the device itself is smaller, a smaller vacuum pump can be used, making the device cheaper, and the evacuation time is shortened, increasing the efficiency of film-forming work. The present invention provides a sputtering device that has the following features.

〔問題点を解決するための手段〕[Means for solving problems]

真空状態において、陰極aから陽イオンの衝撃
によりたたき出された物質を基材12表面に飛散
させて基材12表面に成膜を行うスパツタリング
装置において、真空室13の中に複数の陰極aを
円周上に配置した回転板14を設け、この回転板
14の天井部に成膜室15を開口連設する。
In a sputtering device that forms a film on the surface of a base material 12 by scattering substances ejected from the cathode a by the impact of cations onto the surface of the base material 12 in a vacuum state, a plurality of cathodes a are placed in a vacuum chamber 13. A rotating plate 14 arranged on the circumference is provided, and a film forming chamber 15 is opened and connected to the ceiling of the rotating plate 14.

〔作用〕[Effect]

真空室13内を低圧状態にして、回転板14を
回転させて陰極aを成膜室15内に設けられてい
る基材12の真下に停止させる。
The inside of the vacuum chamber 13 is brought into a low pressure state, and the rotating plate 14 is rotated to stop the cathode a directly below the base material 12 provided in the film forming chamber 15.

この状態で陰極aから陽イオンの衝撃によりた
たき出された物質を基材12表面に飛散させて基
材12表面に第一層目の成膜を行う。
In this state, the substance ejected from the cathode a by the impact of cations is scattered onto the surface of the base material 12 to form a first layer on the surface of the base material 12.

成膜終了後、回転板14を回転させて次の陰極
aを基材12の真下に停止させた状態で第二層目
の成膜を行う。
After the film formation is completed, the rotary plate 14 is rotated to form the second layer while the next cathode a is stopped directly below the base material 12.

この操作を繰り返す事により基材12表面に多
層膜を形成することが出来る。
By repeating this operation, a multilayer film can be formed on the surface of the base material 12.

第4図の場合には、回転板14を回転させてタ
ーゲツト材11を磁石10真上に停止させるとタ
ーゲツト材11と磁石10とにより陰極aが形成
され、この陰極aから陽イオンの衝撃により叩き
出された物質を基材12表面に飛散させて成膜を
行う。
In the case of FIG. 4, when the rotary plate 14 is rotated to stop the target material 11 directly above the magnet 10, the target material 11 and the magnet 10 form a cathode a, and from this cathode a, the cathode a is bombarded with cations. The ejected substance is scattered onto the surface of the base material 12 to form a film.

多層膜の場合にはこの上記操作を繰り返して成
膜を行う。
In the case of a multilayer film, the above operation is repeated to form the film.

〔実施例〕〔Example〕

第2図は、回転板14の中心に回転導入軸16
を真空シール17を介して真空室13底部中心に
軸受支承し、この回転導入軸16に回転機構18
を設けている。
FIG. 2 shows a rotation introduction shaft 16 at the center of the rotation plate 14.
is supported by a bearing at the center of the bottom of the vacuum chamber 13 via a vacuum seal 17, and a rotation mechanism 18 is attached to this rotation introduction shaft 16.
has been established.

この回転板14は第5図に示すような円形状の
ものでも良いし、第6図に示すように十文字状の
ものでも良く、第5図の場合は、陰極aを円周上
に一定の間隔を置いて設け、第6図の場合は、陰
極aを夫々の先端部に設けている。
This rotating plate 14 may be circular as shown in FIG. 5, or cross-shaped as shown in FIG. 6. In the case of FIG. They are provided at intervals, and in the case of FIG. 6, a cathode a is provided at the tip of each.

この真空室14の一側に電源導入端子19を陰
極aに対して接離自在に設け、この電源導入端子
19に電源20を接続している。
A power supply terminal 19 is provided on one side of the vacuum chamber 14 so as to be able to come into contact with and separate from the cathode a, and a power supply 20 is connected to this power supply terminal 19.

この回転導入軸16にロータリジヨイント21
を設け、このロータリジヨイント21より陰極a
に冷却を送水して陰極aを冷却する場合を図示し
ている。
A rotary joint 21 is attached to this rotation introduction shaft 16.
is provided, and from this rotary joint 21 the cathode a
The figure shows a case where the cathode a is cooled by supplying water for cooling.

また真空室13に真空ポンプが連設される排気
口22とガスが導入されるガス導入口23とが設
けられている。
Further, the vacuum chamber 13 is provided with an exhaust port 22 to which a vacuum pump is connected and a gas inlet 23 to which gas is introduced.

この真空室13の天井部13a一側に基材12
を収納保持する成膜室15を開口連設し、この成
膜室15の開口部真下にシヤツター24を水平回
動自在に設け、図中25はそのハンドル、26は
基材12を着脱自在に取り付ける治具、27は蓋
である。
A base material 12 is placed on one side of the ceiling 13a of this vacuum chamber 13.
A shutter 24 is provided directly below the opening of the film forming chamber 15 so as to be horizontally rotatable. The attachment jig 27 is a lid.

第3図は真空室13の天井部13aの両側に成
膜室15を設けて同時に2基材12の成膜を行う
場合を図示しているが、更に成膜室15を数を増
やすことにより、同時に複数の基材12に成膜を
行うことが出来る。
FIG. 3 shows a case in which film forming chambers 15 are provided on both sides of the ceiling 13a of the vacuum chamber 13 to form films on two substrates 12 at the same time, but by further increasing the number of film forming chambers 15, , it is possible to form films on a plurality of base materials 12 at the same time.

第4図の陰極aはターゲツト材11に直接磁石
10を設けないで、真空室13底部に固定し、回
転板14を回転させてターゲツト材11を磁石1
0の真上に停止させてターゲツト材11と磁石1
0とにより陰極aを形成させた時にスパツタリン
グを行う場合を図示している。
The cathode a in FIG. 4 is fixed to the bottom of the vacuum chamber 13 without directly attaching the magnet 10 to the target material 11, and by rotating the rotary plate 14, the target material 11 is attached to the magnet 1.
0, target material 11 and magnet 1.
The figure shows the case where sputtering is performed when the cathode a is formed using 0 and 0.

この場合も、第2,3図と同様に回転導入軸1
6にロータリジヨイント21を設け、このロータ
リジヨイント21により冷却水をターゲツト材1
1裏側に送水して冷却するようにする。
In this case as well, the rotation introducing shaft 1
6 is provided with a rotary joint 21, and this rotary joint 21 supplies the cooling water to the target material 1.
1 Supply water to the back side to cool it down.

電源20と回転導入軸16とを接続してターゲ
ツト材11に伝達する場合を図示している。(2
8は絶縁部、29はシールド板) 〔発明の効果〕 本発明は上述の様に構成したから次の様な特長
を有するものである。
A case is illustrated in which the power source 20 and the rotation introduction shaft 16 are connected to transmit the rotation to the target material 11. (2
8 is an insulating part, 29 is a shield plate) [Effects of the Invention] Since the present invention is configured as described above, it has the following features.

1 従来のスパツタリング装置は第1図に示すよ
うに真空室1内の底部に陰極6を配置し、この
陰極6上方の真空室1の天上部に回転板3を設
けた構造で、この回転板3下面に基材4を固定
し、この回転板3を回転させて、成膜しようと
する陰極6の真上に停止させた上、陰極6から
陽イオンの衝撃によりたたき出された物質を基
材4に飛散させてそれぞれの位置において成膜
を行うものであるから陰極6を多数取り付けよ
うとした時、真空室1の容積が大きくなり、そ
れだけ装置自体が大型化し、場所を取る欠点が
あつたり、また真空室1を排気するために大型
の真空ポンプを使用しなければならず、価格も
高くなつてしまう欠点がある。
1 As shown in Fig. 1, a conventional sputtering device has a structure in which a cathode 6 is placed at the bottom of a vacuum chamber 1, and a rotating plate 3 is provided at the top of the vacuum chamber 1 above this cathode 6. A base material 4 is fixed to the lower surface of 3, and the rotary plate 3 is rotated and stopped directly above the cathode 6 on which a film is to be formed. Since the film is formed by scattering onto the material 4 and forming a film at each position, when a large number of cathodes 6 are attached, the volume of the vacuum chamber 1 increases, which increases the size of the device itself, which has the drawback of taking up space. Furthermore, a large-sized vacuum pump must be used to evacuate the vacuum chamber 1, resulting in an increase in cost.

更に排気時間が長くなり、それだけ作業性に
劣る欠点もあつた。
Furthermore, the evacuation time was longer, and the workability was correspondingly lower.

この点本発明は、真空室13と成膜室15と
を別々にしたから真空室13自体を非常に小型
することが出来、このため装置自体が小さくな
り、真空ポンプを排気能力が小さな小型のもの
を使用することが出来、また短時間で十分に低
い圧力が得られるから作業能率が向上すること
になる。
In this regard, in the present invention, since the vacuum chamber 13 and the film forming chamber 15 are separated, the vacuum chamber 13 itself can be made very small, and therefore the device itself can be made small. Since a sufficiently low pressure can be obtained in a short period of time, work efficiency is improved.

2 この真空室13の中に複数の陰極aを円周上
に配置した回転板14を設けたから回転板14
を回転させて陰極aを成膜室15の真下に位置
させて順次スパツタリングを行うことによりタ
ーゲツト材11や基材12を大気にさらすこと
なく複数層の成膜を行うことが出来、極めて作
業能率の向上を高めることになる。
2 Since a rotary plate 14 with a plurality of cathodes a arranged on the circumference is provided in this vacuum chamber 13, the rotary plate 14
By rotating the cathode a and positioning it directly below the film forming chamber 15 and sequentially performing sputtering, multiple layers can be formed without exposing the target material 11 and the base material 12 to the atmosphere, resulting in extremely high work efficiency. This will increase the improvement of

3 第3図に示すように成膜室15を複数設ける
ことにより同時に複数の基材12に対して同時
に成膜を行うことが出来るから一層成膜作業が
能率がアツプすることになる。
3 As shown in FIG. 3, by providing a plurality of film forming chambers 15, it is possible to simultaneously form films on a plurality of substrates 12, thereby further increasing the efficiency of the film forming process.

4 第4図に示すようにターゲツト材11と磁石
10を離して磁石10を真空室13底部に固定
しているから成膜する物質を変えることにより
ターゲツト材11のみを変換することが出来る
から極めて便利であり、また経済的である。
4 As shown in Fig. 4, since the target material 11 and the magnet 10 are separated and the magnet 10 is fixed at the bottom of the vacuum chamber 13, it is possible to convert only the target material 11 by changing the substance to be deposited. It is convenient and economical.

【図面の簡単な説明】[Brief explanation of the drawing]

図面は本発明の一実施例を示すもので、第1図
は従来のスパツタリング装置の正断面図、第2図
は本装置の正断面図、第3,4図は本装置別例の
正断面図、第5,6図は回転板の平面図である。 a……陰極、10……磁石、11……ターゲツ
ト材、12……基材、13……真空室、13a…
…天井部、14……回転板、15……成膜室。
The drawings show one embodiment of the present invention; FIG. 1 is a front sectional view of a conventional sputtering device, FIG. 2 is a front sectional view of this device, and FIGS. 3 and 4 are front sectional views of other examples of this device. 5 and 6 are plan views of the rotating plate. a... cathode, 10... magnet, 11... target material, 12... base material, 13... vacuum chamber, 13a...
...Ceiling part, 14... Rotating plate, 15... Film forming chamber.

Claims (1)

【特許請求の範囲】 1 真空状態において、陰極から陽イオンの衝撃
によりたたき出された物質を基材表面に飛散させ
て基材表面に成膜を行うスパツタリング装置にお
いて、真空室の中に複数の陰極を円周上に配置し
た回転板を設け、この真空室の天井部に成膜室を
開口連設し、この回転板を回転させて陰極を成膜
室の真下に停止させてスパツタリングを行う事を
特徴とするスパツタリング装置。 2 真空状態において、陰極から陽イオンの衝撃
によりたたき出された物質を基材表面に飛散させ
て基材表面に成膜を行うスパツタリング装置にお
いて、真空室の中に複数のターゲツト材を円周上
に配設した回転板を設け、この真空室の天井部に
成膜室を開口連設し、この成膜室の真下に位置す
る真空室底部に磁石を固定し、この回転板を回転
させてターゲツト材を磁石上に停止させた時にス
パツタリングを行う事を特徴とするスパツタリン
グ装置。
[Claims] 1. In a sputtering device that forms a film on the surface of a substrate by scattering substances ejected from the cathode by the impact of cations onto the surface of the substrate in a vacuum state, a plurality of sputtering devices are installed in a vacuum chamber. A rotating plate with cathodes arranged on the circumference is provided, a film forming chamber is opened in the ceiling of this vacuum chamber, and the rotating plate is rotated to stop the cathode directly below the film forming chamber to perform sputtering. A sputtering device characterized by: 2 In a sputtering device that forms a film on the surface of a substrate by scattering substances ejected from the cathode by the impact of cations onto the surface of the substrate in a vacuum state, multiple target materials are placed circumferentially in a vacuum chamber. A rotating plate is provided, a film forming chamber is opened and connected to the ceiling of this vacuum chamber, a magnet is fixed to the bottom of the vacuum chamber located directly below this film forming chamber, and this rotating plate is rotated. A sputtering device that performs sputtering when a target material is stopped on a magnet.
JP16897787A 1987-07-07 1987-07-07 Sputtering device Granted JPS6415368A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP16897787A JPS6415368A (en) 1987-07-07 1987-07-07 Sputtering device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP16897787A JPS6415368A (en) 1987-07-07 1987-07-07 Sputtering device

Publications (2)

Publication Number Publication Date
JPS6415368A JPS6415368A (en) 1989-01-19
JPH0248624B2 true JPH0248624B2 (en) 1990-10-25

Family

ID=15878068

Family Applications (1)

Application Number Title Priority Date Filing Date
JP16897787A Granted JPS6415368A (en) 1987-07-07 1987-07-07 Sputtering device

Country Status (1)

Country Link
JP (1) JPS6415368A (en)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR20010090033A (en) * 2001-08-14 2001-10-18 손종역 Multi-target holder operating by one shaft control for Laser Deposition.
JP4667057B2 (en) * 2005-02-08 2011-04-06 キヤノン株式会社 Film forming apparatus and film forming method

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS56155981A (en) * 1980-05-06 1981-12-02 Mitsubishi Electric Corp Optical encoder

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS56155981A (en) * 1980-05-06 1981-12-02 Mitsubishi Electric Corp Optical encoder

Also Published As

Publication number Publication date
JPS6415368A (en) 1989-01-19

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